Type-II Ge/Si quantum dots

The electronic structure of spatially indirect excitons, multiparticle excitonic complexes, and negative photoconductivity in arrays of Ge/Si type-II quantum dots (QDs) are considered. A comparison is made with the well-known results for type-II III-V and II-VI QD heterostructures. The following fundamental physical phenomena are observed in the structures under study: an increase in the exciton binding energy in QDs as compared with that for free excitons in homogeneous bulk materials, a blue shift in the excitonic transitions during the generation of multiparticle complexes (charged excitons, biexcitons), and the capture of equilibrium carriers to localized states induced by the electric ield of charged QDs.     

HPT型Ge量子点红外探测器

异质结光敏晶体管(HPT)是一种具有内部电流增益的光电探测器,且与异质结双极晶体管(HBT)的制作工艺完全兼容.利用超高真空化学气相淀积(UHV/CVD)方法在HBT晶体管的基区和集电区间加入多层Ge量子点材料作为光吸收区.TEM和DCXRD测试结果表明,生长的多层Ge量子点材料具有良好的晶体质量.为了提高HPT的发射...     

Dynamics of InAs/GaAs quantum dot lasers epitaxially grown on Ge or Si substrate

Growing semiconductor laser sources on silicon is a crucial but challenging technology for developing photonic integrated circuits(PICs).InAs/GaAs quantum dot(Qdot)lasers have successfully circumvented the mismatch problem betweenⅢ–Ⅴmaterials and Ge or Si,and have demonstrated efficient laser emission.In this paper,we review dynamical characteristics of Qdot lasers epitaxially grown on Ge or Si,in comparison with those of Qdot lasers on native GaAs substrate.We discuss properties of linewidth broadening factor,laser noise and its sensitivity to optical feedback,intensity modulation,as well as mode locking operation.The investigation of these dynamical characteristics is beneficial for guiding the design of PICs in optical communications and optical computations.     

Photoresistance of Si/Ge/Si structures with germanium quantum dots

An exponential decrease in the resistance of a Si/Ge/Si structure containing germanium quantum dots with an increase in the band-to-band optical excitation intensity is observed at 4.2 K. Two different exponential regions in the dependence of structure resistance on the optical excitation intensity are observed in elastically strained structures, but only one such region is observed in unstrained structures. The experimental results obtained are explained within the model of the hopping conduction of nonequilibrium electrons, which are localized at and between quantum dots in the strained structures, but are localized only between quantum dots in the unstrained structures.     

Lateral photoconductivity of Ge/Si heterostructures with Ge quantum dots

The spectral dependences of the lateral photoconductivity of Ge/Si heterostructures with Ge quantum dots are studied. The photoresponse of the Ge/Si structures with Ge nanoclusters is detected in the range 1.0–1.1 eV at T = 290 K, whereas the photocurrent in the single-crystal Si substrate is found to be markedly suppressed. This result can be attributed to the effect of elastic strains induced in the structure on the optical absorption of Si. At temperatures below 120 K, the heterostructures exhibit photosensitivity in the spectral range 0.4–1.1 eV, in which the Si single crystal is transparent. The photocurrent in this range is most likely due to the transitions of holes from the ground states localized in the quantum dots to the extended states of the valence band.     

Ge/Si量子点的控制生长

采用离子束溅射技术,在生长了Si缓冲层的硅晶片上制备了一系列Ge量子点样品.借助原子力显微镜(AFM)和Raman光谱等测试手段研究了Ge/Si量子点生长密度、尺寸及排列均匀性的演变规律.结果表明,改变Si缓冲层厚度及其生长方式,可以有效控制量子点的尺寸、均匀性和密度.随缓冲层厚度增大,量子点密度先增大后减小,停顿生长有利于提高缓冲层结晶性,从而提高量子点的密度,可以达到1.9×1010 cm-2.还研究了Si缓冲层在Ge量子点生长过程中的作用,并提出了量子点的生长模型.     

Lateral photoconductivity of multilayer Ge/Si structures with Ge quantum dots

Spectra of lateral photoconductivity of multilayer Ge/Si structures with Ge quantum dots, fabricated by molecular-beam epitaxy are studied. The photoresponse caused by optical transitions between hole levels of quantum dots and Si electronic states was observed in the energy range of 1.1–0.3 eV at T = 78 K. It was shown that the electronic states localized in the region of Si band bending near the Ge/Si interface mainly contribute to lateral photoconductivity. The use of the quantum box model for describing hole levels of quantum dots made it possible to understand the origin of peaks observed in the photoconductivity spectra. A detailed energy-level diagram of hole levels of quantum dots and optical transitions in Ge/Si structures with strained Ge quantum dots was constructed.     

