Optimization of Third-Order Intermodulation Product and Output Power from an X-Band MESFET Amplifier Using Volterra Series Analysis

A third-order analysis for accurately predicting large-signal power and intermodulation distortion performance for GaAs MESFET amplifiers is presented. The analysis is carried out for both single- and two-tone input signals using the Volterra series representation and is based only on small-signal measurements. Simple expressions for the nonlinear power gain frequency response, the output power, the gain compression factor, and the third-order intermodulation (IM/sub 3/) power are presented. The major sources of gain compression and intermodulation distortion are identified. Based on the developed nonlinear analysis in conjunction with the device nonlinear model, a systematic procedure for designing a MESFET amplifier under large-signal conditions for optimum output power and IM/sub 3/ performance is proposed. The method utilizes out of band computed matching compensation through a nonlinear model of the amplifier. The accuracy of the device large-signal and IM/sub 3/ distortion characterization and the practicability of the proposed method are illustrated through comparison between measured and predicted results.     

Accurate pHEMT nonlinear modeling in the presence of low-frequency dispersive effects

Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of "traps" (i.e., surface state densities and bulk spurious energy levels) must be taken into account in the large-signal dynamic modeling of III-V field-effect transistors when accurate performance predictions are pursued, since these effects cause important deviations between direct current (dc) and dynamic drain current characteristics. In this paper, a new model for the accurate characterization of these phenomena above their cutoff frequencies is presented, which is able to fully exploit, in the identification phase, large-signal current-voltage (I-V) measurements carried out under quasi-sinusoidal regime using a recently proposed setup. Detailed experimental results for model validation under LF small- and large-signal operating conditions are provided. Furthermore, the I-V model proposed has been embedded into a microwave large-signal pseudomorphic high electron-mobility transistor (pHEMT) model in order to point out the strong influence of LF modeling on the degree of accuracy achievable under millimeter-wave nonlinear operation. Large-signal experimental validation at microwave frequencies is provided for the model proposed, by showing the excellent intermodulation distortion (IMD) predictions obtained with different loads despite the very low power level of IMD products involved. Details on the millimeter-wave IMD measurement setup are also provided. Finally, IMD measurements and simulations on a Ka-band highly linear power amplifier, designed by Ericsson using the Triquint GaAs 0.25-/spl mu/m pHEMT process, are shown for further model validation.     

A large-signal switching MESFET model for intermodulationdistortion analysis

This paper describes an improved large-signal model for predicting an intermodulation distortion (IMD) power characteristic of MESFETs in switching applications. The model is capable of modeling the voltage-dependent drain current and its derivatives, including gate-source and gate-drain capacitors. The drain current and its derivatives are described by a function of a voltage-dependent drain conductance. The model parameters are extracted from a measured drain conductance versus gate voltage characteristic of a MESFET. This paper also presents a new fully symmetric equivalent circuit for switching MESFETs. The IMD power characteristics calculated with the use of the proposed method are compared with experimental data taken from a monolithic microwave integrated circuit single-pole double-throw switch. Good agreements over the large gate voltages and input power levels are observed     

Improved large-signal GaN HEMT model suitable for intermodulation distortion analysis

In this article, a complete empirical large-signal model of GaN high electron-mobility transistors (HEMTs) is presented. The developed nonlinear model employs differentiable trigonometric function continuously to describe the drain-source current characteristic and its higher order derivatives, making itself suitable for the simulation of intermodulation distortion (IMD) in microwave circuits. Besides, an improved charge-conservative gate charge model is proposed to accurately trace the nonlinear gate-source and gate-drain capacitances. The model validity is demonstrated for different 0.25-µm gate-length GaN HEMTs. The simulation results of small-signal S-parameters, radio frequency (RF) large-signal power performances and two-tone IMD products show an excellent agreement with the measured data.     

C-band GaAs FET power amplifiers with 70-W output power and 50% PAE for satellite communication use

This paper describes a successfully developed high-power and high-efficiency C-band GaAs FET amplifier for satellite communication systems. To realize high efficiency in a high-power amplifier, an HFET well-designed for high-power applications is developed, and precise design for an amplifier is carried out. The HFET employed achieves reduction in a gate leakage current while maintaining a high maximum drain current. For precise design of an amplifier, large-signal FET model parameters are extracted using pulsed I-V and S-parameter measurements. Based on this model, second harmonic impedances as well as fundamental impedances are determined for obtaining high efficiency and input- and output-matching circuits which are assembled in a compact package are designed to achieve a high-efficiency internally matched amplifier. As a result, the amplifier delivers a high saturated output power of 70 W and a high power-added efficiency of 51%. These characteristics are the record power performance in C-band in terms of simultaneous achievement of high power and high efficiency. A low third order intermodulation distortion of -35 dBc is also obtained at a drain voltage of 10 V.     

