InGaP HBT 大信号RF功率传输特性

本文实验研究了用于RF功率放大器的先进的InGaP HBT 器件大信号RF功率传输特性。研究了InGaP HBT在小信号和大信号状态下输出端的发射功率和反射功率及输入端的反射功率的规律。分析了InGaP HBT RF功率信号的多频率功率成份及其对大信号功率增益压缩,非线性和RF输出功率饱和的影响。     

Large signal RF power transmission characterization of InGaP HBT for RF power amplifiers

The large signal RF power transmission characteristics of an advanced InGaP HBT in an RF power amplifier are investigated and analyzed experimentally. The realistic RF powers reflected by the transistor, transmitted from the transistor and reflected by the load are investigated at small signal and large signal levels. The RF power multiple frequency components at the input and output ports are investigated at small signal and large signal levels, including their effects on RF power gain compression and nonlinearity. The results show that the RF power reflections are different between the output and input ports. At the input port the reflected power is not always proportional to input power level; at large power levels the reflected power becomes more serious than that at small signal levels, and there is a knee point at large power levels. The results also show the effects of the power multiple frequency components on RF amplification.     

一种应用于InGaP/GaAs HBT射频功率放大器的在片温度补偿电路

A new on-chip temperature compensation circuit for a GaAs-based HBT RF amplifier applied to wireless communication is presented.The simple compensation circuit is composed of one GaAs HBT and five resistors with various values,which allow the power amplifier to achieve better thermal characteristics with a little degradation in performance.It effectively compensates for the temperature variation of the gain and the output power of the power amplifier by regulating the base quiescent bias current.The temp...     

An on-chip temperature compensation circuit for an InGaP/GaAs HBT RF power amplifier

A new on-chip temperature compensation circuit for a GaAs-based HBT RF amplifier applied to wireless communication is presented.The simple compensation circuit is composed of one GaAs HBT and five resistors with various values,which allow the power amplifier to achieve better thermal characteristics with a little degradation in performance.It effectively compensates for the temperature variation of the gain and the output power of the power amplifier by regulating the base quiescent bias current.The temperature compensation circuit is applied to a 3-stage integrated power amplifier for wireless communication applications,which results in an improvement in the gain variation from 4.0 to 1.1 dB in the temperature range between -20 and +80℃.     

High reliability InGaP/GaAs HBT

Excellent long term reliability InGaP/GaAs heterojunction bipolar transistors (HBT) grown by metalorganic chemical vapor deposition (MOCVD) are demonstrated. There were no device failures (T=10000 h) in a sample lot of ten devices (L=6.4 μm ×20 μm) under moderate current densities and high-temperature testing (J_c=25 kA/cm ², V_ce=2.0 V, Junction Temp =264°C). The dc current gain for large area devices (L=75 μm ×75 μm) at 1 kA/cm² at a base sheet resistance of 240 ohms/sq (4×10 ¹⁹ cm^-3@700 Å) was over 100. The dc current gain before reliability testing (L=6.4 μm ×10 μm) at 0.8 kA/cm² was 62. The dc current gain (0.8 kA/cm²) decreased to 57 after 10000 h of reliability testing. The devices showed an f_T=61 GHz and f_max=103 GHz. The reliability results are the highest ever achieved for InGaP/GaAs HBT and these results indicate the great potential of InGaP/GaAs HBT for numerous low- and high-frequency microwave circuit applications. The reliability improvements are probably due to the initial low base current at low current densities which result from the low surface recombination of InGaP and the high valence band discontinuity between InGaP and GaAs     

一种预失真可调InGaP/GaAs HBT射频功率放大器

提出了一种具有可调预失真功能的共集电极放大电路,对其动态偏置点及双负反馈回路进行了分析.AWR Microwave Office仿真表明:该预失真电路产生的增益扩展与负相位偏差可以补偿该功率放大器后级电路产生的增益压缩和正相位偏差,提高其线性度.采用该预失真电路作为输入级,设计了一款功率放大器,并基于截止频率为29.5 GHz的2 μm InGaP/GaAs HBT工艺成功流片.测试结果表明,该宽带放大器在3.5 V偏置电压下和1.3～2.0 GHz频段范围内功率增益可达27 dB,P1dB为28.6 dBm,最大功率附加效率为39%.     

