Temperature accelerated life test on commercial concentrator III–V triple‐junction solar cells and reliability analysis as a function of the operating temperature

A temperature accelerated life test on commercial concentrator lattice‐matched GaInP/GaInAs/Ge triple‐junction solar cells has been carried out. The acceleration of the aging has been accomplished by subjecting the solar cells at temperatures markedly higher than the nominal working temperature inside a concentrator, and the nominal photo‐current condition (820 X) has been emulated by injecting current in darkness. Three tests at different temperatures have been carried out. The failure distributions across the three test temperatures have been fitted to an Arrhenius–Weibull model. An Arrhenius activation energy of 1.59 eV was determined from the fit. The reliability functions and parameters of these solar cells at two nominal working conditions (80 and 100 °C) have been obtained. In both cases, the instantaneous failure rate function monotonically increases, that is, the failures are of the wear‐out kind. We have also observed that the reliability data are very sensitive to the nominal temperature condition. In fact, at a nominal working condition of 820 X and 80 °C, assuming that the concentration module works 5 h per day, the warranty time obtained for a failure population of 5% has been 113 years. However, for a nominal working condition of 820 X and 100 °C, the warranty time obtained for a failure population of 5% has been 7 years. Therefore, in order to offer a long‐term warranty, the working temperature could be a key factor in the design of the concentration photovoltaic systems. Copyright © 2014 John Wiley & Sons, Ltd.     

Semi‐quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers

An adequate qualification of concentrator photovoltaic solar cells and cell‐on‐carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi‐quantitative temperature‐accelerated life test to qualify solar cells and cell‐on‐carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9 eV. A properly designed semi‐quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper. Copyright © 2015 John Wiley & Sons, Ltd.     

Evaluation of the reliability of high concentrator GaAs solar cells by means of temperature accelerated aging tests

Evaluating the reliability, warranty period, and power degradation of high concentration solar cells is crucial to introducing this new technology to the market. The reliability of high concentration GaAs solar cells, as measured in temperature accelerated life tests, is described in this paper. GaAs cells were tested under high thermal accelerated conditions that emulated operation under 700 or 1050 suns over a period exceeding 10 000 h. Progressive power degradation was observed, although no catastrophic failures occurred. An Arrhenius activation energy of 1.02 eV was determined from these tests. The solar cell reliability [R(t)] under working conditions of 65°C was evaluated for different failure limits (1–10% power loss). From this reliability function, the mean time to failure and the warranty time were evaluated. Solar cell temperature appeared to be the primary determinant of reliability and warranty period, with concentration being the secondary determinant. A 30‐year warranty for these 1 mm²‐sized GaAs cells (manufactured according to a light emitting diode‐like approach) may be offered for both cell concentrations (700 and 1050 suns) if the solar cell is operated at a working temperature of 65°C. Copyright © 2012 John Wiley & Sons, Ltd.     

Spectral response measurements of monolithic GaInP/Ga(In)As/Ge triple‐junction solar cells: Measurement artifacts and their explanation

Procedures for measuring the spectral response of multi‐junction cells in general require variation of the bias spectrum and voltage biasing. It is shown that a refined procedure including optimization of bias spectrum and voltage is necessary to minimize a measurement artifact, which appears if the subcell under test has non‐ideal properties, such as a low shunt resistance or a low reverse breakdown voltage. This measurement artifact is often observed on measuring the spectral response of the Ge bottom cell of GaInP/Ga(In)As/Ge triple‐junction cells. The main aspect of the measurement artifact is that the response of another subcell is simultaneously measured, while at the same time the signal of the Ge subcell is too low. Additionally, the shape of the spectral response curve is influenced under certain measurement conditions. In this paper the measurement artifact is thoroughly discussed by measurement results and simulation. Based on this analysis, a detailed procedure for the spectral response measurement of multi‐junction cells is developed, specially designed to minimize such measurement artifacts. Copyright © 2003 John Wiley & Sons, Ltd.     

Degradation of subcells and tunnel junctions during growth of GaInP/Ga(In)As/GaNAsSb/Ge 4‐junction solar cells

A GaInP/Ga(In)As/GaNAsSb/Ge 4J solar cell grown using the combined MOVPE + MBE method is presented. This structure is used as a test bench to assess the effects caused by the integration of subcells and tunnel junctions into the full 4J structure. A significant degradation of the Ge bottom subcell emitter is observed during the growth of the GaNAsSb subcell, with a drop in the carrier collection efficiency at the high energy photon range that causes a ~15% lower J_sc and a V_oc drop of ~50 mV at 1‐sun. The V_oc of the GaNAsSb subcell is shown to drop by as much as ~140 mV at 1‐sun. No degradation in performance is observed in the tunnel junctions, and no further degradation is neither observed for the Ge subcell during the growth of the GaInP/Ga(In)As subcells. The hindered efficiency potential in this lattice‐matched 4J architecture due to the degradation of the Ge and GaNAsSb subcells is discussed.     

Effect of postgrowth techniques on the characteristics of triple-junction InGaP/Ga(In)As/Ge solar cells

The photoelectric characteristics of triple-junction InGaP/Ga(In)As/Ge solar cells are studied in relation to the method used to form the photocell chip. It is shown that the application of a postgrowth technique developed in the study for separating a nanoheterostructure into chips in a single process makes it possible to improve the quality of passivation of the chip edges, which diminishes the surface leakage currents and makes larger the yield of devices with improved characteristics.     