9～15GHz GaAs E-PHEMT高性能线性功率放大器

基于0.15 μm GaAs增强型赝配高电子迁移率晶体管(E-PHEMT)工艺,研制了一款用于5G通信和点对点传输的高性能线性功率放大器单片微波集成电路(MMIC).采用栅宽比为1:4.4的两级放大结构保证了电路的增益和功率指标满足要求;基于大信号模型实现了最优输入输出阻抗匹配:采用电磁场仿真技术优化设计的MMIC芯片尺寸为2.5 mm×1.1 mm.芯片的在片测试结果表明,静态直流工作点为最大饱和电流的35％、漏压为5V的条件下,在9 ～15 GHz频率内,MMIC功率放大器小信号增益大于20 dB,1 dB压缩点输出功率不小于27 dBm,功率附加效率不小于35％,功率回退至19 dBm时三阶交调不大于-37 dBc.     

A novel temperature-dependent large-signal model of heterojunction bipolar transistor with a unified approach for self-heating and ambient temperature effects

A large-signal modeling of power heterojunction bipolar transistor (HBT) is demonstrated for an accurate simulation of self-heating and ambient temperature effects and nonlinear behaviors such as output power, gain expansion, intermodulation distortion (IMD), and adjacent channel power ratio (ACPR). The physical relationship between the device current and the rate of change in the built-in potential with respect to the device temperature has been utilized for a fully electrothermal modeling. To enable an immediate use for a circuit design, the model extraction was done for in-situ output-stage device from two-stage power amplifier (PA) circuit. In each parameter extraction step, measurement data obtained under a consistent environment, which are current-voltage (I-V) at various temperatures and small-signal S-parameters under various bias conditions, have been carefully examined and utilized to relate the meaning of each parameter to the physical principle of the device. Measurements and simulations are compared for the verification of the model under dc condition at various temperatures.     

A new empirical large-signal model for enhancement-mode AlGaAs/InGaAs pHEMTs

We propose a new large-signal model for AlGaAs/InGaAs pHEMTs, which can simulate the device microwave output power, non-linear characteristics at arbitrary bias points. This model includes a new drain current equation, which is extracted from its derivatives. In addition, gate-to-source and gate-to-drain capacitances are also characterized versus the function of gate and drain biases. The parameter extraction procedure is addressed for the enhancement-mode pHEMTs, which offers an attractive solution for handset power amplifier application because of its positive bias characteristics. Finally, measured and model-predicted dc I–V, S-parameters, and power performance have been compared.     

GaAs MESFET modeling and nonlinear CAD

Equivalent circuit modeling techniques are described for both small-signal and large-signal models of GaAs MESFETs. The use of large-signal model in an interactive program for amplifier analysis is shown. The computed load-pull results and IMD (intermodulation distortion) predictions are shown to be in good agreement with measured data at 10 GHz     

Characterization of cross modulation in multichannel amplifiers using a statistically based behavioral modeling technique

A statistically based modeling technique is developed for characterizing in-band and out-of-band intermodulation and cross-modulation distortions in multichannel amplifier environments. The model is based on a new multiple envelope memoryless behavioral model that captures the black-box characteristics of multichannel amplifiers. A power amplifier with a two code-division multiple-access channel signal is characterized experimentally and verifies the approach.     

Prediction of IMD in LDMOS transistor amplifiers using a new large-signal model

In this paper, the intermodulation distortion (IMD) behavior of LDMOS transistors is treated. First, an analysis is performed to explain measured IMD characteristics in different classes of operation. It is shown that the turn-on region plays an important role in explaining measured IMD behavior, which may also give a clue to the excellent linearity of LDMOS transistors. Thereafter, with this knowledge, a new empirical large-signal model with improved capability of predicting IMD in LDMOS amplifiers is presented. The model is verified against various measurements at low as well as high frequency in a class-AB power amplifier circuit.     

A new empirical large-signal model of Si LDMOSFETs for high-poweramplifier design

We propose a new empirical large-signal model of silicon laterally diffused MOSFETs for the design of various modes of high-power amplifiers. The new channel current model has only nine parameters that represent the unique operation principles of a MOSFET. In the channel current model, we include the thermal phenomena of high-power devices. To accurately characterize high-power devices, we incorporate the channel heating and heat-sink heating effects by providing two thermal capacitances and two thermal resistances. Nonlinear capacitances, including deep subthreshold and triode regions, as well as normal saturation regions, are extracted and modeled. For validation of our model, a 1.4-GHz 5-W amplifier is implemented, and the measured and simulated results match very well     

