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由于MEMS器件的应用日益频繁,其可靠性研究就显得十分重要。介绍了引起可靠性问题的原因。以微机械加速度计为例,指出了该加速度计的可靠性问题,以及对其可靠性测试研究的内容。 相似文献
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Reliability of vacuum packaged MEMS gyroscopes 总被引:11,自引:0,他引:11
The greatest challenge for the successful commercialization of MEMS (micro-electro-mechanical system) technology is proving its reliability. Of concern in particular are the reliability and long-term stability of wafer level vacuum packaged MEMS gyroscope sensors subjected to cyclic mechanical stresses at high frequencies. In this study, we carried out several reliability tests and investigated the failure mechanisms of the anodically bonded vacuum gyroscope sensors designed for commercial electronic products. Particularly we studied mechanical reliability issues such as fatigue, shock, and vibration. It was found that successful vacuum packaging could be achieved through the optimization of the bonding process by reducing leakage and the deposition of titanium coating for reducing out-gassing inside the cavity. The effects of the pre-baking process are also described in this study. The current design of the gyroscope structure is found to be safe from fatigue failure for the 1000 h of operation test. The MEMS gyroscope sensor survives the drop and vibration qualification tests for electronic products without any damage, indicating the robustness of the sensor. The reliability test results presented in this study demonstrate that the MEMS gyroscope sensor is very close to commercialization. 相似文献
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非硅MEMS惯性开关可靠性研究 总被引:1,自引:0,他引:1
非硅MEMS惯性开关具有体积小、成本低、可批量生产以及强度和导电性能较好的优点,但其可靠性问题制约了其应用领域。通过开展非硅MEMS惯性开关的可靠性实验(包括温度循环实验和随机振动实验),找出其主要失效模式为分层。通过对失效部位进行分析,并利用有限元方法分析器件上的应力分布,研究了相应的失效机理。研究结果表明:引发惯性开关分层失效的主要原因是层间产生疲劳效应,温度循环应力会使惯性开关各层间由于热膨胀系数失配而产生疲劳,而振动应力则直接加载在惯性开关上而使其产生疲劳;惯性开关中铬层与铜层之间最易发生失效,而分析表明该层间界面处热应力最大;经历温度循环实验和振动实验的惯性开关相较只经历一种实验的样本更容易失效,进一步说明了温度循环应力会使开关层间发生疲劳,而振动应力则会引起应力集中而加速分层失效。 相似文献
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MEMS惯性传感器可靠性试验方法研究 总被引:1,自引:0,他引:1
MEMS惯性传感器在军事与商业应用中的一个主要问题便是可靠性试验方法尚未标准化,因而目前绝大多数MEMS惯性传感器器件的可靠性试验依据的是傲电子的试验标准。但是,这些标准对于这类器件的适用性却受到许多机构的质疑,国外关于该问题的研究也已起步。汇总了MEMS惯性传感器器件的结构和工作原理等信息,重点总结了该类器件的典型环境失效机理,并将典型的环境载荷情况与失效机理进行了对比分析:从现有的微电子可靠性试验标准中选取了针对不同环境失效机理的试验方法。并对其适用性问题进行了讨论。 相似文献
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针对MEMS系统中硅通孔(TSV)的热可靠性,利用快速热处理技术(RTP)进行了温度影响的实验分析。通过有限元分析(FEA)方法得到不同温度热处理后TSV结构的变化趋势,利用RTP对实验样品进行了不同温度的热处理实验,使用扫描电子显微镜和光学轮廓仪表征了样品发生的变化。结果表明,热处理后TSV中Cu柱的凸起程度与表面粗糙度均随热处理温度的升高而增加,多次重复热处理与单次热处理的结果基本相同。该项研究为TSV应用于极端环境下MEMS小型化封装提供了一种解决方案。 相似文献
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以电容式MEMS加速度计的悬臂梁结构为研究对象,分析了振动环境下MEMS加速度计的典型失效模式及失效机理;在Miner理论的基础上,引入了应力-寿命曲线,建立了疲劳可靠性模型;在考虑强度退化前提下,基于应力强度干涉理论建立了塑性形变可靠性模型;运用蒙特卡洛法验证了两种可靠性模型的准确性,并分析了模型关键参数对可靠度的影响。结果显示,振动应力水平和材料的屈服强度对可靠度有显著的影响,减小应力幅值,增大屈服强度,可以提高MEMS加速度计的可靠性。 相似文献
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Swaminathan R. Bhaskaran H. Sandborn P.A. Subramanian G. Deeds M.A. Cochran K.R. 《Advanced Packaging, IEEE Transactions on》2003,26(2):141-151
