共查询到19条相似文献,搜索用时 62 毫秒
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为了对激光等离子体进行诊断,研制了聚焦型椭圆弯晶谱仪用来探测等离子体辐射的X射线.谱仪利用从椭圆一个焦点发射出的光线经椭圆面反射必汇聚于另一焦点的性质而研制,椭圆的离心率和焦距分别为0.9586mm及1350mm.在此采用氟化锂(200)(2d=0.4027nm)作为晶体分析器,其布拉格衍射角变化范围为30~67.5°,可探测波长范嗣为0.2~O.37nm.在"神光-Ⅱ"激光装置上进行了打靶实验,利用软X射线CCD相机作为摄谱器件,该谱仪获得了钛的类He共振线(w)、磁四级M2跃迁x线、互组合跃迁y线、禁戒谱线(z)以及类Li谱线(q).实验结果表明该谱仪的最高光谱分辨率(λ/△λ)可以达到1000以上,能够用于激光等离子体X射线光谱学研究. 相似文献
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Z箍缩等离子体X射线椭圆弯晶谱仪 总被引:3,自引:3,他引:3
为了测量Z箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪.以Si(111)椭圆弯晶作为色散分析元件,椭圆的离心率为0.9480,焦距为1348 mm,布拉格角范围为30°~54°,谱线探测角范围为54°~103°,探测的波长范围为0.31~0.51 nm.设计了半径为50 mm的半圆型胶片暗盒,内装胶片接收光谱信号.分析了椭圆的弥散度对光谱分辨率的影响.在"阳"加速器装置上进行摄谱实验,胶片成功获取了氩喷气等离子体X射线的跃迁光谱,实测谱线分辨率(λ/Δλ)达300~500,波长与理论值吻合. 相似文献
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5晶(7晶)X射线衍射仪非常适合于高级半导体单昌,特别是Ⅲ-Ⅴ族和Ⅱ=Ⅵ经合物半导体及其异质体外延层的特性分析。本文将简单地介绍5晶(7晶)X射线衍射仪,以及在半导体薄膜研究中的结果。 相似文献
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周勇 《微电子学与计算机》2009,26(11)
基于ASMC 0.35μm2P3MCMOS工艺,完成了对x射线探测器前端信号处理芯片的设计.该设计主要包括前端读出电路和信号处理电路.在模拟仿真的基础上完成了版图布局和设计,并对芯片进行了流片验证和测试.测试结果表明,该芯片能探测到的光电流范围为10pA到5nA.并实现了光电转换,多路选择等功能.该芯片的电源电压5V,整体功耗为40mW,工作频率可在100kHz到1MHz之间,线性度达到0.35%,具有较低的噪声性能. 相似文献
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Propagation in cylindrical fibres with anisotropic crystal cores 总被引:1,自引:0,他引:1
Expressions for the fields and propagation constants in cylindrical dielectric waveguides with umaxial crystal cores are found. The propagation constants of biaxial-crystal-cored guides are then deduced from a coupled-mode analysis, using the uniaxial solutions as ideal modes. 相似文献
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We show how to construct multiwavelets from wavelets. The multiwavelets resulting from such constructions retain accuracy and regularity or the original wavelets and are all supported on a shorter interval than the original wavelets. In fact, we can arrange, at the expense of the number of channels, to obtain any accuracy obtainable for compactly supported wavelets and support in a prescribed neighborhood of the unit interval 相似文献
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《Vision, Image and Signal Processing, IEE Proceedings -》1995,142(5):304-312
One approach to the detection of curves at subpixel accuracy involves the reconstruction of such features from subpixel edge data points. A new technique is presented for reconstructing and segmenting curves with subpixel accuracy using deformable models. A curve is represented as a set of interconnected Hermite splines forming a snake generated from the subpixel edge information that minimises the global energy functional integral over the set. While previous work on the minimisation was mostly based on the Euler-Lagrange transformation, the authors use the finite element method to solve the energy minimisation equation. The advantages of this approach over the Euler-Lagrange transformation approach are that the method is straightforward, leads to positive m-diagonal symmetric matrices, and has the ability to cope with irregular geometries such as junctions and corners. The energy functional integral solved using this method can also be used to segment the features by searching for the location of the maxima of the first derivative of the energy over the elementary curve set 相似文献
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Through-silicon via (TSV) is one of the most critical elements in 3D integration, where defects such as unfilled bottom and holes are very common. Thus, defect detection is of great importance to improve products quality. In this work, a non-destructive TSV defect detection method using X-ray imaging is introduced. Seven features representative of TSVs are extracted from the images, and then inputted into a self-organizing map (SOM) network for classification and testing. The results demonstrate that the normal TSVs and defective TSVs can be distinguished obviously by SOM network. The voids inside the TSVs are further located qualitatively using the Otsu algorithm and verified by the SEM images. These prove the feasibility of X-ray inspection of TSV defects with SOM network and Otsu algorithm. 相似文献
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Kai Kang Wen Xun Zhang K. F. Tsang 《Journal of Infrared, Millimeter and Terahertz Waves》1995,16(12):2223-2229
An equivalent source model for the analysis of curved edge tapered slot-line antenna is developed, which employs effective filamentary currents along the conductor edges of the slot, but forces the electric field produced by the currents to satisfy the boundary condition on the whole conductor surface. This idea is implemented by method of moments with collocation technique, and applied to analyze a tapered slot-line antenna with arbitrarily curved edge. 相似文献
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一、引言 光学干涉仪是测量光学元件面形、评价透镜质量最常用的手段。七十年代人们将微型电子计算机及相位探测技术应用到干涉计量上,使干涉条纹的数据处理成为独立系统而将高精度光学元件的检验发展到一崭新阶段。美国贝尔实验室首先研制成带微型计算机的条纹扫描干涉仪,使干涉条纹的测量精度由λ/10提高到λ/50~λ/100。我们运用MarkⅢ型干涉仪测量了各种光学元件及光学材料的质量,对仪器的性能进行了分析和讨论。 二、实验结果和讨论 Mark Ⅲ型激光数字波面干涉仪是将位相测量技术应用于费索干涉仪上,利用实时相位同步检 相似文献
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In-Kag Hwang Guk-Hyun Kim Yong-Hee Lee 《Quantum Electronics, IEEE Journal of》2006,42(2):131-136
The evanescent coupling from a photonic crystal resonator to a micron-thick optical fiber is investigated in detail by using a three-dimensional finite-difference time-domain (3D-FDTD) method. Properly designed photonic crystal cavity and taper structures are proposed, and optimal operating conditions are found to enhance the coupling strength while suppressing other cavity losses including the coupling to the slab propagating mode and to the higher-order fiber mode. In simulation, the coupling into the fundamental fiber mode is discriminated from other cavity losses by spatial and parity filtering of the FDTD results. The coupling efficiency of more than 80% into the fundamental fiber mode together with a total Q factor of 5200 is achieved for the fiber diameter of 1.0 /spl mu/m and the air gap of 200 nm between the fiber and the cavity. 相似文献