Lateral photoconductivity in structures with Ge/Si quantum dots

The spectra of lateral photoconductivity and optical absorption caused by the intraband optical transitions of holes in Ge/Si quantum dots are studied at different lattice temperatures. Polarization-dependent spectral features related to the transitions of holes from the quantum dot (QD) ground state are revealed in the optical spectra. Temperature photoconductivity quenching caused by the reverse trapping of nonequilibrium free holes by the QD bound state is observed. The obtained experimental data make it possible to determine the height of the surface band bending at the QD heterointerface.     

Photoconductivity of Si/Ge multilayer structures with Ge quantum dots pseudomorphic to the Si matrix

Longitudinal photoconductivity spectra of Si/Ge multilayer structures with Ge quantum dots grown pseudomorphically to the Si matrix are studied. Lines of optical transitions between hole levels of quantum dots and Si electronic states are observed. This allowed us to construct a detailed energy-level diagram of electron-hole levels of the structure. It is shown that hole levels of pseudomorphic Ge quantum dots are well described by the simplest “quantum box” model using actual sizes of Ge islands. The possibility of controlling the position of the long-wavelength photosensitivity edge by varying the growth parameters of Si/Ge structures with Ge quantum dots is determined.     

Photoluminescence and photoreflectance study of Si/Si0.91Ge0.09 andSi9/Ge6 quantum dots

Nanometer-scale quantum dots based on a series of Si/Si_0.91Ge_0.09 strained layer superlattices and a Si₉/Ge₆ strain-symmetrized superlattice were fabricated using electron beam lithography and reactive ion etching. They were investigated by photoluminescence and photoreflectance. It was found for the first time that the quantum efficiency of optical emission from the quantum well layers increased by over two orders of magnitude when the quantum dot sizes were reduced to ≤100 nm.     

Improved nanocrystal formation,quantum confinement and carrier transport properties of doped Si quantum dot superlattices for third generation photovoltaics

An all‐Si tandem solar cell has the potential to achieve high conversion efficiency at low cost. However, the selection and synthesis of candidate material remain challenging. In this work, we show that the conventional ‘Si quantum dots (Si QDs) in SiO₂ matrix’ approach can lead to the formation of over‐sized Si nanocrystals especially when doped with phosphorous, making the size‐dependent quantum confinement less effective. Also, our investigation has shown that the high resistivity of this material has become the performance bottleneck of the solar cell. To resolve these matters, we propose a new design based on Si QDs embedded in a SiO₂/Si₃N₄ hybrid matrix. By replacing the SiO₂ tunnel barriers by the Si₃N₄ layers, the new material manages to constrain the growth of doped Si QDs effectively and enhances the apparent band gap, as shown in X‐ray diffraction, Raman, photoluminescence and optical spectroscopic measurements. Besides, electrical characterisation on Si QD/c‐Si heterointerface test structures indicates the new material possesses improved vertical carrier transport properties. Copyright © 2011 John Wiley & Sons, Ltd.     

Photoinduced and equilibrium optical absorption in Ge/Si quantum dots

The results of studies of the optical absorption spectra in Ge/Si quantum dot structures in the mid-infrared region are reported. Two types of structures different in terms of the method used for quantum dot formation and in terms of barrier layer thickness are explored. The photoinduced absorption associated with the nonequilibrium population of hole states and optical absorption in structures doped to different levels are investigated. Specific features that are associated with occupation of the ground and excited states of quantum dots and exhibit a polarization dependence are observed. From the experimental data, the energy spectrum of holes is determined for structures of both types.     

On the process of hole trapping in Ge/Si heterostructures with Ge quantum dots

Admittance spectroscopy is used to determine the cross sections and energy levels of holes in Ge/Si heterostructures with Ge quantum dots. The structures are grown by molecular-beam epitaxy. It is established that, in layers of quantum dots produced at low growth temperatures T _g ≤ 450°C, the capture cross section for hole trapping into quantum dots exponentially increases with increasing hole binding energy (the Meyer-Neldel rule), with the same characteristic energy ～25 eV independent of T _g . It is shown that the Meyer-Neldel rule is violated in structures grown at higher temperatures or in samples treated in hydrogen plasma. In the case of nanoclusters synthesized at low temperatures, the experimental results suggest that charge-carrier trapping into Ge quantum dots proceeds via the electron-phonon mechanism with the participation of structural defects.     

