裂变径迹法普查铀矿的自动测量

用裂变径迹法普查铀矿时需要测量大量样品,用裂变径迹的自动测量可以大大提高测量的速度。本文描述自动图象分析仪测量铀矿普查现场样品的结果,并与用显微镜测量的结果进行了比较。     

156Eu衰变发射的γ射线绝对强度测量

经热中子辐照过的154 Sm样品 ,用离子交换法进行化学分离 ,得到放射性核素156 Eu。用 4πβ γ符合装置测量放射性活度 ,以及用HPGe和小平面Ge探测器测量γ射线数。通过这些测量 ,精确测定了156 Eu衰变发射的γ射线绝对强度。测量结果的不确定度小于 2 %。     

BES 桶部簇射计数器工作特性的测量

本文给出了ＢＥＳ桶部簇射计数器工作特性的一些测量结果。用５５ＦｅＸ射线源测量了工作气体的气体放大特性曲线和气体入出口的坪特性曲线，测量了输出脉冲电荷量的稳定性。用宇宙线μ子测量了桶部簇射计数器不同并联单元的坪特性曲线。用Ｂｈａｂｈａ散射测量了桶部簇射计数器的能量分辨与位置分辨。     

CaSO_4:Dy-Teflon元件测量~(60)Coγ射线吸收剂量分布的适用性

本文讨论了用CaSO_4:Dy-Teflon元件对狗模吸收剂量分布的测量,并与用电离室的测量结果进行比较,表明此元件能较精确地测量体模的吸收剂量分布。     

内墙漆防氡效率测定方法的研究

为了建立一种测量内墙漆防氡效率的有效测量方法,采用局部静态法测量被测测介质表面在测量期间的平均氡析出率。用有机玻璃制成充氡箱,用市售单面光滑的纤维板制作样品,用特制的PCMR－1连续测氡仪作测量手段,用GD－LI流气式固体氡源向充氡箱充氡,从而建立了内墙漆防氡效率的测定方法,该方法对不同内墙漆防氡效率容易实现同条件测量,测量结果具有很好的可比心。该方法能够满足内墙防氡效率测定工作的需要。     

裂变径迹法普查铀矿中的两种自动测量技术

本文介绍了裂变径迹法普查铀矿中的两种自动测量技术——利用图象分析仪测量技术和火花自动测量技术。着重叙述了用火花计数自动测量的必要性,改进措施和测量大量样品的可靠性。 1.图象分析仪自动测量技术 图象分析仪有两种计数方法,即不带收敛计数法和带收敛计数法。由于径迹有交叉的情况,若采用带收敛法则需要人为地用光笔逐个机场修象,关洞。     

辐照电子直线加速器辐射剂量测定的技术研究

研究了辐照电子直线加速器辐射剂量测定的技术方法,在测量方法上采取实测与蒙特卡洛模拟计算相结合的方法提高辐射剂量测定的准确度和可操作性;用化学剂量计建立电子束吸收能量测量的方法;用平板电离室建立电子束表面剂量、电子束吸收剂量率测量的方法;用半导体探测器阵列建立电子束辐照均匀性测量的方法。     

BES桶中簇射计数器工作特性的测量

本文给出了ＢＥＳ桶部簇射计数器工作特性的一些测量结果，用＾５５ＦｅＸ射线源测量了工作气体的气体放大特性曲线和气体入出口的坪特性曲线，测量了输出脉冲电荷量的稳定性。用宇宙线μ子测量子桶部簇射计数器不同并联单元的坪特性曲线。用Ｂｈａｂｈａ散射测量了桶部簇射计数器的能量分辨与位置分辨。     

用 NaI(TI)γ 谱仪测量环境 γ 照射量率的总谱能量法

本文介绍用 NaI(Tl)γ谱仪测量环境γ照射量率的总谱能量法。谱仪用标准镭源刻度,刻度系数 K_r 为17.82(GeV/20min)/(μR/h),环境γ照射量率测量值的总不确定度约为±9.5%,在玉泉路高能所内外20多个测量点上的测量结果表明,γ谱仪与高气压电离室的测量值较好符合。文中还讨论了用总谱能量法测量环境γ照射量率时的几个有关问题。     

169Yb放射性溶液的比活度测量

研究用4πX(PPC)-γ和4πX(L•S)-γ活度标准装置直接测量¹⁶⁹Yb放射性溶液比活度。描述了测量的基本原理和测量技术,并提出用外推法选择合适的分辨时间。比较了不同标准装置的测量结果。比较表明,它们之间的偏差在0.5%以内。     

X-ray CCD相机在杆箍缩二极管X射线焦斑诊断中的应用

针孔成像法是诊断杆箍缩二极管X射线焦斑的常用方法。本文建立基于增感屏、光锥耦合、CCD相机的X-ray CCD相机系统,取代针孔成像法中基于闪烁体、物镜、CCD相机的图像获取系统,提高了诊断系统的紧凑性。对所建立的X-ray CCD相机系统的空间分辨能力进行了测试,系统的空间分辨能力受增感屏限制,使用铅制分辨卡测得系统的空间分辨率为5lp/mm,使用刀口法测得调制传递函数为0.5时的频率为1.5lp/mm。测试结果表明,在针孔成像倍率为0.5时,可满足1.5 mm左右的X射线焦斑诊断的需要。并开展了杆箍缩二极管侧面焦斑诊断实验,获得了侧面焦斑图像,且进行了图像复原处理。     