Large-signal characteristics of InP-based heterojunction bipolartransistors and optoelectronic cascode transimpedance amplifiers

A large-signal model for InP/InGaAs-based single HBTs incorporating soft-breakdown effects to the LIBRA Gummel-Poon (GP) model is developed and its validity is established from DC to microwave frequencies and over a wide range of input excitation levels. The large-signal characteristics of a cascode InP-based transimpedance optoelectronic preamplifier employing such devices are studied. Gain compression for the preamplifier was found to take place at an input power level of -20 dBm. Input power excitation varying from -65 to -5 dBm results in a degradation of the amplifier transimpedance gain of the order of 3 dBn. Experimental and theoretical characteristics are presented for the InP-based HBTs and transimpedance amplifier. Self-biasing effects are suggested as possible origin of the transimpedance variations with input power     

Generation of harmonic and intermodulation products in velocity modulation microwave devices

This paper deals with the large-signal analysis of velocity modulation microwave devices. Expressions are obtained for the harmonic and intermodulation current components of the velocity modulation devices excited by multisinusoidal microwave signals. The special case of relatively small input amplitudes is considered and the results are compared with previously published results.     

A vector intermodulation analyzer applied to behavioral modeling of nonlinear amplifiers with memory

A large signal vector intermodulation network analyzer with a dynamic range of 90 dB and phase resolution of better than 2/spl deg/ is reported. The analyzer is used in conjunction with a multislice behavioral model to characterize memory effects in three different RF power amplifiers: an MOSFET instrumentation amplifier, a multistage GaAs/silicon-based broadband microwave integrated-circuit amplifier, and an SiGe HBT monolithic-microwave integrated-circuit amplifier. The multislice behavioral model architecture builds on conventional single-tone AM-AM and AM-PM modeling extended to capture long-term memory effects that are characterized by asymmetric intermodulation distortion (IMD). Phase asymmetries of upper and lower IMD are captured. A systematic procedure for extracting the model is presented.     

An accurate nonlinear MOSFET model for intermodulation distortion analysis

A compact charge-conservative nonlinear equivalent circuit model for metal-oxide-semiconductor field-effect transistors is comprehensively verified in terms of its ability to predict intermodulation distortion. The model is valid for the dc, small-signal, and large-signal simulation of high frequency circuits over a wide range of bias conditions and is globally fully continuous. Simulations made using the model, following parameter extraction, are validated by comparisons with experimental data. Using harmonic balance methods, intermodulation distortion for weak and large-signal two-tone tests and more realistic wide-band code-division-multiple-access signals is successfully predicted for a range of bias points.     

Analysis of the large-signal characteristics of powerheterojunction bipolar transistors exhibiting self-heating effects

The large-signal microwave characteristics of AlGaAs/GaAs heterojunction bipolar transistors (HBTs) are modeled using the conventional Gummel-Poon-based bipolar junction transistor (BJT) model and extending it to include self-heating effects. The model is incorporated as a user-defined model in a commercial circuit simulator. The experimental microwave characteristics of HBTs are analyzed using the new model and harmonic balance techniques and the impact of self-heating effects on the device large-signal characteristics is investigated. Use of constant base voltage rather than constant current is more suitable for achieving maximum output power. Self-heating induced by RF drive is reduced under constant base current conditions. Increased thermal capacitance values result in gain enhancement at high power levels     

High-performance error amplifier for fast transient DC-DC converters

A new error amplifier is presented for fast transient response of dc-dc converters. The amplifier has low quiescent current to achieve high power conversion efficiency, but it can supply sufficient current during large-signal operation. Two comparators detect large-signal variations, and turn on extra current supplier if necessary. The amount of extra current is well controlled, so that the system stability can be guaranteed in various operating conditions. The simulation results show that the new error amplifier achieves significant improvement in transient response than the conventional one.     

RF electro-thermal modeling of LDMOSFETs for power-amplifier design

A new approach for the electro-thermal modeling of LDMOSFETs for power-amplifier design that bypasses pulsed-IVs and pulsed-RF measurements is presented in this paper. The existence of low-frequency dispersion in LDMOSFETs is demonstrated by comparing pulsed IVs with iso-thermal IVs. The modeling technique uses iso-thermal IV and microwave measurements to obtain the temperature dependence of small-signal parameters. Optimized tensor-product B-splines, which distribute knots to minimize fitting errors, are used to represent the small-signal parameters and extract the large-signal model as a function of voltages and temperature. The model is implemented on ADS and is verified by simulating and measuring the power harmonics and IMD large-signal performance of a power amplifier. The impact on the model of temperature-dependent drain and gate charge is investigated. The presented model is found to compare well and, in some cases, exceed the existing MET model for LDMOSFETs