Highly (100)-oriented Ce1 − xFexO2 − δ solid solution films prepared by laser chemical vapor deposition

Ce_1 − xFe_xO_2 − δ solid solution films were prepared on amorphous silica substrates by laser chemical vapor deposition using metal dipivaloylmethanate precursors and a semiconductor InGaAlAs (808 nm in wavelength) laser. X-ray diffraction revealed the formation of single Ce_1 − xFe_xO_2 − δ phase at x ≤ 0.15, while CeO₂ and Fe₂O₃ phases were found for higher Fe content. Highly (100)-oriented Ce_1 − xFe_xO_2 − δ (x = 0.02) films were obtained at laser power, P_L = 50-200 W and deposition temperature, T_dep = 800-1063 K. Lotgering factor (200) was calculated to be above 0.8 for films prepared at P_L = 50-150 W. X-ray photoelectron spectroscopy revealed the presence of Fe³⁺, Ce⁴⁺ and Ce³⁺ on solid solution films. Cross-sectional transmission electron microscope images disclosed a film columnar feather-like structure with a large number of nano-scale interspaces. Deposition rates were 2 or 3 orders of magnitude higher than those reported for conventional metal organic chemical vapor deposition of CeO₂.     

Structure and mechanical properties of ZrO2 films deposited by gas flow sputtering

ZrO₂ films were deposited by reactive gas flow sputtering (GFS) where voltage is applied to a cyindrical hollow-cathode target from a DC source, the discharge being produced at relatively high sputtering pressure. In this system, secondary electrons form a major component of the total current flow and lead to heating of the substrate which in turn has an effect on the properties of deposited films. The present experiments were carried out under the following conditions: Ar gas flow rate of 200 sccm, O₂ flow rate FO₂ in the range between 0.003 and 1 sccm, and sputtering power (P_S) in the range of 50-800 W. The reults showed that the crystal structure of the films deposited for P_S below 200 W was monoclinic but for P_S above 400 W, the films included tetragonal cystals of stable structure formed at high temperature by the electron bombardment. The films were formed with grains of 20-100 nm in diameter in a porous structure. The mechanical properties of the films were determined by a nanoindentation technique. Martens hardness (H_M) of the porous films was found to be in the range between 220 and 330 MPa which is substantially less than that of films typically deposited by rf magnetron sputtering.     

Characterization of stepwise flash-evaporated CuInSe2 films

CuInSe₂ (CIS) films were deposited by stepwise flash evaporation from polycrystalline powder source onto glass substrates held at various temperatures ranging from 100 to 560 K. The phase purity and microstructure were analyzed by transmission electron microscopy. The investigations show that films grown at 300 K and below were amorphous, whereas those grown at 370 K and above were polycrystalline in nature. The grain size in polycrystalline films were found to improve with increase in substrate temperature and during post-deposition annealing. The films had near stoichiometric composition as revealed by Rutherford backscattering spectrometry. Analysis of the optical transmittance spectra of CIS films deposited at 520 K yielded a value of ∼0.97 eV for the fundamental band gap.     

Carbide formation in tungsten-containing amorphous carbon films by annealing

Tungsten-containing amorphous carbon films were produced by dual magnetron sputter deposition. The formation of carbide phases after heat treatment in inert gas at temperatures up to 2800 K was investigated by X-ray diffraction for tungsten concentrations below 25 at.%. After deposition, each film consists of an amorphous carbon matrix with atomically dispersed W inclusions. Annealing up to 2800 K leads to a formation of carbide phases and to nano clustering. Three tungsten carbide phases were observed (WC, W₂C, and WC_1 − x), mostly as mixtures of two phases. The phase combination depends on annealing temperature and W concentration. Additionally, nano diffraction was performed in a scanning transmission electron microscope, to determine the phase of single crystallites at scales, where X-ray diffraction fails.     

