共查询到19条相似文献,搜索用时 171 毫秒
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高频组件是空间行波管的主要部件,是管内传播高频电磁波的重要传输部件,其中陶瓷封接部位一般采用银焊料进行焊接,它一般存放于真空柜中.存放一段时间后,组件表面出现了发黑现象.分析表明真空柜中放置的橡胶制品导致了高频组件银焊料焊接部位发生硫化,导致贮存失效.结合实验结果和理论分析,在大气状态下,橡胶套中的硫是比较稳定的.然而在真空状态下,硫是比较容易从橡胶套中升华进入真空柜中的,从而会在真空柜中弥漫大量硫蒸气,这些硫蒸气与银焊料发生化学反应形成Ag2S,因此含硫的橡胶套不宜放入真空柜. 相似文献
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真空环境下的共晶焊接 总被引:1,自引:1,他引:0
共晶焊接是微电子组装中一种重要的焊接工艺。文章简要介绍了共晶焊接的工作原理以及共晶焊料如何选用和常用共晶焊料的性能特性。然后比较了几种共晶焊接设备的优缺点,得出用真空可控气氛共晶炉在真空环境下完成共晶焊接能有效防止共晶焊接过程中氧化物的产生,大大降低空洞率,从而提高焊接质量。它同样适用于多芯片组件的一次共晶。对真空环境下影响共晶焊接质量的真空度、保护性气氛、焊接过程中的温度曲线、焊接时的压力等条件做了探讨,得出了几种最优的工艺方案,能适用于大部分的共晶焊接工艺。 相似文献
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介绍了半导体金锡(AuSn)焊料焊接封装的影响因素:焊接气氛、镀金层、焊料,在低温真空焊接封装的基础上,重点探讨了AuSn焊料真空钎焊封装的影响因素、AuSn焊料本身的组分比及其浸润性等对焊接封装的影响、AuSn焊料真空焊接封装炉温曲线设置及焊接温度和时间的正交实验、AuSn焊料真空焊接封装中真空度的影响因素、真空度对... 相似文献
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感应钎焊技术因其具有加热迅速、焊接效率高、焊料氧化少和加热部位局域化的优点,被用来焊接微波组件中的电连接器。针对组件外形不同和待焊电连接器种类不同,设计了与组件结构相匹配的感应线圈,探索优化了感应加热参数设置。焊接获得的电连接器焊缝质量良好、气密性指标优异,满足气密封质量要求。 相似文献
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《Proceedings of the IEEE. Institute of Electrical and Electronics Engineers》1966,54(10):1335-1349
This paper is intended as a status report on high-speed detectors for the visible and near-infrared portion of the optical spectrum. Both vacuum and solid-state detectors are discussed, with the emphasis on those devices which can be used as direct (noncoherent) detectors of weak optical signals modulated at microwave frequencies. The best detectors for this application have internal current gain and in this regard the relevant properties and limitations of high-frequency secondary emission multiplication in vacuum tube devices and avalanche multiplication in p-n junctions are summarized. 相似文献
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Johnson R.W. Palmer M.J. Bozack M.J. Isaacs-Smith T. 《Electronics Packaging Manufacturing, IEEE Transactions on》1999,22(1):7-15
As the laminate substrate industry moves from hot air solder level (HASL) finishes, alternate plating finishes are being proposed such as immersion gold/electroless nickel, electroless palladium, and electroless silver. This paper presents results of an evaluation of the thermosonic gold ball wire bondability of electroless palladium. Two palladium thicknesses, with and without a nickel underlayer, were evaluated from two vendors. In each case, a thin gold passivation layer was deposited by immersion plating over the palladium. The initial evaluation criteria included bondability (number of missed bonds and flame off errors), wire pull strength, standard deviation, bond failure mode, and visual inspection. The bonding window was determined by independently varying force (four levels), power (four levels), and time (two levels). The stage temperature was maintained at 150°C, compatible with BT laminate material. Different preconditioning environments such as a solder reflow cycle, high temperature storage (125°C) and humidity storage (85%RH/85°C) on initial bondability were also considered. Rutherford backscattering and Auger analysis were used to examine the surface finishes. The stability of the bonds was investigated by high temperature storage (125°C) with periodic electrical resistance and pull strength testing 相似文献
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N. P. Klochko G. S. Khrypunov N. D. Volkova V. R. Kopach V. N. Lyubov M. V. Kirichenko A. V. Momotenko N. M. Kharchenko V. A. Nikitin 《Semiconductors》2013,47(6):856-864
