Low-power W-band CPWG InAs/AlSb HEMT low-noise amplifier

We present the development of a low-power W-band low-noise amplifier (LNA) designed in a 200-nm InAs/AlSb high electron mobility transistor (HEMT) technology fabricated on a 50-/spl mu/m GaAs substrate. A single-stage coplanar waveguide with ground (CPWG) LNA is described. The LNA exhibits a noise figure of 2.5 dB and an associated gain of 5.6 dB at 90 GHz while consuming 2.0 mW of total dc power. This is, to the best of our knowledge, the lowest reported noise figure for an InAs/AlSb HEMT LNA at 90 GHz. Biased for maximum gain, the single-stage amplifier presents 6.7-dB gain and an output 1-dB gain compression point (P1dB) of -6.7dBm at 90 GHz. The amplifier provides broad-band gain, greater than 5dB over the entire W-band.     

An ultra-low power InAs/AlSb HEMT Ka-band low-noise amplifier

The first antimonide-based compound semiconductor (ABCS) MMIC, a Ka-Band low-noise amplifier using 0.25-/spl mu/m gate length InAs/AlSb metamorphic HEMTs, has been fabricated and characterized on a 75 /spl mu/m GaAs substrate. The compact 1.1 mm/sup 2/ three-stage Ka-band LNA demonstrated an average of 2.1 dB noise-figure between 34-36 GHz with an associated gain of 22 dB. The measured dc power dissipation of the ABCS LNA was an ultra-low 1.5 mW per stage, or 4.5 mW total. This is less than one-tenth the dc power dissipation of a typical equivalent InGaAs/AlGaAs/GaAs HEMT LNA. Operation with degraded gain and noise figure at 1.1 mW total dc power dissipation is also verified. These results demonstrate the outstanding potential of ABCS HEMT technology for mobile and space-based millimeter-wave applications.     

High-performance in W-band monolithic pseudomorphic InGaAsHEMT LNA's and design/analysis methodology

High-performance W-band monolithic one- and two-stage low noise amplifiers (LNAs) based on pseudomorphic InGaAs-GaAs HEMT devices have been developed. The one-stage amplifier has a measured noise figure of 5.1 dB with an associated gain of 7 dB from 92 to 95 GHz, and the two-stage amplifier has a measured small signal gain of 13.3 dB at 94 GHz and 17 dB at 89 GHz with a noise figure of 5.5 dB from 91 to 95 GHz. An eight-stage LNA built by cascading four of these monolithic two-stage LNA chips demonstrates 49 dB gain and 6.5 dB noise figure at 94 GHz. A rigorous analysis procedure was incorporated in the design, including accurate active device modeling and full-wave EM analysis of passive structures. The first pass success of these LNA chip designs indicates the importance of a rigorous design/analysis methodology in millimeter-wave monolithic IC development     

Millimeter-wave low-noise and high-power metamorphic HEMTamplifiers and devices on GaAs substrates

This paper reports on state of-the-art HEMT devices and circuit results utilizing 32% and 60% indium content InGaAs channel metamorphic technology on GaAs substrates. The 60% In metamorphic HEMT (MHEMT) has achieved an excellent 0.61-dB minimum noise figure with 11.8 dB of associated gain at 26 GHz. Using this MHEMT technology, two and three-stage Ka-band low-noise amplifiers (LNAs) have demonstrated <1.4-dB noise figure with 16 dB of gain and <1.7 with 26 dB of gain, respectively. The 32% In MHEMT device has overcome the <3.5-V drain bias limitation of other MHEMT power devices, showing a power density of 650 mW/mm at 35 GHz, with V_ds=6 V     

InAlAs/InGaAs/InP基PHEMTs小信号建模及低噪声应用

利用改进的小信号模型对采用100nmInAlAs/InGaAs/InP工艺设计实现的PHEMTs器件进行建模, 并设计实现了一款W波段单片低噪声放大器进行信号模型的验证。为了进一步改善信号模型低频S参数拟合差的精度, 该小信号模型考虑了栅源和栅漏二极管微分电阻, 在等效电路拓扑中分别用Rfs和Rfd表示.为了验证模型的可行性, 基于该信号模型研制了W波段低噪声放大器单片.在片测试结果表明:最大小信号增益为14.4dB@92.5GHz, 3dB带宽为25GHz@85-110GHz.而且, 该放大器也表现出了良好的噪声特性, 在88GHz处噪声系数为4.1dB, 相关增益为13.8dB.与同频段其他芯片相比, 该放大器单片具有宽3dB带宽和高的单级增益.     