Strain induced lateral ordering in Ga0.22In0.78As/Ga0.22In0.78P short period superlattices on (001) InP

The application of the strain induced lateral ordering process to the strain-compensated (Ga_0.22In_0.78As)_m (Ga_0.22In_0.78P)_m short period superlattices is investigated. The superlattices have been grown at low temperatures by solid source molecular beam epitaxy (MBE) on (001) InP. These superlattices have been used in multiquantum well heterostructures using InP as barriers. The anisotropic polarization of photoluminescence shows the existence of lateral modulation. Dark-field images using the 220 reflection gives modulated contrast in the superlattice layers. High-resolution transmission electron microscopy shows local variations of the interplanar spacing of the (200) planes as well as the angles they form with the (002) planes.     

Failure analysis of Cu(In,Ga)Se2 photovoltaic modules: degradation mechanism of Cu(In,Ga)Se2 solar cells under harsh environmental conditions

High‐temperature‐induced and humidity‐induced degradation behaviors were investigated through the failure analysis of encapsulated Cu(In,Ga)Se₂ (CIGS) modules and non‐encapsulated CIGS cells. After being exposed to high temperature (85 °C) for 1000 h, the efficiency loss of CIGS modules and the resistivities of the aluminum‐doped zinc oxide (AZO) layer, CIGS layer, and Mo layer were slightly increased. After damp heat (DH) testing (85 °C/85% RH), the efficiency of some modules decreased significantly accompanied by discoloration, and in these areas, the resistivity of the AZO layers increased markedly. The causes of degradation of CIGS cells after high temperature and DH tests were suggested through X‐ray photoelectron spectroscopy analysis. The high‐temperature‐induced degradation behaviors were revealed to be increases in series resistance of the CIGS cells, due to the adsorption of oxygen on the AZO, CIGS, and Mo layers. The degradation behavior after DH (85 °C/85% RH) exposure was caused by the adsorption of oxygen, as well as the generation of Zn(OH)₂ due to water molecules. In particular, the humidity‐induced degradation behavior in discolored CIGS modules was ascribed to the generation of Zn(OH)₂ and carboxylic acids in the AZO layer, due to a chemical reaction between the AZO, ethylene‐vinyl acetate copolymer, and water. Copyright © 2014 John Wiley & Sons, Ltd.     

High efficiency low temperature grown Cu(In,Ga)Se2 thin film solar cells on flexible substrates using NaF precursor layers

We report a total‐area efficiency of 15.9% for flexible Cu(In,Ga)Se₂ thin film solar cells on polyimide foil (cell area 0.95 cm²). The absorber layer was grown by a multi‐stage deposition process at a maximum nominal process temperature of 420°C. The Na was added via evaporation of a NaF layer prior to the absorber deposition leading to an enhanced V_oc and FF. Growth conditions and device characterization are described. Copyright © 2011 John Wiley & Sons, Ltd.     

The effect of Zn1‐xMgxO buffer layer deposition temperature on Cu(In,Ga)Se2 solar cells: A study of the buffer/absorber interface

The effect of atomic layer deposition temperature of Zn_1‐xMg_xO buffer layers for Cu(In,Ga)Se₂ (CIGS) based solar cell devices is evaluated. The Zn_1‐xMg_xO films are grown using diethyl zinc, bis‐cyclopentadienyl magnesium and water as precursors in a temperature range of 105 to 180°C. High efficiency devices are produced in the region from 105 up to 135°C. At a Zn_1‐xMg_xO deposition temperature of 120°C, a maximum cell efficiency of 15·5% is reached by using a Zn_1‐xMg_xO layer with an x‐value of 0·2 and a thickness of 140 nm. A significant drop in cell efficiency due to large losses in open circuit voltage and fill factor is observed for devices grown at temperatures above 150°C. No differences in chemical composition, structure and morphology of the samples are observed, except for the samples prepared at 105 and 120°C that show elemental selenium present at the buffer/absorber interface. The selenium at the interface does not lead to major degradation of the solar cell device efficiency. Instead, a decrease in Zn_1‐xMg_xO resistivity by more than one order of magnitude at growth temperatures above 150°C may explain the degradation in solar cell performance. From energy filtered transmission electron microscopy, the width of the CIGS/Zn_1‐xMg_xO chemical interface is found to be thinner than 10 nm without any areas of depletion for Cu, Se, Zn and O. Copyright © 2008 John Wiley & Sons, Ltd.     

Non‐destructive optical analysis of band gap profile,crystalline phase,and grain size for Cu(In,Ga)Se2 solar cells deposited by 1‐stage, 2‐stage,and 3‐stage co‐evaporation

Cu(In,Ga)Se₂ (CIGS) thin films co‐evaporated by 1‐stage, 2‐stage, and 3‐stage processes have been studied by spectroscopic ellipsometry (SE). The disappearance of a Cu_2‐xSe optical signature, detected by real time SE during multistage CIGS, has enabled precise endpoint control. Band gap energies determined by SE as depth averages show little process variation for fixed [Ga]/([In] + [Ga]) atomic ratio, whereas their broadening parameters decrease with increasing number of stages, identifying successive grain size enhancements. Refined SE analysis has revealed band gap profiling only for 3‐stage CIGS. Solar cells incorporating these absorbers have yielded increased efficiencies in correlation with phase control, grain size, and band gap profiling. Copyright © 2013 John Wiley & Sons, Ltd.