Studies of heteroepitaxial growth of diamond

Large-scale heteroepitaxial growth of diamond depends critically on the development of a suitable lattice-matched substrate system. Oxide substrates, notably MgO and SrTiO₃, on which thin epitaxial films of iridium serve as a nucleation layer for diamond have already shown considerable promise. We describe here improvements in the growth of single crystal diamond by low-pressure microwave plasma-enhanced CVD. Oxide substrates with flat, low-index surfaces form the initial basis for the process. Iridium was deposited on heated substrates in a UHV electron-beam evaporation system resulting in epitaxial films, typically 150–300 nm thick, with Ir (1 0 0) parallel to the surface of all substrates as confirmed by X-ray and electron backscattering diffraction. Following Ir deposition, the samples were transferred to a CVD reactor where a bias-enhanced nucleation step induced a dense condensate that completely covered the Ir surface. Uniform nucleation densities of order 10¹² cm⁻² were observed. Interrupted growth studies, carried out at intervals from seconds to minutes subsequent to terminating the nucleation step, revealed a rapid coalescence of grains. One hour of growth resulted in a smooth, nearly featureless, (0 0 1) diamond film. For extended growth runs, slabs of diamond were grown with thickness as great as 38 μm and lateral dimensions near 4 mm. The crystals were transparent in visible light and cleaved on (1 1 1) planes along 〈1 1 0〉 directions, similar to natural diamond. Of particular significance is the successful use of sapphire as an underlying substrate. Its high crystalline perfection results in epitaxial Ir films with X-ray linewidths comparable to those grown on SrTiO₃. However, Al₂O₃ possesses superior interfacial stability at high temperatures in vacuum or in a hydrogen plasma with a better thermal expansivity match to diamond. Since sapphire is available as relatively inexpensive large diameter substrates, these results suggest that wafer-scale growth of heteroepitaxial diamond should be feasible in the near future.     

Preparation of 4-inch Ir/YSZ/Si(001) substrates for the large-area deposition of single-crystal diamond

Diamond/Ir/YSZ/Si(001) is currently the most promising multilayer structure for the future realisation of large-area diamond single crystals. A decisive key is the preparation of the iridium layers on silicon. It is shown in this work that high quality iridium films with mosaic spread below 0.2° can be grown on oxide buffer layers with a mosaic spread higher than 1°. An averaging process during the coalescence of the iridium islands provides a plausible mechanism for this phenomenon. The oxide buffer and the iridium overlayers can be grown homogeneously on 4-inch wafers in a similar quality as for 1 × 1 cm² samples. Bias enhanced nucleation followed by 40 h growth on the large-area Ir/YSZ/Si(001) wafers yields diamond films with a mosaicity of 0.16° (tilt) and 0.34° (twist). For a further increase of the area of heteroepitaxial diamond nucleation the homogeneity of the plasma discharge has to be improved.     

Bias-enhanced nucleation of oriented diamonds on cone-like Si

Uniform distribution of bias-enhanced nucleation of diamond has been improved on Si substrate of an area of 1 × 1 cm² by using a dome-shaped Mo counter electrode in a microwave plasma chemical vapor deposition reactor. A nucleation density of 10⁹ cm² can be reached within a few minutes when the bias voltage of − 100 V is applied on the substrates. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) show that a single-crystalline diamond in a few nanometered size can be deposited on a volcano-shaped cubic SiC which is epitaxially formed on a Si cone. Examination reveals a large fraction of diamond nuclei are oriented along with one side of SiC on each Si cone. The Si cone formed on the Si substrate is due to plasma etching. The diamond nuclei have a shape close to rhombus in TEM. With further growth, secondary nucleation of diamond occurs on top of diamond nuclei and SiC which grows with Si cones. As a result, polycrystalline diamonds are deposited on each Si cone.     

Structural and optical characterizations of nanostructured diamond films grown on Si(0 0 1) substrates

Nanostructured diamond films (NDFs) were grown on fine-polished Si(0 0 1) substrates by radio-frequency plasma-enhanced hot-filament chemical vapor deposition at low gas pressure of approximately 2 Torr. High resolution field-emission scanning electron microscopy (FESEM), X-ray diffraction and Raman scattering spectroscopy were employed to characterize the NDFs. FESEM measurement indicated that diamond nuclei density exceeded 10¹⁰ cm⁻² after growth for 20 min, which should render potential applications, such as in the fabrication of diamond-related field-emission devices. Photoluminescence excitation characterizations revealed the sharp optical absorption band edge of NDFs, and the band gap is 5.34 eV.     

