国产高效GaInP/GaAs/Ge三结太阳电池的低能质子辐射效应

运用2×1.7MV串列静电加速器提供的质子束,对MOCVD方法制备的GaInP/GaAs/Ge三结电池进行低能质子辐射效应研究.选质子能量为0.28,0.62和2.80MeV,辐照注量为1×1010,1×1011,1×1012和1×1013cm-2.对电池的辐射效应用I-V特性和光谱响应测试进行分析.研究结果表明:随辐照注量的增加,太阳电池性能参数Lsc,Voc和Pmax的衰降幅度均增大;但随质子辐照能量的增加,Lsc,Voc和Pmax的衰降幅度均减小.实验中0.28MeV质子辐照引起电池Lsc,Voc,Pmax衰降最显著,三结电池中光谱响应衰降最明显的是中间GaAs电池.     

量子阱GaAs太阳电池的质子辐射效应

用I-V特性、光谱响应和深能级谱分析辐射效应,分析了1×109～2×1013cm-2,2MeV质子辐照量子阱GaAs太阳电池.结果表明,随辐照注量增大,电池Jsc,Voc,Pmax衰降程度增加;相同的注量,Pmax衰降程度最大.当注量大于3×1012cm-2时,Isc衰降程度比Voc的大;当注量小于3×1012cm-2时,Voc衰降程度比Isc的大;在900～1000nm波长范围内,2×1013cm-2辐照使量子阱光谱响应特性消失.这与量子阱结构受到损伤引入位于Ec-0.35eV的深能级有关.     

空间实用背场Si太阳电池和GaAs/Ge太阳电池性能随质子辐照注量变化的比较

研究了空间实用背场Si太阳电池和GaAs/Ge太阳电池性能随质子辐照注量1×109～5×1013cm-2的变化.实验表明,两种太阳电池的电性能随辐照注量增加有不同的衰降趋势.背场Si太阳电池性能参数Isc、Voc和Pmax衰降变化快,辐照注量为2×1010cm-2时,Pmax就已衰降为原值的75%;而GaAs/Ge电池对应相同的衰降辐照注量达8×1011cm-2,且其Isc、Voc和Pmax衰降变化起初缓慢,当辐照注量接近3×1012cm-2时才迅速下降.背场Si电池和GaAs/Ge电池性能衰降分别与质子辐照引入的Ev+0.14eV及Ev+0.43eV和Ec-0.41eV深能级有关.     

空间实用背场Si太阳电池和GaAs/Ge太阳电池性能随质子辐照注量变化的比较

研究了空间实用背场Si太阳电池和GaAs/Ge太阳电池性能随质子辐照注量1×109～5×1013cm-2的变化.实验表明,两种太阳电池的电性能随辐照注量增加有不同的衰降趋势.背场Si太阳电池性能参数Isc、Voc和Pmax衰降变化快,辐照注量为2×1010cm-2时,Pmax就已衰降为原值的75%;而GaAs/Ge电池对应相同的衰降辐照注量达8×1011cm-2,且其Isc、Voc和Pmax衰降变化起初缓慢,当辐照注量接近3×1012cm-2时才迅速下降.背场Si电池和GaAs/Ge电池性能衰降分别与质子辐照引入的Ev+0.14eV及Ev+0.43eV和Ec-0.41eV深能级有关.     

量子阱GaAs太阳电池的质子辐射效应

用I-V特性、光谱响应和深能级谱分析辐射效应，分析了1e9～2e13cm－2，2MeV质子辐照量子阱GaAs太阳电池．结果表明，随辐照注量增大，电池Isc，Voc，Pmax衰降程度增加；相同的注量，Pmax衰降程度最大．当注量大于3e12cm－2时，Isc衰降程度比Voc的大；当注量小于3e12cm－2时，Voc衰降程度比Isc的大；在900～1000nm波长范围内，2e13cm－2辐照使量子阱光谱响应特性消失．这与量子阱结构受到损伤引入位于Ec－0.35eV的深能级有关．     

质子辐照对超辐射发光二极管性能的影响

用能量分别为350keV和1MeV,注量为1×1012和1×1013p/cm2的质子对超辐射发光二极管(SLD)进行辐照,对辐照前后器件的光学和电学性能进行了测试.结果表明,在相同注量辐照的条件下,350keV与1MeV能量质子辐照引起的辐照损伤相比,前者引起的出光功率的退化更大,造成的辐照损伤更加严重.采用TRIM程序对质子入射到器件材料中的射程分布进行了模拟,初步探讨了SLD在350keV和1MeV能量质子辐照下的损伤效应.     

质子辐照对超辐射发光二极管性能的影响

用能量分别为350keV和1MeV,注量为1×1012和1×1013p/cm2的质子对超辐射发光二极管(SLD)进行辐照,对辐照前后器件的光学和电学性能进行了测试.结果表明,在相同注量辐照的条件下,350keV与1MeV能量质子辐照引起的辐照损伤相比,前者引起的出光功率的退化更大,造成的辐照损伤更加严重.采用TRIM程序对质子入射到器件材料中的射程分布进行了模拟,初步探讨了SLD在350keV和1MeV能量质子辐照下的损伤效应.     

