Structural,dielectric, and electrical studies on thermally evaporated CdTe thin films

Sandwich structures of cadmium telluride (CdTe) thin films between Ag electrodes were prepared by thermal evaporation technique at a vacuum of ~2 × 10⁻⁵ torr. Structural characterization of these thin films was performed using X-ray diffraction (XRD) studies. The effect of temperature and frequency on the electrical and dielectric properties of these films was studied in detail and reported in this article. The experimental study indicates that for the CdTe thin film the dielectric constant and dielectric loss increases with temperature and decreases with frequency. However, A.C. conductivity increases both with temperature and frequency. The data of complex impedance measurements over the same range of temperature and frequency are used to describe the relaxation behavior of the CdTe film. Our results indicate that the transport behavior of carriers in CdTe thin films is consistent with the correlated barrier hopping (CBH) model.     

Structural and electrical studies of thermally evaporated nanostructured CdTe thin films

CdTe thin films were deposited on KCl and glass substrates using thermal evaporation technique under high vacuum conditions. CdTe bulk compound grown by vertical directional solidification (VDS) technique was used as the source material to deposit thin films. Powder X-ray diffraction technique was employed to identify the phase of the as grown bulk CdTe compound as well as its thin films. Surface morphology and the stoichiometry of the bulk compound and thin films was carried out by using scanning electron microscope (SEM) with an attachment of energy dispersive spectrometer(EDS). Microstructural features associated with the as deposited CdTe thin films were studied by using transmission electron microscope (TEM). The films deposited on to glass substrates at different temperatures have been used to study the I-V characteristics of the films. These parameters have been studied in detail in order to prepare good quality nanostructured thin films of CdTe compound. CdTe bulk compound grown by VDS method and its thin films prepared by thermal evaporation method found to have single phase with cubic structure. Size of the particles in the as deposited films vary between 5 and 40 nm In the present study efforts have been made to correlate the electrical and optical properties of the CdTe thin films with the corresponding microstructural features associated with them.     

Structural,optical and electrical properties of CdZnS thin films

The thin films of Cd_1-x Zn _x S (x?=?0, 0.2, 0.4, 0.6, 0.8 and 1) have been prepared by the vacuum evaporation method using a mechanically alloyed mixture of CdS and ZnS. The structural, optical and electrical properties have been investigated through the X-ray diffractometer, spectrophotometer and Keithley electrometer. The X-ray diffraction patterns of these films show that films are polycrystalline in nature having preferential orientation along the (002) plane. In the absorption spectra of these films, absorption edge shifts towards lower wavelength with the increase of Zn concentration. The energy band gap has been determined using these spectra. It is found that the energy band gap increases with increasing Zn concentration. The electrical conductivity of so prepared thin films has been determined using a I–V characteristic curve for these films. The result indicates that the electrical conductivity decreases with increasing Zn content and increases with temperature. An effort has also been made to obtain activation energy of these films which increases with increasing Zn concentration in CdS.     

Structural, optical and electrical measurements on boron-doped CdO thin films

Several boron-doped CdO with different boron composition thin films have been prepared on glass substrate by a vacuum evaporation technique. The effects of boron doping on the structural, electrical and optical properties of the host CdO films were systematically studied. The X-ray diffraction study shows that some of B³⁺ ions occupied locations in interstitial positions and/or Cd²⁺-ion vacancies of CdO lattice. The band gap of B-doped CdO suffers narrowing by 30–38% compare to undoped CdO. Such band gap narrowing (BGN) was studied in the framework of the available models. Furthermore, a phenomenological evaluation of the dependence of band gap on the carrier concentration in the film samples is discussed. The electrical behaviours show that all the prepared B-doped CdO films are degenerate semiconductors. However, the boron doping influences all the optoelectrical properties of CdO. Their dc-conductivity, carrier concentration and mobility increase compare to undoped CdO film. The largest mobility of 45–47 cm²/V s was measured for 6–8% boron-doped CdO film. From near infrared transparent-conducting oxide (NIR-TCO) point of view, boron is effective for CdO donor doping.     

