Analysis of scanning probe microscope images using wavelets

The utility of wavelet transforms for analysis of scanning probe images is investigated. Simulated scanning probe images are analyzed using wavelet transforms and compared to a parallel analysis using more conventional Fourier transform techniques. The wavelet method introduced in this paper is particularly useful as an image recognition algorithm to enhance nanoscale objects of a specific scale that may be present in scanning probe images. In its present form, the applied wavelet is optimal for detecting objects with rotational symmetry. The wavelet scheme is applied to the analysis of scanning probe data to better illustrate the advantages that this new analysis tool offers. The wavelet algorithm developed for analysis of scanning probe microscope (SPM) images has been incorporated into the WSxM software which is a versatile freeware SPM analysis package.     

A scanning near-field optical microscope having scanning electron tunnelling microscope capability using a single metallic probe tip

A new microscope system that has the combined capabilities of a scanning near-field optical microscope (SNOM) and a scanning tunnelling microscope (STM) is described. This is achieved with the use of a single metallic probe tip. The distance between the probe tip and the sample surface is regulated by keeping the tunnelling current constant. In this mode of operation, information about the optical properties of the sample, such as its refractive index distribution and absorption characteristics, can be disassociated from the information describing its surface structure. Details of the surface structure can be studied at resolutions smaller than the illumination wavelength. The performance of the microscope is evaluated by analysing a grating sample that was made by coating a glass substrate with gold. The results are then compared with the corresponding SNOM and STM images of the grating.     

Near-field scanning optical microscope probe analysis

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.     

High-speed force load in force measurement in liquid using scanning probe microscope

This article presents an inversion-based iterative feedforward-feedback (II-FF/FB) approach to achieve high-speed force load in force measurement of soft materials in liquid using scanning probe microscope (SPM). SPM force measurement under liquid environment is needed to interrogate a wide range of soft materials, particularly live biological samples. Moreover, when dynamic evolution of the sample occurs during the measurement, and/or measuring the rate-dependent viscoelasticity of the sample, the force measurement also needs to be acquired at high-speed. Precision force load in liquid, however, is challenged by adverse effects including the thermal drift effect, the reduction of the signal to noise ratio, the distributive hydrodynamic force effect, and the hysteresis and vibrational dynamics effects of the piezoelectric actuators (for positioning the probe relative to the sample), particularly during high-speed measurement. Thus, the main contribution of the article is the development of the II-FF/FB approach to tackle these challenges. The proposed method is illustrated through an experimental implementation to the force-curve measurement of a poly (dimethylsiloxane) sample in liquid at high-speed.     

Observation of recording pits on phase-change film using a scanning probe microscope

A phase-change film is a key material for optical data storage media such as rewritable compact disks (CD-RW) and digital versatile disk random access memory (DVD-RAM). Data pits are recorded as differences in crystal state (crystallized state vs. amorphous state) on phase-change film. It is very important to distinguish the crystal state difference in a very small area for material research of phase-change film. Measuring size and shape of recorded data pits is also very important for the development to achieve good data reliability and high data density of optical data storage media. The crystal state difference in very small areas of phase-change film is successfully observed by Kelvin probe force microscopy (KFM) and scanning near-field optical/atomic force microscopy (SNOAM). The advantage of KFM and SNOAM for measuring physical property differences in a very small area is demonstrated.     

Charge drives for scanning probe microscope positioning stages

Due to hysteresis exhibited by piezoelectric actuators, positioning stages in scanning probe microscopes require sensor-based closed-loop control. Although closed-loop control is effective at eliminating non-linearity at low scan speeds, the bandwidth compared to open loop is severely reduced. In addition, sensor noise significantly degrades achievable resolution in closed loop. In this work, charge drives are evaluated as a simple positioning alternative when feedback control cannot be applied or provides inadequate performance. These situations arise in high-speed imaging, where position sensor noise can be large or where no feedback sensors are present. Charge drives can reduce the error caused by hysteresis to less than 1% of the scan range. We review the design of charge drives and compare them to voltage amplifiers for driving lateral SPM scanners. The first experimental images using charge drive are presented.     

