Effect of processing on the properties of Bi3.15Nd0.85Ti3O12 thin films

Various crystallization parameters were studied during the fabrication of Bi_3.15Nd_0.85Ti₃O₁₂ (BNdT) thin films on Pt/Ti/SiO₂/Si (100) by metal organic solution decomposition method. The effect of crystallization processes, crystallization ambients on the properties of BNdT thin films such as orientation, ferroelectric properties were examined. By adopting different fabrication processes, it is possible to get both highly c-axis oriented as well as randomly oriented thin films. Highly c-axis oriented BNdT thin film showed a large remnant polarization (2P_r) of 70 μC/cm² at an applied voltage of 10 V and exhibited a fatigue free behavior unto 2 × 10⁹ switching cycles. The improved ferroelectric properties of BNdT thin films suggest their suitability for high density ferroelectric random access memory applications.     

Better,Faster, and Less Biased Machine Learning: Electromechanical Switching in Ferroelectric Thin Films

Machine-learning techniques are more and more often applied to the analysis of complex behaviors in materials research. Frequently used to identify fundamental behaviors within large and multidimensional datasets, these techniques are strictly based on mathematical models. Thus, without inherent physical or chemical meaning or constraints, they are prone to biased interpretation. The interpretability of machine-learning results in materials science, specifically materials’ functionalities, can be vastly improved through physical insights and careful data handling. The use of techniques such as dimensional stacking can provide the much needed physical and chemical constraints, while proper understanding of the assumptions imposed by model parameters can help avoid overinterpretation. These concepts are illustrated by application to recently reported ferroelectric switching experiments in PbZr_0.2Ti_0.8O₃ thin films. Through systematic analysis and introduction of physical constraints, it is argued that the behaviors present are not necessarily due to exotic mechanisms previously suggested, but rather well described by classical ferroelectric switching superimposed by non-ferroelectric phenomena, such as electrochemical deformation, electrostatic interactions, and/or charge injection.     

Strain engineering of piezoelectric properties of strontium titanate thin films

The in-plane and out-of-plane piezoelectric properties of (001) strontium titanate (SrTiO₃, STO) epitaxial thin films on pseudo-cubic (001) substrates are computed as a function of in-plane misfit strain. A nonlinear thermodynamic model is employed, which takes into account the appropriate mechanical boundary conditions, the electromechanical coupling between the polarization and the in-plane lattice mismatch, and the self-strains of the ferroelastic and ferroelectric phase transformations. The piezoelectric behavior of epitaxial STO films is described in various strain-induced ferroelectric phase fields in a temperature range from ?50 to 50 °C. The calculations show that by carefully tailoring in-plane misfit strains in both tensile and compressive ranges, piezoelectric coefficients that are of the order of prototypical lead zirconate titanate and other lead-based piezoceramics can be realized. These results indicate that strain engineered STO films may be employed in a variety of sensor and actuator applications as well as surface acoustic wave devices and thin-film bulk acoustic resonators.     

Characterization of Bi and Fe co-doped PZT capacitors for FeRAM

Abstract

Ferroelectric random access memory (FeRAM) has been in mass production for over 15 years. Higher polarization ferroelectric materials are needed for future devices which can operate above about 100 °C. With this goal in mind, co-doping of thin Pb(Zr₄₀,Ti₆₀)O₃ (PZT) films with 1 at.% Bi and 1 at.% Fe was examined in order to enhance the ferroelectric properties as well as characterize the doped material. The XRD patterns of PZT-5% BiFeO₃ (BF) and PZT 140-nm thick films showed (111) orientation on (111) platinized Si wafers and a 30 °C increase in the tetragonal to cubic phase transition temperature, often called the Curie temperature, from 350 to 380 °C with co-doping, indicating that Bi and Fe are substituting into the PZT lattice. Raman spectra revealed decreased band intensity with Bi and Fe co-doping of PZT compared to PZT. Polarization hysteresis loops show similar values of remanent polarization, but square-shaped voltage pulse-measured net polarization values of PZT-BF were higher and showed higher endurance to repeated cycling up to 10¹⁰ cycles. It is proposed that Bi and Fe are both in the +3 oxidation state and substituting into the perovskite A and B sites, respectively. Substitution of Bi and Fe into the PZT lattice likely creates defect dipoles, which increase the net polarization when measured by the short voltage pulse positive-up-negative-down (PUND) method.     