Structural, electrical and optical studies of SILAR deposited cadmium oxide thin films: Annealing effect

Successive ionic layer adsorption and reaction (SILAR) method has been successfully employed for the deposition of cadmium oxide (CdO) thin films. The films were annealed at 623 K for 2 h in an air and changes in the structural, electrical and optical properties were studied. From the X-ray diffraction patterns, it was found that after annealing, H₂O vapors from as-deposited Cd(O₂)_0.88(OH)_0.24 were removed and pure cubic cadmium oxide was obtained. The as-deposited film consists of nanocrystalline grains of average diameter about 20-30 nm with uniform coverage of the substrate surface, whereas for the annealed film randomly oriented morphology with slight increase in the crystallite size has been observed. The electrical resistivity showed the semiconducting nature with room temperature electrical resistivity decreased from 10⁻² to 10⁻³ Ω cm after annealing. The decrease in the band gap energy from 3.3 to 2.7 eV was observed after the annealing.     

Structural,optical, electrical and photo-electrochemical studies on indium doped Cd0.6Hg0.4Se thin films

Indium doped Cd_0.6Hg_0.4Se thin films have been prepared using simple chemical bath deposition technique with the objectives to study structural, optical, electrical changes taking place upon doping and to test their electrochemical properties. The ‘as deposited’ thin films were characterized by XRD, AAS, EDAX SEM, optical absorption, thermo-electrical techniques and photo-electrochemical studies. The donor atoms were found to dissolve substitutionally in the lattice of Cd_0.6Hg_0.4Se up to a certain range of doping concentration. The films were polycrystalline in the single cubic phase without appreciable lattice distortion. The crystallinity, grain size, band gap, conductivity were found to increase with increase in indium content up to 0.1 mol%. The carrier concentration and mobility were found to depend on indium content and temperature. An enhancement in the PEC efficiency, V_oc, I_sc and the fill factor has been found.     

Structural,optical, and electrical properties of flash-evaporated copper indium diselenide thin films

Copper indium diselenide (CuInSe₂) compound was synthesized by reacting its elemental components, i.e., copper, indium, and selenium, in stoichiometric proportions (i.e., 1:1:2 with 5% excess selenium) in an evacuated quartz ampoule. Structural and compositional characterization of synthesized pulverized material confirms the polycrystalline nature of tetragonal phase and stoichiometry. CuInSe₂ thin films were deposited on soda lime glass substrates kept at different temperatures (300–573 K) using flash evaporation technique. The effect of substrate temperature on structural, morphological, optical, and electrical properties of CuInSe₂ thin films were investigated using X-ray diffraction analysis (XRD), atomic force microscopy (AFM), optical measurements (transmission and reflection), and Hall effect characterization techniques. XRD analysis revealed that CuInSe₂ thin films deposited above 473 K exhibit (112) preferred orientation of grains. Transmission and reflectance measurements analysis suggests that CuInSe₂ thin films deposited at different substrate temperatures have high absorption coefficient (~10⁴ cm⁻¹) and optical energy band gap in the range 0.93–1.02 eV. Results of electrical characterization showed that CuInSe₂ thin films deposited at different substrate temperatures have p-type conductivity and hole mobility value in the range 19–136 cm²/Vs. Variation of energy band gap and resistivity of CuInSe₂ thin films deposited at 523 K with thickness was also studied. The temperature dependence of electrical conductivity measurements showed that CuInSe₂ film deposited at 523 K has an activation energy of ~30 meV.     

Structural,optical and electrical properties of PbS and PbSe quantum dot thin films

PbS and PbSe were prepared by hot injection method. The powders were used for preparing the corresponding films by using thermal evaporation technique. The structural, optical and electrical properties of PbS and PbSe thin films were investigated. The structural properties of PbS and PbSe were investigated by X-ray diffraction, transmission electron microscopy and energy dispersive X-ray techniques (EDX). PbS and PbSe films were found to have cubic rock salt structure. The particles size ranged from 1.32 to 2.26 nm for PbS and 1.28–2.48 nm for PbSe. EDX results showed that PbS films have rich sulphur content, while PbSe films have rich lead content. The optical constants (absorption coefficient and the refractive index) of the films were determined in the wavelength range 200–2500 nm. The optical energy band gap of PbS and PbSe films was determined as 3.25 and 2.20 eV, respectively. The refractive index, the optical dielectric constant and the ratio of charge carriers concentration to its effective mass were determined. The electrical resistivity, charge carriers concentration and carriers mobility of PbS at room temperature were determined as 0.55 Ω cm, 1.7 × 10¹⁶ cm^?3 and 656 cm² V^?1 s^?1, respectively, and for PbSe films they were determined as 0.4 Ω cm, 9 × 10¹⁵ cm^?3 and 1735 cm² V^?1 s^?1, respectively. These electrical parameters were investigated as a function of temperature.     

