Carrier Dynamics Study of CdxZn1-xSe/ZnSe (x = 0.2) Multiple Quantum Wells

In this paper, nonlinear optical properties of Cd_xZn_1-xSe/ZnSe (x = 0.2) multiple quantum wells were studied by low temperature steady-state and transient photoluminescence at high excitation densities. The biexciton transition was observed on the low energy side of the exciton transition. Based on the characteristics of stimulated emission observed in similar structures, we suggest the biexciton transition as the mechanism for stimulated emission. Optical degradation was also studied by room temperature photoluminescence using femtosecond laser pulses as the excitation source. The results confirm the formation of nonradiative recombination centers with a saturating degradation effect after about 10 min of exposure.     

Molecular beam epitaxial growth of MgZnCdSe on (100) InP substrates

Wide-gap II-VI MgZnCdSe quaternary compounds were grown on InP substrates by molecular beam epitaxy, for the first time. Changing the Mg composition (x = 0 to 0.63), various Mg_x(Zn_yCd_{1_y})_{1_x}Se lattice-matched to InP were grown. Mirror-like surface morphologies and streaky reflection high energy electron diffraction patterns of MgZnCdSe were obtained. With increased Mg compositions, the band-edge emissions wavelength in photoluminescence spectra was shifted from 572 nm (2.17 eV) to 398 nm (3.12 eV) at 15K. Furthermore, the absolute PL peak intensity increased drastically with increased band-edge emission, being accompanied by a relative decrement in the deep level emission intensities were also observed.     

Development of an epitaxial lift-off technology for II-VI nanostructures using ZnMgSSe alloys

An epitaxial lift-off technique for removing wide bandgap II-VI heterostructures from GaAs substrates has previously been demonstrated using lattice-matched MgS as the sacrificial layer. However, using MgS as an etch release layer prevents its use as a wide bandgap barrier in the rest of the structure. Here, we describe the use of the etch-resistant alloy Zn_.2Mg_.8S_.64Se_.36 which we have developed as a replacement for MgS. We demonstrate that this alloy can be grown by MBE together with MgS in heterostructures and used as a barrier for ZnSe. A ZnSe quantum well with Zn_.2Mg_.8S_.64Se_.36 barriers shows no decrease in photoluminescence intensity after the etching process but shows a shift in emission wavelength associated with the changing strain state.     

Zn1?xMgxO用于 CIGS 太阳电池的研究进展

Zn1-xMgxO透过率高、带隙可调,且与CIGS太阳电池在晶格和能带结构上匹配良好,可用作CIGS太阳电池缓冲层、窗口层,因此制备高质量的Zn1-xMgxO薄膜是提高太阳电池性能的关键。文章介绍了Zn1-xMgxO薄膜的结构特性、光学特性及制备方法;从Mg含量、Zn1-xMgxO膜厚及Zn1-xMgxO/CIGS界面处缺陷密度等方面概述了Zn1-xMgxO用于CIGS太阳电池的研究进展,并比较了Zn1-xMgxO与In2S3,ZnS,CdS等其他材料作缓冲层的CIGS太阳电池性能的差别。     

Structural and optical properties of Zn<Subscript>1−x</Subscript>Mg<Subscript>x</Subscript>O thin films synthesized with metal organic chemical vapor deposition

We present the structural and optical properties of Zn_1?xMg_xO thin films studied using x-ray diffraction (XRD), extended x-ray absorption fine structure (EXAFS), and photoluminescence (PL) measurements. The Zn_1?xMg_xO films on sapphire [0001] substrates were fabricated with metal organic chemical vapor deposition (MOCVD). The XRD measurements showed that the Zn_1?xMg_xO films (x≤0.05) had a wurtzite structure without any MgO phase and were epitaxially grown along the c-axis of the Al₂O₃ substrate. The lattice constant of the Zn_0.95Mg_0.05O film shrank by 0.023 Å, compared with that of ZnO crystals. From the EXAFS measurements on the Zn_1?xMg_xO films at Zn K-edge, we found a substantial amount of distortion in the bond length of Zn-Zn pairs with a small amount of Mg substitution on the Zn site. The PL measurements showed a gradual increment of the main exciton transitions from 3.36 eV (x=0.0) to 3.57 eV (x=0.05) at 10 K. We also observed a strong deep-level emission near 2.3 eV from the specimen with x=0.05.     

