Development of no-flow underfill materials for lead-free solderbumped flip-chip applications

No-flow underfill process in flip-chip assembly has become a promising technology toward a smaller, faster and more cost-efficient packaging technology. The current available no-flow underfill materials are mainly designed for eutectic tin-lead solders. With the advance of lead-free interconnection due to the environmental concerns, a new no-flow underfill chemistry needs to be developed for lead-free solder bumped flip-chip applications. Many epoxy resin/hexahydro-4-methyl phthalic anhydride/metal acetylacetonate material systems have been screened in terms of their curing behavior. Some potential base formulations with curing peak temperatures higher than 200°C (based on differential scanning calorimetry at a heating rate of 5°C/min) are selected for further study. The proper fluxing agents are developed and the effects of fluxing agents on the curing behavior and cured material properties of the potential base formulations are studied using differential scanning calorimetry, thermomechanical analysis, dynamic-mechanical analysis, thermogravimetric analysis, and rheometer. Fluxing capability of the developed no-flow formulations is evaluated using the wetting test of lead-free solder balls on a copper board. The developed no-flow underfill formulations show sufficient fluxing capability and good potential for lead-free solder bumped flip-chip applications     

Development of new no-flow underfill materials for both eutectic Sn-Pb solder and a high temperature melting lead-free solder

In recent years, no-flow underfill technology has drawn more attention due to its potential cost-savings advantages over conventional underfill technology, and as a result several no-flow underfill materials have been developed and reported. However, most of these materials are not suitable for lead-free solder, such as Sn/Ag (m.p. 225/spl deg/C), Sn/Ag/Cu (m.p. 217/spl deg/C), applications that usually have higher melting temperatures than the eutectic Sn-Pb solder (m.p. 183/spl deg/C). Due to the increasing environmental concern, the demand for friendly lead-free solders has become an apparent trend. This paper demonstrates a study on two new formulas of no-flow underfill developed for lead-free solders with a melting point around 220/spl deg/C. As compared to the G25, a no-flow underfill material developed in our research group, which uses a solid metal chelate curing catalyst to match the reflow profile of eutectic Sn-Pb solder, these novel formulas employ a liquid curing catalyst thus provides ease in preparation of the no-flow underfill materials. In this study, curing kinetics, glass transition temperature (Tg), thermal expansion coefficient (TCE), storage modulus (E') and loss modulus (E') of these materials were studied with a differential scanning calorimetry (DSC), a thermo-mechanical analysis (TMA), and a dynamic-mechanical analysis (DMA), respectively. The pot-life in terms of viscosity of these materials was characterized with a stress rheometer. The adhesive strength of the materials on the surface of silicon chips were studied with a die-shear instrument. The influences of fluxing agents on the materials curing kinetics were studied with a DSC. The materials compatibility to the solder penetration and wetting on copper clad during solder reflow was investigated with both eutectic Sn-Pb and 95.9Sn/3.4Ag/0.7Cu solders on copper laminated FR-4 organic boards.     

Modeling of the curing kinetics of no-flow underfill in flip-chip applications

No-flow underfill has greatly improved the production efficiency of flip-chip process. Due to its unique characteristics, including reaction latency, curing under solder reflow conditions and the desire for no post-cure, there is a need for a fundamental understanding of the curing process of no-flow underfill. Starting with a promising no-flow underfill formulation, this paper seeks to develop a systematic methodology to study and model the curing behavior of this underfill. A differential scanning calorimeter (DSC) is used to characterize the heat flow during curing under isothermal and temperature ramp conditions. A modified autocatalytic model is developed with temperature-dependent parameters. The degree of cure (DOC) is calculated; compared with DSC experiments, the model gives a good prediction of DOC under different curing conditions. The temperature of the printed wiring board (PWB) during solder reflow is measured using thermocouples and the evolution of DOC of the no-flow underfill during the reflow process is calculated. A stress rheometer is used to study the gelation of the underfill at different heating rates. Results show that at high curing temperature, the underfill gels at a lower DOC. Based on the kinetic model and the gelation study, the solder wetting behavior during the eutectic SnPb and lead-free SnAgCu reflow processes is predicted and confirmed by the solder wetting tests.     