(0 0 6)-oriented α-Al2O3 films prepared in CO2-H2 atmosphere by laser chemical vapor deposition using a diode laser

(0 0 6)-oriented α-Al₂O₃ films were prepared by laser chemical vapor deposition (LCVD) using aluminum acetylacetonate (Al(acac)₃) in CO₂-H₂ atmosphere. The effects of the CO₂ mole fraction (FCO₂) and laser power (P_L) on the crystal phase, microstructure, and deposition rate (R_dep) were investigated. α- and γ-Al₂O₃ mixture films were prepared at P_L = 90 W (deposition temperature of 818 K), whereas (0 0 6)-oriented single-phase α-Al₂O₃ films were obtained at P_L = 110 W (863 K). The texture coefficient and the grain size of the (0 0 6)-oriented films increased with increasing FCO₂. The orientation of the α-Al₂O₃ films changed from (0 0 6) to (1 0 4) to (0 1 2) with increasing P_L (T_dep). The R_dep of the (0 0 6)-oriented α-Al₂O₃ films increased with increasing FCO₂.     

Growth and vacuum post-annealing effect on the properties of the new absorber CuSbS2 thin films

Post-growth treatments in vacuum atmosphere were performed on CuSbS₂ films prepared by the single-source thermal evaporation method on glass substrates. The films were annealed in vacuum atmosphere for 2 h in temperature range 130-200 °C. The effect of this thermal treatment on the structural, optical and electrical properties of the films was studied. X-ray diffraction (XRD) patterns indicated that the films exhibited an amorphous structure for annealing temperature below 200 °C and a polycrystalline structure with CuSbS₂ principal phase. For the films annealed at temperatures below 200 °C one direct optical transition in range 1.8-2 eV was found. For the films annealed at 200 °C, two optical direct transitions emerged at 1.3 and 1.79 eV corresponding to the CuSbS₂ and Sb₂S₃ values respectively. The electrical measurements showed a conversion from low resistivities (3.10^− 2-9.10^− 2) Ω cm for the samples annealed at temperatures below 200 °C to relatively high resistivities (2 Ω cm) for the samples annealed at 200 °C. In all cases the samples exhibited p-Ztype conductivity.     

Thermoelectric properties of the bismuth-antimony-telluride and the antimony-telluride films processed by electrodeposition for micro-device applications

Thermoelectric properties of the electrodeposited bismuth-antimony-telluride (Bi-Sb-Te) and the antimony-telluride (Sb-Te) films were characterized. The electrodeposited Bi-Sb-Te films exhibited the Seebeck coefficients of 21-71 µV/K and a maximum power factor of 1.2 × 10^− 4 W/K²-m. The Sb-Te films electrodeposited at potentials of 10 mV-30 mV were amorphous with compositions close to the Sb₂Te₃ stoichiometry. The electrodeposited Sb-Te films exhibited the Seebeck coefficients larger than 250 µV/K due to their noncrystallinity. The amorphous Sb-Te films of the stoichiometric composition exhibited a maximum power factor of 57 × 10^− 4 W/K²-m.     

Preparation of Magnéli phases of Ti27O52 and Ti6O11 films by laser chemical vapor deposition

Magnéli phases of Ti₂₇O₅₂ and Ti₆O₁₁ films were prepared by laser chemical vapor deposition using Ti(dpm)₂(O-i-Pr)₂ as a precursor. Ti₆O₁₁ film was obtained at a laser power (P_L) of 200 W and a deposition temperature (T_dep) of 1270 K. Ti₂₇O₅₂ film was obtained at P_L = 150 to 200 W and T_dep = 1120 to 1250 K. Ti₆O₁₁ and Ti₂₇O₅₂ films had a faceted texture about 2 μm in grain size and a columnar cross section. The deposition rate of Ti₂₇O₅₂ and Ti₆O₁₁ films were 90 and 70 μm h^− 1, respectively.     

Er,Yb:YVO4 waveguides deposited on amorphous SiO2 by PLD and UVPLD

In this work, erbium, and erbium and ytterbium co-doped YVO₄ waveguiding thin films were deposited on amorphous SiO₂ substrates by pulsed laser deposition (PLD) and ultraviolet-assisted pulsed laser deposition (UVPLD). The influence of the deposition technique on the structure, morphology, and optical properties of the films was investigated. At lower dopant concentrations the films prepared by UVPLD show better crystallinity and optical properties. All the samples show preferred orientation of the (001) zone axes parallel to the substrate surface. The polycrystalline samples show difference in the refractive indexes ?n (?n = n_TE − n_TM) for the TE and TM polarizations.     

