刍议数字电子电路的调试方法

数字电子电路的调试指的是对数字电路进行检测的工作,测验该电路的逻辑功能是否能够达到预先对电路的设计效果。想要使数字电子电路能够符合事先设计要求来进行准确工作,就应当对其进行一定的调试与调整处理。数字电子电路的调试与常规电子电路的调整存在着一定的相同之处,当然也存在有差异的地方,但同样具备调整常规电子电路的思想与思维方式,也就是“静态先动态后”的原则。倘若所调试的数字电子电路中具备多个模块单位,那么就应当先对子系统或者单位模块进行调试,接着再调试多个单元模块的电子电路,最后再来调试整个系统。     

电子电路的调试技巧

电子设备在使用中,电路的调试占有重要地位。电子电路安装完成后,必须通过调试,使电路能够满足规定的各项技术指标要求。本文就常用电子电路调试原则、调试过程中的技巧、调试步骤及调试注意事项做了较为详尽的叙述。     

电子电路的调试技巧

电子设备在使用中,电路的调试占有重要地位。电子电路安装完成后,必须通过调试,使电路能够满足规定的各项技术指标要求。本文就常用电子电路调试原则、调试过程中的技巧、调试步骤及调试注意事项做了较为详尽的叙述。     

电子电路设计常用调试方法与步骤新探

电子电路调试是电路设计中的重中之重,可提升电子电路的实效性.为实现电子电路设计质量的优化,文中讨论了基于电子电路设计基本原则对其常用调试方法和调试步骤,可以优化电子电路设计.     

数字电子电路的干扰及其抑制方法

分析了数字电路中常见的干扰的类型,即内部干扰、外部干扰、电源干扰等,介绍了相关的抑制方法.     

电子电路的调试与故障处理探析

对电子电流进行调试,并且针对其故障进行分析处理对于电子电路理论设计的实践检验,让电子电路能够更加完善,性能更佳、使用更安全.电子电路的调试与故障处理给电子技术在生产生活与实践应用中发挥了十分重大的作用,并且给拓展了电子电路应用范围.现本文主要针对电子电路的调试与故障处理进行研究,以期可以为电子电路的发展提供借鉴与参考.     

常用电子电路的设计及调试探讨

在进行电子电路的设计时,要对设计任务清晰明了,进而选择合适的设计方案。设计方案要包括各种小部件的设定和参数选择,最、终用合适的方式连接各器件组成一个完整并符合需求的电路图。在完成电子电路的设计工作后,还有一项重要的环节不能忽视,那就是调试。在调试过程中,要发现电路存在的问题,通过不断改善最终使电路各项性能都合乎标准,使电路设计更加完善同时符合实际要求。     

常用电子电路的设计及调试之我见

对于电子电路的设计和调试,应该坚持理论实践相结合的原则,确保电路设计的科学性,并且经过全面的调试确保电路更加完善。对于电子电路的各种器件来说,如果电路设计质量较差或者存在问题,就会导致电路安装完成后效果不尽如人意,并且在工作中也会出现各种误差,例如电阻误差、参数误差等,因此在电路设计和安装完成后必须进行调试,解决出现的问题,改正存在的缺陷,才能确保电子器件满足使用需求。     

电子产品的硬件测试技术研究

电子硬件测试技术是电子产品从研发到生产的必经的一个阶段,也是决定一件电子产品质量的重要环节,所以如果将电子产品的硬件测试技术发展的更加完善,更加专业也是很多电子产品生产企业追求的目标。本文从这一目标出发详细介绍了电子产品的硬件测试技术以及发展状况。     

A survey on fault injection methods of digital integrated circuits

One of the most popular methods for reliability assessment of digital circuits is Fault Injection (FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we present a survey of FI techniques as well as classifying these techniques considering different aspects and criteria to bring out their similarities and differences. The goal of this paper is to help the researchers and reliable circuit designers in gaining insights into the state-of-art in FI techniques and motivate them to further improve these techniques for more efficient reliability evaluation of digital circuit designs of tomorrow.     