Interface delamination analysis of TQFP package during solder reflow

Interface delamination during solder reflow is a critical reliability problem for the plastic IC packages. The main objective of this study is to apply modified virtual crack closure method (MVCCM) for the analysis of interface delamination between the leadframe pad and the encapsulant during a lead-free solder reflow after the level 1 moisture preconditioning. In this study, the moisture diffusion parameters and the coefficient of moisture expansion (CME) of two different epoxy molding compounds (EMC) are characterized for moisture diffusion analysis and the deformation analysis due to hygroscopic swelling. At the same time, the entire thermal and moisture history of Thin Quad Flat Pack (TQFP) package is simulated from the start of level 1 moisture preconditioning (85 °C/85%RH for 168 h) to subsequent exposure to a lead-free solder reflow process. Finally, the transient development of the stress intensity factors due to thermal stress only K_t, hygrostress only K_h, vapor pressure only K_p and combined energy release rate G_tot are computed and studied by using MVCCM. Based on the calculated stress intensity factors and energy release rates, it seems that for the EMC, the Young’s modulus, moisture diffusion coefficient, CME and adhesion strength with leadframe at high temperature appear to be the most significant variables for the MSL performance of TQFP package and this matches well with the experimental finding.     

Recent advances in modeling the underfill process in flip-chip packaging

Flip-chip underfill process is a very important step in the flip-chip packaging technology because of its great impact on the reliability of the electronic devices. In this technology, underfill is used to redistribute the thermo-mechanical stress generated from the mismatch of the coefficient of thermal expansion between silicon die and organic substrate for increasing the reliability of flip-chip packaging. In this article, the models which have been used to describe the properties of underfill flow driven by capillary action are discussed. The models included apply to Newtonian and non-Newtonian behavior with and without the solder bump resistance for the purpose of understanding the behavior of underfill flow in flip-chip packaging.     

回流焊峰值温度对混装BGA焊点的影响研究

针对当前大量使用有铅焊料焊接无铅BGA的实际现状,通过调控有铅制程回流曲线的峰值温度,研究其对混装BGA焊点坍塌高度、空洞率及微观组织的影响。结果表明,峰值温度从210℃提升至225℃,无铅BGA焊球能够全部充分坍塌且高度保持一致;峰值温度为210℃时,混合焊点内的空洞率最低,随着峰值温度的升高,空洞尺寸和空洞率均有所增加;峰值温度为215℃时的微观组织最细小且尺寸分布最均匀,继续提升峰值温度,微观组织尺寸会随之增大。因此使用有铅焊料焊接无铅BGA的最佳峰值温度为215℃,与有铅制程保持一致。     

In process stress analysis of flip-chip assemblies during underfill cure

Low cost flip chip on board assemblies are analyzed during the underfill cure process to determine residual stress generation. In situ stress measurements are performed over the active face of the die during processing and relative in-plane stresses are measured. Experimental measurements are made using flip-chip test vehicles, based on the Sandia National Laboratories’ ATC04 assembly test chip. Four different commercial underfill materials have been evaluated and a relative comparison is presented with respect to the residual stresses produced by each underfill on the flip-chip assemblies. Significant stress variations are observed between the four underfills studied. Correlation between the glass transition temperature (T_g) and storage modulus (G^′) are made relative to residual stresses produced during underfill cure. Stress relaxation characteristics are also evaluated for the low cost flip-chip assemblies.     

Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill

In the flip-chip ball grid array (FCBGA) assembly process, no-flow underfill has the advantage over traditional capillary-flow underfill on shorter cycle time. Reliability tests are performed on both unmolded and molded FCBGA with three different types of no-flow underfill materials. The JEDEC Level-3 (JL3) moisture preconditioning, followed by reflow and pressure cooker test (PCT) is found to be a critical test for failures of underbump metallization (UBM) opening and underfill/die delamination. In this paper, various types of modeling techniques are applied to analyze the FCBGA-8×8 mm on moisture distribution, hygroswelling behavior, and thermomechanical stress. For moisture diffusion modeling, thermal-moisture analogy is used to calculate the degree of moisture saturation in the multi-material system of FCBGA. The local moisture concentration along the critical interface, e.g. die/underfill, is critical for delamination, because the moisture weakens the interfacial adhesion strength, generates internal vapor pressure during reflow, and induces tensile hygroswelling stress on UBM during PCT. The results of moisture distribution can be used as loading input for the subsequent hygroswelling modeling. The magnitude of hygroswelling stress acting on UBM is found to be greater than the thermal stress induced during reflow, both in tensile mode which may cause the UBM-opening failure. Underfill with lower saturated moisture concentration (C_sat) and coefficient of moisture expansion (CME) are found to induce lower UBM stress and has better reliability results. Molded package generally has higher stress level than unmolded package. Parametric studies are performed to study the effects of no-flow underfill materials, package type (molded vs. unmolded), die thickness, and substrate size on the stresses of UBM during reflow and PCT.     

Chemothermal modeling and finite-element analysis for microwave cure process of underfill in flip-chip packaging

The reaction kinetics of microwave cure process of underfill materials in flip-chip packaging was investigated with nonisothermal kinetic method and compared with that of the thermal cure. Three-dimensional (3-D) nonlinear cure kinetic and transient heat transfer coupled model was solved by finite-element method (FEM) to simulate the microwave cure process. The accuracy of the program was verified using a simple heat conduction case by commercial FEM software. Temperature and conversion inside underfill during microwave cure process were evaluated by solving the nonlinear anisotropic heat conduction equation including internal heat generation produced by exothermic chemical reactions. Numerical results show that the iteration calculations are very sensitive to small changes in time step sizes. It was also found that variable frequency microwave can process underfill materials with uniform conversion under different curing temperatures.     

SCSP中芯片黏结层在焊接时的可靠性

提出了一个细观力学模型,该模型同时考虑了热膨胀和蒸汽膨胀对叠层芯片尺寸封装(SCSP)中芯片黏结层变形的影响.当初始温度确定时,由该模型可求得给定温度下芯片黏结层内部的蒸汽压力和孔隙率,从而判断芯片黏结层在焊接回流时的可靠性.当温度从100℃升高到250℃时,芯片黏结层的饱和蒸汽压、等效弹性模量及孔隙率分别从0.10 ...     

Finite volume based CFD simulation of pressurized flip-chip underfill encapsulation process

This paper presents the simulation of pressurized underfill encapsulation process for high I/O flip chip package. 3D model of flip chip packages is built using GAMBIT and simulated using FLUENT software. Injection methods such as central point, one line, L-type and U-type are studied. Cross-viscosity model and volume of fluid (VOF) technique are applied for melt front tracking of the encapsulant. The melt front profiles and pressure field for all injection types are analyzed and presented. The pressure distribution within the flip-chip, fill volume versus filling time and viscosity versus shear rate are also plotted. The U-type injection is found to be faster in filling. The numerical results are compared with the previous experimental results and found in good conformity. The strength of CFD software in handling underfill encapsulation problems is proved to be excellent.     

Yield analysis and process modeling of low cost, high throughputflip chip assembly based on no-flow underfill materials

