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Au掺杂TiO2/SiO2薄膜的光学非线性特性研究 总被引:2,自引:0,他引:2
采用溶胶-凝胶方法制备了Au掺杂的TiO2/SiO2复合薄膜(厚度约为1.0μm)。X-ray衍射分析表明,Au的颗粒镶嵌在TiO2/SiO2复合薄膜的玻璃网络中。谢乐公式计算给出Au的颗粒大小约为10nm。采用Z-Scan测量技术得此薄膜的光学非线性折射率为1.09×10-7esu。 相似文献
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本文基于对Si3N4、SiO2、α-Si薄膜本身结构及其层间结构的分析,在半导体器件的表面钝化中做了选择应用。并将此用于生产实践,在Si3N4-α-Si-SiO2结构中解决了由SiO2/Si界面的表面电荷及SiO2中Na+的漂移运动等引起的器件电学特性变差的问题。 相似文献
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SnO2/Si的光伏特性 总被引:1,自引:0,他引:1
采用CVD方法在硅单晶上制备SnO2薄膜,对不同硅衬底及在不同温度下淀积SnO2制得SnO2/Si进行光电压谱的测量,得出最佳的制备温度;采用类金属半导体接触模型,推导出有关计算公式,计算得出其介面复合速度和异质结势垒宽度等参数。 相似文献
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C2H2/H2/SiH4等离子体聚合及其沉积物的结构与性能的研究 总被引:1,自引:0,他引:1
利用C2H2/H2/SiH4混合单体等离子体聚合沉积在HDPE板表面制备薄膜,发现薄膜与HDPE粘接良好,H2使薄膜与基体附着性能提高但其沉积速率下降,而引入SiH4则使薄膜的耐磨性能有较大的提高。IR和XPS光谱表明:薄膜中含有较多的-OH,O-C,C-Si和Si-O基团,随着SiH4/H2的增加薄膜中的C/Si比可达1.222,说明产物的结构介于无机材料和有机物之间。 相似文献
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隧道小孔中超薄SiO2的生长是EEPROM电路制造的关键工艺之一。采用SUPREM-Ⅲ工艺模拟程序对超薄SiO2的热生长进行了工艺模拟,经过大量的工艺实验及优化,确定了超薄SiO2的最佳生长条件,生长出的SiO2性能良好,完全可满足EEPROM研制的要求。 相似文献
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采用非醇盐溶胶-凝胶工艺制得纳米微晶SnO2多孔薄膜,该法易于实现SnO2与多种添加剂的均匀掺杂。通过调整薄膜的微观结构使薄膜对C2H5OH和CO在最佳工作温度的灵敏度比调整前分别提高了3倍和14倍。 相似文献
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报道了以正硅酸乙酯(TEOS)为源,采用等离子体增强化学汽相淀积(PECVD)技术在InP表面低温生长SiO2钝化膜。对SiO2/InP界面态进行了X射线光谱(XPS)分析和C-V特性研究。 相似文献
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采用激光束反射偏转法测量了用溶胶-凝胶法在Si(11)基片上制备的TiO2-SiO2复合薄膜的曲率半径。由此计算出薄膜的热应力,应力和本征应力。研究了工艺过程与薄膜应力的关系,其应力随热处理温度的增加而由张应力转变为压应力;当热处理温度较低时,随膜厚的增加,其应力增大,而最终导致膜的开裂,薄膜的最大不开裂厚度随热处理温度和TiO2含量的增加而增加。 相似文献
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以石英玻璃片为基底,利用自组装技术在TiCl4-HCl体系中生长纳米TiO2,与在Fe(NO3)3-HNO3体系中生长纳米FeOOH制备负载型多层不同层序FeOOH-TiO2纳米复合薄膜光催化材料.高分辨透射电镜(HRTEM)表征结果显示:复合膜由纳米锐钛矿和针铁矿构成.UV-Vis表征结果显示:TiO2与FeOOH间的复合使TiO2吸收带均发生一定程度的红移,其中FeOOH/TiO2/FeOOH/TiO2和FeOOH/TiO2/FeOOH复合薄膜的吸收带分别为490 nm和498 nm;在以罗丹明B溶液为模拟废水的光催化实验中发现:负载FeOOH/TiO2/FeOOH/TiO2和FeOOH/TiO2/FeOOH的两种复合薄膜材料的光催化效果最佳;并且FeOOH膜在复合膜最外层比TiO2膜在最外层时光解效率高.具有一定吸附能力的针铁矿薄膜与TiO2薄膜的复合优化了复合膜内部微孔结构,促进两者间形成了积极地吸附-光催化耦合增强效应. 相似文献
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S.Hariech M.S.Aida J.Bougdira M.Belmahi G.Medjahdi D.Genève N.Attaf H.Rinnert 《半导体学报》2018,39(3):50-56
Cadmium sulfide (CdS) thin films have been prepared by a simple technique such as chemical bath deposition (CBD).A set of samples CdS were deposited on glass substrates by varying the bath temperature from 55 to 75 ℃ at fixed deposition time (25 min) in order to investigate the effect of deposition temperature on CdS films physical properties.The determination of growth activation energy suggests that at low temperature CdS film growth is governed by the release of Cd2+ ions in the solution.The structural characterization indicated that the CdS films structure is cubic or hexagonal with preferential orientation along the direction (111) or (002),respectively.The optical characterization indicated that the films have a fairly high transparency,which varies between 55% and 80% in the visible range of the optical spectrum,the refractive index varies from 1.85 to 2.5 and the optical gap value of which can reach 2.2 eV.It can be suggested that these properties make these films perfectly suitable for their use as window film in thin films based solar cells. 相似文献