110-120-GHz monolithic low-noise amplifiers

The authors discuss the development of 110-120-GHz monolithic low-noise amplifiers (LNAs) using 0.1-mm pseudomorphic AlGaAs/InGaAs/GaAs low-noise HEMT technology. Two 2-stage LNAs have been designed, fabricated, and tested. The first amplifier demonstrates a gain of 12 dB at 112 to 115 GHz with a noise figure of 6.3 dB when biased for high gain, and a noise figure of 5.5 dB is achieved with an associated gain of 10 dB at 113 GHz when biased for low-noise figure. The other amplifier has a measured small-signal gain of 19.6 dB at 110 GHz with a noise figure of 3.9 dB. A noise figure of 3.4 dB with 15.6-dB associated gain was obtained at 113 GHz. The authors state that the small-signal gain and noise figure performance for the second LNA are the best results ever achieved for a two-stage HEMT amplifier at this frequency band     

A high-gain, low-noise 1/2-μm pulse-doped pseudomorphic HEMT

A 1/2-μm gate-length pulse-doped pseudomorphic high-electron-mobility transistor (HEMT) grown by MBE, which exhibits a current-gain cutoff frequency of 62 GHz, is discussed. The maximum available gain cutoff frequency was greater than 150 GHz. A minimum noise figure of 0.85 dB and associated gain of 14 dB were measured at 10 GHz. Tuned small-signal gain in a waveguide-to-microstrip test fixture at 44 GHz was 7.6 dB. When the HEMT was tuned for power, 260 mW/mm with 5-dB gain and 17% power-added efficiency were obtained at 44 GHz. These results suggest that a 1/2-μm pseudomorphic HEMT is a viable candidate for Q-band applications     

Two-stage broadband high-gain W-band amplifier using 0.1-/spl mu/m metamorphic HEMT technology

We report broadband high-gain W-band monolithic microwave integrated circuit amplifiers based on 0.1-/spl mu/m InGaAs-InAlAs-GaAs metamorphic high electron mobility transistor (MHEMT) technology. The amplifiers show excellent S/sub 21/ gains greater than 10 dB in a very broad W-band frequency range of 75-100 GHz, thereby exhibiting a S/sub 21/ gain of 10.1 dB, a S/sub 11/ of -5.1 dB and a S/sub 22/ of -5.2 dB at 100 GHz, respectively. The high gain of the amplifier is mainly attributed to the performance of the MHEMTs exhibiting a maximum transconductance of 691 mS/mm, a current gain cutoff frequency of 189 GHz, and a maximum oscillation frequency of 334 GHz.     

5-60-GHz high-gain distributed amplifier utilizing InP cascodeHEMTs

A high-gain InP MMIC cascode distributed amplifier was developed which has 12 dB of gain from 5 to 60 GHz with over 20-dB gain control capability and a noise figure of 2.5-4 dB in the Ka band. Lattice-matched InAlAs/InGaAs cascode HEMTs on InP substrate with 0.25-μm gate length were the active devices. Microstrip was the transmission medium for this MMIC with an overall chip dimension of 2.3 mm×0.9 mm. The gain/noise figure advantages of the InP HEMT over the AlGaAs HEMT and the superior gain performance of the cascode HEMT over the common-source HEMT are demonstrated     

一款130～140GHz MMIC低噪声放大器

基于90 nm栅长的InP高电子迁移率晶体管(HEMT)工艺,研制了一款工作于130 ～140 GHz的MMIC低噪声放大器(LNA).该款放大器采用三级级联的双电源拓扑结构,第一级电路在确保较低的输入回波损耗的同时优化了放大器的噪声,后两级则采用最大增益的匹配方式,保证了放大器具有良好的增益平坦度和较小的输出回波损耗.在片测试结果表明,在栅、漏极偏置电压分别为-0.25 V和3V的工作条件下,该放大器在130～ 140 GHz工作频带内噪声系数小于6.5 dB,增益为18 dB±1.5 dB,输入电压驻波比小于2:1,输出电压驻波比小于3:1.芯片面积为1.70 mm×1.10 mm.该低噪声放大器有望应用于D波段的收发系统中.     