Preparation of nanocrystalline Mg doped CdSe thin films and their optical,photoluminescence, electrical and structural characterization

Phosphors used are mostly rare earth doped complex structures. A simple and unique material system of CdSe:Mg nanocrystalline thin films, which efficiently absorb UV (235 nm) and emit broad spectrum of green-yellow region has been prepared by chemical bath deposition method with average particle size of 52.3 nm, measured using AFM images. The optical absorption studies found that CdSe thin film has direct optical band gap, \({E_g}\) of 2.62 eV that shows a blue shift of 0.88 eV compared to the bulk \({E_g}\) value. Optical, electrical, structural and morphological properties were studied by UV–Vis–NIR spectrophotometer, photoluminescence (PL) emission spectra, dc two-probe method, X-ray diffraction (XRD), and atomic force microscope (AFM). Measured electrical resistivity decreased with increase of doping concentration. Activation energy was also calculated. The results confirm that the CdSe:Mg thin films are in the pure cubic phase. The magnesium concentrations also affect the nanocrystalline nature of the CdSe thin films. The optical band gap and surface roughness of CdSe thin films mostly decrease with 5% doping of Mg. The effect of Mg doping on refractive index, extinction coefficient and other optical parameters was also investigated.     

Structural and optical studies on ortho-hydroxy acetophenone azine thin films

The bulk material and deposited thin films of ortho-hydroxy acetophenone azine (o-HAcPhAz) were identified by X-ray diffraction (XRD) to be single phase polycrystalline of the monoclinic structure. The unit cell lattice constants were determined to be a = 1.578 nm, b = 1.394 nm and c = 0.64 nm, as well as its plane angles as = 90°, = 123.8° and = 90°. FTIR spectra of the bulk and thin films of the compound under investigation were assigned in the wave number range 4000–500 cm^–1. It was revealed that they were similar to each other. The optical constants (the refractive index, n, and the extinction coefficient, k) of the compound thin films were determined from the measured transmittance, T, and reflectance, R, at normal incidence of light in the spectral range 200–2100 nm. The plot of the absorption coefficient () versus h, gave three intense bands and a shoulder which were designated as A (232.3 nm), B (299.5 nm) and C (440.6 nm, 404.8 nm, sh). The observed A and B bands were attributed to * transitions, while the C-bands were attributed to * (n). The optical high frequency dielectric constant (₁, ₂) as well as the real and imaginary parts of the optical conductivity (₁, ₂) were determined. The plots of both ₁, ₂, ₁ and ₂ versus h reveal the same obtained optical transitions. Also, the relationships between both of surface, volume and surface/volume energy losses against h gave the same optical transtions.     

Structural,optical, and electrical properties of ZnTe:Cu thin films by PLD

In this work, ZnTe and ZnTe:Cu films were obtained by pulsed laser deposition using the co-deposition method. ZnTe and Cu₂Te were used as targets and the shots ratio were varied to obtain 0.61, 1.47, 1.72, and 3.46% Cu concentration. Doping of ZnTe films with Cu was performed with the purpose of increasing the p-type carrier concentration and establishing the effect of concentration of Cu on structural, optical, and electrical properties of ZnTe thin films to consider their potential application in electronic devices. According to X-ray diffraction, X-ray photoelectron spectroscopy, UV–visible spectroscopy, and Hall effect results, ZnTe and ZnTe:Cu films correspond to polycrystalline zinc–blende phase with preferential orientation in (111) plane. Optical characterization results indicate that as-deposited films (band gap?=?2.16 eV) exhibit a band gap decrease as function of the increase of Cu concentration (2.09–1.64 eV), while, annealed films exhibit a decrease from 1.75 to 1.46 eV, as the Cu concentration increases. Lastly, Hall effect results show that ZnTe films correspond to a p-type semiconductor with a carrier concentration of 3?×?10¹³ cm^?3 and a resistivity of 1.64?×?10⁵ Ω?cm. ZnTe:Cu films remain like a p-type material and present an increasing carrier concentration (from 3.8?×?10¹⁵ to 1.26?×?10¹⁹ cm^?3) as function of Cu concentration and a decreasing resistivity (from 7.01?×?103 to 2.6?×?10^?1 Ω cm). ZnTe and ZnTe:Cu thin films, with the aforementioned characteristics, can find potential application in electronic devices, such as, solar cells and photodetectors.     