Characterization of Bi and Fe co-doped PZT capacitors for FeRAM

Ferroelectric random access memory (FeRAM) has been in mass production for over 15 years. Higher polarization ferroelectric materials are needed for future devices which can operate above about 100 °C. With this goal in mind, co-doping of thin Pb(Zr₄₀,Ti₆₀)O₃ (PZT) films with 1 at.% Bi and 1 at.% Fe was examined in order to enhance the ferroelectric properties as well as characterize the doped material. The XRD patterns of PZT-5% BiFeO₃ (BF) and PZT 140-nm thick films showed (111) orientation on (111) platinized Si wafers and a 30 °C increase in the tetragonal to cubic phase transition temperature, often called the Curie temperature, from 350 to 380 °C with co-doping, indicating that Bi and Fe are substituting into the PZT lattice. Raman spectra revealed decreased band intensity with Bi and Fe co-doping of PZT compared to PZT. Polarization hysteresis loops show similar values of remanent polarization, but square-shaped voltage pulse-measured net polarization values of PZT-BF were higher and showed higher endurance to repeated cycling up to 10¹⁰ cycles. It is proposed that Bi and Fe are both in the +3 oxidation state and substituting into the perovskite A and B sites, respectively. Substitution of Bi and Fe into the PZT lattice likely creates defect dipoles, which increase the net polarization when measured by the short voltage pulse positive-up-negative-down (PUND) method.     

Properties of multilayer composite thin films based on morphotropic phase boundary Pb(Mg1/3Nb2/3)O3-PbTiO3

It has been reported that ferroelectric and piezoelectric properties of Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ (PMNT) thin films, with compositions close to the morphotropic phase boundary (MPB), show lower values than those reported for bulk ceramics with the same composition, which has been attributed to a reduction of the remnant polarization caused by the small size of the grains in the films. An alternative has been proposed to take full advantage of the excellent piezoelectric properties of polycrystalline PMNT in thin film form: a multilayer configuration that uses ferroelectric layers with large remnant polarization, in this case PbTiO₃, to generate an internal electric bias within the PMNT layers and, thus, anchor an induced polarization on them, resulting in a consequent large piezoelectric behavior. The detailed study of the properties of these multilayer composite films reveals the complex correlations that arise in these heterostructures, which are key for the design of optimized piezoelectric films based on MPB PMNT.     

Characterization of ferroelectric/metal interface under the repeated polarization switching

Polarization fatigue mechanism in organic ferroelectrics, structures at interface between ferroelectric vinylidene fluoride oligomer and Al electrode under the repeated polarization switching process were investigated by high-resolution X-ray diffraction (XRD) and Fourier transform infrared spectroscopy (FT-IR). Al₂O₃ layer at interface was formed with increasing the number of polarization reversal. The formation of oxide layer will be strongly related to polarization reversal, thus the repeated charge and discharge process by polarization reversal may promote the oxidation of Al electrode. Furthermore, the structural and orientation changes in ferroelectric molecular films by applying the electric field were observed. The formation of Al₂O₃ layer, as well as the structural changes in thin films, is affected to polarization fatigue process of ferroelectric organic devices.     

Ferroelastic interactions in bilayered ferroelectric thin films

We present a theoretical investigation of the elastic interactions in a heteroepitaxial bilayer consisting of a (001) tetragonal PbZr _x Ti_1−x O₃ and (001) rhombohedral PbZr_1−x Ti _x O₃ on a thick (001) passive substrate. Analytical expressions for the elastic interaction energies between the layers and the resultant ferroelastic twin formation have been derived as a function of the lattice misfit strain (between layers and the substrate), composition of the ferroelectric and thickness. It is found that the elastic coupling between the tetragonal and rhombohedral layers leads to the equilibrium domain fraction in the tetragonal layer several time larger than that in single-layer films of similar thickness. Most critically, the model finds a significant change in the ferroelastic domain volume fraction in the presence of an applied electric field and hence enhanced piezoelectric properties compared to single-layered epitaxial PZT thin films.     

