一种基于共模稳定电路的单调开关切换的0.6V 10位 1MHz采样率的逐次逼近型模数转换器

本文叙述了一个在0.6V电源电压下用于无线传感网络中的10位逐次逼近型模数转换器（SAR ADC）的设计。这个SAR ADC中的数模转换器（DAC）采用单调开关切换的方式,目的是减小芯片面积和功耗。但是单调开关切换的方式存在共模电压改变引起的比较器失调电压动态变化的问题。由于电源电压仅有0.6V,传统的在动态比较器中使用恒定电流偏置技术的方法不再适用。在本文的设计中,我们提出了一个共模电压稳定电路（common mode stabilizer）可在低电源电压下稳定比较器的输入共模电压,这种方法的有效性得到了仿真和测试的验证。本文设计的SAR ADC采用0.13μm CMOS工艺,测试结果显示在0.6V电源电压和1MHz采样率下,功耗为6.3μW,在奈奎斯特输入频率下信号噪声失真比（SNDR）为51.25 dB,品质因数（FOM）为21 fJ/conversion-step,芯片的核心面积只有120 μm×300 μm。     

一种10位80 Ms/s逐次逼近A/D转换器

基于65 nm CMOS工艺,设计了一种10位80 Ms/s的逐次逼近A/D转换器。该A/D转换器采用1.2 V电源供电以及差分输入、拆分单调的DAC网络结构。采用拆分单调的电容阵列DAC,可以有效降低A/D转换所消耗的能量,缩短DAC的建立时间,降低控制逻辑的复杂度,提高转换速度;避免了由于比较器共模电平下降过多引起的比较器失调,从而降低了比较器的设计难度,改善了ADC的线性度。动态比较器降低了A/D转换的功耗。使用Spectre进行仿真验证,结果表明,当采样频率为80 MHz,输入信号频率为40 MHz时,该A/D转换器的SFDR为72 dBc。     

一种基于0.13m CMOS工艺的10位SAR A/D转换器

基于SMIC0.13μm CMOS1P6M Logic工艺,采用一种新型R-C组合式D/A转换结构、伪差分比较结构以及低功耗电平转换结构设计了一种用于多电源SoC的10位8通道逐次逼近型A/D转换器。在3.3V模拟电源电压和1.2V数字电源电压下,测得DNL和INL分别为0.31LSB和0.63LSB。当采样频率为1MS/s,输入信号频率为490kHz时,测得的SFDR为67.33dB,ENOB为9.48bits,功耗为3.25mW。该A/D转换器版图面积为318μm×270μm,能直接应用于嵌入式多电源SoC。     

一种电容阵列结构的10位8通道1MS/s逐次逼近AD转换器

设计了一种用于多电源SoC的10位8通道1MS/s逐次逼近结构AD转换器。为提高ADC精度,DAC采用改进的分段电容阵列结构。为降低功耗,比较器使用了反相器阈值电压量化器,在模拟输入信号的量化过程中减少静态功耗产生。电平转换器将低电压数字逻辑信号提升为高电平模拟信号。采用UMC 55nm 1P6M数字CMOS工艺上流片验证设计。测试结果表明,当采样频率为1 MS/s、输入信号频率为10 kHz正弦信号情况下,该ADC模块在3.3 V模拟电源电压和1.0 V数字电源电压下,具有最大微分非线性为0.5LSB,最大积分非线性为1LSB。测得的SFDR为75 dB,有效分辨率ENOB为9.27位。     

基于混合结构的一种高性能90nm CMOS逐次逼近A/D转换器

实现了一种10位2.5MS/s逐次逼近A/D转换器。在电路设计上采用了R-C混合结构D/A转换、伪差分比较结构以及低功耗电平转换方式实现。为了实现好的匹配性能,在版图布局上分别采用电阻梯伪电阻包围对策以及电容阵列共中心对称布局方式进行布局。整个A/D转换器基于90nm CMOS工艺实现,在3.3V模拟电源电压以及1.0V数字电源电压下,测得的DNL和INL分别为0.36LSB和0.69LSB。在采样频率为2.5MS/s,输入频率为1.2MHz时,测得的SFDR和ENOB分别为72.86dB和9.43bits。包括输出驱动在内,测得整个转换器的功耗为6.62mW。整个转换器的面积约为238um×214um。设计结果显示该转换器性能良好,非常适合多电源嵌入式SoC的应用。     

10 bit 80 Msample/s流水线ADC的电路级设计

实现了0.18μmCMOS模拟工艺、1.8V电源电压下10位分辨率、80MHz采样率的流水线ADC的电路级设计,采用栅压自举的采样开关和增益提升运放保证ADC的精度;采用复位结构的SHC和MDAC消除运放失调电压的影响;采用动态比较器并优化每级电容以降低功耗.当输入信号幅度为1Vpp时,ADC在整个量化范围内无失码,当输入信号频率为39MHz时,可获得71.6dB的无失真动态范围和60.56dB的信噪失真比.     