Tl2Ba2CaCu2O8 thin films on 2 in. LaAlO3(0 0 1) substrates

High quality Tl₂Ba₂CaCu₂O₈ (Tl-2212) superconducting thin films are prepared on both sides of 2 in. LaAlO₃(0 0 1) substrates by off-axis magnetron sputtering and post-annealing process. XRD measurements show that these films possess pure Tl-2212 phase with C-axis perpendicular to the substrate surface. The thickness unhomogeneity of the whole film on the 2 in. wafer is less than 5%. The superconducting transition temperatures T_cs of the films are around 105 K. At zero applied magnetic field, the critical current densities J_cs of the films on both sides of the wafer were measured to be above 2 × 10⁶ A/cm² at 77 K. The microwave surface resistance R_s of film was as low as 350 μΩ at 10 GHz and 77 K. In order to test the suitability of Tl-2212 thin films for passive microwave devices, 3-pole bandpass filters have been fabricated from double-sided Tl-2212 films on LaAlO₃ substrates.     

On the synthesis of ultra smooth ITO thin films by conventional direct current magnetron sputtering

Highly transparent, conductive Sn-doped In₂O₃ (ITO) thin films with a characteristic root mean square surface roughness RMS below 1 nm were obtained from deposition of amorphous ITO and subsequent annealing treatment. ITO thin films with ultra flat surface were produced by (i) controlling crystallization mechanisms (nucleation and growth) of amorphous ITO through optimization of hydrogen content and temperature profile during sputtering and annealing process and (ii) preventing formation of agglomerated atoms/clusters in the gas phase and hence reducing large surface particles through fine tuning the sputtering rate and process pressure. Characterization of the coatings revealed specific resistivities below 2.5 × 10^− 4 Ω cm and transparencies above 90% in the visible range of light.     

Preparation of anatase TiO2 thin films for dye-sensitized solar cells by DC reactive magnetron sputtering technique

Anatase titanium dioxide (TiO₂) thin films are prepared by DC reactive magnetron sputtering using Ti target as the source material. In this work argon and oxygen are used as sputtering and reactive gas respectively. DC power is used at 100 W per 1 h. The distance between the target and substrate is fixed at 4 cm. The glass substrate temperature value varies from room temperature to 400 °C. The crystalline structure of the films is determined by X-ray diffraction analysis. All the films deposited at temperatures lower than 300 °C were amorphous, whereas films obtained at higher temperature grew in crystalline anatase phase. Phase transition from amorphous to anatase is observed at 400 °C annealing temperature. Transmittances of the TiO₂ thin films were measured using UV-visible NIR spectrophotometer. The direct and indirect optical band gap for room temperature and substrate temperature at 400 °C is found to be 3.50, 3.41 eV and 3.50, 3.54 eV respectively. The transmittance of TiO₂ thin films is noted higher than 75%. A comparison among all the films obtained at room temperature showed a transmittance value higher for films obtained at substrate temperature of 400 °C. The morphology of the films and the identification of the surface chemical stoichiometry of the deposited film at 400 °C were studied respectively, scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The surface roughness and the grain size are measured using AFM.     

Sputter-assisted plasma CVD of polymer-like amorphous CNx:H films using supermagnetron plasma

By using a sputter-assisted chemical vapor deposition (CVD) of supermagnetron plasma, amorphous CN_x:H films were deposited on the lower part of two parallel electrodes. By applying rf power to the upper electrode (UPRF) at 5 W to 800 W, polymer-like a-CN_x:H films were deposited on substrates placed on the lower electrode with an rf power (LORF) of 10 W. The deposition rate increased as UPRF increased. The hardness was as low as about 6.5 GPa, which is less than that of glass (13.1 GPa). The refractive index changed only slightly as UPRF changed from 1.6 to 1.75. The FT-IR spectrum showed strong absorption bands of NH and CH bonds at high and low UPRFs, respectively. The optical band gap was as large as 2.1 to 2.5, and it decreased as UPRF increased. These a-CN_x:H films showed white photoluminescence (PL) with broadband. With the increase of UPRF from 5 W to 800 W, the PL peak energy shifted down from 2.3 eV to 1.9 eV.     