Fretting wear and electrochemical corrosion of well-adhered CVD diamond films deposited on steel substrates with a WC–Co interlayer

Diamond films have been grown on carbon steel substrates by hot-filament chemical vapour deposition methods. A Co-containing tungsten-carbide (WC–Co) coating prepared by high velocity oxy-fuel spraying was used as an intermediate layer on the steel substrates to minimize the early formation of graphite (and thus growth of low quality diamond films) and to enhance the diamond film adhesion. The effects of the WC–Co interlayer on nucleation, quality, adhesion, tribological behaviour and electrochemical corrosion of the diamond film were investigated. The diamond films exhibit excellent adhesion under Rockwell indentation testing (1500 N load) and when subjected to high-speed, high-load, long-time reciprocating dry sliding ball-on-flat wear tests against a Si₃N₄ counterface in ambient air (500 rpm, 200 N, 300,000 cycles). A WC–Co interlayer with appropriate chemical pretreatment is shown to play an important role in improving the nucleation, quality and adhesion of the diamond film, relative to that shown by substrates without such pretreatment.     

Initial growth of heteroepitaxial diamond on Ir (0 0 1)/MgO (0 0 1) substrates using antenna-edge-type microwave plasma assisted chemical vapor deposition

Initial growth of heteroepitaxial diamond on Ir (0 0 1)/MgO (0 0 1) was investigated by scanning electron microscopy, reflection high-energy electron diffraction (RHEED) and atomic force microscopy. Bias-enhanced nucleation (BEN) was performed by antenna-edge-type microwave plasma assisted chemical vapor deposition. In BEN, diamond crystallites nucleated and grew along the [−1 1 0] and [1 1 0] directions of iridium. Diamond was likely to nucleate on protruded iridium areas. After BEN, in addition to the diamond diffraction spots, iridium bulk diffraction spots, which were not observed before BEN, were observed by RHEED. The iridium surface appeared to be protruded and changed by the high ion current density in BEN. Under [0 0 1] selective growth conditions, diamond crystallites, which were less than 10 nm in diameter, were etched by H₂ plasma. Diamond nucleated areas corresponded to the surface ridges of iridium along the [−1 1 0] and [1 1 0] directions at 10–40 nm intervals before BEN.     

Nucleation and growth of diamond films on single crystal and polycrystalline tungsten substrates

Silicon has been the most widely studied substrate for the nucleation and growth of CVD diamond films. However, other substrates are of interest, and in this paper, we present the results of a study of the biased nucleation and growth of diamond films on bulk single and polycrystalline tungsten. Diamond films were nucleated and grown, using a range of bias and reactor conditions, and characterized by Raman spectroscopy and scanning electron microscopy (SEM). High-quality (100) textured films (Raman FWHM<4 cm⁻¹) could be grown on both single and polycrystalline forms of the tungsten substrate. On carefully prepared substrates, by varying the bias treatment, it was possible to determine the nucleation density over a 4–5 order range, up to ∼10⁹ cm⁻². Raman measurements indicated that the diamond films grown on bulk tungsten exhibited considerable thermal stress (∼1.1 GPa), which, together with a thin carbide layer, resulted in film delamination on cooling. The results of the study show that nucleation and growth conditions can be used to control the grain size, nucleation density, morphology and quality of CVD diamond films grown on tungsten.     

Influence of SiC particle addition on the nucleation density and adhesion strength of MPCVD diamond coatings on Si3N4 substrates

It is generally accepted that SiC layers are often involved in the adhesion efficiency of chemical vapour deposition (CVD) diamond films on Si-containing substrates. Si₃N₄–SiC composite substrates with different amounts of SiC particles (0–50 wt%) were then used for diamond deposition. Samples were produced by pressureless sintering (1750°C, N₂ atmosphere, 2–4 h). The diamond films were grown on a commercial MPCVD reactor using H₂/CH₄ mixtures. Despite there being no special substrate pre-treatment, the films were densely nucleated when SiC was added (N_d≈1×10¹⁰ cm⁻²) with primary nanosized (∼100 nm) particles, followed by a less dense (N_d≈1×10⁶ cm⁻²) secondary nucleation. Indentation experiments with a Brale tip of up to 588 N applied load corroborated the benefit of SiC inclusion for a strong adhesion. The low thermal expansion coefficient mismatch between Si₃N₄ and diamond resulted in very low compressive stresses in the film, as proved by micro-Raman spectroscopy.     