As a concept to achieve low-cost, high-throughput flip chip on board (FCOB) assembly, a new process has been developed implementing next generation flip chip processing based no-flow fluxing underfill materials. The low-cost, high throughput flip chip process implements large area underfill printing, integrated chip placement and underfill flow and simultaneous solder interconnect reflow and underfill cure. The goals of this study are to demonstrate feasibility of no flow underfill materials and the high throughput flip chip process over a range of flip chip configurations, identify the critical process variables affecting yield, analyze the yield of the high throughput flip chip process, and determine the impact of no-flow underfill materials on key process elements. Reported in this work is the assembly of a series of test vehicles to assess process yield and process defects. The test vehicles are assembled by depositing a controlled mass of underfill material on the chip site, aligning chip to the substrate pads, and placing the chip inducing a compression type underfill flow. The assemblies are reflowed in a commercial reflow furnace in an air atmosphere to simultaneously form the solder interconnects and cure the underfill. A series of designed experiments identify the critical process variables including underfill mass, reflow profile, placement velocity, placement force, and underfill material system. Of particular interest is the fact that the no-flow underfill materials studied exhibit an affinity for unique reflow profiles to minimize process defects     

Effects of substrate metallization of solder/under-bump metallization interfacial reactions in flip-chip packages during multiple reflow cycles

The effects of various elements of substrate metallization, namely, Au, Ni, and P, on the solder/under-bump metallization (UBM), (Al/Ni(V)/Cu) interfacial reactions in flip-chip packages during multiple reflow processes were systematically investigated. It was found that Au and P had negligible effects on the liquid-solid interfacial reactions. However, Ni in the substrate metallization greatly accelerated the interfacial reactions at chip side and degraded the thermal stability of the UBM through formation of a (Cu,Ni)₆Sn₅ ternary compound at the solder/UBM interface. This phenomenon can be explained in terms of enhanced grain-boundary grooving on (Cu,Ni)₆Sn₅ in the molten solder during the reflow process. This could eventually cause the rapid spalling of an intermetallic compound (IMC) from the solder/UBM interface and early failure of the packages. Our results showed that formation of multicomponent intermetallics, such as (Cu,Ni)₆Sn₅ or (Ni,Cu)₃Sn₄, at the solder/UBM interface is detrimental to the solder-joint reliability.     

A new experimental method to evaluate creep fatigue life of flip-chip solder joints with underfill

A new accelerated stress test method was developed to evaluate creep life of flip-chip solder joints with underfill. With this method, a cyclic creep test can be done simply by applying a displacement to the FR-4 printed circuit board (PCB) board in the axial direction. The creep fatigue test was performed under displacement control with real-time electrical continuity monitoring. Test results show that the displacement arising from the force is equivalent to the thermal stress during thermal expansion. It was found that the magnitude of displacement was proportional to the inelastic strain sustained by the solder joints. This indicates that the creep fatigue life obtained will not only reflect the quality of the solder joints, but can also be used to characterize the reliability of the flip-chip assembly. Finite element modeling was also performed to confirm the agreement of deformation of the solder joints under mechanical and thermal loading. Results suggest that deformation and strain of the flip-chip assembly are consistent or comparable between the mechanical and thermal cycling. The failure analysis indicates that fatigue cracks often initiate from the top edge of a corner solder joint in the creep fatigue test, which is similar to what would happen in thermal cycling test. Lastly, the effect of underfill on the creep fatigue test is discussed. It is postulated that the test method is applicable to other flip-chip assemblies, such as conductive adhesive interconnections.     

A computational study on solder bump geometry, normal, restoring, and fillet forces during solder reflow in the presence of liquefied underfill

A computational survey was performed to evaluate the effect of volume and material properties on a concurrent underfilling and solder reflow manufacturing technique applied to flip-chip technology. Fillet geometry in addition to collapsed solder ball geometry and forces during solder reflow in the presence of liquefied underfill are reported. Targeted material properties included surface tension, wetting angles, and process parameters such as underfill volume. A regression model is presented representing over 1000 case studies completed using surface evolver. Also, a multiple ball model was developed to study the solder ball array behavior. Modeling results are presented. Application of this model for wafer applied coating underfill thickness prediction was also studied including the fillet forces added to a multiple-ball-model. Behavior and force studies combining all these effects were performed and are presented. Finally, a more realistic arrangement consisting of circular and square solder pad geometries combined is modeled for a single ball. The models results are expanded to include a multiball model employing a commonly used regression method. Solder joints were cross-sectioned and measured after reflow in the presence of a fluxing underfill for comparison to model predictions. The experimental results agree within 1.5%.     