Microstructure and hardness of SiC-TiC nanocomposite thin films prepared by radiofrequency magnetron sputtering

Silicon carbide-titanium carbide (SiC-TiC) nanocomposite thin films were prepared by radiofrequency magnetron sputtering using SiC-TiC composite targets fabricated by spark plasma sintering. The SiC thin films were amorphous at substrate temperatures below 573 K and crystallized in the cubic crystal system (3C) at substrate temperatures greater than 773 K. Cubic SiC-TiC nanocomposite thin films, which contain a mixture of 3C-SiC and B1-TiC phases, were obtained at a TiC content of greater than 20 mol%. The amorphous films possessed a dense cross-section and a smooth surface. The morphology of the SiC-TiC nanocomposite thin films changed from granular to columnar with increasing substrate temperature. The SiC-TiC nanocomposite thin films prepared at TiC content of 70-80 mol% and substrate temperature of 573 K showed the highest hardness of 35 GPa.     

Fabrication of KTa0.65Nb0.35O3 film by pulsed laser deposition on glass substrate with various buffer layers

KTa_0.65Nb_0.35O₃ (KTN) thin films were deposited on amorphous glass substrates using a range of single buffer layers such as indium tin oxide (ITO), zinc oxide (ZnO), 3 at% Al-doped ZnO (AZO), and 3 at% Ga-doped ZnO (GZO), as well as a variety of multi-buffer layers such as SrTiO₃ (STO)/ITO, STO/ZnO, STO/AZO, and STO/GZO using a pulsed laser deposition system. All films showed a polycrystalline perovskite phase with the exception of all single buffer layers and STO/ITO multi-buffer layers. The STO buffer layer is important for crystallizing KTN films due to the similar lattice constant and same crystal structure. The optical transmittance of all films exhibited a transmittance ?90% in the wavelength range.     

Composition, structural and electrical properties of thin films prepared by laser ablation of neodymium-doped potassium gadolinium tungstate

Thin films were grown on (001) SiO₂, SiO₂/(100) Si or (100) MgO substrates by laser ablation of neodymium-doped potassium gadolinium tungstate (Nd:KGW) single crystal target. The films were deposited at temperatures between room temperature and 750 °C and pressures between 1 × 10^− 4 Pa and 50 Pa of oxygen ambient. The influence of the deposition conditions on the composition, structure, morphology and electrical properties of the films was investigated. Special attention was paid to the films deposited in vacuum (1 × 10^− 4 Pa) or at very low oxygen pressures. Under such conditions, the potassium (K), gadolinium (Gd) and oxygen (O) content decreased strongly as the temperature was increased. At room temperature, the films were K and O stoichiometric, in contrast with Gd, which showed a concentration twice higher. The films were polycrystalline, with the exception of those deposited at temperatures below 500 °C, which were amorphous. However, all were smooth and dense. The films grown in vacuum and at temperatures between 500 and 700 °C consist mainly of “â-tungsten” - tungsten oxide (W₃O) phase. The films grown on SiO₂/Si possessed the best surface quality with nano-size relief. The resistivity measurements as a function of the temperature showed that the films produced in vacuum and at temperatures below 500 °C were highly insulating, whereas at 600 °C they exhibited semiconducting behavior or a metallic one at 700 °C. This behavior can be attributed to the existence of various valence states for tungsten below W⁶⁺ in the films and to their crystal structure.     

Fabrication of Ta3N5-Ag nanocomposite thin films with high resistivity and near-zero temperature coefficient of resistance

In this study, we investigate as-deposited Ta₃N₅-Ag nanocomposite thin films with near-zero temperature coefficients of resistance (TCRs) that are fabricated by a reactive co-sputtering method; these films can be used in thin-film embedded resistors. In these films, the TCR approaches zero due to compensation between Ag (+TCR) and Ta-N (−TCR) at resistivities higher than 0.005 Ω-cm.Taking into account the fact that Ag counterbalances the resistivity of the Ta₃N₅-Ag thin film, we performed reactive co-sputtering at a nitrogen partial pressure of 55%, corresponding to a resistivity of 0.384 Ω-cm. The resistivity and power density changed, respectively, from 1.333 Ω-cm and 0.44 W/cm² for silver to 0.0059 Ω-cm and 0.94 W/cm² for the Ta₃N₅-Ag thin film. A near-zero TCR of + 34 ppm/K was obtained at 0.94 W/cm² in the Ta₃N₅-Ag thin film without heat treatment.     