高功率附加效率的InGaP/GaAs功率HBT

采用发射极基极金属自对准工艺，成功研制出了InGaP/GaAs功率HBT．发射极尺寸为(3μm×15μm)×16的功率器件的截止频率和最高振荡频率分别为55GHz和35GHz．在片load-pull测试表明：当工作频率为1GHz时，器件工作在AB类，该功率管最大输出功率为23.5dBm，最大功率附加效率达60%，P1dB的输出功率为21dBm，对应增益为16dB，工作电压为3.5V．     

晶向对InGaP/GaAs HBT性能的影响

在对In Ga P/ Ga As HBT特性的研究中发现,发射极长边与主对准边垂直([0 1 1 ]方向)和平行([0 1 1 ]方向)放置时,其直流电流增益和截止频率是不同的.[0 1 1 ]方向的直流电流增益远远大于[0 1 1 ]方向,而它的截止频率则略小于[0 1 1 ]方向.文献中认为电流增益的不同是压电效应产生的,但这种观点并不能很好地解释截止频率的晶向依赖性.文中用压电效应和两个互相垂直方向上发射区侧向腐蚀形状的不同很好地解释了所有实验结果     

一种应用于IEEE 802.11 a_n的高线性度InGaP/GaAs功率放大器

A three-stage 4.8-6 GHz monolithic power amplifier(PA) compatible with IEEE 802.11a/n designed based on an advanced 2μm InGaP/GaAs hetero-junction bipolar transistor(HBT) process is presented.The PA integrates input matching and closed-loop power control circuits on chip.Under 3.3 V DC bias,the amplifier achieves a ~31 dB small signal gain,excellent wide band input and output matching among overall 1.2 GHz bandwidth,and up to 24.5 dBm linear output power below EVM 3%with IEEE 802.11a 64QAM OFDM input signal.     

晶向对InGaP/GaAs HBT性能的影响

在对InGaP/GaAs HBT特性的研究中发现,发射极长边与主对准边垂直([011]方向)和平行([01 1]方向)放置时,其直流电流增益和截止频率是不同的.[011]方向的直流电流增益远远大于[01 1]方向,而它的截止频率则略小于[01 1]方向.文献中认为电流增益的不同是压电效应产生的,但这种观点并不能很好地解释截止频率的晶向依赖性.文中用压电效应和两个互相垂直方向上发射区侧向腐蚀形状的不同很好地解释了所有实验结果.     

高功率附加效率的InGaP/GaAs功率HBT

采用发射极-基极金属自对准工艺,成功研制出了InGaP/GaAs功率HBT.发射极尺寸为(3μm×15μm)×16的功率器件的截止频率和最高振荡频率分别为55GHz和35GHz.在片load-pull测试表明:当工作频率为1GHz时,器件工作在AB类,该功率管最大输出功率为23.5dBm,最大功率附加效率达60%,P1dB的输出功率为21dBm,对应增益为16dB,工作电压为3.5V.     

自对准InGaP/GaAs HBT单片集成跨阻放大器

对自对准InGaP/GaAs HBT单片集成跨阻放大器进行了研究.采用发射极金属做腐蚀掩膜并利用GaAs腐蚀各向异性的特点来完成BE金属自对准工艺,最终制作出的器件平均阈值电压为1.15V,单指管子电流增益为50,发射极面积4μm×14μm的单管在IB=200μA和VCE=2V偏压条件下截止频率达到了40GHz.设计并制作了直接反馈和CE-CC-CC两种单片集成跨阻放大器电路,测量得到的跨阻增益在3dB带宽频率时分别为50.6dBΩ和45.1dBΩ,3dB带宽分别为2.7GHz和2.5GHz,电路最小噪声系数分别为2.8dB和3.2dB.     

用于微波放大器的InGaP HBT微波动态大信号波形特性

In wireless mobile communications and wireless local area networks （WLAN）, advanced InGaP HBT with power amplifiers are key components. In this paper, the microwave large signal dynamic waveform characteristics of an advanced InGaP HBT are investigated experimentally for 5.8 GHz power amplifier applications. The microwave large signal waveform distortions at various input power levels, especially at large signal level, are investigated and the reasons are analyzed. The output power saturation is also explained. These analyses will be useful for power amplifier designs.     

