一种基于半分析法的HEMT小信号参数的提取方法

提出了一种基于半分析法的高速电子迁移率半导体晶体管小信号模型的提取方法.此方法是用测试结构的方法来提取焊盘电容和寄生电感,半分析法来提取寄生电阻,提高了寄生电阻的提取精度.在频率高达40 GHz的范围内,多偏置情况下模拟的S参数和测试的S参数曲线吻合良好,证明这种方法是正确的.     

PIN光探测器的小信号电路模型参数的提取

提出了一种利用自适应遗传算法提取p-i-n光探测器小信号电路模型参数的方法.文章首先根据p-i-n光探测器的物理结构确定其等效电路模型,进而采用自适应遗传算法对测量的S参数进行拟合,提取模型参数.自适应遗传算法自动优化交叉概率和变异概率,避免了以往遗传算法中易早熟的缺点.利用该法成功提取出模型的10个参数,建立光探测器小信号电路模型.在130 MHz～20 GHz范围内的实验结果表明,模型仿真结果和测量结果相吻合,证明了这种参数提取方法的可靠性.     

用改进的遗传算法从S参数中提取HBT交流小信号等效电路模型参数

将遗传算法用于HBT等效电路模型参数的提取并对其进行改进,改进后的遗传算法自动优化遗传、杂交和变异算子,节省了寻找最佳遗传、杂交和变异概率的时间并提高了提取参数的速度.在1～26.5GHz频率范围内,用改进的遗传算法提取了Ga0.49In0.51P/GaAs HBT交流小信号等效电路模型的全部16个参数,得到了令人满意的模拟与测量S参数的比较结果.     

用改进的遗传算法从S参数中提取HBT交流小信号等效电路模型参数

将遗传算法用于HBT等效电路模型参数的提取并对其进行改进,改进后的遗传算法自动优化遗传、杂交和变异算子,节省了寻找最佳遗传、杂交和变异概率的时间并提高了提取参数的速度.在1～26.5GHz频率范围内,用改进的遗传算法提取了Ga0.49In0.51P/GaAs HBT交流小信号等效电路模型的全部16个参数,得到了令人满意的模拟与测量S参数的比较结果.     

用模拟退火算法从S参数提取HFET小信号等效电路模型参数

微波集成电路和微波器件的设计需要准确地提取 HFET的小信号等效电路模型参数 .采用带回火的模拟退火算法从 S参数提取 HFET小信号等效电路模型参数 ,得到了高质量的解 .计算结果是全局最优解 ,摆脱了初始值的影响 ,并且克服了局部优化算法遇到的不收敛或收敛到错误解的问题 .利用测量得到的栅电阻 ,计算结果的精度可以进一步提高 .这个算法同样也适用于 HBT、电容和电感等器件模型参数的提取     

Ⅲ-Ⅴ族HBT小信号模型直接提取方法

介绍了一种较为精确的Ⅲ-Ⅴ族HBT小信号模型的直接提取方法。该方法中的HBT小信号等效电路拓扑结构采用混合PI型结构,并通过在不同偏置状态下的测量进行模型参数的提取。采用该方法对2μm工艺、叉指数为2、发射结面积为2μm×20μm的HBT模型管进行了提取,提取结果在DC-20GHz频率范围内具有较好的精度,提取误差小于6%。     

SOLT校准方法及其在射频测量中的应用

分析了矢量网络分析仪测试系统的误差来源,给出二端口SOLT校准的12项误差模型,由此推导了待测元件的真实S参数,并且详细讲述了SOLT校准件的制作方法,确定出开路件的边缘电容。最后,使用自制的PCB夹具测量了0603封装的电感和电容．对校准前后的测量数据进行了对比、分析,并成功地提取了封装后的模型参数,结果证明该方法可以用于射频夹具测量的校准。     

用模拟退火算法从S参数提取HFET小信号等效电路模型参数

微波集成电路和微波器件的设计需要准确地提取HFET的小信号等效电路模型参数.采用带回火的模拟退火算法从S参数提取HFET小信号等效电路模型参数,得到了高质量的解.计算结果是全局最优解,摆脱了初始值的影响,并且克服了局部优化算法遇到的不收敛或收敛到错误解的问题.利用测量得到的栅电阻,计算结果的精度可以进一步提高.这个算法同样也适用于HBT、电容和电感等器件模型参数的提取.     

