扫描离子电导显微镜技术及其在纳米生物学研究中的应用

扫描探针显微镜技术的出现开辟生命科学研究的新纪元并逐步发展成为在纳米尺度研究细胞结构与功能的一类新型的显微镜技术。扫描离子电导显微镜技术就是新近发展起来的这一扫描探针显微镜技术家族中的一员,可被用来在生理条件下、高分辨率及非接触地研究活细胞的表面形貌,从而帮助人们深入研究细胞微观结构与功能的关系。本文简要介绍扫描离子电导显微镜技术的基本原理,并结合国外研究现状综述该技术在纳米生物学研究中的应用。     

近场扫描光学显微镜和光子扫描隧道显微镜

近场扫描光学显微镜和光子扫描隧道显微镜＊王佳（清华大学精密仪器系北京１０００８４）０引言自从８０年代初扫描隧道显微镜ＳＴＭ发明以来，扫描探针显微术ＳＰＭ已经发展成具有十几种类型的系列技术。其中引人注目的是以近场扫描光学显微镜ＮＳＯＭ和光子扫描隧道显微...     

分子力显微镜

1引言Binnis和Rohrer发明的扫描隧道显微镜（STM）能在实空间观察到固体表面的一个一个原子。这是一种划时代的显微镜，广泛用于各个领域，已充分证实其有用性。STM的原理非常简单，即是在导电性试样和尖锐的金属探针之间加上电压，当探针和试样表面之间的距离接近至Inm左右时，在探针和试样表面之间有隧道电流流过。这一隧道电流和探针至试样表面的距离之间有指数函数关系。若在测量隧道电流的同时使探针在试样表面扫描，则可测得有关试样表面凹凸的信息。若用在三个轴向伸缩的压电元件，使探针扫描，则可以原子级的精度控制探针相对于…     

扫描探针显微镜在粗糙度、纳米尺寸、表面形貌观测方面的应用

扫描探针显微镜是近十几年来在表面特征表面形貌观测方面最重大的进展之一，是纳米测量学的基本工具，本文叙述了扫描探针显微镜的工作原理、检测模式及在观察检测纳米级的粗糙度、微小尺寸、表面形貌方面的特点和方法，比较了原子力显微镜、常规的表面轮廓仪、干涉显微镜、扫描电子显微镜在表面特性、表面形貌观测方面的性能，着重介绍了扫描探针显微镜在这方面的应用和存在的问题。     

SPM三维纳米级微定位的研究

介绍了一种三维纳米级微定位系统。该系统可用于各种扫描探针显微镜（ＳＰＭ）探针和样品的微定位,探针可在样品表面１０ｍｍ×１０ｍｍ区域内定位,重复定位精度小于１００ｎｍ,在高度方向,探针可 顺利地进入样品表面１０ｎｍ区域内。     

扫描探针显微镜在纳米科技中的应用

本文在介绍了扫描探针显微镜的发展和有关纳米科技知识的基础上，论述了扫描显微镜在纳米科技中的应用。     

大气状态下STM电场加工机理分析

扫描探针显微镜（SPM）家族的拓展始于扫描隧道显微镜（STM）,它的发明使人类能够真正获得物质表面在原子尺度上的局域电子结构,并可揭示与之对应的原子结构,基于SPM的纳米加工技术同样是从STM开始的,本文主要介绍大气状态下STM在Au和Ti表面的电场加工结果,并对其作用机理进行较深入分析,确定表面结构的生成为准接触和电场诱导氧化的综合作用。     

具有宽测量范围的扫描探针见微镜研究

介绍了具有宽测量范围（１４０×１４０μｍ２）的高灵敏度扫描探针显微镜（ＳＰＭ）。仅用了６个需加工的零件，构造出了直接对１３０ｍｍ的磁盘、光盘表面纳诺形貌和集成电路芯片光刻质且检查分析的多模式测量仪器。通过更换测头，可以在扫描隧道显微镜（ＳＴＭ）、原子力显微镜（ＡＦＭ）、磁力显微镜（ＭＰＭ）与静电力显微镜（ＥＦＭ）模式下工作。本文给出了部份试验结果，如高定向石墨的原子图像、光栅和超精密磨削试件表面的纳米级形貌图。     

大范围扫描的高精度三维数显镜体的设计

介绍了一种新型扫描探针显微镜镜体的设计,该镜体的扫描工作平台可以在3个方向以每步10nm的精度移动,它突破了扫描探针显微镜中压电陶瓷对扫描范围的限制,采用非压电陶瓷机械传动装置实现了大范围扫描.该设计采用逐级定位扫描放大技术将纳米测量与纳米加工范围延伸到25mm×25mm,甚至更大,镜体设计已经获得国家实用新型专利(ZL02221502.6).将该镜体应用在STM和AFM上,实现了对样品的大范围扫描检测,并保证了测量的高精度.     

开放式多功能扫描探针显微镜系统

开放式多功能扫描探针显微镜、集成扫描隧道显微镜、原子力显微镜、横向力显微镜和静电力显微镜．具有接触、半接触和非接触工作模式，可进行作用力、电流、电位、光能量等参数的高度局域综合测量,具有极高的开放性和可扩展性，支持用户进行二次开发。     

Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 μm in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program "SARINA," which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.     