Structural and optical properties of hexagonal MgxZn1−xO thin films

High-quality epitaxial magnesium zinc oxide (Mg_xZn_1-xO) alloy thin films were grown on sapphire (α-Al₂O₃ (0001)) substrates using pulsed laser deposition. The structural and optical properties of these hexagonal films were determined using transmission electron microscopy (TEM), x-ray diffraction (XRD), Rutherford backscattering spectrometry (RBS), absorption, and photoluminescence measurements. XRD and TEM data reveal that magnesium zinc oxide alloy films, grown by domain matching epitaxy, exhibited the following relationships: MgZnO[0001] ∥ α-Al₂O₃ [0001] and MgZnO[01 0] ∥ α-Al₂O₃ [2 0]. RBS data demonstrate that a maximum magnesium content of x=0.34 can be obtained in hexagonal Zn_xMg_1-xO thin films. This value is significantly higher than the thermodynamic limitation of x=0.04. The absorption spectra of magnesium zinc oxide alloy films obtained at room temperature demonstrate significant excitonic behavior. The exciton binding energies have been extracted from the absorption data. Values of the exciton bandgap as a function of magnesium content were determined by fitting the bandgap energies using polynomial fitting. The Zn_xMg_1−xO alloy thin films demonstrate bright room-temperature luminescence and significant excitonic behavior. A shift in the excitonic emission peak as a function of magnesium content was observed.     

MBE Growth of lattice-matched ZnCdMgSe quaternaries and ZnCdMgSe/ZnCdSe quantum wells on InP substrates

We report the growth and characterization of a new wide bandgap II-VI alloy, Zn_xCd_yMg_1-x-ySe, grown lattice-matched to InP. High quality quaternary layers with bandgaps ranging from 2.4 to 3.1 eV were grown by molecular beam epitaxy. The bandgaps and lattice constants were measured using photoluminescence and single crystal Θ-2Θ scans. Quantum well structures with quaternary barriers and ZnCdSe wells were also grown, entirely lattice matched to InP. Their photoluminescence properties suggest that these materials are suitable for the design of visible semiconductor lasers spanning the blue, green, and yellow regions of the visible range. The absence of strain in these heterostructures is expected to improve the reliability of the materials in device applications.     

Growth-Temperature-Controlled Optical Properties of Textured MgxZn1?xO Thin Films

Pulsed laser deposition was used to grow magnesium zinc oxide thin films on amorphous fused silica substrates at several temperatures between room temperature and 750°C. In this study, the effect of growth temperature on the optical properties of textured Mg _x Zn_1−x O thin films was examined. The optical properties of the films were measured using absorption and photoluminescence spectrometry. Absorption spectra revealed that the bandgap values of textured Mg _x Zn_1−x O thin films were enhanced in films grown at higher temperatures. The absorption spectra near the absorption edge were fitted using the Urbach equation in order to investigate the effects of growth temperature on exponential band tail and bandgap. The photoluminescence spectra were measured for magnesium zinc oxide thin films deposited at 250°C, 350°C, 450°C, 550°C, and 650°C. The film grown at 350°C provided the highest excitonic peak intensity. On the other hand, the film grown at 250°C exhibited the lowest excitonic peak intensity. The excitonic peak intensity was considerably reduced in magnesium zinc oxide thin films grown at temperatures greater than 350°C. The ability to perform substrate-temperature-dependent bandgap engineering of Mg _x Zn_1−x O will enable use of this material in next-generation optical and optoelectronic devices.     