基于原子力显微的多模式扫描探针显微镜

扫描探针显微镜是目前世界上分辨率最高的显微镜之一,也是纳米技术研究的主要工具。本文在分析原子力显微镜工作原理的基础上,探讨多模式扫描探针显微镜的相关功能,并对扫描探针显微镜的发展前景进行展望。     

Evaluation of nano-optical probe from scanning near-field optical microscope images

We studied a nanometre-sized optical probe in a scanning near-field optical microscope. The probe profile is determined by using a knife-edge method and a modulated transfer function evaluation method which uses nanometre-sized line-and-space tungsten patterns (with spaces 1 microm to 50 nm apart) on SiO2 substrates. The aluminium-covered, pipette-pulled fibre probe used here has two optical probes: one with a large diameter (350 nm) and the other with a small diameter (10 nm). The small-diameter probe has an optical intensity approximately 63 times larger than that of the large-diameter probe, but the power is about 1/25 of that of the large probe.     

Evaluation of nano-optical probe from scanning near-field optical microscope images

We studied a nanometre-sized optical probe in a scanning near-field optical microscope. The probe profile is determined by using a knife-edge method and a modulated transfer function evaluation method which uses nanometre-sized line-and-space tungsten patterns (with spaces 1 μm to 50 nm apart) on SiO₂ substrates. The aluminium-covered, pipette-pulled fibre probe used here has two optical probes: one with a large diameter (350 nm) and the other with a small diameter (10 nm). The small-diameter probe has an optical intensity ≈63 times larger than that of the large-diameter probe, but the power is about 1/25 of that of the large probe.     

A microheater with temperature stabilization for a scanning probe microscope

A microheater for conducting measurements by the scanning probe microscopy technique at various temperatures is described. The temperature stabilization accuracy is 0.05°C in a range of 20–80°C. A negligible temperature drift of 40 nm/°C (in the sample plane) and 100 nm/°C (along the normal) allows the study of temperature-dependent structural changes and phase transitions in polymer materials, biological objects, and other samples.     

Quantitative scanning probe microscope topographies by charge linearization of the vertical actuator

Many forms of scanning probe microscopy require a piezoelectric actuator to vary the probe-sample distance. Examples include constant-force atomic force microscopy and constant-current scanning tunneling microscopy. In such modes, the topography of the sample is reconstructed from the voltage applied to the vertical piezoelectric actuator. However, piezoelectric actuators exhibit significant hysteresis which can produce up to 14% uncertainty in the reproduced topography. In this work, a charge drive is used to linearize the vertical piezoelectric actuator which reduces the error from 14% to 0.65%.     

High second harmonic generation signal from muscles and fascia pig's muscles using the two-photon laser scanning microscope

I have provided update to our two photon laser scanning microscope by adding new technique which enables us to simultaneously measured the second harmonic generation signals in the forward and backward directions; in the meantime, one can measure the two photon excitations fluorescence if the materials produce fluorescence. In the present work, the fascia muscles, muscles of pig and pig's skin were used. I found that these materials produced high second harmonic generation signal in both directions. These measurements show that the second harmonic generation strongly depends on the state of the polarization of the laser light and the orientation of the dipole moment in the molecules that interact with the laser light. It is therefore advantageous to control the laser's state of polarization, to maximize second harmonic generation. The novelty of this work is to establish new multi-functional technique by combing three platforms of laser scanning microscopy – the fluorescence microscopy, harmonic generation microscopy and polarizing microscopy in which one can use the second harmonic imaging to investigate the true architecture of the sensitive samples and the samples which do not produce auto-fluorescence. Moreover investigation of the new sample needs to look at all details of the true architecture of the sample. Thereby the sample will be exposed to the laser radiation more than the well-known sample, and that will cause photo-bleaching and photo-damage. Since the second harmonic generation does not undergo from photo-bleaching and photo-damage it will be the promising technique for investigating the sensitive and new samples. Then one can move to acquire fluorescence images after good investigation of the true architecture of the sample by the SH imaging.     

Highly controllable fabrication of fiber probe for photon scanning tunneling microscope

A selective chemical etching was used to fabricate fiber probes for the photon scanning tunneling microscope (PSTM). The cladding diameter of the fiber probe was controlled by varying the first-step etching time. The cone angle of the fiber probe tip was controlled by varying the doping ratio of the fiber and the composition of the etching solution. A cladding diameter of 8 μm and a tip diameter of about 3 nm were fabricated. The smallest cone angle was 14°.     