一种10bit 200MS/s电流型DAC设计

基于SMIC 0.18μm CMOS工艺,采用了具有电荷抽放技术的电流源结构,以及新型锁存电路产生同步控制信号.设计了一个10位精度的数模转换器(DAC),电源电压为1.8 V,在50负载条件下,DAC满量程输出电流为4mA.当采样频率为200 MHz,输入频率为5 MHz的情况下.满量程功耗为15 mw.微分非线性误差(DNL)为0.25 LSB,积分非线性误差(INL)为0.15 LSB,无杂散动态范围达到79.7 dB.     

一种用于SAR ADC开关电容比较器的失调消除技术

论文阐述了一种用于逐次逼近ADC开关电容比较器的失调消除技术。采用预放大加再生锁存的比较结构,基于0.18μm 1P5M CMOS工艺设计实现了一种伪差分比较器。通过采用前级预放大器输入失调消除技术以及低失调再生锁存技术进行设计,整个比较器的输入失调电压小于0.55mV。通过采用预放大加再生锁存的比较模式,整个比较器的功耗有效减小,不足0.09mW。在电源电压为1.8V、ADC采样速率为200kS/s、时钟频率为3MHz的情况下,比较器能达到13位的转换精度。最后,通过设计讨论、后仿真分析及其在一种10位200kS/s的触摸屏SAR ADC中的成功应用验证了本文比较器的实用性和优越性。     

一种应用于10位逐次逼近ADC的比较器设计

文中提出了一种应用于10位逐次逼近ADC的比较器。该比较器包括预放大器、中间放大器、输出驱动级及共模电平缓冲器。整体开环设计,采用多级级联的形式以满足增益和速度的要求;采用输出失调消除技术进行失调校正;为了提高共模电平的驱动能力和缩短建立时间,采用分压电路加单位增益放大器的结构。基于3.3V电源电压、TSMC0.18μmCMOS工艺下,仿真结果表明,完全满足最高采样频率30MHz、10位精度的模数转换器要求。     

一种嵌入式10位2MS/s逐次逼近模数转换器

设计了一种10位2 MS/s嵌入式逐次逼近结构ADC。为提高ADC精度,其中DAC采用电压和电荷按比例缩放混合结构,比较器使用了输入失调校准和输出失调校准技术。采用TSMC0.18μm1P6M数字CMOS工艺进行流片验证,整个ADC核面积仅为0.9×0.6 mm2。测试结果表明,在2 MHz采样率、输入信号为180 kHz正弦信号情况下,该ADC模块具有8.51位的有效分辨率,最大微分非线性为-0.8~+0.7LSB,最大积分非线性为-1.7~+1.5 LSB,而整个模块的功耗仅为1.2 mW。     

A 10-bit 1.8 V 45 mW 100 MHz CMOS transmitter chip for use in an XDSL modem in a home network

This paper describes a 10-bit 1.8 V 45 mW 100 MHz transmitter chip (TX chip) that is fabricated using 0.18 μm 1P6 M CMOS technology for use in an xDSL modem in a home network. The chip is composed of a 10-bit segmented digital-to-analog converter (DAC) and a fully differential adaptive line driver (LD). In designing the DAC, the switched-current method is used to increase the conversion speed; the anti-process-variation current cell with threshold-voltage compensation is used to reduce the linearity error, and the current cell, with differential input and gain boosting, is used to minimize the feedthrough error and tapered error distribution. The circuit layout of the current source has four-phase symmetry, not only to increase the linearity but also to eliminate the gradient error. To design a fully differential adaptive LD, the feed-forward capacitor and quiescent current control circuit are used to reduce the zero-crossing distortion and to minimize the second-order harmonic. Additionally, the power efficiency is increased using an output-impedance matching circuit. Measurements reveal that, for a TX chip at a differential load of 100 Ω and a supplied voltage of 1.8 V, the efficient number of bits, operating frequency, output voltage, output current, power consumption, differential nonlinearity error and integral nonlinearity error are 9 bits, 100 MHz, ± 0.874 V, ± 10 mA, 45.8 mW, ?0.80 to +0.62 LSB, and ?0.92 to +0.82 LSB, respectively.     