From micro to nanocrystalline transition in the diamond formation on porous pure titanium

A novel composite material of nanocrystalline (NCD) and/or microcrystalline (MCD) diamond films grown on porous titanium (Ti) substrate was obtained by hot filament chemical vapor deposition technique. Diamond films were grown using 1.5 vol.% CH₄ in a balanced mixture of Ar/H₂. The grain size control was obtained by varying the argon concentration from 0 up to 90 vol.% at substrate temperature of 870 K. Porous Ti substrates were obtained by powder metallurgy and presented an inter-connected open porosity. Scanning electron microscopy images of diamond/Ti exposed the substrate covered by a continuous textured coating which changed from MCD to NCD morphology; depending on the amount of Ar concentration in the feed gas. Micro-Raman spectra showed the characteristic t-polyacethylene peaks around 1150 cm^− 1 and 1470 cm^− 1, associated to NCD formation for samples grown with Ar concentration higher than 40 vol.%. X-ray diffraction patterns identified the diamond and TiC peaks, where the crystallinity of (111) TiC phase decreased as the Ar amount increased. This behavior was associated to diamond (220) peak increase for films grown with Ar concentration higher than 70 vol.%. Diamond crystallite size was also evaluated from Sherrer's formula in the range of 11 up to 20 nm.     

Investigation of nanocrystalline diamond films grown on silicon and glass at substrate temperature below 400 °C

We present investigation of nanocrystalline diamond films deposited in a wide temperature range. The nanocrystalline diamond films were grown on silicon and glass substrates from hydrogen based gas mixture (methane and hydrogen) by microwave plasma CVD process. Film composition, nano-grain size and surface morphology were investigated by Raman spectroscopy and scanning electron microscopy. All samples showed diamond characteristic line centred at 1332 cm^− 1 in the Raman spectrum. Nanocrystalline diamond layers revealed high surface flatness (under 10 nm) with crystal size below 60 nm. Surface morphology of grown films was well homogeneous over glass substrates due to used mechanical seeding procedure. Very thin films (40 nm) were successfully grown on glass slides (i.e. standard size 1 × 3″). An increase in delay time was observed when the substrate temperature was decreased. A possible origin for this behaviour was discussed.     

Microstructural characterization of diamond films deposited on c-BN crystals

The morphology and structure of diamond films, deposited on cubic boron nitride (c-BN) crystals by microwave-plasma-enhanced chemical vapor deposition, is studied by high-resolution scanning electron microscopy and micro-Raman spectroscopy. The c-BN crystals, with sizes of 200 to 350 μm and grown by a high-temperature/high-pressure technique, were embedded in a copper holder, and used as substrates in deposition runs of 15 min to 5 h. The nucleation centers for diamond appear as well-shaped cuboctahedral crystallites, having diameters of approximately 100 nm. With increasing deposition time the diamond crystallites grew larger, forming islands on the c-BN faces. In some cases, epitaxial growth was observed on the (111) c-BN faces where coalesced particles gave rise to very smooth regions. A number of diamond crystals with peculiar shapes are observed, such as a pseudo five-fold symmetry due to multiple twinning. Moreover, both randomly distributed carbon tubes, about 100 nm in diameter and 1 μm in length, and spherically shaped features are observed in samples prepared under the typical conditions of diamond deposition, this effect being ascribed to the influence of plasma-sputtered copper contamination. Quite unusual diamond crystals with a deep, pyramidal-shaped hole in the middle grew on the copper substrate between the c-BN crystals.     

Investigation of the nucleation and growth mechanisms of nanocrystalline diamond/amorphous carbon nanocomposite films

Nucleation and growth, but especially the development of the morphology of nanocrystalline diamond/amorphous carbon (NCD/a-C) nanocomposite films have been investigated by systematic variation of three important parameters, namely the deposition time, the growth rate, and the substrate pre-treatment used to enhance the nucleation density. The films have been characterized, among others, by scanning electron microscopy, atomic force microscopy, and Fourier transform infrared spectroscopy. It is shown that, by successive addition of ultradispersive diamond powder to the suspension of nanocrystalline diamond powder in n-pentane used for the ultrasonic pre-treatment, the nucleation density can be enhanced by two orders of magnitude from 1 · 10⁸ cm^− 2 to > 1 · 10¹⁰ cm^− 2. This reduces the thickness required to achieve closed films from 1 µm to 100 nm. However, once coalescence of the individual nodules emerging from the nucleation sites has taken place the films loose “memory” of the nucleation step and start to develop the typical NCD morphology consisting of larger features with diameters of some hundreds of nm which are in turn composed of much smaller features. Irrespective of the feature size and of the parameters used, the films of this investigation possess AFM rms roughnesses of 9–13 nm, indicating that rms values are not sufficient to characterize NCD surfaces.     