Elastic-strain tensor and inhomogeneous strain in thin films by X-ray diffraction

Elastic residual and inhomogeneous defect-related strains are very important parameters when considering thin-film and microelectronics device properties and operation. In regard to the residual strain/stress modeling, we describe a novel approach to model diffraction line shifts caused by elastic residual or applied stresses in textured polycrystals. The model yields the complete texture-weighted strain and stress tensors as a function of crystallite orientations, the so-called weighted strain orientation distribution function. In the second part, we present an extension to the phenomenological thermodynamic theory for ferroelectrics. It includes the contribution of both residual-elastic lattice-misfit strain and inhomogeneous strain caused by lattice defects. The model yields correction terms for dielectric and ferroelectric quantities in terms of both elastic misfit strain and defect-related strain that was successfully applied to the pristine, W and Mn 1% doped Ba_0.6Sr_0.4TiO₃ epitaxial thin films grown on the LaAlO₃ substrate.     

Hydrothermal temperature effect on magnetoelectric coupling of Ni/Pb(Zr0.52Ti0.48)O3 bilayers

Magnetoelectric (ME) Ni/Pb(Zr_0.52Ti_0.48)O₃ bilayers have been prepared by hydrothermal method. The structure and ferroelectric properties of the Pb(Zr_0.52Ti_0.48)O₃ (PZT) thin films prepared at various hydrothermal temperatures are characterized by X-ray diffraction and ferroelectric testing. With the hydrothermal temperature increasing the grain size of the PZT thin films gradually decreases leading to a gradual increase of the coercive field and a decrease of the remnant polarization of the Ni/PZT bilayers. The ME voltage coefficient of the Ni/PZT bilayers gradually decreases as hydrothermal temperature increases. The large ME coefficient makes these Ni/PZT bilayers possible for applications in multifunctional devices such as electromagnetic sensor, transducers and microwave devices.     

Effect of compositional variations on electrical properties in phase switching (Pb,La)(Zr,Ti,Sn)O3 thin and thick films

The composition-dependent electrical properties in (Pb,La)(Zr,Ti,Sn)O₃ antiferroelectric-ferroelectric phase switching thin and thick films have been systematically studied and compared with bulk ceramics. The films were deposited on Pt-buffered silicon substrates by a sol-gel method. The results show that the dependence of low-field dielectric properties on compositions in the films is similar to that in bulk ceramics but the variation of high field properties (polarization or hysteresis loops) is quite different, which may be attributed to the special mechanical boundary condition of the films. While all the films with compositions in the antiferroelectric tetragonal region in the phase diagram demonstrate the existence of remanent polarization in the hysteresis loops, the films with zero remanent polarization can be obtained in the antiferroelectric orthorhombic region. This is because the films are under high tensile stress due to the thermal mismatch between the film and substrate, which tends to stabilize the ferroelectric phase and causes the retention of ferroelectric phase for the films in the antiferroelectric tetragonal region because of their relatively small free energy difference between the antiferroelectric phase and ferroelectric phase.     

Effect of Zn doping on structure and ferroelectric properties of PST thin films prepared by sol–gel method

(Pb _y Sr_1−y )Zn _x Ti_1−x O_3−x thin films were prepared on ITO/glass substrate by sol–gel process using dip-coating method. The phase structure, morphology and ferroelectric property of the thin film were studied. All the thin films show the typical perovskite phase structure. Both the crystallinity and c/a ratio of the perovskite phase increases initially and then decreases gradually with doping Zn in the thin film. Ferroelectric properties of the Zn-doped PST thin films, including ferroelectric hysteresis-loop, remnant polarization and coercive force, decrease gradually with increasing Zn. And the effect of Zn on ferroelectric properties is more obvious in PST thin film with high content of Pb than that with low Pb although the high lead thin film exhibits high intrinsic ferroelectric properties.     