一种改进的深亚微米MOSFET噪声模型

提出一种基于小信号的噪声模型,在精确提取0.13 μm MOSFET的小信号参数后,结合Pospieszalsik和pucel模型,运用噪声相关矩阵转换技术提取出所有噪声参数。利用ADS建立噪声模型,在2～20 GHz频率范围内,仿真结果与测量结果吻合良好,验证了模型的准确性。     

射频MOSFET噪声模型研究

对0.13μm MOSFET噪声建模和参数提取技术进行了研究,在精确地提取了小信号模型参数之后,利用噪声相关矩阵技术从测量的散射参数和射频噪声参数直接提取了栅极感应噪声电流■、沟道噪声电流■和它们的相关系数,并用PRC模型中的参数来表示。将参数提取结果带入ADS中进行仿真,在2～8GHz频段上仿真结果与测量数据吻合良好。     

Direct parameter-extraction method for HBT small-signal model

An accurate and broadband method for the direct extraction of heterojunction bipolar transistor (HBT) small-signal model parameters is presented in this paper. This method differs from previous ones by extracting the equivalent-circuit parameters without using special test structures or global numerical optimization techniques. The main advantage of this method is that a unique and physically meaningful set of intrinsic parameters is extracted from the measured S-parameters for the whole frequency range of operation. The extraction procedure uses a set of closed-form expressions derived without any approximation. An equivalent circuit for the HBT under a forward-bias condition is proposed for extraction of access resistances and parasitic inductances. An experimental validation on a GaInP/GaAs HBT device with a 2×25 μm emitter was carried out, and excellent results were obtained up to 30 GHz. The calculated data-fitting residual error for three different bias points over 1-30 GHz was less then 2%     

A pure analytic method for direct extraction of collector-up HBT's small-signal parameters

A pure analytic procedure for direct extraction of the small-signal equivalent-circuit parameters, including extrinsic inductances, has been demonstrated and successfully applied to III-V and SiGe collector-up heterojunction bipolar transistors (HBTs). This method can alleviate some difficulties encountered among conventional extracting techniques that are the use of additional test structures, forward-biased measurements at specific bias conditions, and empirical optimization process. In this paper, the hybrid-/spl pi/ equivalent-circuit elements are extracted in a simple and efficient way from impedance and admittance formulation on the basis of measured S-parameters. To study the bias dependence, the extrinsic and intrinsic circuit components are evaluated under different bias conditions. The model parameters are sequentially derived during the extraction process yielding a full set of physical element values. The validity of our model is explored on pnp collector-up AlGaAs-InGaAs HBTs, and a good coincidence between measured and modeled S-parameters is observed for the entire frequency range of operation. Consistent extracted trends indicate that this improved equivalent-circuit model is suitable to be implemented in circuit simulators for microwave-circuit TCAD applications.     

Direct parameter extraction of SiGe HBTs for the VBIC bipolar compact model

An improved direct parameter extraction method of SiGe heterojunction bipolar transistors (HBTs) for the vertical bipolar intercompany (VBIC)-type hybrid-/spl pi/ model is developed. All the equivalent circuit elements are extracted analytically from S-parameter data only and without any numerical optimization. The proposed technique of the parameter extraction, differing from the previous ones, focuses on correcting the pad de-embedding error for an accurate and invariant extraction of intrinsic base resistance (R/sub bi/), formulating a new parasitic substrate network, and improving the extraction procedure of transconductance (g/sub m/), dynamic base-emitter resistance (r/sub /spl pi//), and base-emitter capacitance (C/sub /spl pi//) using the accurately extracted R/sub bi/. The extracted parameters are frequency-independent and reliable due to elimination of any de-embedding errors. The agreements between the measured and model-calculated data are excellent in the frequency range of 0.2-10.2 GHz over a wide range of bias points. Therefore, we believe that the proposed extraction method is a simple and reliable routine applicable to the optimization of transistor design, process control, and the improvement of VBIC compact model, especially for SiGe HBTs.     

