An Infinite Phase Shift Delay-Locked Loop With Voltage-Controlled Sawtooth Delay Line

A wide-range delay-locked loop (DLL) with infinite phase shift and digital-controlled duty cycle is presented. By changing the polarity of the input clock of the voltage-controlled sawtooth delay, this proposed DLL achieves infinite phase shift by only a single loop. The proposed DLL has been fabricated in a 0.18$ mu$m CMOS process and the core area is $hbox{0.45}times {hbox{0.3 mm}}^{2}$. The measurement results show the proposed DLL operates from 50 to 500 MHz. The duty cycle of the output clock can be adjusted from 30% to 60% in the step of 5%. At 500 MHz, the measured rms jitter and peak-to-peak jitter is 1.43 and 11.1 ps, respectively. Its power consumption is 6 mW for a supply of 1.5 V.      

A Delay-Locked Loop With Statistical Background Calibration

A delay-locked loop (DLL) using a statistical background calibration circuit (SBCC) is presented. This SBCC is utilized to calibrate the charge pump. Eighty identical arbiters with random mismatch effectively measure the phase error between the input and output clocks. Therefore, the static phase error of the DLL is improved. The proposed DLL has been fabricated in 0.18- $mu$m CMOS process. Its active area is 0.078 ${hbox {mm}}^{2}$ . The power dissipation is 35 mW for the supply of 1.8 V and the input clock of 1.2 GHz. This DLL operates from 900 MHz to 1.2 GHz. The measured static phase error is 15.45 and 2.92 ps without and with the SBCC, respectively at 1.2 GHz.      

A Mixed-Mode Synchronous Mirror Delay Insensitive to Supply and Load Variations

A digital synchronous mirror delay combined with an analog delay-locked loop (DLL) is introduced. Under the influence of process, voltage, temperature, and load variations, the conventional digital synchronous mirror delay could not compensate the static phase error because of its digital type and open loop by nature. The proposed circuit can compensate the delay mismatch between the output buffer and the inner stage, which is caused by the different loading conditions. It can improve the noise immunity from supply variations. Moreover, because of the tracking property of the DLL, the static phase error and jitter could also be reduced. The proposed circuit has been fabricated by a CMOS 0.35-m one-poly four-metal process and the whole chip area is 1.47 × 1.07 mm² including I/O pad peripherals. The measured peak-to-peak jitter is 16.4 ps at supply voltage of 3.3 V and frequency of 300 MHz. The power consumption of the entire chip is 16.5 mW for analog part and 84 mW for digital part. The comparisons between the proposed circuit and the conventional digital synchronous mirror delay are also demonstrated.     

A 250-MHz-2-GHz wide-range delay-locked loop

This paper describes a wide-range delay-locked loop (DLL) for a synchronous clocking which supports dynamic frequency scaling and dynamic voltage scaling. The DLL has wide operating range by using multiple phases from its delay line. A phase detector (PD) which combines linear and binary characteristics achieves low jitter and fast locking speed. A pulse reshaper makes output pulses of the phase detector have variable pulsewidth and variable voltage level to mitigate the static phase error due to the inherent mismatch of the charge pump. The DLL operates in the range from 250 MHz to 2 GHz. At 1 GHz operating frequency, RMS jitter and peak-to-peak jitter are 1.57 ps and 10.7 ps, respectively.     

An all-analog multiphase delay-locked loop using a replica delayline for wide-range operation and low-jitter performance

This paper describes an all-analog multiphase delay-locked loop (DLL) architecture that achieves both wide-range operation and low-jitter performance. A replica delay line is attached to a conventional DLL to fully utilize the frequency range of the voltage-controlled delay line. The proposed DLL keeps the same benefits of conventional DLLs such as good jitter performance and multiphase clock generation. The DLL incorporates dynamic phase detectors and triply controlled delay cells with cell-level duty-cycle correction capability to generate equally spaced eight-phase clocks. The chip has been fabricated using a 0.35-μm CMOS process. The peak-to peak jitter is less than 30 ps over the operating frequency range of 62.5-250 MHz, At 250 MHz, its jitter supply sensitivity is 0.11 ps/mV. It occupies smaller area (0.2 mm²) and dissipates less power (42 mW) than other wide-range DLL's [2]-[7]     