On the design parameters of flip-chip PBGA package assembly foroptimum solder ball reliability

An experimental investigation of the warpage of a flip-chip plastic ball grid array package assembly is presented and a critical deformation mode is identified. The experimental data, documented while cooling the assembly from the underfill curing temperature to -40°C, clearly reveal the effect of the constraints from the chip and the PCB on the global behavior of the substrate. The constraints produce an inflection point of the substrate at the edge of the chip. An experimentally verified three-dimensional (3-D) nonlinear finite element analysis proceeds to quantify the effect of the substrate behavior on the second-level solder ball strains. An extensive parametric study is conducted to identify the most critical design parameter for optimum solder ball reliability     

Influence of transient flow and solder bump resistance on underfill process

The underfill flow process is one of the important steps in Microsystems technology. One of the best known examples of such a process is with the flip-chip packaging technology which has great impact on the reliability of electronic devices. For optimization of the design and process parameters or real-time feedback control, it is necessary to have a dynamic model of the process that is computationally efficient yet reasonably accurate. The development of such a model involves identifying any factors that can be neglected with negligible loss of accuracy. In this paper, we present a study of flow transient behavior and flow resistance due to the presence of an array of solder bumps in the gap. We conclude (1) that the assumption of steady flow in the modeling of the flow behavior of fluids in the flip-chip packaging technology is reasonable, and (2) the solder bump resistance to the flow can not be neglected when the clearance between any two solder bumps is less than 60-70 μm. We subsequently present a new model, which extends the one proposed by Han and Wang in 1997 by considering the solder bump resistance to the flow.     

Effects of solder reflow on the reliability of flip-chip on flex interconnections using anisotropic conductive adhesives

This work describes the work of an investigation of the effects of solder reflow process on the reliability of anisotropic conductive film (ACF) interconnection for flip-chip on flex (FCOF) applications. Experiments as well as computer modeling methods have been used. The results show that the contact resistance of ACF interconnections increases after the reflow and the magnitude of the increase is strongly correlated to the peak reflow temperature. In fact, nearly 40 percent of the joints are open when the peak reflow temperature is 260/spl deg/C, while there is no opening when the peak temperature is 210/spl deg/C. It is believed that the coefficient of thermal expansion (CTE) mismatch between the polymer particle and the adhesive matrix is the main cause of this contact degradation. To understand this phenomenon better, a three-dimensional (3-D) finite element (FE) model of an ACF joint has been analyzed in order to predict the stress distribution in the conductive particles, adhesive matrix and metal pads during the reflow process. The stress level at the interface between the particle and its surrounding materials is significant and it is the highest at the interface between the particle and the adhesive matrix.     

Plasma reflow bumping of Sn-3.5 Ag solder for flux-free flip chip package application

A new flux-free reflow process using Ar+10%H/sub 2/ plasma was investigated for application to solder bump flip chip packaging. The 100-/spl mu/m diameter Sn-3.5wt%Ag solder balls were bonded to 250-/spl mu/m pitch Cu/Ni under bump metallurgy (UBM) pattern by laser solder ball bonding method. Then, the Sn-Ag solder balls were reflowed in Ar+H/sub 2/ plasma. Without flux, the wetting between solder and UBM occurred in Ar+H/sub 2/ plasma. During plasma reflow, the solder bump reshaped and the crater on the top of bump disappeared. The bump shear strength increased as the Ni/sub 3/Sn/sub 4/ intermetallic compounds formed in the initial reflow stage but began to decrease as coarse (Cu,Ni)/sub 6/Sn/sub 5/ grew at the solder/UBM interface. As the plasma reflow time increased, the fracture mode changed from ductile fracture within the solder to brittle fracture at the solder/UBM interface. The off-centered bumps self-aligned to patterned UBM pad during plasma reflow. The micro-solder ball defects occurred at high power prolonged plasma reflow.