Cd and Te-based ohmic contact materials to p-Type ZnSe

In order to explore a possibility of forming an intermediate semiconductor layer with low Schottky barrier by the conventional deposition and annealing technique, the electrical properties of Cd and Te-based contacts on the nitrogendoped ZnSe substrates have been investigated. Cd in the Cd/W contact reacted with the ZnSe substrate after annealing at temperatures above 250°C and formed epitaxial Cc_x}Zn_1−xSe layers, leading to reduction of the “turn-on” voltage (V_T) from about 11 to 6 V (here, a slash “/” between Cd and W means the deposition sequence). The reduction of the V_n} value by annealing at elevated temperatures was also observed for the Bi-Cd/W and In-Cd/W contacts. The average Cd composition (x) in the Cd_n}Zn_1−xSe layers was measured to be larger than 0.9, which agreed with the values estimated from the calculated Cd-Zn-Se phase diagrams. The ohmic behavior was strongly influenced by the thickness of the Cd_xZn_1−xSe layer, the density of misfit dislocations formed at the interface between the Cd_x Zn_1−x Se and the ZnSe, and/or the total area of the Cd Zn. Se layers covering the ZnSe surface. The present result suggests that formation of the large-areal Cc_xZn_1−xSe layers with thin thickness is crucial to achieve further reduction of the V_T value by the conventional deposition and annealing technique. Also, the V_T reduction was not obtained for the Te/W contact even after annealing at temperatures close to 300°C, which was explained to be due to absence of ternary ZnSe_1−xTe_n intermediate layers.     

One‐Step Solvent‐Free Synthesis and Characterization of Zn1−xMnxSe@C Nanorods and Nanowires

The carbon‐encapsulated, Mn‐doped ZnSe (Zn_1−xMn_xSe@C) nanowires, nanorods, and nanoparticles are synthesized by the solvent‐free, one‐step RAPET (reactions under autogenic pressure at elevated temperature) approach. The aspect ratio of the nanowires/nanorods is altered according to the Mn/Zn atomic ratio, with the maximum being observed for Mn/Zn = 1:20. A 10–20 nm amorphous carbon shell is evidenced from electron microscopy analysis. The replacement of Zn by Mn in the Zn_1−xMn_xSe lattice is confirmed by the hyperfine splitting values in the electron paramagnetic resonance (EPR) experiments. Raman experiments reveal that the Zn_1−xMn_xSe core is highly crystalline, while the shell consists of disordered graphitic carbon. Variable‐temperature cathodoluminescence measurements are performed for all samples and show distinct ZnSe near‐band‐edge and Mn‐related emissions. An intense and broad Mn‐related emission at the largest Mn alloy composition of 19.9% is further consistent with an efficient incorporation of Mn within the host ZnSe lattice. The formation of the core/shell nanowires and nanorods in the absence of any template or structure‐directing agent is controlled kinetically by the Zn_1−xMn_xSe nucleus formation and subsequent carbon encapsulation. Mn replaces Zn mainly in the (111) plane and catalyzes the nanowire growth in the [111] direction.     

Temperature‐dependent current‐voltage and lightsoaking measurements on Cu(In,Ga)Se2 solar cells with ALD‐Zn1‐xMgxO buffer layers

In this paper, lightsoaking and temperature‐dependent current‐voltage (JVT) measurements on Cu(In,Ga)Se₂ solar cells with atomic layer deposited Zn_1‐xMg_xO buffer layers are presented. A range of Mg concentrations are used, from pure ZnO (x=0) to 26% Mg (x=0·26). Since this kind of solar cells exhibit strong metastable behaviour, lightsoaking is needed prior to the JVT‐measurements to enable fitting of these to the one‐diode model. The most prominent effect of lightsoaking cells with Mg‐rich buffer layers is an increased fill factor, while the effect on cells with pure ZnO buffer is mainly to increase V_oc·. The activation energy is extracted from JVT‐measurement data by applying three different methods and the ideality factors are fitted to two different models of temperature‐dependence. A buffer layer consisting either of ZnO or Zn_1‐xMg_xO with a minor Mg content gives solar cells dominated by interface recombination, which probably can be related to a negative conduction band offset. A relatively high Mg content in the buffer layer (x=0·21) leads to solar cells dominated by recombination in the space charge region. The recombination is interpreted as being tunnelling‐enhanced. The situation in between these Mg concentrations is less clear. Before lightsoaking, the sample with x=0·12 has the highest efficiency of 15·3%, while after lightsoaking the sample with x=0·21 holds the best efficiency, 16·1%, exceeding the value for the CdS reference. The J_sc values of the Zn_1‐xMg_xO cells surpass that of the reference due to the larger bandgap of Zn_1‐xMg_xO compared to CdS. Copyright © 2009 John Wiley & Sons, Ltd.     