Nucleation of diamond films by ECR-enhanced microwave plasma chemical vapor deposition

A novel nucleation technique based on electron cyclotron resonance microwave plasma was developed to enhance the nucleation of diamond. By choosing a suitable experimental condition, a nucleation density higher than 10⁸ nuclei cm⁻² was achieved on an untreated, mirror-polished silicon substrate. Uniform diamond films were obtained by combining this nucleation method with subsequent growth by the common microwave plasma chemical vapor deposition. Furthermore, the possibility of this new nucleation method to generate heteroepitaxial diamond nuclei on (001) silicon substrates was explored.     

High-quality diamond film deposition on a titanium substrate using the hot-filament chemical vapor deposition method

Diamond film on titanium substrate has become extremely attractive because of the combined properties of these two unique materials. Diamond film can effectively improve the properties of Ti for applications as aerospace and biomedical materials, as well as electrodes. This study focuses on the effects of process parameters, including gas composition, substrate temperature, gas flow rate and reactor pressure on diamond growth on Ti substrates using the hot-filament chemical vapor deposition (HFCVD) method. The nucleation density, nuclei size as well as the diamond purity and growth tendency indices were used to quantify these effects. The crystal morphology of the material was examined with scanning electron microscopy (SEM). Micro-Raman spectroscopy provided information on the quality of the diamond films. The growth tendency of TiC and diamond film was determined by X-ray diffraction analysis. The optimal conditions were found to be: CH₄:H₂ = 1%, gas flow rate = 300 sccm, substrate temperature T_sub = 750 °C, reaction pressure = 40 mbar. Under these conditions, high-quality diamond film was deposited on Ti with a growth rate of 0.4 μm/h and sp² carbon impurity content of 1.6%.     

Iron-mediated growth of epitaxial graphene on SiC and diamond

Ordered graphene films have been fabricated on Fe-treated SiC and diamond surfaces using the catalytic conversion of sp³ to sp² carbon. In comparison with the bare SiC (0 0 0 1) surface, the graphitization temperature is reduced from over 1000 °C to 600 °C and for diamond (1 1 1), this new approach enables epitaxial graphene to be grown on this surface for the first time. For both substrates, a key development is the in situ monitoring of the entire fabrication process using real-time electron spectroscopy that provides the necessary precision for the production of films of controlled thickness. The quality of the graphene/graphite layers has been verified using angle-resolved photoelectron spectroscopy, scanning tunneling microscopy and low energy electron diffraction. Graphene is only formed on treated regions of the surface and so this offers a method for fabricating and patterning graphene structures on SiC and diamond in the solid-state at industrially realistic temperatures.     

Semiconducting to metallic-like boron doping of nanocrystalline diamond films and its effect on osteoblastic cells

The impact of boron doping level of nanocrystalline diamond (NCD) films on the character of cell growth (i.e., adhesion, proliferation and differentiation) is presented. Intrinsic and boron-doped NCD films were grown on Si/SiO₂ substrates by microwave plasma CVD process. The boron-doped samples were grown by adding trimethylboron (TMB) to the gas mixture of methane and hydrogen. Highly resistive (0 ppm), semiconducting (133 or 1000 ppm), and metallic-like (6700 ppm) NCD films were tested as the artificial substrates for the cultivation of osteoblast-like MG 63 cells. The conductivity and surface charge increased monotonically with the increasing boron content. All NCD substrates showed good biocompatibility and stimulated the adhesion and growth of MG 63 cells. Higher osteocalcin concentration (by more than 30%) for the cells growing on 1000 and 6700 ppm boron-doped NCD films was found which indicates an enhancement in the cell growth biochemistry.     

