浅谈铜含量对热风无铅焊料整平可焊性的影响

为适应欧盟、美国和我国对铅等重金属有毒物质使用的限制,电子组件中传统的有铅热风焊料整平PCB已经逐渐向无铅热风焊料整平PCB转化,而在热风焊料整平工艺中锡槽中铜含量的管控对于可焊性的好坏具有决定性作用。本文重点介绍了热风无铅焊料整平工艺中铜离子的提取和控制方法,解决热风无铅焊料整平因铜含量过高导致的可焊性不良之问题。     

无铅锡焊技术与无铅免清洗锡膏

本文主要论述无铅锡焊技术基础,无铅焊料的必要条件与流动焊工艺技术,无铅锡膏技术与再流焊工艺技术、无铅免清洗锡膏的性能特点、低银无铅锡膏与低温锡饿铜无铅锡膏等。     

在铅焊料的标准流程中用无铅元件

随着欧洲的RoHS和WEEE指令已于2006年7月1日开始执行,许多元件供应商面临着使其产品符合无铅环境的挑战。两个指令都要解决将铅从元件中去除的问题。半导体公司必须选择高性价比、与含铅焊料逆向兼容,并与无铅焊料前向兼容的无铅镀层策略。逆向兼容表示无铅元件能够用锡铅（SnPb）焊料回流工艺安放在PCB上。前向兼容表示目前的锡铅工艺能够在面板组装中,与无铅焊料一起使用。     

无铅的锡-银-铜焊料的发展——第二代低银含量SnAgCu体系

概要地评述了无铅焊料中低银含量的锡-银-铜（SnAgCu）体系的发展方向。由于高银含量的锡-银-铜（SnAgCu）体系存在着成本高和耐跌落（摔）性差的问题,它将被低银含量的锡-银-铜（SnAgCu）体系所取代。在低银含量的锡-银-铜（SnAgCu）体系中加入某些微量添加剂可以达到锡-铅焊料的性能水平。     

助焊剂腐蚀失效案例分析

随着国内外环保要求的不断提高,电子产品正全速向低毒、低碳方向前进,由此也引发产品制造业向无铅、无卤方向快速发展。由于无铅焊料的焊接温度范围受到PCB和元器件耐温要求的限制,特别是无铅焊料本身的润湿性较锡铅焊料差,无铅焊接工艺的难度大大得提高,由此导致大量的焊接工艺缺陷。为了客服无铅工艺焊接能力较差的问题,人们纷纷开发了更加适合无铅焊接的焊接辅助材料,其中新型无铅助焊剂在提高无铅焊接能力上起到了很大的作用。     

低银无铅焊料润湿及可靠性能研究

利用润湿测量法研究了低银无铅焊料SAC0307、SAC0507和SAC0807的润湿性能,发现上述低银焊料润湿性能几乎相同.通过波峰焊接实验鉴定了其溶解铜焊盘性能,发现所做短时间溶铜实验中上述低银焊料的低银焊料的溶铜速度几乎相同.温度循环实验后检测了金属间化合物生长及裂纹发生情况,确定低银无铅焊料SAC0807裂纹萌生率最低.所作实验研究中皆采用共晶锡银焊料SAC305作为参照焊料.     

无铅表面组装工艺试验

<正> 1 前言 与标准的锡/铅焊料相比,使用无铅焊料组装印制板需要更高的工艺温度,该问题在电子工业从含铅焊料向无铅焊料转变时就已成为了人们关注的焦点。由于无铅焊料的熔点高、浸润性差,回流焊接需要的温度比当前使用的含铅焊料的高30～40℃。因此,元件制造商、印制板制造商、组装商和设备制造商大都会受到影响。     

焊料应满足无铅和效益双重要求

对于电子组装制造商而言，无铅电子组装技术主要针对印刷电路板级组装，即使用的单元材料达到无铅的标准，同时使用符合无铅规范材料的设备和工艺以及最终产品达到必需的可靠性要求。其中，在印刷电路板级细装过程的浸焊、波峰焊及回流焊等焊接工艺中，锡丝、锡条、锡膏是最广泛使用的电子焊接焊料，因此拥有广阔的应用市场。对于这类焊接材料，焊料合金成分对于产品的价格、品质性能和效率起着决定性的影响。因此，电子产品制造商迫切需要一种在成本、质量和效率三者之间取得平衡的无铅焊料满足市场对于无铅和效益的双重要求。     