基于QN旋转布局的10位500 MS/s分段电流舵DAC

针对分段电流舵数/模转换器（Digital-to-Analog Converter，DAC），通过理论分析和推导，研究电流源阵列系统失配误差和寄生效应对非线性的影响，采用电流源阵列Q^N旋转游走版图布局方案，能够减小电流源系统失配的一次误差，而且版图布线简单，由寄生效应引起的电流源失配较小，利于DAC非线性的优化.基于0.18μm CMOS，采用"6+4"的分段结构，设计了一种10位500MS/s分段电流舵DAC，流片测试结果表明，在输入频率为1.465MHz，采样速率为500MS/s的条件下，无杂散动态范围（Spurious Free Dynamic Range，SFDR）为64.9dB，有效位数（Effective Number of Bits，ENOB）为8.8 bit，微分非线性误差（Differential Non-linearity，DNL）和积分非线性误差（Integral Non-linearity，INL）分别为0.77LSB和1.12LSB.     

A 10-b 75-MSPS subranging A/D converter with integrated sample andhold

The design of a fully differential two-step analog-to-digital converter (ADC) is presented. A sample-and-hold (S/H) circuit based on a unity-gain feedback amplifier, flash ADCs driven by differential resistor ladders, and a differential digital-to-analog converter (DAC) combined with the subtractor are described. The chip has been fabricated in a standard high-speed bipolar process and, by extensively utilizing compensation techniques, achieves ±1 LSB integral nonlinearity and low harmonic distortion. A 75 Msample/s conversion rate not yet exceeded even by full-flash 10-b ADCs, has been achieved with a power consumption of 2 W. Due to the S/H circuit, the input bandwidth of 250 MHz; the effective resolution of 9 b at 5 MHz exhibits a gradual decrease over input frequency but still remains above 8 b up to 50 MHz     

A current-steering self-calibration 14-bit 100-MSPs DAC

This paper presents the design and implementation of a 14-bit,100 MS/s CMOS digital-to-analog converter(DAC).Analog background self-calibration based on the concept of analog current trimming is introduced.A constant clock load switch driver,a calibration period randomization circuit and a return-to-zero output stage have been adopted to improve the dynamic performance.The chip has been manufactured in a SMIC 0.13-μm process and occupies 1.33× 0.97 mm2 of the core area.The current consumption is 50 mA under 1.2/3.3 V dual power supplies for digital and analog,respectively.The measured differential and integral nonlinearity is 3.1 LSB and 4.3 LSB,respectively.The SFDR is 72.8 dB at a 1 MHz signal and a 100 MHz sampling frequency.     

A 10-b, 500-MSample/s CMOS DAC in 0.6 mm2

A 10-b current steering CMOS digital-to-analog converter (DAC) is described, with optimized performance for frequency domain applications. For sampling frequencies up to 200 MSample/s, the spurious free dynamic range (SFDR) is better than 60 dB for signals from DC to Nyquist. For sampling frequencies up to 400 MSample/s, the SFDR is better than 55 dB for signals from DC to Nyquist. The measured differential nonlinearity and integral nonlinearity are 0.1 least significant bit (LSB) and 0.2 LSB, respectively. The circuit is fabricated in a 0.35-μm, single-poly, four-metal, 3.3 V, standard digital CMOS process and occupies 0.6 mm². When operating at 500 MSample/s, it dissipates 125 mW from a 3.3 V power supply. This DAC is optimized for embedded applications with large amounts of digital circuitry     