Misfit strain induced tweed-twin transformation on composition modulation Zn1−xMgxSxSe1−y layers and the quality control of the ZnSe buffer/GaAs interface

[100] composition modulation as well as [101] and $$1$$ tweed strain contrast were observed in 0.72 μm thick Zn_1?xMg_xS Se_1?y epitaxial films grown on ZnSe buffer layers. The lattice distortion induced tweed strain contrast disappears in relaxed Zn_1?xMg_xS Se_1?y layers of thicknesses above ～ 0.8—1 μm even though the [100] composition modulation remains. Instead, the formation of microtwins takes place to relieve the strain in the distorted lattice of the quaternary films. The Zn_1?xMg_xS_ySe_1?y layers were obtained by growing a ZnSe buffer layer on Asstabilized GaAs substrates with Zn treatment of the substrate prior to the growth of the film. The samples with film thickness of ～0.72 μm were of very high quality with a defect density of less than 5 x lO⁴/cm². Some samples showed rough ZnSe/ GaAs interfaces and a high density of Frank partial dislocations originating at the ZnSe/GaAs interface. The interface roughness is believed to result from an As-rich GaAs surface after the oxide desorption.     

Growth of high-quality 1.93-eV AIGaAs using metalorganic chemical vapor deposition

High-quality Al_xGa_1-xAs with a bandgap of 1.93 eV has been grown using metalorganic chemical vapor deposition (MOCVD). Levels exceeding 10₁₈ cm_-3 can be obtained for Se, Si and Zn dopants. In particular, incorporation of the re-type dopants at this bandgap is not appreciably less efficient than in lower-bandgap Al_xGa_1-xAs. The best material, as measured by photoluminescence intensity, is obtained using high V/III ratios (40 forp-type material and as high as 60 forn- type and low growth rates (300 Å/min). Purification of the arsine in situ with an Al/Ga/In eutectic bubbler to remove trace water and oxygen impurities is found to be essential for the growth of high-quality material, as indicated by photoluminescence intensity measurements. Solar cells fabricated from such material exhibit efficiencies as high as 12.1% under one-sun, airmass zero (AMO) conditions, with an open-circuit voltage of 1.38 V, short-circuit current density of 14.1 mA/cm², and fill factor of 0.84.     

Dielectric confinement on exciton binding energy and nonlinear optical properties in a strained Zn1-xinMgxinSe/Zn1-xoutMgxoutSe quantum well

The band offsets for a Zn1-xinMgxin Se/Zn1-xoutMgxout Se quantum well heterostructure are determined using the model solid theory.The heavy hole exciton binding energies are investigated with various M...     

Preparation and characteristics of the wide gap semiconductor Mg0.18Zn0.82O thin film by L-MBE

The high purity ZnO ceramic target and the (MgO)_0.1(ZnO)_0.9 target were fabricated. The wurtzite-phase ZnO thin film and ternary Mg_xZn_1−xO thin film were grown on sapphire (0001) substrates by laser molecular beam epitaxy (L-MBE) from the sintered ceramic targets separately. The films' transmittance spectra at room temperature for the ZnO film and the Mg_xZn_1−xO film were measured and compared while their room temperature photoluminescence spectra were done. The band-gap modulation is realized from 3.31 eV for the ZnO film to 3.64 eV for the Mg_xZn_1−xO alloy film. The Mg content x in the Mg_xZn_1−xO alloy film was determined to be 0.18.     

Excitonic recombination near the mobility edge in CdSe/ZnSe nanostructures

The low-temperature photoluminescence and Raman scattering in CdSe/ZnSe nanostructures with individual CdSe inserts of 1.5 and 3.0 monolayers in nominal thickness were studied. The energy position of the photoluminescene band is governed by interdiffusion of Cd and Zn into the insert regions, whereas the shape of this band is controlled by strong interaction of localized excitons with optical phonons in the Zn_1?xCd_xSe solid-solution insert. Multiphonon processes of excitonic relaxation with involvement of acoustic phonons at the Brillouin zone edges are also important. The results obtained are interpreted in the context of a model for the effective excitonic mobility edge.     