Iterative image-based modeling and control for higher scanning probe microscope performance

In this article, we develop an image-based approach to model and control the dynamics of scanning probe microscopes (SPMs) during high-speed operations. SPMs are key enabling tools in the experimental investigation and manipulation of nano- and subnanoscale phenomena; however, the speed at which the SPM probe can be positioned over the sample surface is limited due to adverse dynamic effects. It is noted that SPM speed can be increased using model-based control techniques. Modeling the SPM dynamics is, however, challenging because currently available sensing methods do not measure the SPM tip directly. Additionally, the resolution of currently available sensing methods is limited by noise at higher bandwidth. Our main contribution is an iterative image-based modeling method which overcomes these modeling difficulties (caused by sensing limitations). The method is applied to model an experimental scanning tunneling microscope (STM) system and to achieve high-speed imaging. Specifically, we model the STM up to a frequency of 2000 Hz (corresponds to approximately 23 of the resonance frequency of our system) and achieve approximately 1.2% error in 1 nm square images at that same frequency.     

Highly controllable fabrication of fiber probe for photon scanning tunneling microscope

A selective chemical etching was used to fabricate fiber probes for the photon scanning tunneling microscope (PSTM). The cladding diameter of the fiber probe was controlled by varying the first-step etching time. The cone angle of the fiber probe tip was controlled by varying the doping ratio of the fiber and the composition of the etching solution. A cladding diameter of 8 μm and a tip diameter of about 3 nm were fabricated. The smallest cone angle was 14°.     

The height regulation of a near-field scanning optical microscope probe tip

A nonoptical detection of the optical fibre tip has been developed. By detecting the output signal from a tiny piezoelectric detector attached to the vibrating fibre tip, the distance between the fibre tip and the sample has been successfully controlled. The frequency responses of the system composed of tip, the dither and the detector have been studied. The difference between the shear-force detection and the tapping-mode detection is discussed. It is found that the shear force exerted on the tip reduces the vibration amplitude with an unvaried resonance frequency. However, in the tapping mode, the resonance frequency varies with the tip-sample distance as the force is exerted on the fibre tip only within a half period. This requires better adjustments for the tapping-mode detection.     

Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed

The mechanical design of a high-bandwidth, short-range vertical positioning stage is described for integration with a commercial scanning probe microscope (SPM) for dual-stage actuation to significantly improve scanning performance. The vertical motion of the sample platform is driven by a stiff and compact piezo-stack actuator and guided by a novel circular flexure to minimize undesirable mechanical resonances that can limit the performance of the vertical feedback control loop. Finite element analysis is performed to study the key issues that affect performance. To relax the need for properly securing the stage to a working surface, such as a laboratory workbench, an inertial cancellation scheme is utilized. The measured dominant unloaded mechanical resonance of a prototype stage is above 150 kHz and the travel range is approximately 1.56 μm. The high-bandwidth stage is experimentally evaluated with a basic commercial SPM, and results show over 25-times improvement in the scanning performance.     

A scanning probe microscope for studying electron transport at low temperatures

A scanning probe microscope that allows studies of electron transport—in particular, in carbon nanotubes at cryogenic temperatures—has been developed. The stiff structure of the microscope and its small transverse dimensions allow scanning to be performed in the atomic-force-microscope mode of a portable Dewar flask with a neck diameter of >40 mm without using additional vibration insulation.     

The height regulation of a near-field scanning optical microscope probe tip

A nonoptical detection of the optical fibre tip has been developed. By detecting the output signal from a tiny piezoelectric detector attached to the vibrating fibre tip, the distance between the fibre tip and the sample has been successfully controlled. The frequency responses of the system composed of tip, the dither and the detector have been studied. The difference between the shear-force detection and the tapping-mode detection is discussed. It is found that the shear force exerted on the tip reduces the vibration amplitude with an unvaried resonance frequency. However, in the tapping mode, the resonance frequency varies with the tip–sample distance as the force is exerted on the fibre tip only within a half period. This requires better adjustments for the tapping-mode detection.