多结太阳电池辐射损伤的电致发光研究

建立了电致发光测试方法,对一种国产GaInP/GaAs/Ge三结太阳电池1MeV电子辐照后各子电池的辐照特性进行了研究,并与光谱响应结果进行了比较。讨论了GaInP/GaAs/Ge三结太阳电池的辐射损伤机理。     

GaN基PIN紫外探测器的质子辐照效应

制备了GaN基PIN结构紫外探测器.用能量为2MeV的质子对器件依次进行注量为5×1014 cm-2和2×1O15 cm-2的辐照.通过测量辐照前后器件的Ⅰ-Ⅴ曲线和光谱响应曲线,讨论了不同注量的质子辐照对GaN基紫外探测器件性能的影响.Ⅰ-Ⅴ特性表明,辐照使器件的反向暗电流增大,正向开启电流减小,并减小了器件的响应率,使峰值响应波长向短波方向稍有移动.为分析器件的辐照失效机理,研究了质子辐照对GaN材料的拉曼散射谱(Raman谱)和光致发光谱(PL谱)的影响.拉曼散射谱表明,A1(LO)模式随辐照注量向低频移动,通过拟合A1(LO)谱形,得到辐照使材料的载流子浓度降低的结果.PL谱表明,辐照使主发光峰和黄光峰强度降低,并出现一些新的发光峰,分析认为这是由于辐照引起了N空位缺陷和其他一些缺陷的亚稳态造成.     

GaInP/GaAs/Ge三结太阳电池辐照损伤效应及加固技术研究进展

文章首先重点介绍了国内外开展GaInP/GaAs/Ge三结太阳电池的电子、质子及其他辐射粒子或射线辐照实验的研究进展,然后从辐照损伤效应的仿真模拟研究、抗辐射加固技术、损伤预估方法等方面综述了GaInP/GaAs/Ge三结太阳电池辐照损伤效应及加固技术的研究进展,最后梳理了当前GaInP/GaAs/Ge三结太阳电池辐照损伤效应研究中亟待解决的关键技术问题,为深入开展GaInP/GaAs/Ge三结太阳电池辐照损伤效应实验方法标准制定、损伤机理分析、在轨寿命预估及抗辐射加固技术研究提供了理论指导和实验技术支持。     

Theoretical analysis on GaAs sub-cell doping concentration for triple-junction solar cells irradiated by proton based on TCAD simulation

The degradation on the GaInP/GaAs/Ge triple-junction solar cells was irradiated by proton, and the solar cells with various GaAs sub-cell doping concentrations are modeled by the technology computer aided design (TCAD) simulation. The degradation results of related electrical parameters and external quantum efficiency (EQE) are studied. The degradation mechanism irradiated by proton is discussed. The short-circuit current, maximum power and conversion efficiency decrease with the increasing of GaAs sub-cell doping concentration. When the base doping concentration of GaAs sub-cell is 1×1016 cm-3, the degradation of short-circuit current is less than that of other base doping concentrations. Furthermore, under proton irradiation, with the increase of doping concentration of GaAs sub-cell, the open-circuit voltage first increases and then decreases. Meanwhile, when the base doping concentration of GaAs sub-cell is 2×1017 cm-3, the degradation of open-circuit voltage is less than that of other base doping concentrations. The research will provide the basic theories and device simulation method for GaInP/GaAs/Ge triple-junction solar cells radiation damage evaluation study and radiation hardening, and can provide guidance for the production of triple-junction solar cells in orbit.     

分子束外延生长的GaAs/GaInP双结电池研究

We report the recent result of GaAs/GaInP dual-junction solar cells grown by all solid-state molecularbeamepitaxy(MBE).The device structure consists of a GaIn0.48P homojunction grown epitaxially upon a GaAs homojunction,with an interconnected GaAs tunnel junction.A photovoltaic conversion efficiency of 27% under the AM1.5 globe light intensity is realized for a GaAs/GaInP dual-junction solar cell,while the efficiencies of 26% and 16.6% are reached for a GaAs bottom cell and a GaInP top cell,respectively.The energy loss mechanism of our GaAs/GaInP tandem dual-junction solar cells is discussed.It is demonstrated that the MBE-grown phosphide-containing Ⅲ–V compound semiconductor solar cell is very promising for achieving high energy conversion efficiency.     

Correlation of electron and proton-irradiation-induced damage in InP solar cells

The measured degradation of epitaxial shallow homojunction n⁺p InP solar cells under 1-MeV electron irradiation is correlated with that measured under 3-MeV proton irradiation based on ‘displacement damage dose’. The measured data are analyzed as a function of displacement damage dose from which an electron-to-proton dose equivalency ratio is determined which enables the electron and proton degradation data to be described by a single degradation curve. It is discussed how this single curve can be used to predict the cell degradation under irradiation by any particle energy. The degradation curve is used to compare the radiation response of InP and GaAs/Ge cells on an absolute damage energy scale. The comparison shows InP to be inherently more resistant to displacement damage deposition than the GaAs/Ge.     