The conditions of the bonding of silicon multijunction solar cells with vertical p-n junctions using Ag-In solder are studied. The compositions of electrodeposited indium films on silicon wafers silver plated by screen printing and silver and indium films fabricated by layer-by-layer electrochemical deposition onto the surface of silicon vertical diode cells silver plated in vacuum are studied. Studying the electrochemical-deposition conditions, structure, and surface morphology of the grown layers showed that guaranteed bonding is provided by 8-min heat treatment at 400°C under the pressure of a stack of metallized silicon wafers; however, the ratio of the indium and silver layer thicknesses should not exceed 1: 3. As this condition is satisfied, the solder after wafer bonding has the InAg3 structure (or InAg3 with an Ag phase admixture), due to which the junction melting point exceeds 700°C, which guarantees the functioning of such solar cells under concentrated illumination. 相似文献
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The effects of sulfur on the wettability of Sn-0.7Cu on Cu and on the corrosion behavior of Sn-0.7Cu in 3.5 wt% NaCl solution were investigated. The results reveal that sulfur considerably improves the wettability of Sn-0.7Cu and the optimal sulfur content is 0.08 wt%. SnS and SnSO4 phases form on the surface of the sulfur containing Sn-0.7Cu solder alloy after soldering characterized by XPS and XRD analysis. The addition of sulfur decreases the dross formation of the solder melt and the formation of SnO2 is inhibited. The potentiodynamic polarization tests show that the corrosion resistance of Sn-0.7Cu solder alloy is obviously enhanced by sulfur element. Analyses by SEM and XRD indicate that sulfur promotes the formation of the corrosion product, Sn3O(OH)2Cl2, on the surface of sulfur containing Sn-0.7Cu solder and it keeps the solder alloy from further corrosion. 相似文献
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Te-yuan Chung Jian-Hong Jhang Jing-Sian Chen Yi-Chien Lo Gwo-Herng Ho Mount-Learn Wu Ching-Cherng Sun 《Microelectronics Reliability》2012,52(5):872-877
We tested the ability of Au/Sn eutectic, silver paste, and solder paste to bond to a large area as well as the bonding of a high power LED die to a highly conductive submount. The samples ran through several tests including ultrasound image, shear force, and thermal resistance measurement. Finite element analysis (FEA) models were built for comparison and analysis. Au/Sn bonding shows the best thermal and mechanical properties. Silver paste shows lower contact thermal resistance compared with solder paste. Although the thickness of the silver paste bonding layer is greater than the solder paste bonding layer, the average total thermal resistance is noticeably lower than the solder paste bonded samples. 相似文献
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Yoshiharu Kariya Takuya Hosoi Shinichi Terashima Masamoto Tanaka Masahisa Otsuka 《Journal of Electronic Materials》2004,33(4):321-328
The mechanical shear fatigue test has been performed to study the effect of silver content on the fatigue properties of Sn-xAg-0.5Cu
(x=1, 2, 3, and 4) for flip-chip interconnections. The strength of the solder alloy increases with increasing silver content,
preventing shear plastic deformation of the solder bump. The flip-chip joints made using higher silver content solder, such
as 3%Ag and 4%Ag, exhibit longer fatigue life for all conditions. The fatigue ductility of the solder decreases with an increase
in the silver content. The fatigue endurance of 1%Ag solder is superior to other solders over the plastic strain range of
3%, even though the strength of the solder is the lowest in the solders tested. Based on this study, the 3Ag solder may exhibit
good fatigue performance for all conditions, and the 1Ag solder is optimum for severe strain conditions. 相似文献