The bond layer is often the weakest link in the reliability of chip packages in the integrated circuit (IC) industry. Micro-electrical-mechanical systems (MEMS) packages are no exception to this trend. This paper presents a nondestructive methodology for determining delamination in chip-to-chip bonded MEMS. Experimental methods are used to determine the adhesive layer strength in samples subjected to environmental testing, and the reliability of the bonding layer is investigated. A simulation is performed using inputs from scanning acoustic microscopy, and simulation model results are correlated with the experimental die shear measurements to establish the validity of the nondestructive methodology for determining adhesive layer strength. 相似文献
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研究了封装工艺对传感器可靠性的影响。分析和实验结果表明,机油压力传感器封装材料及各个工艺步骤都会影响传感器的性能和可靠性。贴片胶性能不能满足可靠性要求,会引起传感器信号漂移和高温不稳定性;引线键合强度不够,在工作中会断裂;硅油化学稳定和耐温性能不够好,会造成传感器高温输出信号不稳定,硅油中的空气和杂质会造成传感器零点输出偏大,使传感器的精度下降等。 相似文献
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MEMS机油压力传感器可靠性研究 总被引:2,自引:0,他引:2
研究了封装工艺对传感器可靠性的影响。分析和实验结果表明,机油压力传感器封装材料及各个工艺步骤都会影响传感器的性能和可靠性。贴片胶性能不能满足可靠性要求,会引起传感器信号漂移和高温不稳定性;引线键合强度不够,在工作中会断裂;硅油化学稳定和耐温性能不够好,会造成传感器高温输出信号不稳定,硅油中的空气和杂质会造成传感器零点输出偏大,使传感器的精度下降等。 相似文献
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A. Neels A. Dommann A. Schifferle O. Papes E. Mazza 《Microelectronics Reliability》2008,48(8-9):1245-1247
In single crystal silicon (SCSi) MST devices, crystalline imperfection is recognized to favor failure. Defects are introduced by DRIE etching which is commonly used in SCSi structuring. However, thermal annealing improves the crystal quality. High resolution X-ray diffraction methods such as the rocking curve method and reciprocal space mapping can monitor crystalline imperfection in SCSi devices. A DRIE etched SCSi structure was built to study the crystal strain profile in dependence of the SCSi deformation by applying a mechanical force. Our investigations also include the numerical simulation of deformations. 相似文献
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为了评估采用UV-LIGA技术制作的多层MEMS惯性开关的温度可靠性,进行了可靠性强化试验。介绍了开关的结构特征、工作原理和制作工艺。建立了试验系统,对开关进行温度循环和振动冲击试验。利用扫描电子显微镜观察开关失效模式,并利用公式进行热应力分析。试验结果表明,开关主要失效模式为位错和分层。开关热应力分析结果表明,种子层为开关薄弱位置。结合可靠性强化实验和热应力分析结果,从结构设计和制作工艺角度提出了可靠性强化方法。该研究为应用于极限温度环境下的多层UV-LIGA惯性器件的设计与制作提供了试验依据。 相似文献
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Simone Lee Ramesh Ramadoss Michael Buck V. M. Bright K. C. Gupta Y. C. Lee 《Microelectronics Reliability》2004,44(2):422-250
In this paper, reliability results of a novel type of electrostatically actuated RF MEMS capacitive switches developed by our group are discussed. The test setup used for reliability testing consists of the capacitive MEMS switch under test connected in series with a resistor. A specified actuation waveform is applied to the switch and the voltage waveform across the resistor is continuously recorded. The recorded waveform aids in identifying short, open, or stiction failure of the switch. Further, the waveform recorded can be analyzed to study the degradation, reliability, and lifetime characteristics of the switch. The proposed method has been used to study the reliability, failure, and hold-down test characteristics of flexible circuit-based RF MEMS switches. Reliability testing up to 75 million operations has been carried out for flexible circuit-based RF MEMS switches. 相似文献