Analysis of scanning probe microscope images using wavelets

The utility of wavelet transforms for analysis of scanning probe images is investigated. Simulated scanning probe images are analyzed using wavelet transforms and compared to a parallel analysis using more conventional Fourier transform techniques. The wavelet method introduced in this paper is particularly useful as an image recognition algorithm to enhance nanoscale objects of a specific scale that may be present in scanning probe images. In its present form, the applied wavelet is optimal for detecting objects with rotational symmetry. The wavelet scheme is applied to the analysis of scanning probe data to better illustrate the advantages that this new analysis tool offers. The wavelet algorithm developed for analysis of scanning probe microscope (SPM) images has been incorporated into the WSxM software which is a versatile freeware SPM analysis package.     

Invited review article: combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science

This is a comprehensive review of the combination of scanning probe microscopy (SPM) with various optical spectroscopies, with a particular focus on Raman spectroscopy. Efforts to combine SPM with optical spectroscopy will be described, and the technical difficulties encountered will be examined. These efforts have so far focused mainly on the development of tip-enhanced Raman spectroscopy, a powerful technique to detect and image chemical signatures with single molecule sensitivity, which will be reviewed. Beyond tip-enhanced Raman spectroscopy and/or topography measurements, combinations of SPM with optical spectroscopy have a great potential in the characterization of structure and quantitative measurements of physical properties, such as mechanical, optical, or electrical properties, in delicate biological samples and nanomaterials. The different approaches to improve the spatial resolution, the chemical sensitivity, and the accuracy of physical properties measurements will be discussed. Applications of such combinations for the characterization of structure, defects, and physical properties in biology and materials science will be reviewed. Due to the versatility of SPM probes for the manipulation and characterization of small and/or delicate samples, this review will mainly focus on the apertureless techniques based on SPM probes.     

选择性激光烧结新型扫描方式的研究及实现

选择性激光烧结（Ｓｅｌｅｃｔｉｖｅ　ｌａｓｅｒ　ｓｉｎｔｅｒｉｎｇ，ＳＬＳ）快速成形技术是近１０年来发展起来的一种先进制造技术，采用此项技术可以显著地缩短产品投放市场的周期，降低成本，提高产品质量，增强企业的竞争能力。而扫描方式是ＳＬＳ成形过程中的一项关键技术，在分析了现有扫描方式及其对ＳＬＳ制件精度、强度以及成形速度影响的基础上，指出了现有扫描方式的缺陷。为了克服这种缺陷，特提出并实现了一种新的分区变向扫描方式及其分区算法，它通过将扫描线段进行分组，以避开截面内孔和凹槽。这种新的分区变向扫描方式及其算法已经成功地应用到华中科技大学开发的ＨＲＰＳ系列ＳＬＳ系统中。实际应用表明：这种新型扫描方式能大幅度地提高烧结成形效率和减小烧结体的翘曲变形量。     

Real time observation of viscoelastic creep of a polymer coating by scanning probe microscope

We have developed a new technique of using the scanning probe microscope to measure the marring resistance that is a very desirable characteristic of clearcoats used in the automotive industry. With its high resolution, SPM can also be used to investigate the marring mechanism, and provide useful information in development of highly mar resistant coatings. In this paper, we will report a real time observation of viscoelastic creep which can result in a partial or complete healing of a marred surface. Based on the experimental data, a preliminary analysis of the recovery rate, recoverable deformation, and permanent deformation is presented. This revised version was published online in June 2006 with corrections to the Cover Date.     

Automatization of nanotomography

An approach for automated nanotomography, a layer-by-layer imaging technique based on scanning probe microscopy (SPM), is presented. Stepwise etching and imaging is done in situ in a liquid cell of an SPM. The flow of etching and rinsing solutions after each etching step is controlled with solenoid valves which allow for an automated measuring protocol. The thermal drift and the drift of the piezo scanner is corrected by applying offsets calculated from the cross correlation coefficients between successive images. As an example, we have imaged human bone with approximately 10 nm resolution using tapping mode SPM and successive etching with hydrochloric acid.     

The FAST module: an add-on unit for driving commercial scanning probe microscopes at video rate and beyond

We present the design and the performance of the FAST (Fast Acquisition of SPM Timeseries) module, an add-on instrument that can drive commercial scanning probe microscopes (SPM) at and beyond video rate image frequencies. In the design of this module, we adopted and integrated several technical solutions previously proposed by different groups in order to overcome the problems encountered when driving SPMs at high scanning frequencies. The fast probe motion control and signal acquisition are implemented in a way that is totally transparent to the existing control electronics, allowing the user to switch immediately and seamlessly to the fast scanning mode when imaging in the conventional slow mode. The unit provides a completely non-invasive, fast scanning upgrade to common SPM instruments that are not specifically designed for high speed scanning. To test its performance, we used this module to drive a commercial scanning tunneling microscope (STM) system in a quasi-constant height mode to frame rates of 100 Hz and above, demonstrating extremely stable and high resolution imaging capabilities. The module is extremely versatile and its application is not limited to STM setups but can, in principle, be generalized to any scanning probe instrument.     

Vertical inertial sliding drive for coarse and fine approaches in scanning probe microscopy

Mechanisms for controlled approach of a probe tip toward the sample surface are essential in high resolution imaging by scanning probe microscopy (SPM). This work describes the development and performance of an inertial sliding drive capable of translating a relatively large mass (25 g) at up to 1 mms over 1 cm with step sizes of 10-250 nm in ambient conditions using various wave forms as measured by fiber optic interferometry. The drive functions independent of orientation with a threshold voltage of less than 15 V using a single drive signal. Use of piezotube actuators in a radially symmetric arrangement provides guided motion and minimizes differential thermal expansion between critical components. Controlled translation of the entire scanning component in both ambient and electrochemical scanning tunneling microscopy has been routinely achieved with no evidence of tip crash. This device has been specifically designed for use in in situ SPM applications where stability of the sample and that of the liquid environment are paramount.