Fast lock-on time mixed mode DLL with 10 ps jitter

A fast lock-on time mixed mode delay locked loop (DLL) is proposed to eliminate phase error in two steps. A digital fixed delay line compensates for the initial large phase error and an analogue voltage controlled delay line compensates for the small static phase error, resulting in low jitter. The lock-on time of the DLL is less than 10 clock cycles and the simulated jitter is below 10 ps at 200 MHz     

A 2.5 GHz All-Digital Delay-Locked Loop in 0.13 μm CMOS Technology

A 2.5 GHz, 30 mW, 0.03 mm², all-digital delay-locked loop (ADDLL) in 0.13 mum CMOS technology is presented. The tri-state digital phase detector suppresses the dithering phenomenon and reduces the output peak-to-peak jitter for a counter-controlled digital DLL. The lattice delay unit has both a small delay step and a fixed intrinsic delay of two nand gates. A modified successive approximation register-controller reduces the locking time and allows the DLL to track the process, voltage, temperature, and load variations. This ADDLL locks in 24 cycles and has a closed-loop characteristic. The measured peak-to-peak jitter is 14 ps at 2.5 GHz.     

An 8-GHz to 10-GHz Distributed DLL for Multiphase Clock Generation

A distributed DLL (DDLL) with low jitter and high phase accuracy is proposed for the multiphase clock generator. The high-speed multiphase clock generator produces a five-phase clock at a frequency range of 8 to 10 GHz. Additionally, the discrete-time model for the distributed DLL and the analysis about stability and noise are proposed in this work. The measured rms jitter is 293.3 fs and the maximum phase mismatch is 1.4 ps. The proposed architecture can suppress the jitter by 58%. The distributed DLL occupies 0.03 ${hbox{mm}}^{2}$ active area in a 90-nm CMOS technology and consumes 15 mA from a 1.0-V supply.      

Fast locking,startup-circuit free,low area, 32-phase analog DLL

This work presents 32-phase analog delay-locked-loop (DLL) having fast locking ability, startup-circuit free operation, and a low area with improved DNL-INL performance. The proposed faster delay-cell and the new bias-circuit enable startup-circuit free operation under process-voltage-temperature (PVT) variation, while the DLL achieves low area and faster locking by using a small filter capacitor. Again, input and output clocks pass through the respective CMOS buffer before the phase detector (PD) for load matching, which reduces DNL-INL in the DLL. The analog DLL locks in less than 54 or 56 clock cycles depending upon initial control voltage (supply or ground voltage) with 100 MHz input clock. The DLL generates 32-phase clocks with a bin-size of 312.5 ps, the peak-to-peak period jitter of 9.51 ps, the rms period jitter of 1.36 ps, the phase-offset error of 4.72 ps, DNL and INL less than ±0.11 LSB. The design consumes 3.54 mW power with a supply voltage of 3.3 V, and an area of 0.017 mm² in UMC 180 nm MMRF technology. ^© 2001 Elsevier Science. All rights reserved     

A wide-range and fast-locking all-digital cycle-controlled delay-locked loop

An all-digital cycle-controlled delay-locked loop (DLL) is presented to achieve wide range operation, fast lock and process immunity. Utilizing the cycle-controlled delay unit, the proposed DLL reuses the delay units to enlarge the operating frequency range rather than cascade a huge number of delay units. Adopting binary search scheme, the two-step successive-approximation-register (SAR) controller ensures the proposed DLL to lock the input clock within 32 clock cycles regardless of input frequencies. The DLL operates in open-loop fashion once lock occurs in order to achieve low jitter operation with small area and low power dissipation. Since the DLL will not track temperature or supply variations once it is in lock, it is best suited for burst mode operation. Given a supplied reference input with 50% duty cycle, the DLL generates an output clock with the duty cycle of nearly 50% over the entire operating frequency range. Fabricated in a 0.18-/spl mu/m CMOS one-poly six-metal (1P6M) technology, the experimental prototype exhibits a wide locking range from 2 to 700 MHz while consuming a maximum power of 23 mW. When the operating frequency is 700 MHz, the measured peak-to-peak jitter and rms jitter is 17.6 ps and 2.0 ps, respectively.     