Formation and properties of vacuum-evaporated high conductivity n-type CdTe films

High dark conductivity CdTe films have been prepared by co-evaporating CdTe and cadmium. The structural, electrical and optical properties were investigated. The dark conductivity of the film increased monotonically with an increase in the amount of co-evaporated cadmium. The highest dark conductivity of the films obtained in this experiment was 1.4x10^-2Ω^-1 cm^-1. The film structure was of the zinc blende type with a preferential orientation of the (111) planes parallel to the substrate and fibrous. The crystallinity of the films was similar to that of films without cadmium doping. The dark conductivity vs. the reciprocal temperature characteristics showed regular aspects. High dark conductivity films will be useful for CdTe thin film device applications.     

A photoluminescence study of film structure in CdTe nanoparticle thin films

The layer-by-layer deposition of thin films of CdTe nanoparticles and three different polyelectrolytes has been investigated. Photoluminescence spectra were used to monitor the energy transfer properties within the films. As the number of bilayers in a thin film was increased a decrease in the energy of the light emitted was observed. The wavelength change is a two-stage process. Deposition of the first one to two bi-layers of a thin film produced a sharp energy change (626 nm to 637 nm with the addition of a single bi-layer) whereas deposition of subsequent bi-layers produced a more gradual energy change (642 nm-646 nm with the addition of 5 bi-layers). A space-filling mechanism is suggested to account for these changes; smaller nanoparticles penetrate the earlier levels of a thin film and increase the inter-particle energy transfer opportunities within the layers.     

Structural,optical and electrical properties of spray pyrolytically deposited thin films of CuInS2

CuInS₂ is a promising chalcopyrite semiconducting material for solar cell fabrication. Using aqueous solutions of cupric chloride, indium trichloride and thiourea, we deposited thin CuInS₂ films on glass at 350°C and studied their structural, optical and electrical properties. From the XRD pattern the chalcopyrite structure of these films was confirmed. The films were polycrystalline. The grain size estimated from scanning electron micrographs was found to be of the order of 1μm. Resistivity of the film was measured for temperatures ranging from 77 to 473 K. Band gap values were determined from optical transmission data. Hall mobility and carrier concentration at room temperature were calculated using Van der Pauw-Hall method.     

Structural, optical and electrical characterization of spray-deposited TiO2 thin films

Titanium oxide (TiO₂) thin films were deposited onto glass substrates by means of spray pyrolysis method using methanolic titanyl acetyl acetonate as precursor solution. The thin films were deposited at three different temperatures namely 350, 400 and 450 °C. As-deposited thin films were amorphous having 100–300 nm thickness. The thin films were subsequently annealed at 500 °C in air for 2 h. Structural, optical and electrical properties of TiO₂ thin films have been studied. Polycrystalline thin films with rutile crystal structure, as evidenced from X-ray diffraction pattern, were obtained with major reflexion along (1 1 0). Surface morphology and growth stages based on atomic force microscopy measurements are discussed. Electrical properties have been studied by means of electrical resistivity and thermoelectric power measurements. Optical study shows that TiO₂ possesses direct optical transition with band gap of 3.4 eV.     

Structural, optical and electrical properties of In doped CdO thin films for optoelectronic applications

Thin films of indium doped cadmium oxide were deposited on quartz substrate using pulsed laser deposition technique. The effect of growth temperature and partial oxygen pressure on structural, optical and electrical properties was studied. We find that the optical transparency of the films largely depends on the growth temperature, while partial oxygen pressure has virtually no effect on the transparency of the films. Electrical properties are found to be sensitive to both the growth temperature and oxygen pressure. It is observed that conductivity and carrier concentration decreases with temperature. The film grown at 200 °C under an oxygen pressure of 5.0 × 10^− 4 mbar shows high mobility (155 cm²/V s), high carrier concentration (1.41 × 10²¹ cm³), and low resistivity (2.86 × 10^− 5 Ω cm).     

Structural, optical, and electrical properties of tin sulfide thin films grown by spray pyrolysis

Tin sulfide (SnS) thin films have been prepared by spray pyrolysis (SP) technique using tin chloride and N, N-dimethylthiourea as precursor compounds. Thin films prepared at different temperatures have been characterized using several techniques. X-ray diffraction studies have shown that substrate temperature (T_s) affects the crystalline structure of the deposited material as well as the optoelectronic properties. The calculated optical band gap (E_g) value for films deposited at T_s = 320-396 °C was 1.70 eV (SnS). Additional phases of SnS₂ at 455 °C and SnO₂ at 488 °C were formed. The measured electrical resistivity value for SnS films was ∼ 1 × 10⁴ Ω-cm.