A high performance 90 nm CMOS SAR ADC with hybrid architecture

A 10-bit 2.5 MS/s SAR A/D converter is presented. In the circuit design, an R-C hybrid architecture D/A converter, pseudo-differential comparison architecture and low power voltage level shifters are utilized. Design chal-lenges and considerations are also discussed. In the layout design, each unit resistor is sided by dummies for good matching performance, and the capacitors are routed with a common-central symmetry method to reduce the nonlin-earity error. This proposed converter is implemented based on 90 nm CMOS logic process. With a 3.3 V analog supply and a 1.0 V digital supply, the differential and integral nonlinearity are measured to be less than 0.36 LSB and 0.69 LSB respectively. With an input frequency of 1.2 MHz at 2.5 MS/s sampling rate, the SFDR and ENOB are measured to be 72.86 dB and 9.43 bits respectively, and the power dissipation is measured to be 6.62 mW including the output drivers. This SAR A/D converter occupies an area of 238×214 μm~2. The design results of this converter show that it is suitable for multi-supply embedded SoC applications.     

An I/Q channel 12-bit 120?MS/s CMOS DAC with deglitch circuits

This paper describes an I/Q channel 12bit 120?MS/s DAC with deglitch circuits. The proposed DAC implemented in a 0.35???m CMOS n-well process employs three stage 4 bit thermometer decoders and deglitch circuits to minimize glitch energy and linearity error. The measurement results show a ±1.5?LSB/±1.3?LSB of INL/DNL and 31 pV·s of glitch energy. ENOB and SFDR are measured to be 10.5 bit and 71.09?dB at sampling frequency of 120?MHz and input frequency of 1?MHz with a total power consumption of 105?mW. Linearity error between I-channel DAC and Q-channel DAC is measured to be approximately 1.5?mV, i.e. the accuracy of 13 bit.     

一种低功耗嵌入式14位400MHz数模转换器

设计了一个14位刷新频率达400MHz,用于高速频率合成器的低功耗嵌入式数模转换器。该数模转换器采用5+4+5分段式编码结构,其电流源控制开关输出驱动级采用归零编码以提高DAC动态特性。该数模转换器核采用0.18μm1P6M混合信号CMOS工艺实现,整个模块面积仅为1.1mm×0.87mm。测试结果表明,该DAC模块的微分非线性误差是-0.9～+0.5LSB,积分非线性误差是-1.4～+1.3LSB,在400MHz工作频率下,输出信号频率为80MHz时的无杂散动态范围为76.47dB,并且功耗仅为107.2mW。     

A systematic design approach for low-power 10-bit 100 MS/s pipelined ADC

A systematic design approach for low-power 10-bit, 100 MS/s pipelined analog-to-digital converter (ADC) is presented. At architectural level various per-stage-resolution are analyzed and most suitable architecture is selected for designing 10-bit, 100 MS/s pipeline ADC. At Circuit level a modified wide-bandwidth and high-gain two-stage operational transconductance amplifier (OTA) proposed in this work is used in track-and-hold amplifier (THA) and multiplying digital-to-analog converter (MDAC) sections, to reduce power consumption and thermal noise contribution by the ADC. The signal swing of the analog functional blocks (THA and MDAC sections) is allowed to exceed the supply voltage (1.8 V), which further increases the dynamic range of the circuit. Charge-sharing comparator is proposed in this work, which reduces the dynamic power dissipation and kickback noise of the comparator circuit. The bootstrap technique and bottom plate sampling technique is employed in THA and MDAC sections to reduce the nonlinearity error associated with the input signal resulting in a signal-to-noise-distortion ratio of 58.72/57.57 dB at 2 MHz/Nyquist frequency, respectively. The maximum differential nonlinearity (DNL) is +0.6167/−0.3151 LSB and the maximum integral nonlinearity (INL) is +0.4271/−0.4712 LSB. The dynamic range of the ADC is 58.72 dB for full-scale input signal at 2 MHz input frequency. The ADC consumes 52.6 mW at 100 MS/s sampling rate. The circuit is implemented using UMC-180 nm digital CMOS technology.     

10比特200Msps电流舵DAC的设计

实现了一款10比特200Msps采样速度的数模转换器。该数模转换器采用了8+2的分段结构,高8位比特使用温度码设计。文中详细分析了CMOS工艺下匹配问题,采取一定措施提高匹配性。该数模转换器采用3.3V供电电压,摆幅为2Vpp,提高了系统的抗干扰能力。在200Msps采样率下,后仿真结果可达到INL小于0.34LSB,DNL小于0.05LSB,有效比特数为9.9,SNDR达到61.7dB,SFDR为75.3dB。该DAC采用SMIC180nm CMOS工艺设计,整体面积为800*800μm2。