A DLL-Based Variable-Phase Clock Buffer

A variable-phase clock buffer that uses a delay-locked loop (DLL) is presented. The variable-phase clock is achieved by switching the multiphase outputs of the divider in the DLL. The output phase is adjustable in a step of where pi/n is the ratio of two voltage-controlled delay lines in the proposed circuit. The prototype has been fabricated in a 0.18- CMOS process to realize the output phases of 0deg, 90deg, 180deg, and 270deg. The corresponding measured phase error is 3.24deg, 3.46deg, 3.89deg, and 1.94deg, respectively. The measured root-mean-squared jitter is 1.81 ps. The clock buffer consumes 67 mW including I/O circuits from a single 1.8-V supply at 600 MHz.     

A portable digital DLL for high-speed CMOS interface circuits

A digital delay-locked loop (DLL) that achieves infinite phase range and 40-ps worst case phase resolution at 400 MHz was developed in a 3.3-V, 0.4-μm standard CMOS process. The DLL uses dual delay lines with an end-of-cycle detector, phase blenders, and duty cycle correcting multiplexers. This more easily process portable DLL achieves jitter performance comparable to a more complex analog DLL when placed into identical high-speed interface circuits fabricated on the same test-chip die. At 400 MHz, the digital DLL provides <250 ps peak-to-peak long-term jitter at 3.3 V and operates down to 1.7 V, where it dissipates 60 mW. The DLL occupies 0.96 mm²     

A Multiphase-Output Delay-Locked Loop With a Novel Start-Controlled Phase/Frequency Detector

This paper presents a multiphase-output delay-locked loop (MODLL). The proposed phase/frequency detector (PFD) utilizes a new NAND-resettable dynamic D-flip-flop (DFF) circuit to achieve a shorter reset path. Thus, lower power consumption and higher speed can be obtained. The proposed voltage-controlled delay element used in this design can operate at a lower supply voltage and overcome the dead-band issue of the voltage-controlled delay line. An experimental multiphase-output DLL was designed and fabricated using a TSMC 0.35-$mu$m 2P4M CMOS process. The delay-locked loop (DLL) power consumption is 3.4 mW with a 2 V supply and a 100 MHz input. The measured rms and peak-to-peak jitters are 17.575 ps and 145 ps, respectively. In addition, the supply voltage of the experimental multiphase-output DLL can vary from 1.5 V to 2.5 V without causing malfunctions. The active area is 426 $mu$m $times$ 381 $mu$m.      

A 33.6-to-33.8 Gb/s Burst-Mode CDR in 90 nm CMOS Technology

A 33.6–33.8 Gb/s burst-mode clock/data recovery circuit (BMCDR) is presented in this paper. To reduce the data jitter and generate the high-frequency output clock, the LC gated voltage-controlled oscillator is presented. To receive and transmit the broadband data, a wideband input matching circuit and a wideband data buffer are presented, respectively. The phase selector is proposed to overcome the false phase lock due to the full-rate operation. This proposed BMCDR has been fabricated in a 90 nm CMOS process. The measured peak-to-peak and rms jitters for the recovered data are 7.56 ps and 1.15 ps, respectively, for a 33.72 Gb/s, 2 $^{11} -$1 PRBS. The measured bit error rate is less than $10^{-8}$ for a 33.72 Gb/s, 2$^{7} -$1 PRBS. It consumes 73 mW without buffers from a 1.2 V supply.      

A 0.4 ps-RMS-Jitter 1–3 GHz Ring-Oscillator PLL Using Phase-Noise Preamplification

This paper presents the design and experimental results of a 0.4 ps rms jitter (integrated from 3 kHz to 300 MHz offset at 2.5 GHz) 1–3 GHz tunable ring-oscillator PLL for integrated clock multiplier applications. A new loop filter structure based on a sample-reset phase-to-voltage converter and a Gm-C filter decouples reference spur performance from charge-pump current matching and loop filter leakage, while enables phase error preamplification to lower PLL in-band noise without reducing VCO analog tuning range or increasing loop filter capacitor size. The ring-oscillator VCO features programmability of phase noise and power consumption at a given frequency. The PLL is implemented in a digital 0.13 $mu{hbox{m}}$ CMOS process using only 1.2 V devices, occupies 0.07 ${hbox{mm}}^{2}$ and consumes 23 mW excluding reference clock receiver for 2.5 GHz output at the lowest phase noise mode.      