Early stage of diamond growth at low temperature

We investigate the first stages of nanocrystalline diamond (NCD) thin film growth at low substrate temperature. NCD films were grown on silicon substrates by microwave plasma enhanced chemical vapor deposition (CVD) for 0–300 min at a temperature of 410 °C. Si substrates were ultrasonically seeded in suspension of detonation nanocrystalline diamond powder. The seeding density approached values up to 1 ⁎ 10¹² cm^− 2, which allows growth of ultra-thin fully closed layers. Stagnation of the AFM roughness indicates that the low temperature NCD growth is a) delayed due to the surface contamination of the used nanodiamond powder and b) possibly dominated by the growth in the lateral direction. XPS measurements showed that the measured surface exhibits changes from a multi-phase composite (seeding layer) to single-phase one (NCD layer).     

Influence of substrate nature on the d.c.-glow discharge induced nucleation of diamond

The nature of the nucleation centers, formed during the so called bias enhanced nucleation (BEN) of chemical vapor deposition (CVD) diamond is still an open question. We address this question by investigating the chemical composition and structure of the material deposited during the “nucleation” stage on various substrates by near edge X-ray absorption fine structure technique (NEXAFS) and Raman spectroscopy.The key step of the BEN of diamond in hot filament CVD systems is the generation of a stable d.c.-glow discharge between the grounded substrate and a positively biased electrode. This process results in the deposition of a carbon based film which contains the diamond nucleation and growth centers. Different materials, such as Si(100), CVD diamond films, and Si(100) onto which thin films of Ni were evaporated were used as substrates.It was found that the structure of the material deposited during the d.c.-glow discharge process is affected by the nature of the substrate. The d.c.-glow discharge process applied to the Si substrate resulted in the formation of a graphite-like film in the earlier stages (5 min), which after prolonged treatment time (30 min) was predominantly composed of nanosized diamond. The CVD diamond film, used as a substrate, promoted the formation of nanosized diamond particles even after 5 min of the d.c.-glow discharge process. However, C-13 labeling experiments have shown that microcrystalline diamond does not grow on the pre-existing CVD diamond substrate under the d.c.-glow discharge conditions. In the case of the Ni modified Si, the deposited film was graphitic in nature both after short and prolonged d.c.-glow discharge treatment times.     

Erosive wear resistance of NCD coatings produced by pulsed microwave discharges

Erosion tests on nanocrystalline diamond (NCD) films are relevant not only for the evaluation of the erosive wear resistance, anticipating applications where coated materials are exposed to particle impacts, but also as a way to evaluate their adhesion to the substrates. NCD films were grown on Si₃N₄ ceramic by microwave plasma assisted deposition in continuous (CW) and pulsed (PW-50 Hz and PW-500 Hz) discharge modes in argon-rich gas mixture. The films grown in PW modes presented lower crystallite size and lower surface roughness than those grown in CW one, while the use of CF₄ plasma pre-treatment of the substrate lead to further film homogeneity. The erosive wear resistance of NCD was evaluated by solid particle impact using SiC (45–250 μm size) as erodent material, with selected parameters accordingly to Hertzian stress field calculations. Film weight loss was undetectable until delamination took place. When tested with 150 μm SiC particles, the CF₄ plasma pre-treated substrates yield a three-fold increase (15 min) in delamination time comparing to untreated specimens, while samples coated under PW-50 Hz conditions presented a six times lower erosion rate compared to CW ones. It is believed that the improved nucleation behaviour by the use of PW mode and its higher homogeneity on the CF₄ plasma pre-treated samples decrease the flaw population on the diamond/substrate interface, leading to improved adhesion levels.     

Growth of single and multi-layer graphene on Ir(1 0 0)

We report on the high temperature chemical vapor deposition of ethylene on Ir(1 0 0) and the resulting development of single and multi-layer graphene films. By employing X-ray photoemission electron spectromicroscopy, low energy electron microscopy and related microprobe methods, we investigate nucleation and growth of graphene as a function of the concentration of the chemisorbed carbon lattice gas. Further, we characterize the morphology and crystal structure of graphene as a function of temperature, revealing subtle changes in bonding occurring upon cooling from growth to room temperature. We also identify conditions to grow multi-layer flakes. Their thickness, unambiguously determined through the analysis of the intensity of the Ir 4f and C 1s emission, is correlated to the electron reflectivity at very low kinetic energy. The effective attenuation length of electrons in few-layer graphene is estimated to be 4.4 and 8.4 Å at kinetic energies of 116 and 338 eV, respectively.