无铅组装技术浅析

从无铅组装的角度出发,详细分析了无铅组装技术涉及的无铅焊料和导电胶组装技术,阐述了传统的锡铅焊接与无铅焊接的工艺差异,提出了该技术要推广应用所面临的技术难点。     

无铅转化给波峰焊工艺所带来的问题研究

无铅焊料的应用使得波峰焊设备问题更加突出,其中主要的问题是设备的腐蚀及材料的寿命.无铅焊料和助焊剂的特性决定了无铅波峰焊设备在结构和材料选用上有很大不同.无铅钎料的成分配比不同于有铅钎料,因此在无铅钎焊时,其工艺流程、工艺参数也有所改变.从焊接温度、波峰高度、浸锡时间、冷却系统、传输系统等方面分析了无铅波峰焊的工艺要求...     

Contact resistance and fretting corrosion of lead-free alloy coated electrical contacts

As lead-free solders replace tin-lead solders in soldering, it is also expected that lead-free solder alloys will be used as contact finish materials for electrical contacts. In this study, the contact resistance and fretting corrosion of tin-silver-copper and tin-copper coatings were investigated and compared with tin-lead eutectic coating. The contact resistance before and after different aging conditions, including mixed flowing gas, steam, and dry heat aging, was examined. Tin-silver-copper and tin-lead alloy coatings have similar performance on contact resistance versus contact normal force after dry heat aging and MFG aging. Severe degradation was found on tin-silver-copper coatings after steam aging. Higher contact force is suggested in the application of tin-silver-copper solder alloy coating than for eutectic tin-lead alloy coatings. Fretting corrosion on tin-silver-copper and tin-copper lead-free alloy coatings was studied and compared with tin-lead coating. Fretting corrosion experiments were conducted and compared at different temperatures and normal forces. In general, tin-silver-copper and tin-copper alloys show equal or better fretting corrosion resistance than tin-lead eutectic alloy at the experimental conditions in this study.     

Get the lead out! [lead free solder]

Concern over lead's toxicity launched a quest for alternatives to the tin-lead solder common in printed-circuit board manufacture. The options for no-lead solders rely on tin as the base metal with smaller amounts of other metals, such as antimony, bismuth, copper, indium, silver, or zinc, added to enhance performance. Tin, which is considered to be one of the least toxic metals, will most probably endure as the base metal since it is relatively inexpensive, sufficiently available, and possesses desirable physical properties. In considering alternatives, the cost and availability of metals also come into play. Indeed, the limited availability and high costs of indium, bismuth, and silver-based alloy systems will likely prevent their widespread use. In 1997, a tin-copper alloy was used to assemble a desktop telephone, the first such product made with lead-free solder     

The current status of lead-free solder alloys

The issue of lead-free soldering has gripped the electronics assembly industry as of late. What was once something that appeared to be too far away to worry about now has become a pressing reality. In order to avoid confusion, panic, and a misunderstanding of how the issue of lead-free soldering will affect the industry and individuals, it is necessary for all suppliers and assemblers to become educated in this matter. There currently exist several lead-free alloys deemed "acceptable" for various applications. However, it is important to note that many differences occur from alloy to alloy, and much research and background information is required before the successful implementation of a lead-free solder. This paper shall provide a comparison of the tin-silver, tin-copper, and tin-silver-copper alloys with each other and the tin-lead alloy, and well as process advice for the implementation of these solders and an overview of where the industry stands on the issue today. Highlighted in this is comparative test data of the aforementioned alloys, along with a discussion of other "alternative" alloys     

黑色高光油墨的工艺改进

由于电子产品使用环境的变化以及电子装配厂家对装配的要求，黑色油墨的使用越来越多。由于黑色油墨本身的一些特性，众多PCB厂家在面对黑色油墨的生产过程中，总面临着许多问题。黑色哑光油墨的应用相对较多，而关于黑色高光油墨的研究却鲜见报道。而且，在生产过程中黑色高光油墨更容易出现问题。文章就黑色高光油墨的制作工艺及难点控制进行了改进，有效解决了生产中出现的油墨起皱及压痕。     

钎料量对通孔再流焊焊点强度的影响规律

以波峰焊工艺焊点强度为标准,研究在不同钎料量下通孔再流焊焊点的强度.同时考虑了印制电路板厚度对焊点强度的影响.结果发现当钎料量超过临界值时,通孔再流焊点的强度可以和波峰焊焊点强度相比拟.观察焊点的外观形态及内部钎料填充情况,找出它对焊点强度的影响规律,为焊点质量目检提供了参考标准.     