基于OrCAD电路设计软件的高频电子线路仿真分析

本文基于OrCAD/Pspice电子线路计算机辅助分析设计软件以实现高频电子线路的综合电路分析仿真为目的,针对回路使用的信号频率比较高,电路实现的功能多、结构复杂,造成OrCAD设计软件在仿真过程时运算量大,电路调试过程变得复杂、电路的元器件参量优化难度大.通过采用复杂电路的仿真调试关联优化的方法对变容二极管调频与功率放大及发射电路的仿真过程进行分析,仿真效果表明,采用关联优化方法能有效提高优化设计效率。     

A hierarchical test generation methodology for digital circuits

A new hierarchical modeling and test generation technique for digital circuits is presented. First, a high-level circuit model and a bus fault model are introduced—these generalize the classical gate-level circuit model and the single-stuck-line (SSL) fault model. Faults are represented by vectors allowing many faults to be implicitly tested in parallel. This is illustrated in detail for the special case of array circuits using a new high-level representation, called the modified pseudo-sequential model, which allows simultaneous test generation for faults on individual lines of a multiline bus. A test generation algorithm called VPODEM is then developed to generate tests for bus faults in high-level models of arbitrary combinational circuits. VPODEM reduces to standard PODEM if gate-level circuit and fault models are used. This method can be used to generate tests for general circuits in a hierarchical fashion, with both high- and low-level fault types, yielding 100 percent SSL fault coverage with significantly fewer test patterns and less test generation effort than conventional one-level approaches. Experimental results are presented for representative circuits to compare VPODEM to standard PODEM and to random test generation techniques, demonstrating the advantages of the proposed hierarchical approach.     

典型电力电子电路仿真的研究

电力电子技术的关键知识点很多,电路结构变换复杂,但在应用中,典型的电路最为常见,分析好典型电路也就掌握了电力电子技术的核心内容。文中给出了设计思路和仿真方法,详细分析三个经典的电力电子电路,将电路中关键的变量仿真出来,并最终给出了实际的仿真效果图。     

Selecting measurements to test the functional behavior of analog circuits

This paper presents a method for functional testing of analog circuits, on the basis of circuit sensitivities. The approach selects the minimum number of measurements that allows a precise prediction of a circuit's functional behavior. A criterion is applied to this predicted behavior to determine if the circuit functions according to specifications. The presented method combines a matrix decomposition technique (the singular value decomposition) with an iterative algorithm to select measurements. The number of measurements is determined on the basis of the desired precision of the response prediction and the influence of random measurement errors. Examples demonstrate that the resulting method tests the functional circuit behavior with a high precision, even in the presence of large measurement errors.     

Using modern RF tools to detect chaotic behaviour of electronic circuits and systems

In this paper, a new approach in identifying chaotic behaviour of nonlinear circuits is presented. This approach could be very useful to circuit designers, whether they pursue a chaotic behaviour or not. Simulation tools used for radio-frequency circuit design (Cadence SpectreRF), initially developed to characterise harmonic oscillators, are now utilised to detect chaotic behaviour, as well as routes to chaotic mode of operation. Specifically, Periodic Steady State Convergence Norm is used for the first time for chaos detection in circuits. The advantages of this method (especially in terms of simulation time) are presented, together with an example of detection of chaotic route to chaos in the case of a chaotic-operating Colpitts oscillator.     

Ring-like testing of digital circuits

Here we propose a new approach to the testing of digital devices, which can potentially save diagnostic hardware. An example is given for testing combinational devices. Estimates are given for reliability and hardware complexity, and an algorithm for designing operability tests is described.     

Electrical characterization of analogue and RF integrated circuits by thermal measurements

This paper presents a novel technique for measuring the electrical characteristics of analogue circuits, based on measuring the temperature at the silicon surface close to the circuit under test. As a detailed example, the paper analyses how the gain of an amplifier can be observed through temperature measurements. Experimental results validate the feasibility of the technique. Simulated results show how this technique can be used to measure the bandwidth and central frequency of a 2.4 GHz low noise amplifier (LNA) designed in a 0.35 μm standard CMOS technology.     

伪随机测试生成在混合电路参数测试中的应用

混合信号电路在通信、多媒体等领域获得越来越广泛的应用。然而,测试也变得更复杂。传统上对模拟电路的测试采用的是直接功能测试,即直接测量电路的性能参数Z。采用该测试方法,其缺点是测试时间长、测试设备昂贵、且精度差。本文针对这一问题进行研究,详细讨论了利用伪随机技术进行混合信号电路测试的方法。