Molecular beam epitaxy of II–VI wide bandgap semiconductors

The paper presents the issues and challenges for molecular beam epitaxy (MBE) of the II–VI wide-bandgap semiconductors used for blue/green lasers. Use of reflection high-energy electron diffraction (RHEED) addresses many of these challenges, permitting characterization and control of various aspects of wide-bandgap II–VI MBE growth. The paper describes their use to control composition of Zn_{1 − x}Mg_xSe and ZnS_ySe_{1 − y}, layers, and to measure and control the growth rates of ZnSe, ZnTe and CdSe during migration-enhanced epitaxy (MEE) growth. RHEED oscillations reveal additional information about growth processes during II–VI MBE. The Mg sticking coefficient is found to be independent of substrate temperature, flux ratios, and electron beam excitation. Re-evaporation of Se, but not of Zn, is found to occur during pauses in growth. The effects of an electron beam on growth may be quantitatively determined.     

Electrical transport in n-type ZnMgSSe grown by molecular beam epitaxy on GaAs

Significant progress in improving the performance of blue-green II-VI semiconductor injection lasers has come about from advances in the epitaxial growth and doping of ZnMgSSe on GaAs substrates. This paper investigates electrical transport and its relation to structural quality in n-type Zn_1-yMg_y S_xSe_1-x epilayers doped with Cl, grown by molecular beam epitaxy. The composition parameters x and y vary from about 0.12-0.18 and 0.08-0.15, respectively. The quaternary epilayers studied are lattice-matched (or nearly so) to the GaAs substrate. Temperature-dependent Hall-effect measurements are performed on seven n-type ZnMgSSe:Cl epilayers, and a technique is presented whereby the resulting mobility-vs-temperature data is compared with data for ZnSe to obtain a structural figure of merit that is useful in characterizing the quaternary epilayer.     

Hybrid deposition of piezoelectric (11\bar 20) MgxZn1−xO (0≤x≤0.3) on (01\bar 12) R-sapphire substrates using RF sputtering and MOCVDR-sapphire substrates using RF sputtering and MOCVD

Mg_xZn_1?xO (0≤x≤0.3) films are deposited on R-plane $(01\bar 12)$ sapphire substrates using a hybrid deposition technique: metalorganic chemical vapor deposition and radiofrequency (RF) sputtering. Thick piezoelectric Mg_xZn_1?xO films are deposited by RF sputtering on MOCVD grown thin ZnO buffers on R-sapphire substrate. Molar ratio of ZnO and MgO powders are mixed to form Mg_xZn_1?xO (0≤x≤0.3) sputtering targets with NiO (2–3 wt.%) added for compensation doping to achieve piezoelectricity. Field emission scanning electron microscopy shows that the deposited films are dense and uniform. X-ray diffraction indicates that the sputter-deposited Mg_xZn_1?xO (0≤x≤0.3) films retain the wurtzite crystal structure. The crystallinity of the deposited films is further improved by postannealing at 700°C in oxygen. Compositional analysis of the films is carried out using Rutherford back-scattering. High-frequency and low-loss surface acoustic wave (SAW) testing devices fabricated on these films are demonstrated. The SAW properties are tailored to changing Mg compositions. In the ZnO/R-Al₂O₃ system, two types of wave modes, the Rayleigh-type and the Love-type wave modes, are investigated.     

Molecular beam epitaxy of ZnxBe1−xSe: Influence of the substrate nature and epilayer properties

We have studied the heteroepitaxial growth of Zn_xBe_1−xSe onto Si, GaAs and GaP substrates. By comparing the growth on these different substrates, we showed that lattice-matching is not a sufficient condition to achieve a good epitaxy. Then we have investigated by low-temperature photoluminescence and reflectivity spectroscopies a series of Zn_xBe_1−xSe alloys with Be content up to 70%. This allowed us to locate the direct-to-indirect band-gap cross over at x=0.46. We found a bowing parameter b=0.97 eV for the direct band-gap in the whole composition range. Finally, Zn_0.59Be_0.41Se and Zn_0.55Be_0.45Se alloys lattice-matched, respectively, to GaP and Si substrates are direct band-gap semiconductors which exhibit band-gap at 3.72 eV and 3.85 eV.