焊膏回流性能动态测试法及其应用

通过体视显微镜和CCD等视频设备录制、焊膏回流动态测试方法,观察焊膏回流的整个过程,有助于分析焊膏回流过程中出现的问题,弥补了目前焊膏–锡珠试验只能观察最终结果,而不能对中间过程进行评价的缺点。利用该方法研究了保温时间和焊膏活性对焊膏回流性能的影响,对焊膏的收球性能进行了评价。结果表明:焊膏回流的保温时间有一定限制,超过限制,产生缺陷的机会大大增加;对于活性较强的焊膏,可以通过增加焊膏的黏性,减少锡珠和立碑以及元件歪斜倾向;通过对不同焊膏的回流过程进行对比,提出了焊膏收球性能良好的参考标准。     

倒装焊中复合SnPb焊点形态模拟

本文给出了倒装焊(flip-chip)焊点形态的能量控制方程,采用Surface Evolver软件模拟了倒装焊复合SnPb焊点(高Pb焊料凸点,共晶SnPb焊料焊点)的三维形态.利用焊点形态模拟的数据,分析了芯片和基板之间SnPb焊点的高度与焊点设计和焊接工艺参数的关系.研究表明:共晶SnPb焊料量存在临界值,当共晶SnPb焊料量小于临界值时,焊点的高度等于芯片上高Pb焊料凸点的半径值;当共晶SnPb焊料量大于临界值时,焊点的高度随共晶SnPb焊料量的增加而增加.另外,采用无量纲的形式给出了焊点高度与共晶焊料量、焊盘尺寸、芯片凸点的尺寸,芯片重量之间的关系模型,研究结果对倒装焊焊点形态的控制、工艺参数的优化和提高焊点可靠性具有指导意义.     

Experimental Wetting Dynamics Study of Eutectic and Lead-Free Solders With Various Fluxes, Isothermal Conditions, and Bond Pad Metallizations

Demands on solder bump interconnects have increased in modern electronics. This is characterized by high density, small size, and fine-pitch devices. In solder bump interconnects, solder wetting onto bond pads is the key factor that determines the interconnect process yield and the solder joint reliability. Solder wetting involves various physical phenomena such as surface tension imbalance, viscous dissipation, molecular kinetic motion, chemical reaction, and diffusion. In this paper, an experimental study on solder wetting dynamics will be presented. The effects of solder reflow process parameters and bonding materials will be discussed, as they relate to the physics of solder wetting and ultimately the interconnect process yield and solder joint reliability. The experimental setup consists of a high-speed image acquisition system and a temperature chamber which were used to measure the time dependent behavior of molten solder spheres onto bond pads under an isothermal condition. The solder materials investigated were eutectic tin–lead solder and lead-free 95.5Sn–4.0Ag–0.5Cu solder. The wetting dynamics of the solder materials were investigated on pure Cu bond pads and Cu/Ni/Au bond pads, with several different flux systems, at different environmental temperatures and with various solder sphere sizes. The experimental observations indicate that the wetting dynamics clearly depend on temperature, solder materials, and substrate metallization but do not depend significantly on the flux system or the solder sphere size.     

片式电阻混合焊点热循环负载可靠性研究

对在不同工艺参数下形成的、并且经过不同周数热循环负载的片式电阻混合焊点、有铅焊点和无铅焊点进行了外观检测和剪切测试。结果显示,在不同工艺参数下形成的混合焊点的剪切力,随热循环周数的变化趋势有所不同,但是在保证片式电阻焊端和焊料充分熔融的情况下,部分混合焊点的平均剪切力比有铅焊点高,热循环1 000周后,为9.1～11.1 N。     

无铅焊料的选择与对策（未完待续）

通过大量的数据信息分析了各研究机构在无铅焊料方面的研究成果，在目前流行使用的无铅焊料的基础上，进一步研究并比较了其中的Sn-Cu系列与具有专利限制的SnAgCu系列焊料在消费类电子产品组装的波峰焊工艺中使用的可靠性，同时研究并比较Sn-Ag系列焊料与SnAgCu系列焊料在回流焊工艺使用的情况。结果表明，Sn-Cu共晶焊料在消费类电子产品组装的波峰焊工艺中完全可以取代Sn-Ag-Cu系列焊料，同时满足使用要求；而同样技术成熟的Sn-Ag共晶焊料也完全可以取代SnAgCu系列焊料在回流焊工艺使用，焊点的可靠性与成本可以媲美SnAgCu焊料。而且该二元合金在使用维护以及回收利用方面具有相当的优势。