A C-band high-dynamic range GaN HEMT low-noise amplifier

A C-band low-noise amplifier (LNA) is designed and fabricated using GAN HEMT power devices. The one-stage amplifier has a measured noise figure of 1.6 dB at 6 GHz, with an associated gain of 10.9 dB and IIP3 of 13 dBm. it also exhibits broadband operation from 4-8 GHz with noise figure less than 1.9 dB. The circuit can endure up to 31 dBm power from the input port. Compared to circuits based on other material and technology, the circuit shows comparable noise figure with improved dynamic range and survivability.     

50-nm T-gate metamorphic GaAs HEMTs with f/sub T/ of 440 GHz and noise figure of 0.7 dB at 26 GHz

GaAs-based transistors with the highest f/sub T/ and lowest noise figure reported to date are presented in this letter. A 50-nm T-gate In/sub 0.52/Al/sub 0.48/As/In/sub 0.53/Ga/sub 0.47/As metamorphic high-electron mobility transistors (mHEMTs) on a GaAs substrate show f/sub T/ of 440 GHz, f/sub max/ of 400 GHz, a minimum noise figure of 0.7 dB and an associated gain of 13 dB at 26 GHz, the latter at a drain current of 185 mA/mm and g/sub m/ of 950 mS/mm. In addition, a noise figure of below 1.2 dB with 10.5 dB or higher associated gain at 26 GHz was demonstrated for drain currents in the range 40 to 470 mA/mm at a drain bias of 0.8 V. These devices are ideal for low noise and medium power applications at millimeter-wave frequencies.     

Broadband microwave noise characteristics of high-linearity composite-channel Al/sub 0.3/Ga/sub 0.7/N/Al/sub 0.05/Ga/sub 0.95/N/GaN HEMTs

We report broadband microwave noise characteristics of a high-linearity composite-channel HEMT (CC-HEMT). Owing to the novel composite-channel design, the CC-HEMT exhibits high gain and high linearity such as an output third-order intercept point (OIP3) of 33.2 dBm at 2 GHz. The CC-HEMT also exhibits excellent microwave noise performance. For 1-/spl mu/m gate-length devices, a minimum noise figure (NF/sub min/) of 0.7 dB and an associated gain (G/sub a/) of 19 dB were observed at 1 GHz, and an (NF/sub mi/) of 3.3 dB and a G/sub a/ of 10.8 dB were observed at 10 GHz. The dependence of the noise characteristics on the physical design parameters, such as the gate-source and gate-drain spacing, is also presented.     

A miniature Q-band low noise amplifier using 0.13-/spl mu/m CMOS technology

A miniature Q-band low noise amplifier (LNA) using 0.13-/spl mu/m standard mixed signal/radio frequency complementary metal-oxide-semiconductor (CMOS) technology is presented in this letter. This three-stage common source thin-film microstrip LNA achieves a peak gain of 20dB at 43GHz with a compact chip size of 0.525mm/sup 2/. The 3-dB frequency bandwidth ranges from 34 to 44GHz and the minimum noise figure is 6.3dB at 41GHz. The LNA outperforms all the reported commercial standard CMOS Q-band LNAs, with the highest gain, highest output IP3, and smallest chip size.     

High performance W-band InAlAs-InGaAs-InP HEMTs

0.15 mu m T-gate lattice-matched In/sub 0.52/Al/sub 0.48/As-In/sub 0.53/Ga/sub 0.47/As-InP HEMTs with a device minimum noise figure of 1.7 dB with 7.7 dB associated gain at 93 GHz have been fabricated. A single-ended active mixer was fabricated using these devices, and a conversion gain of 2.4 dB was measured with 7.3 dB single-sideband noise figure at 94 GHz. This is the first reported active mixer conversion gain at W-band.<>     

Design and Analysis of Broadband Dual-Gate Balanced Low-Noise Amplifiers

In this paper, we present three MMIC low-noise amplifiers using dual-gate GaAs HEMT devices in a balanced amplifier configuration. The designs target three different frequency bands including 4-9 GHz, 9-20 GHz, and 20-40 GHz. These dual-gate balanced designs demonstrate the excellent qualities of balanced amplifiers in terms of stability and matched characteristics, while demonstrating higher bandwidth than designs with a single-stage common-source device. Additionally, noise performance is excellent, with the 4-9 GHz LNA demonstrating <1.75 dB noise figure (NF), the 9-20 GHz LNA <2.75 dB NF and the 20-40 GHz LNA <2.5 dB NF. Demonstrating high gain and excellent bandwidth, the dual-gate devices seem a logical choice for the balanced amplifier topology.     