Nanoscale Bubble Domains and Topological Transitions in Ultrathin Ferroelectric Films

Observation of a new type of nanoscale ferroelectric domains, termed as “bubble domains”—laterally confined spheroids of sub‐10 nm size with local dipoles self‐aligned in a direction opposite to the macroscopic polarization of a surrounding ferroelectric matrix—is reported. The bubble domains appear in ultrathin epitaxial PbZr_0.2Ti_0.8O₃/SrTiO₃/PbZr_0.2Ti_0.8O₃ ferroelectric sandwich structures due to the interplay between charge and lattice degrees of freedom. The existence of the bubble domains is revealed by high‐resolution piezoresponse force microscopy (PFM), and is corroborated by aberration‐corrected atomic‐resolution scanning transmission electron microscopy mapping of the polarization displacements. An incommensurate phase and symmetry breaking is found within these domains resulting in local polarization rotation and hence impart a mixed Néel–Bloch‐like character to the bubble domain walls. PFM hysteresis loops for the bubble domains reveal that they undergo an irreversible phase transition to cylindrical domains under the electric field, accompanied by a transient rise in the electromechanical response. The observations are in agreement with ab‐initio‐based calculations, which reveal a very narrow window of electrical and elastic parameters that allow the existence of bubble domains. The findings highlight the richness of polar topologies possible in ultrathin ferroelectric structures and bring forward the prospect of emergent functionalities due to topological transitions.     

Microstructure and electrical properties of perovskite (Pb, La)TiO3 thin film deposited at low temperature by the polymeric precursor method

High-quality (Pb, La)TiO₃ ferroelectric thin films were successfully prepared on a Pt(111)/Ti/SiO₂/Si(100) substrate for the first time by spin coating, using the polymeric precursor method. The X-ray diffraction patterns show that the films are polycrystalline in nature. This method allows for low temperature (500° C) synthesis, a high quality microstructure and superior dielectric properties. The effects on the microstructure and electrical properties were studied by changing the La content. The films annealed at 500°C have a single perovskite phase with only a tetragonal or pseudocubic structure. As the La content is increased, the dielectric constant of PLT thin films increases from 570 up to 1138 at room temperature. The C-V and P-E characteristics of perovskite thin films prepared at a low temperature show normal ferroelectric behavior, representing the ferroelectric switching property. The remanent polarization and coercive field of the films deposited decreased due to the transformation from the ferroelectric to the paraelectric phase with an increased La content.     

Metal Oxide Nanocomposites: A Perspective from Strain,Defect, and Interface

Vertically aligned nanocomposite thin films with ordered two phases, grown epitaxially on substrates, have attracted tremendous interest in the past decade. These unique nanostructured composite thin films with large vertical interfacial area, controllable vertical lattice strain, and defects provide an intriguing playground, allowing for the manipulation of a variety of functional properties of the materials via the interplay among strain, defect, and interface. This field has evolved from basic growth and characterization to functionality tuning as well as potential applications in energy conversion and information technology. Here, the remarkable progress achieved in vertically aligned nanocomposite thin films from a perspective of tuning functionalities through control of strain, defect, and interface is summarized.     

Comparative investigating the properties of Pb-based multilayer ferroelectric thin films for FeRAM

The PbZr_0.3Ti_0.7O₃(PZT) thin film and multilayer PbZr_0.3Ti_0.7O₃/PbTiO₃(PZT/PT), PbTiO₃/PbZr_0.3Ti_0.7O₃/ PbTiO₃(PT/PZT/PT) thin films were prepared by a Sol-Gel method on the Pt(111)/Ti/SiO₂/Si(100) substrate for FeRAM application. The microstructure, ferroelectric, fatigue, dielectric, and leakage current properties of these thin films were investigated. The results indicate that the multilayer PT/PZT/PT thin film have a better ferroelectric, fatigue, dielectric and leakage current density properties. Its remanent polarization P_r reaches a maximum value of 21.2 μC/cm² and the coercive field E_c gets to a minimum value of 64.2kV/cm. After 10¹⁰ cycles, it still has more than 80% remnant polarization. The PT/PZT/PT thin film exhibits lower dielectric constant and lower dielectric loss, which is beneficial for FeRAM application. It also has the lowest leakage current density. The leakage current mechanism of the PZT, PZT/PT and PT/PZT/PT thin films is correlated to the microstructure and can be modeled in terms of GBLC and SCLC theory. The microstructure and electric properties of these films are correlated. The double-sided PT seed layers enhance not only the microstructure but also the electric properties. It is evident that the PT/PZT/PT multilayer thin film is a promising candidate for FeRAM application.     