用于HL-2A装置的新型硬X射线探测器

介绍了一种应用于托卡马克等离子诊断领域的新型硬X射线探测器,该探测器主要由硅酸钇镥(Lutetium-yttrium Oxyorthosilicate,LYSO)闪烁体和硅光电倍增管(Silicon Photomultiplier,Si PM)组成。基于项目应用需求,对探测器的选型和基于粒子输运蒙特卡罗仿真软件GEANT4的探测器设计加以阐述,并搭建了前端的探测系统,在HL-2A托卡马克装置上进行了现场诊断实验。实现了硬X射线空间能谱和辐射强度分布的诊断测量。实验表明该探测器阵列具有10 ms的时间分辨率,同时具有结构紧凑、使用方便等特点,能够满足等离子体诊断中硬X射线动态能谱和强度分布测量的诊断需求。     

能量色散X射线荧光分析现场测定地质样品中W钨含量

采用IED - 2000能量色散X射线荧光仪测量化探样品,并对获得的仪器谱进行散射本底扣除和直接解调谱线重建,获得W的Lα特征X射线全能峰净峰面积,从而实现W含量的测量.对同一批化探样品进行室内波长色散X射线荧光分析和野外X射线荧光分析,其分析结果对比表明对能量色散X射线荧光仪进行谱线处理后,可以在野外现场对W元素实现...     

利用多毛细管准直器测量X射线光源焦斑尺寸

设计了一种测量X射线光源焦斑尺寸的方法：多毛细管准直器法。整体玻璃毛细管X射线准直器是由数10⁵根内径为几微米的单玻璃毛细管组成的X射线光学器件,X射线光源发出的发散X射线光束被多毛细管准直器约束后变为准平行束。准平行束的截面直径是X射线光源焦斑直径的函数,通过测量准平行束不同位置处的截面直径,利用线性拟合可得到X射线光源的焦斑直径。分别利用多毛细管准直器法和常用的小孔成像法测量了同一微焦斑X射线光源的焦斑直径,测量结果分别为60.8和59.4μm。多毛细管准直器法对焦斑直径在亚微米量级或更小X射线源的焦斑尺寸测量中将显示出更多的优势。     

Development of a new X-ray source using backscattered X-ray with the use of a cold cathode

The development of an intense X-ray source using backscattered X-ray produced using an advanced electrode configuration is described. The electrodes were composed of field emitters deposited on a wire mounted on a perforated plate as the cathode and a copper plate as the anode. Electrons from these emitters collided with the copper plate and X-ray was generated at collision points. The backscattered X-ray in the direction normal to the electron trajectory through a hole in the anode escaped from the vacuum chamber through a beryllium window. Continuous and characteristic X-rays were detected at an applied voltage lower than that of a conventional X-ray source from 3.0 to 9.4 kV, respectively. Moreover, the X-ray dosage measured with a survey meter reached 0.95 mSv/h at 5.0 kV of applied voltage. The transmission images of three types of material used as an X-ray source for the X-ray imaging system indicate three advantages; low power consumption, focal point controllable by adjusting applied voltage, and photographable motion picture of X-ray transmission.     

DPF脉冲X射线能谱测量

采用滤光法对ＤＰＦ脉冲Ｘ射线源的Ｘ射线能谱进行了测量,取得了较好的结果,为辐尖环境测量提供了一种手段。     

50nm X射线光刻掩模制备关键技术

X射线光刻(XRL)采用约1nm波长的X射线,是一种接近式光刻。就光刻工艺性能而言,XRL能同时实现高分辨率、大焦深、大像场等,是其他光刻手段难以比拟的。由于不需要辅助工艺,因而工艺成本很低。掩模制造技术是XRL开发中最为困难的部分。本文介绍了适用于50nm XRL的掩模制备的关键技术。     

轫致辐射能谱测定SSC高频腔体电压

介绍了利用轫致辐射能谱测定回旋加速器高频腔体电压的原理，方法及测量结果。该测量方法的优点在于采用非接触方式量高频腔体电压，因而不改变高频腔体的谐振特性，并且不受高频频率的影响，测量的高频腔体电压准确可靠。     

Nondestructive measurement of the coating thickness for simulated TRISO-coated fuel particles by using phase contrast X-ray radiography

The TRISO-coated fuel particle for a HTGR (high temperature gas-cooled reactor) is composed of a nuclear fuel kernel and outer coating layers. The coating layers consist of a buffer PyC (pyrolytic carbon) layer, an inner PyC (I-PyC) layer, a SiC layer, and an outer PyC (O-PyC) layer. X-ray radiography is one of the nondestructive alternatives to measure a coating thickness without generating a radioactive waste. Phase contrast X-ray radiography technology is more powerful for acquiring a radiograph with clear boundaries, when compared with a conventional X-ray radiography. The contrast can be enhanced for weakly absorbing materials in a phase contrast X-ray radiograph by detecting an intensity variation due to the variation of a phase of the X-rays in the boundary between two objects. Phase contrast X-ray radiograph was acquired from a simulated TRISO-coated fuel particle with a micro-focus X-ray imaging system. The coating thickness was nondestructively measured from the phase contrast X-ray image for the fuel particle.     

Improvement of the position resolution of the CCD for X-ray use

The authors report here experimental results relating X-ray interaction location and event splitting. The X-ray interaction location can be localized at subpixel scale using the mesh technique. The authors found that the center of gravity of the split event is well-correlated with the X-ray interaction location. They analyzed the data using two models for the charge cloud shape: one is the rectangular model and the other is the Gaussian model. Although the authors could not distinguish between these models, they measured a root mean square charge cloud size of 1 to 2 μm for X-rays of Y-L (1.9 keV), Ag-L (3.0 keV), and Ti-K (4.5 keV). When the X-rays enter near the pixel boundary, the charge splits into adjacent pixels, allowing determination of the X-ray interaction location with an accuracy of 1.5 to 2.2 μm. The authors, therefore, expect that the X-ray CCD can function as an X-ray imager with subpixel resolution, which will be especially useful in applications involving very high spatial resolution optics