An accurate nonlinear MOSFET model for intermodulation distortion analysis

A compact charge-conservative nonlinear equivalent circuit model for metal-oxide-semiconductor field-effect transistors is comprehensively verified in terms of its ability to predict intermodulation distortion. The model is valid for the dc, small-signal, and large-signal simulation of high frequency circuits over a wide range of bias conditions and is globally fully continuous. Simulations made using the model, following parameter extraction, are validated by comparisons with experimental data. Using harmonic balance methods, intermodulation distortion for weak and large-signal two-tone tests and more realistic wide-band code-division-multiple-access signals is successfully predicted for a range of bias points.     

A physical, yet simple, small-signal equivalent circuit for theheterojunction bipolar transistor

A physical, yet simple, small-signal equivalent circuit for the heterojunction bipolar transistor (HBT) is proposed. This circuit was established by analyzing in detail the physical operation of the HBT. The model verification was carried out by comparison of the measured and simulated S- and Z-parameters for both passive (reverse-biased) and active bias conditions. A feature of this model is that it uses a direct extraction method to determine the parasitic elements, in particular, the parasitic capacitances. The excellent agreement between the measured and simulated parameters was verified all over the frequency range from 0.25 to 75 GHz     

Direct parameter-extraction method for laser diode rate-equation model

A new direct extraction method to determine the small-signal and rate-equation model parameters for laser diode is presented in this paper. This method differs from previous ones by extracting the whole model parameters without global numerical optimization techniques. The main advantage of this method is that a unique and physically meaningful set of extrinsic and intrinsic parameters are extracted by using a set of closed-form expressions based on the input reflection coefficients and modulation responses taken from on-wafer measurement. Simulated and measured results for the input reflection coefficients and modulation responses exhibit good agreement over a wide range of bias points.     

Fast and efficient extraction of HBT model parameters usingmultibias S-parameter sets

Accurate parameter extraction technique has been presented for a small-signal equivalent circuit model of AlGaAs-GaAs HBT's. This technique makes use of multibias data optimization regarding two sets of S-parameters in the active mode and one in the cut-off mode, under the physics-based constraint that current-dependent elements in two active bias circuits are linked to each other by the ratio of their currents. This multibias optimization as well as the constraint imposed on intrinsic parameters may reduce the degree of freedom of circuit variables and increase the probability of finding a global minimum result. As a result of this extraction, good agreement is seen between the circuit models and their measured S-parameters in the frequency range of 0.045 to 26.5 GHz     

Analytical parameter extraction of the HBT equivalent circuit withT-like topology from measured S-parameters

A pure analytical method for extraction of the small-signal equivalent circuit parameters from measured data is presented and successfully applied to heterojunction bipolar transistors (HBT's). The T-like equivalent circuit is cut into three shells accounting for the connection, and the extrinsic and intrinsic parts of the transistor. The equivalent circuit elements are evaluated in a straightforward manner from impedance and admittance representation of the measured S-parameters. The measured data are stripped during the extraction process yielding, step by step, a full set of circuit elements without using fit methods. No additional knowledge of the transistor is needed to start the extraction process with its self-consistent iteration loop for the connection shell. The extrinsic and intrinsic equivalent circuit elements are evaluated using their bias and frequency dependencies. This method yields a deviation of less then 4% between measured and modeled S-parameters     

A robust integrated multibias parameter-extraction method forMESFET and HEMT models

An integrated multibias extraction technique for MESFET and high electron-mobility transistor (HEMT) models is presented in this paper. The technique uses S-parameters measured at various bias points in the active region to construct one optimization problem, of which the vector of unknowns contains a set of bias-dependent elements for each bias point and one set of bias-independent elements. This problem is solved by an extremely robust decomposition-based optimizer, which splits the problem into n subproblems, n being the number of unknowns. The optimizer consistently converges to the same solution from a wide range of randomly chosen starting values. No assumptions are made concerning the layout of the device or the bias dependencies of the intrinsic model elements. It is shown that there is a convergence in the values of the model elements and a decrease in the extraction uncertainty as the number of bias points in the extraction is increased. Robustness tests using 100 extractions, each using a different set of random starting values, are performed on measured S-parameters of a MESFET and pseudomorphic HEMT device. Results indicate that the extracted parameters typically vary by less than 1%. Extractions with up to 48 bias points were performed successfully, leading to the simultaneous determination of 342 model elements