Jitter Analysis and a Benchmarking Figure-of-Merit for Phase-Locked Loops

This brief analyzes the jitter as well as the power dissipation of phase-locked loops (PLLs). It aims at defining a benchmark figure-of-merit (FOM) that is compatible with the well-known FOM for oscillators but now extended to an entire PLL. The phase noise that is generated by the thermal noise in the oscillator and loop components is calculated. The power dissipation is estimated, focusing on the required dynamic power. The absolute PLL output jitter is calculated, and the optimum PLL bandwidth that gives minimum jitter is derived. It is shown that, with a steep enough input reference clock, this minimum jitter is independent of the reference frequency and output frequency for a given PLL power budget. Based on these insights, a benchmark FOM for PLL designs is proposed.      

基于DLL的1.25 G超宽带通信系统时钟生成电路

设计并实现了一个基于延时锁定环(DLL)、用于超宽带(UWB)无线通信系统的1.25GHz时钟生成电路。该时钟生成电路由两个DLL和一个自调谐LC滤波电路组成,输入125MHz的参考时钟,输出1.25GHz的差分时钟和间隔100ps的16相时钟。通过优化电荷泵电路有效地减小了静态相位误差,新式自调谐LC滤波电路的应用消除了工艺偏差对谐振的影响。在1.8V电源电压,SMIC0.18μmCMOS工艺下,该时钟生成电路在各种工作条件下均表现出良好的性能,在标准情况下静态相位误差仅为9ps,最大时钟抖动为10ps。当电感存在30%的工艺偏差时,滤波电路的谐振频率能够自动维持在1.25GHz上。     

用于时钟恢复电路的低抖动可变延迟线锁相环电路

文中给出了一个基于压控可变延迟线的电荷泵锁相环电路的设计,用于时钟恢复电路中采样时钟沿的定位,它的工作不受环境和工艺的影响,保证了采集数据的准确性。应用于延迟线中的改进的延迟单元有效地减小了相位抖动,环路滤波电路的设计避免了电荷重新分配引入的影响。电路采用0.35umTSMC的MOS工艺,在3.3V的低电压下工作,模拟得到在最坏情况下,单个延迟模块的相位抖动为20ps,输出静态相位误差仅45ps。     

A $Delta{-}Sigma$ PLL-Based Spread-Spectrum Clock Generator With a Ditherless Fractional Topology

A triangular-modulated spread-spectrum clock generator using a$Delta{-}Sigma$-modulated fractional-$N$ phase-locked loop (PLL) is presented. The PLL employs a multiphase divider to implement the modulated fractional counter with increased $Delta{-}Sigma$ operation speed. In addition, the phase mismatching error in the phase-interpolated PLL with multiphase clocks can be randomized, and finer frequency resolution is achievable. With a frequency modulation of 33 kHz, the measured peak power reduction is more than 11.4 dB under a deviation of $pm$0.37%. Without spread-spectrum clocking, the PLL generates 2.4-GHz output with 18.82-ps peak-to-peak jitter. After spread-spectrum operation, the measured up-spread and down-spread jitter can achieve 52.59 and 56.79 ps, respectively. The chip occupies $950times850 {rm mu}{rm m}^{2}$ in 0.18-${rm mu}{rm m}$ CMOS process and consumes 36 mW.      

A VCDL-based 60-760-MHz dual-loop DLL with infinite phase-shift capability and adaptive-bandwidth scheme

A dual-loop delay-locked loop (DLL) was implemented by using an analog voltage-controlled delay line (VCDL) for low jitter. An infinite phase-shift capability with seamless phase change was achieved by adding a look-ahead VCDL. A low jitter was achieved for the entire input frequency lock range from 60 to 760 MHz by using the adaptive bandwidth scheme in both reference and fine loops. A wide input-frequency lock range was achieved due to the combined effects of the dual-loop architecture and the extra phase detector of the reference DLL. The extra phase detector eliminated the constraint on the initial VCDL delay for DLL to be locked. Measurements on the fabricated chip by using a 0.18-/spl mu/m CMOS process showed a power consumption of 63 mW at 700 MHz, an active chip area of 370/spl times/510 /spl mu/m/sup 2/, and peak-to-peak jitters of 28 and 39 ps at the 700-MHz synchronous and plesiochronous operations, respectively.