Microwave dynamic large signal waveform characterization of advanced InGaP HBT for power amplifiers

In wireless mobile communications and wireless local area networks (WLAN), advanced lnGaP HBT with power amplifiers are key components. In this paper, the microwave large signal dynamic waveform characteristics of an advanced InGaP HBT are investigated experimentally for 5.8 GHz power amplifier applications. The microwave large signal waveform distortions at various input power levels, especially at large signal level, are investigated and the reasons are analyzed. The output power saturation is also explained. These analyses will be useful for power amplifier designs.     

三指发射极InGaP/GaAs HBT的研制

异质结双极型晶体管(HBT)是MMIC领域中最具有竞争力的三端器件之一.本文提出了一种三指发射极HBT的设计.通过与同一版上两指发射极HBT比较,证实了该设计的工艺宽容度高、可靠性和一致性好、成品率高,并且仍然具有两指发射极HBT良好的击穿、直流和高频特性.     

Linearised InGaP/GaAs HBT MMIC power amplifier with active biascircuit for W-CDMA application

A high linearity InGaP/GaAs heterojunction bipolar transistor (HBT) monolithic microwave integrated circuit (MMIC) power amplifier is demonstrated using a new structure for a bias circuit for wideband-code division multiple access (W-CDMA) application. A one shunt capacitor is added to a novel active bias circuit and acts as a lineariser improving input P_{1 dB} of 16 dB and phase distortion of 5.1° for the hybrid phase shift keying (HPSK) modulated signal at the 28 dBm output power; the lineariser showing no significant increase of signal loss and chip area. The two-stage HBT MMIC amplifier exhibits a power-added efficiency (PAE) of 37%, a linear power gain of 24.5 dB, and an output power of 28 dBm with an adjacent channel power ratio (ACPR) of -45 dBc, under a 3 V operation voltage     

自对准InGaP/GaAs HBT单片集成跨阻放大器

对自对准 In Ga P/ Ga As HBT单片集成跨阻放大器进行了研究 .采用发射极金属做腐蚀掩膜并利用 Ga As腐蚀各向异性的特点来完成 BE金属自对准工艺 ,最终制作出的器件平均阈值电压为 1.15 V,单指管子电流增益为5 0 ,发射极面积 4μm× 14μm的单管在 IB=2 0 0μA和 VCE=2 V偏压条件下截止频率达到了 4 0 GHz.设计并制作了直接反馈和 CE- CC- CC两种单片集成跨阻放大器电路 ,测量得到的跨阻增益在 3d B带宽频率时分别为 5 0 .6 d BΩ和 4 5 .1d BΩ ,3d B带宽分别为 2 .7GHz和 2 .5 GHz,电路最小噪声系数分别为 2 .8d B和 3.2 d B.     

一种InGaP/GaAs HBT高速预分频器MMIC

采用Foundry提供的InGaP/GaAs HBT工艺设计了一种数字静态除2高速预分频器MMIC.流片测试结果与仿真结果基本吻合,最高工作频率高于仿真结果.设计过程在速度和功耗之间进行了折中,并且考虑了自谐振频率对电路的影响.测试结果显示:在5V电源电压下,该预分频器静态电流为60mA,最高工作频率达到15GHz,自谐振频率为19.79GHz.该MMIC可以直接应用到S-X波段射频微波系统中.     

三指发射极InGaP/GaAS HBT的研制

异质结双极型晶体管(HBT)是MMIC领域中最具有竞争力的三端器件之一.本文提出了一种三指发射极HBT的设计.通过与同一版上两指发射极HBT比较,证实了该设计的工艺宽容度高、可靠性和一致性好、成品率高,并且仍然具有两指发射极HBT良好的击穿、直流和高频特性.     

一个新的单异质结InGaP/GaAs HBT模型

对VB IC B JT模型用于Ⅲ-V族化合物HBT器件建模的可行性进行了讨论和借鉴,结合UCSD HBT模型优点,提出一个新的可精确用于单异质结InGaP/GaAsHBT模型,并用于该类器件建模。测量和模型仿真I-V特性及多偏置条件下多频率点S参数对比结果表明,DC~20GHz频率范围内,新模型可对单、多指InGaP/GaAs HBT器件交流小信号特性进行精确表征。运用所建模型准确的预见了一宽带放大器性能。