Influence of Ga2O3 addition on transparent conductive oxide films of In2O3-ZnO

Influence of incorporation of Ga in amorphous In-Zn-O transparent conductive oxide films was investigated as a function of Zn/(Zn + In). For In-Zn-O films with no Ga₂O₃, the range of Zn/(Zn + In) ratio where the amorphous phase appears became narrow at a substrate temperature of 250 °C. With increasing Ga₂O₃ quantity, amorphous films were obtained even at a high substrate temperature of 250 °C in a wider range of Zn/(Zn + In) than that of In-Zn-O films with no Ga₂O₃. This means that the trend of crystallization at higher substrate temperature was disturbed with additional Ga incorporation. For the film deposited from ZnO:Ga (Ga₂O₃: 4.5-7.5 wt%) and In₂O₃ targets, we obtained a resistivity of 2.8 × 10⁻⁴ Ω cm, nearly the same value as that for an In-Zn-O film with no Ga₂O₃. The addition of more than 7.5 wt% Ga₂O₃ induced a widening of the optical band gap.     

Low temperature growth and properties of Cu-In-Te based thin films for narrow bandgap solar cells

Cu-In-Te based thin films were grown onto soda-lime glass (SLG) substrates at 200 °C by co-evaporation using a molecular beam epitaxy system. The microstructural properties were examined by means of scanning electron microscopy, X-ray diffraction and Raman scattering. The crystalline quality of Cu-In-Te based thin films with high Cu/In ratios is superior to that of films with low Cu/In ratios. The films with Cu/In ratios of 0.69 ± 0.04 exhibited a single chalcopyrite phase with random orientation, whereas a defect chalcopyrite phase with a preferred (112) orientation was obtained for thin films with Cu/In ratios of 0.26 ± 0.02. However, the films with high Cu/In ratios of 0.69 ± 0.04 showed nearly constant low resistivity (∼ 10^− 2 Ω cm) at temperatures from 80 to 400 K due to high hole concentration (> 10¹⁹ cm^− 3), resulting in semi-metallic behavior. The hole conduction mechanism of the film (Cu/In atomic ratios = 0.26 ± 0.02) with semi-conductive properties was found to be variable-range-hopping of the Mott type in the wide range of 80-300 K. The optical bandgaps of Cu-In-Te based thin films are determined to be 0.93-1.02 eV at 300 K from transmission and reflection measurements. A solar cell with a ZnO/CdS/CuIn₃Te₅/Mo/SLG structure showed a total area (0.50 cm²) efficiency of 5.1% under AM1.5 illumination (100 mW/cm²) after light soaking. The conduction band offset at the CdS/CuIn₃Te₅ interface was estimated to be − 0.14 eV from X-ray photoelectron spectroscopy analysis.     

Fabrication of PDPhSM matrix nanocomposite thin films by pulsed laser ablation

We have developed a new method to fabricate poly(diphenylsilylenemethylene) (PDPhSM) matrix nanocomposite thin films containing copper nanoparticles produced by pulsed laser ablation in this paper. First of all, 1,1,3,3-tetraphenyl-1,3-disilacyclobutane (TPDC) films were deposited on 4 cm² silicon substrates cut from c-Si wafers by conventional vacuum evaporation under a pressure of 3.0 × 10⁻⁵ Torr; then copper nanoparticles were deposited onto the TPDC films by pulsed laser ablation; finally the TPDC films with copper nanoparticles were heated in an electric furnace in an air atmosphere at 553 K for 10 min to induce ring-opening polymerization of TPDC. The results indicated that it is possible to fabricate PDPhSM matrix nanocomposite thin films using copper nanoparticles produced by laser ablation. The morphology and size distribution of copper nanoparticles can be controlled by pulsed laser ablation conditions. Also, the polymerization efficiency depends on the size and chemical state of copper nanoparticles.