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1.
We tried to control the magnetic anisotropy of a high‐frequency carrier‐type magnetic field sensor by the shape of the magnetic film instead of induced anisotropy. We confirmed that the impedance of the sensor could be changed by applying a magnetic field. In addition, we tried to control the magnetic anisotropy with magnetostatic energy. We show that the properties of the sensor can be controlled by designing the shape of the magnetic film. © 2007 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.  相似文献   

2.
A method has been developed for measuring the shapes of 3‐D objects whose surfaces have regions of different reflectance. The 3‐D coordinates of the object sections are obtained by triangulation with a light‐section method, using a slit light source and a CCD camera. A CCD camera with an expanded dynamic range is employed to reduce the influence of reflection from uneven surfaces. The CCD camera expands the dynamic range by combining multiple images captured at different shutter speeds. A trial 3‐D shape measurement system has been produced using our method. The effectiveness of the method was confirmed experimentally. © 1998 Scripta Technica, Electr Eng. Jpn, 126(2): 40–47, 1999  相似文献   

3.
We have proposed a new type of fault current limiter, which consists of a flux‐lock reactor with high‐Tc superconducting (HTS) elements and an ac magnetic field coil (Flux‐Lock‐Type Fault Current Limiter: FLT‐FCL). The FLT‐FCL can increase both the current capacity and the limiting impedance by means of a transformer action and an ac magnetic field application mechanism. This paper reports the conceptual design of an FLT‐FCL for application to a 6.6‐kV/200‐A distribution system. Theoretical expressions for the current limiting behavior are derived and the new concept of “quench power” is proposed in order to estimate the required number of HTS elements for two types of FLT‐FCL and for a basic FCL type consisting only of HTS elements. Design guidelines for the FLT‐FCL are derived from the calculation results. © 2001 Scripta Technica, Electr Eng Jpn, 135(4): 17–25, 2001  相似文献   

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