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太阳电池中CdS多晶薄膜的微结构及性能 总被引:9,自引:1,他引:9
采用化学水浴法制备了CdS多晶薄膜,通过XRD,AFM,XPS和光学透过率谱等测试手段研究了CdS多晶薄膜生长过程中的结构和性能.结果表明,随着沉积的进行,薄膜更加均匀、致密,与衬底粘附力增强,其光学能隙逐渐增大,薄膜由无定形结构向六方(002)方向优化生长,同时出现了Cd(OH)2相.在此基础上,通过建立薄膜的生长机制与性能的联系,沉积出优质CdS多晶薄膜,获得了转化效率为13.38%的CdS/CdTe小面积电池. 相似文献
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Growth of cadmium sulfide(CdS)thin films on glass substrates was carried out by atmospheric pressure metal-organic chemical vapor deposition(AP-MOCVD)using Cd(S2CNEt2)2 as the single precursor.Changes in the surface morphology of the deposited CdS thin films were investigated by atomic force microscope(AFM)as the function of substrate temperature(Ts),vaporizing temperature(Tv),and Ar flow rate.With the increase of Tv,CdS thin films evolved from pyramidal structure with fine grains to columnar structure with large grains.X-ray diffraction(XRD)patterns indicated that the CdS films had random orientation at the lower T,and preferred orientation at the higher Tv.In addition,Ts had a great effect on the surface roughness of the CdS films,and a quantum dot-like structural CdS films were obtained in a narrow range of T,with high Ar flow rate.Furthermore,the optical properties of the CdS films were measured using ultraviolet-visible(UV/VIS)spectrometer. 相似文献
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David W. Niles Falah S. Hasoon 《Progress in Photovoltaics: Research and Applications》1993,1(4):279-282
Solution grorwth of CdS on SnO2-coated glass with subsequent heat treatments is known to produce stoichiometric CdS thin films with characteristic thicknesses of about 1000 Å. We show that heating solution-grown CdS thin films in a nitrogen atmosphere to ⩾ 450° C results in sulphur loss. Heating to 550°C leads to a 50% loss of sulphur, leaving the entire 1000-A CdS thin film with a concentration of about 75 at.% Cd and 25 at.% S. However, dipping the CdS thin films in a CdCl2 solution prior to heating coats the CdS, leaving a CdCl2 layer that acts as a protective coating and prohibits the loss of sulphur. Cadmium sulphide thin films dipped in a CdCl2 solution and then heated to 550°C are stoichiometric. 相似文献
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采用改进的sol-gel法及浸渍–提拉工艺在低温条件下制备了纳米TiO2薄膜。利用X射线衍射仪(XRD)、傅里叶变换红外光谱仪(FTIR)、扫描电镜(SEM)及紫外–可见光光谱仪(UV-Vis)对所制TiO2薄膜的物相结构、表面形貌以及光吸收特性进行了表征,并利用紫外光照降解亚甲基蓝溶液的方法考察了TiO2薄膜的光催化活性。结果表明:低温制备的纳米TiO2薄膜为锐钛矿结构,表面均匀致密,且对紫外光表现出较强的吸收特性。在紫外光照射48 h后,该TiO2薄膜对亚甲基蓝溶液的降解率为67.4%。 相似文献