Analytical model for multi-junction solar cells prediction in space environment

Multi-junction solar cells, as other semiconductor devices, suffer degradation of their electrical and physical properties under particle irradiation (electrons and protons) in space environment. In this paper we present an analytical model in order to make predictions of multi-junction solar cells (GaInP/GaAs/Ge) degradation in space environment.     

AlGaAs/GaAs tunnel junctions in a 4-J tandem solar cell

TheⅢ-Ⅴcompound tandem solar cell is a third-generation new style solar cell with ultra-high efficiency. The energy band gaps of the sub-cells in a GaInP/GaAs/InGaAs/Ge 4-J tandem solar cell are 1.8,1.4,1.0 and 0.7 eV,respectively.In order to match the currents between sub-cells,tunnel junctions are used to connect the sub-cells.The characteristics of the tunnel junction,the material used in the tunnel junction,the compensation of the tunnel junction to the overall cell’s characteristics,the tunnel junction’s influence on the current density of sub-cells and the efficiency increase are discussed in the paper.An AlGaAs/GaAs tunnel junction is selected to simulate the cell’s overall characteristics by PC1D,current densities of 16.02,17.12,17.75 and 17.45 mA/cm² are observed,with a V_oc of 3.246 V,the energy conversion efficiency under AM0 is 33.9%.     

扩散温度和时间对晶体硅太阳电池性能的影响

研究了薄层方块电阻对单晶硅太阳电池的开路电压(Voc)、短路电流(Isc)、填充因子(FF)和转换效率(η)的影响。通过控制扩散温度和时间制备了具有不同薄层方块电阻的单晶硅太阳电池。结果表明:当扩散温度和时间分别为863℃和1 050 s时,电池性能得到了有效的改善,其平均开路电压、短路电流、填充因子和转换效率分别为0.64 V,5.58 A,0.755和17.3%。     

Amorphous/crystalline heterostructure as a novel approach to fabrication of a solar cell

The performance and characteristics of a novel structure device combining amorphous and crystalline semiconductors is reported for the first time. An amorphous SiC:H/crystal Si heterostructure solar cell gave a conversion efficiency of 5.11% with Voc = 0.53 V and Isc = 22.64 mA/cm2 without the use of any transparent electrode or AR coating. The relative spectral response of the cells has been found to be close to that of the `violet cell?.     

Evaluating electron induced degradation of triple-junction solar cell by numerical simulation

In this paper, the degradation related parameters of GaInP/GaAs/Ge triple-junction solar cell induced by electron irradiation are carried out by numerical simulation. The degradation results of short-circuit current, open-circuit voltage, maximum power have been investigated, and the degradation mechanism is analyzed. Combining the degradation results, the degradation of normalized parameters versus displacement damage dose is obtained. The results show that the degradation increases with the increase of the electron fluence and electron irradiation energy. The degradation normalized related parameters versus displacement damage dose can be characterized by a special curve that is not affected by the type of irradiated particles. By calculating the annual displacement damage dose and the on-orbit operation time of special space orbit, the degradation of normalized parameters can be obtained with the fitting curve in the simulation. The study will provide an approach to estimate the radiation damage of triple-junction solar cell induced by space particle irradiation.     

Radiation degradation characteristics of component subcells in inverted metamorphic triple‐junction solar cells irradiated with electrons and protons

The radiation response of In_0.5Ga_0.5P, GaAs, In_0.2Ga_0.8As, and In_0.3Ga_0.7As single‐junction solar cells, whose materials are also used as component subcells of inverted metamorphic triple‐junction (IMM3J) solar cells, was investigated. All four types of cells were prepared using a simple device layout and irradiated with high‐energy electrons and protons. The essential solar cell characteristics, namely, light‐illuminated current–voltage (LIV), dark current–voltage (DIV), external quantum efficiency (EQE), and two‐dimensional photoluminescence (2D‐PL) imaging were obtained before and after irradiation, and the corresponding changes due to the irradiations were compared and analyzed. The degradation of the cell output parameters by electrons and protons were plotted as a function of the displacement damage dose. It was found that the radiation resistance of the two InGaAs cells is approximately equivalent to that of the InGaP and GaAs cells from the materials standpoint, which is a result of different initial material qualities. However, the InGaAs cells show relatively low radiation resistance to electrons especially for the short‐circuit current (I sc). By comparing the degradation of I sc and EQE, data, It was confirmed that the greater decrease of minority‐carrier diffusion length in InGaAs compared with InGaP and GaAs causes severe degradation in the photo‐generation current of the InGaAs bottom subcells in IMM3J structures. Additionally, it was found that the InGaP and two InGaAs cells exhibited equivalent radiation resistance of V oc, but radiation response mechanisms of V oc are thought to be different. Further analytical studies are necessary to interpret the observed radiation response of the cells. © 2016 The Authors. Progress in Photovoltaics: Research and Applications published by John Wiley & Sons Ltd.