Electroluminescence from the Ge quantum dot MOS tunneling diodes

A Ge quantum dot (QD) light-emitting diode (LED) is demonstrated using a MOS tunneling structure for the first time. The oxide film was grown by liquid phase deposition at 50/spl deg/C to reduce the thermal budget. The infrared emission of /spl sim/1.5 /spl mu/m was observed from Ge QD MOS LEDs, similar to the p-type-intrinsic-n-type structure reported previously. At the negative gate bias, the electrons in the Al gate electrode tunnel to the Ge QD through the ultrathin oxide and recombine radiatively with holes to emit the /spl sim/1.5/spl mu/m infrared. The electrons also recombine with holes in the Si cap, and the band edge emission from Si is also observed.     

Damping of bloch oscillations in quantum dot superlattices: A general approach

A quantum kinetic equation describing damping of the Bloch oscillations in ideal quantum-dot (QD) superlattices of various dimensionalities (1D, 2D, 3D) has been derived using the density matrix formalism. The possibility of suppressing completely single-phonon scattering by optical phonons and considerably suppressing the acoustic-phonon scattering in the QD superlattice by effectively controlling the spectrum by varying the DC electric field magnitude and orientation is demonstrated. Conditions ensuring that the only photon-scattering mechanism responsible for damping of the Bloch oscillations is scattering by acoustic phonons within transverse minibands of the Stark carrier-state ladder are obtained.     

The study of relaxation in asymmetrically strained Si1−x Ge x Si superlattices

Asymmetrically strained Si/SiGe superlattices consisting of 12 nm Si/4 nm Si_0.65Ge_0.35 have been grown in Si(001) by molecular beam epitaxy (MBE) and studied as a function of thermal treatments. Results indicate that initially, the interdiffusion is very rapid and non-linear, and at later annealing stages a steady-state interdiffusion is attained. Raman spectroscopy has been used to determine the Ge content and the strain independently, and to show that in the very early annealing stages, strain relaxation occurs predominantly by interdiffusion. This is supported by transmission electron microscopy (TEM) which indicates that less than 10% of the initial strain relaxation is caused by dislocation formation. In addition, a low temperature relaxation has been observed which may be related to misoriented SiGe crystallites at the superlattice/substrate interface, and increased in size with annealing at 631‡ C.     

Lateral electronic transport in short-period InAs/GaAs superlattices at the threshold of quantum dot formation

Temperature dependences of resistance at 0.7 K<T<300 K, the Hall and Shubnikov-de Haas effects in magnetic fields of up to 40 T, photoluminescence (PL), and morphology of a heterointerface (using an atomicforce microscope) of short-period InAs/GaAs superlattices were investigated. The investigations were carried out for a region of subcritical and critical thickness Q=2.7 monolayers (ML) of InAs. Upon exceeding the critical thickness, the self-organized growth of InAs quantum dots (QDs) set in. The formation of QD layers upon exceeding the critical thickness of InAs Q=2.7 ML is accompanied by a transition of conductivity from metallic to hopping. It is found that at InAs layer thicknesses of Q=0.33 ML and Q=2.0 ML, the PL intensities and electron mobilities in the structures have clearly pronounced maxima. Anisotropy of conductivity, which depends on the thickness of the deposited InAs layers, was observed.     

Wetting layer formation in superlattices with Ge quantum dots on Si(1 0 0)

The influence of parameters of germanium deposition on wetting layer thickness was studied during the growth on the Si(1 0 0) surface. A non-monotone dependence of the thickness on growth temperature was discovered and accounted for by changing the mechanism of the layer-by-layer growth. The conclusion was supported by changing the mode of oscillations of the reflection high-energy electron diffraction (RHEED) specular beam. In addition, wetting layer thickness is strongly affected by the replication number and thickness of the silicon spacer due to accumulation of elastic strains throughout the structure.     

A high efficient 820 nm MOS Ge quantum dot photodetector

A Ge quantum dot photodetector has been demonstrated using a metal-oxide-semiconductor (MOS) tunneling structure. The oxide film was grown by liquid phase deposition (LPD) at 50/spl deg/C. The photodetector with five-period Ge quantum dot has responsivity of 130, 0.16, and 0.08 mA/W at wavelengths of 820 nm, 1300 nm, and 1550 nm, respectively. The device with 20-period Ge quantum dot shows responsivity of 600 mA/W at the wavelength of 850 nm. The room temperature dark current density is as low as 0.06 mA/cm/sup 2/. The high performance of the photodetectors at 820 nm makes it feasible to integrate electrooptical devices into Si chips for short-range optical communication.