共查询到18条相似文献,搜索用时 218 毫秒
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扫描探针显微镜技术的出现开辟生命科学研究的新纪元并逐步发展成为在纳米尺度研究细胞结构与功能的一类新型的显微镜技术。扫描离子电导显微镜技术就是新近发展起来的这一扫描探针显微镜技术家族中的一员,可被用来在生理条件下、高分辨率及非接触地研究活细胞的表面形貌,从而帮助人们深入研究细胞微观结构与功能的关系。本文简要介绍扫描离子电导显微镜技术的基本原理,并结合国外研究现状综述该技术在纳米生物学研究中的应用。 相似文献
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近场扫描光学显微镜和光子扫描隧道显微镜 总被引:1,自引:0,他引:1
近场扫描光学显微镜和光子扫描隧道显微镜*王佳(清华大学精密仪器系北京100084)0引言自从80年代初扫描隧道显微镜STM发明以来,扫描探针显微术SPM已经发展成具有十几种类型的系列技术。其中引人注目的是以近场扫描光学显微镜NSOM和光子扫描隧道显微... 相似文献
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介绍了一种三维纳米级微定位系统。该系统可用于各种扫描探针显微镜(SPM)探针和样品的微定位,探针可在样品表面10mm×10mm区域内定位,重复定位精度小于100nm,在高度方向,探针可 顺利地进入样品表面10nm区域内。 相似文献
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Wirtz T Fleming Y Gerard M Gysin U Glatzel T Meyer E Wegmann U Maier U Odriozola AH Uehli D 《The Review of scientific instruments》2012,83(6):063702
State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 μm in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program "SARINA," which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach. 相似文献
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The utility of wavelet transforms for analysis of scanning probe images is investigated. Simulated scanning probe images are analyzed using wavelet transforms and compared to a parallel analysis using more conventional Fourier transform techniques. The wavelet method introduced in this paper is particularly useful as an image recognition algorithm to enhance nanoscale objects of a specific scale that may be present in scanning probe images. In its present form, the applied wavelet is optimal for detecting objects with rotational symmetry. The wavelet scheme is applied to the analysis of scanning probe data to better illustrate the advantages that this new analysis tool offers. The wavelet algorithm developed for analysis of scanning probe microscope (SPM) images has been incorporated into the WSxM software which is a versatile freeware SPM analysis package. 相似文献
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This is a comprehensive review of the combination of scanning probe microscopy (SPM) with various optical spectroscopies, with a particular focus on Raman spectroscopy. Efforts to combine SPM with optical spectroscopy will be described, and the technical difficulties encountered will be examined. These efforts have so far focused mainly on the development of tip-enhanced Raman spectroscopy, a powerful technique to detect and image chemical signatures with single molecule sensitivity, which will be reviewed. Beyond tip-enhanced Raman spectroscopy and/or topography measurements, combinations of SPM with optical spectroscopy have a great potential in the characterization of structure and quantitative measurements of physical properties, such as mechanical, optical, or electrical properties, in delicate biological samples and nanomaterials. The different approaches to improve the spatial resolution, the chemical sensitivity, and the accuracy of physical properties measurements will be discussed. Applications of such combinations for the characterization of structure, defects, and physical properties in biology and materials science will be reviewed. Due to the versatility of SPM probes for the manipulation and characterization of small and/or delicate samples, this review will mainly focus on the apertureless techniques based on SPM probes. 相似文献
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选择性激光烧结新型扫描方式的研究及实现 总被引:25,自引:3,他引:25
选择性激光烧结(Selective laser sintering,SLS)快速成形技术是近10年来发展起来的一种先进制造技术,采用此项技术可以显著地缩短产品投放市场的周期,降低成本,提高产品质量,增强企业的竞争能力。而扫描方式是SLS成形过程中的一项关键技术,在分析了现有扫描方式及其对SLS制件精度、强度以及成形速度影响的基础上,指出了现有扫描方式的缺陷。为了克服这种缺陷,特提出并实现了一种新的分区变向扫描方式及其分区算法,它通过将扫描线段进行分组,以避开截面内孔和凹槽。这种新的分区变向扫描方式及其算法已经成功地应用到华中科技大学开发的HRPS系列SLS系统中。实际应用表明:这种新型扫描方式能大幅度地提高烧结成形效率和减小烧结体的翘曲变形量。 相似文献
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Shen Weidian Smith Stanley M. Ye Huijuan Jones Frank Jacobs Patricia B. 《Tribology Letters》1998,5(1):75-79
We have developed a new technique of using the scanning probe microscope to measure the marring resistance that is a very
desirable characteristic of clearcoats used in the automotive industry. With its high resolution, SPM can also be used to
investigate the marring mechanism, and provide useful information in development of highly mar resistant coatings. In this
paper, we will report a real time observation of viscoelastic creep which can result in a partial or complete healing of a
marred surface. Based on the experimental data, a preliminary analysis of the recovery rate, recoverable deformation, and
permanent deformation is presented.
This revised version was published online in June 2006 with corrections to the Cover Date. 相似文献
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Dietz C Röper S Scherdel S Bernstein A Rehse N Magerle R 《The Review of scientific instruments》2007,78(5):053703
An approach for automated nanotomography, a layer-by-layer imaging technique based on scanning probe microscopy (SPM), is presented. Stepwise etching and imaging is done in situ in a liquid cell of an SPM. The flow of etching and rinsing solutions after each etching step is controlled with solenoid valves which allow for an automated measuring protocol. The thermal drift and the drift of the piezo scanner is corrected by applying offsets calculated from the cross correlation coefficients between successive images. As an example, we have imaged human bone with approximately 10 nm resolution using tapping mode SPM and successive etching with hydrochloric acid. 相似文献
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Esch F Dri C Spessot A Africh C Cautero G Giuressi D Sergo R Tommasini R Comelli G 《The Review of scientific instruments》2011,82(5):053702
We present the design and the performance of the FAST (Fast Acquisition of SPM Timeseries) module, an add-on instrument that can drive commercial scanning probe microscopes (SPM) at and beyond video rate image frequencies. In the design of this module, we adopted and integrated several technical solutions previously proposed by different groups in order to overcome the problems encountered when driving SPMs at high scanning frequencies. The fast probe motion control and signal acquisition are implemented in a way that is totally transparent to the existing control electronics, allowing the user to switch immediately and seamlessly to the fast scanning mode when imaging in the conventional slow mode. The unit provides a completely non-invasive, fast scanning upgrade to common SPM instruments that are not specifically designed for high speed scanning. To test its performance, we used this module to drive a commercial scanning tunneling microscope (STM) system in a quasi-constant height mode to frame rates of 100 Hz and above, demonstrating extremely stable and high resolution imaging capabilities. The module is extremely versatile and its application is not limited to STM setups but can, in principle, be generalized to any scanning probe instrument. 相似文献
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Mechanisms for controlled approach of a probe tip toward the sample surface are essential in high resolution imaging by scanning probe microscopy (SPM). This work describes the development and performance of an inertial sliding drive capable of translating a relatively large mass (25 g) at up to 1 mms over 1 cm with step sizes of 10-250 nm in ambient conditions using various wave forms as measured by fiber optic interferometry. The drive functions independent of orientation with a threshold voltage of less than 15 V using a single drive signal. Use of piezotube actuators in a radially symmetric arrangement provides guided motion and minimizes differential thermal expansion between critical components. Controlled translation of the entire scanning component in both ambient and electrochemical scanning tunneling microscopy has been routinely achieved with no evidence of tip crash. This device has been specifically designed for use in in situ SPM applications where stability of the sample and that of the liquid environment are paramount. 相似文献