Ferroelectric properties of pulsed laser deposited PZT (92/8) thin films

The effect of pulse amplitude on the ferroelectric and switching properties of pulsed laser deposited PZT (92/8) thin films has been studied. The structural analysis revealed that the films had a well crystallized perovskite phase without secondary phases. The atomic force microscopy has been employed to estimate the grain size and surface roughness of the film. A well-saturated P–E hysteresis loop was observed with average values of remnant polarization (P_r) ≈ 16.0 μC/cm², saturation polarization (P_s) ≈ 21.7 μC/cm² and coercive field ≈138 kV/cm. The P–E loops were very stable with frequency, confirming that the contribution of the leakage current and/or mobile free charges to the polarization is minimum. The polarization current exhibits the exponential dependence on the pulse amplitude and the leakage current seems to be governed by the hopping mechanism which is generally associated to structural defects.     

Exploring Anomalous Polarization Dynamics in Organometallic Halide Perovskites

Organometallic halide perovskites (OMHPs) have attracted broad attention as prospective materials for optoelectronic applications. Among the many anomalous properties of these materials, of special interest are the ferroelectric properties including both classical and relaxor‐like components, as a potential origin of slow dynamics, field enhancement, and anomalous mobilities. Here, ferroelectric properties of the three representative OMHPs are explored, including FAPb_xSn_1–xI₃ (x = 0, x = 0.85) and FA_0.85MA_0.15PbI₃ using band excitation piezoresponse force microscopy and contact mode Kelvin probe force microscopy, providing insight into long‐ and short‐range dipole and charge dynamics in these materials and probing ferroelectric density of states. Furthermore, second‐harmonic generation in thin films of OMHPs is observed, providing a direct information on the noncentrosymmetric polarization in such materials. Overall, the data provide strong evidence for the presence of ferroelectric domains in these systems; however, the domain dynamics is suppressed by fast ion dynamics. These materials hence present the limit of ferroelectric materials with spontaneous polarization dynamically screened by ionic and electronic carriers.     

Light‐Induced Reversible Control of Ferroelectric Polarization in BiFeO3

Manipulation of ferroic order parameters, namely (anti‐)ferromagnetic, ferroelectric, and ferroelastic, by light at room temperature is a fascinating topic in modern solid‐state physics due to potential cross‐fertilization in research fields that are largely decoupled. Here, full optical control, that is, reversible switching, of the ferroelectric/ferroelastic domains in BiFeO₃ thin films at room temperature by the mediation of the tip‐enhanced photovoltaic effect is demonstrated. The enhanced short‐circuit photocurrent density at the tip contact area generates a local electric field well exceeding the coercive field, enabling ferroelectric polarization switching. Interestingly, by tailoring the photocurrent direction, via either tuning the illumination geometry or simply rotating the light polarization, full control of the ferroelectric polarization is achieved. The finding offers a new insight into the interactions between light and ferroic orders, enabling fully optical control of all the ferroic orders at room temperature and providing guidance to design novel optoferroic devices for data storage and sensing.     

Enhanced ferroelectric properties of Pb(Zr0.80Ti0.20)O3/PbO thin films prepared by radio frequency magnetron sputtering

The Pb(Zr_0.80Ti_0.20)O₃ (PZT) thin films with and without a PbO buffer layer were deposited on the Pt(1 1 1)/Ti/SiO₂/Si(1 0 0) substrates by radio frequency (rf) magnetron sputtering method. The PbO buffer layer improves the microstructure and electrical properties of the PZT thin films. High phase purity and good microstructure of the PZT thin films with a PbO buffer layer were obtained. The effect of the PbO buffer layer on the ferroelectric properties of the PZT thin films was also investigated. The PZT thin films with a PbO buffer layer possess better ferroelectric properties with higher remnant polarization (P_r = 25.6 μC/cm²), and lower coercive field (E_c = 60.5 kV/cm) than that of the films without a PbO buffer layer (P_r = 9.4 μC/cm², E_c = 101.3 kV/cm). Enhanced ferroelectric properties of the PZT thin films with a PbO buffer layer is attributed to high phase purity and good microstructure.