W‐Band MMIC chipset in 0.1‐μm mHEMT technology

We developed a 0.1‐μm metamorphic high electron mobility transistor and fabricated a W‐band monolithic microwave integrated circuit chipset with our in‐house technology to verify the performance and usability of the developed technology. The DC characteristics were a drain current density of 747 mA/mm and a maximum transconductance of 1.354 S/mm; the RF characteristics were a cutoff frequency of 210 GHz and a maximum oscillation frequency of 252 GHz. A frequency multiplier was developed to increase the frequency of the input signal. The fabricated multiplier showed high output values (more than 0 dBm) in the 94 GHz–108 GHz band and achieved excellent spurious suppression. A low‐noise amplifier (LNA) with a four‐stage single‐ended architecture using a common‐source stage was also developed. This LNA achieved a gain of 20 dB in a band between 83 GHz and 110 GHz and a noise figure lower than 3.8 dB with a frequency of 94 GHz. A W‐band image‐rejection mixer (IRM) with an external off‐chip coupler was also designed. The IRM provided a conversion gain of 13 dB–17 dB for RF frequencies of 80 GHz–110 GHz and image‐rejection ratios of 17 dB–19 dB for RF frequencies of 93 GHz–100 GHz.     

超低噪声K波段放大器仿真设计

介绍了一种超低噪声K波段放大器的设计方法,以高电子迁移率晶体管为基础,采用3级放大拓扑结构,提出了一种改进型的负反馈网络,较好地改善了电路的增益平坦度。利用Agilent公司的微波电路CAD（计算机辅助设计）软件ADS2006对电路原理图及版图进行了仿真设计,最终实现了在工作频段19．5GHz～21．5GHz内,噪声系数小于1．5dB、增益大于30dB的优异电性能。     

AlSb/InAs HEMT's for low-voltage, high-speed applications

The design, fabrication, and characterization of 0.1 μm AlSb/InAs HEMT's are reported. These devices have an In_0.4Al _0.6As/AlSb composite barrier above the InAs channel and a p ⁺ GaSb layer within the AlSb buffer layer. The HEMT's exhibit a transconductance of 600 mS/mm and an f_T of 120 GHz at V_Ds=0.6 V. An intrinsic f_T of 160 GHz is obtained after the gate bonding pad capacitance is removed from an equivalent circuit. The present HEMT's have a noise figure of 1 dB with 14 dB associated gain at 4 GHz and V_Ds=0.4 V. Noise equivalent circuit simulation indicates that this noise figure is primarily limited by gate leakage current and that a noise figure of 0.3 dB at 4 GHz is achievable with expected technological improvements. HEMT's with a 0.5 μm gate length on the same wafer exhibit a transconductance of 1 S/mm and an intrinsic f_TL_g, product of 50 GHz-μm     

A 0.18μm CMOS low noise amplifier using a current reuse technique for 3.1-10.6 GHz UWB receivers

A new,low complexity,ultra-wideband 3.1-10.6 GHz low noise amplifier(LNA),designed in a chartered 0.18μm RFCMOS technology,is presented.The ultra-wideband LNA consists of only two simple amplifiers with an inter-stage inductor connected.The first stage utilizing a resistive current reuse and dual inductive degeneration technique is used to attain a wideband input matching and low noise figure.A common source amplifier with an inductive peaking technique as the second stage achieves high flat gain and wide -3 dB bandwidth of the overall amplifier simultaneously.The implemented ultra-wideband LNA presents a maximum power gain of 15.6 dB,and a high reverse isolation of—45 dB,and good input/output return losses are better than -10 dB in the frequency range of 3.1-10.6 GHz.An excellent noise figure(NF) of 2.8-4.7 dB was obtained in the required band with a power dissipation of 14.1 mW under a supply voltage of 1.5 V.An input-referred third-order intercept point(IIP3) is -7.1 dBm at 6 GHz.The chip area,including testing pads,is only 0.8×0.9 mm2.