一种新型的微束XRF谱仪

本文介绍一种新型高能量分辨微束X荧光分析谱仪,它由导管X光透镜和使用位置灵敏正比计数管的波长色散谱仪组成。实验结果表明本谱仪使用的X光透镜形成的X光微束的最小束径对Cu Kα线为50μm,一次测量同时覆盖的能量范围可达800eV以上,而对Ti Kα线的能量分辨达到4.4eV。     

两次全反射X射线荧光能谱分析仪的研制

文章概述自行研制的两次全反射ｘ射线荧光（ＴＸＲＦ）能谱分析仪的结构和性能。该谱仪使用与之配套而开发的ＳＰＡＮ／ＸＲＦＶ４．ｏｘ射线谱处理软件。实验测试结果表明：对原子序数Ｚ＞ｌ６的大部分元素的探测下限可达１０￣（－１０）ｇ。该能谱分析仪为测定动力堆乏燃料元件溶解液中的不溶残渣的化学元素而研制，但可推广用于痕量元素分析的诸多研究和应用领域。     

医用电子加速器迷宫内的X射线剂量当量率的测量和估算

使用ＦＡＲＭＥＲ２５７０／１Ａ型和ＦＪ－３４７Ａ型两种电离室剂量仪测量了能量为６，８，１８ＭＶ的７个医用电子加速器迷宫内的Ｘ射线剂量当量率，结果表明迷宫内Ｘ射线测量当量率在迷宫内入口处最高，当迷宫内入口到等中心的蹁小于５．２ｍ时，该迷宫内入口中心处的Ｘ射线测量当量率与等中心处用束Ｘ射线吸收剂量率的比值大于５．５×１０＾－５，随距离增加，剂量率减小，进入迷宫巷道后，Ｘ射线剂量当量率一般不超过等中心有     

毛细管X光透镜聚焦的微束X射线荧光谱仪的研发及应用

针对不同样品的分析需求,本文设计了几种不同类型的微束X射线荧光谱仪。用高精度激光位移传感器实时校正样品表面被测量点与毛细管透镜出端之间的距离,以减少形状不规则的古陶瓷样品测量时带来的误差;利用毛细管X光透镜传输能量高于25 keV的X射线效率低的特点,将其应用于高铅釉瓷器彩料的无损分析中;采用大功率X射线源,扫描分析了大米中K、Ca等元素分布;以人民币5角硬币为例,研究了能量色散的微束X射线衍射方法。研究结果表明,本文研发的微束X射线荧光谱仪在生物样品和文物样品的分析研究中有广泛的应用前景。     

过滤X参考辐射装置性能的非介入评价

报道了中能过滤Ｘ参考辐射装置的性能参数测量和评价方法。利用ＶＩＣＴＯＲＥＥＮ非介入式诊断Ｘ射线质量保证仪器ＮＥＲＯＴＭ６０００Ｂ，一次操作可测出ｋＶ及其平均，最大和有效值，照射时间，辐射的输出和波纹等重要参数以及ｋＶ和辐射波形。测量是从Ｘ射线束取样，不需要拆装置，故提高了工作效率的安全性。该方法也适用于过滤Ｘ参考辐射装置的质量保证。     

软X射线能谱法测定电子温度Te的计算机数据处理…

本文阐述在某一核聚度装置上用ＳＣＯＲＰＩＯ－２０００计算机探测系统测量软Ｘ射线能谱，进而由能谱算出等离子体电子温度Ｔｅ．对１－４ｋｅＶ软Ｘ射能区的数据进行系统处理，所编制的程序大多用ＦＯＲＴＲＡＮ语言写成，只有一个子程序ＳＵＢＳＢ用编语言写成。程序运行方便，修改参数活，计算所得结果与预期值完全吻合，计算所得图表与预期图表完全一致。     

便携式微束X射线荧光谱仪的研发

研制了便携式微束X射线荧光谱仪,并对其硬件、软件和性能等特征进行了分析。该谱仪应用激光位移传感器实时检测样品测量点到透镜出端之间的距离并自动调节该距离的方法,来解决考古样品表面不平整或弧度而造成的照射样品X射线束斑变化的问题,从而保证X射线照射光斑大小不变。为验证谱仪的可靠性,采用该谱仪测量了表面高度差接近5 mm的古陶瓷样品微区的釉彩层元素的分布。分析结果表明,激光位移传感器能有效减少由于样品表面不平整或弧度带来的测量误差。此外,使用本谱仪分析了5角硬币表面4 mm×4 mm的区域,经过数据处理后得到Cu、Sn等元素的分布及其合金相的分布,表明该谱仪不仅可进行微区能量色散X射线荧光分析（μ-EDXRF）,同时还可进行微区能量色散X射线衍射分析（μ-EDXRD）。     

EDXRF法直接测定铁氧体中MnO,ZnO和Fe2O3的含量

用ＥＤＸＲＦ法直接测定锰锌铁氧体中ＭｎＯ、ＺｎＯ和Ｆｅ２Ｏ３含量是采用软、硬件相结合的办法，成功地分解ＭｉｌＫ和ＦｅＫ重迭峰，并对特定基体效应提出具体对策。由２３８Ｐｕ同位素源和正比计数管组成的探测系统，对ＭｎＯ、ＺｎＯ和Ｆｅ２Ｏ３的测量准确度分别为０．１４％、０．１０％和０．１７％。     

ADSORPTION OF ^153Sm—EDTMP ON HYDROXYAPATITE

ＡＤＳＯＲＰＴＩＯＮＯＦ~（１５３）Ｓｍ－ＥＤＴＭＰＯＮＨＹＤＲＯＸＹＡＰＡＴＩＴＥＬｕｏＳｈｕｎｚｈｏｎｇ，ＱｉａｏＪｉａｎ，ＰｕＭａｎｆｅｉ，ＬｉｕＺｈｏｎｇｌｉｎ，ＺｈａｏＰｅｎｇｊｉａｎｄＦｕＹｉｂｅｉ（ＳｏｕｔｈｗｅｓｔＩｎｓｔｉｔｕｔｅｏ?..     

FOXPRO数据库编程训练CAE系统的研制

本系统是针对当前ＲＤＢＭＳ编程训练计算机辅助教学的需要，在ＦＯＸＰＲＯ２．５ＦＯＲ ＤＯＳ的环境下开发的ＦＯＸＰＲＯ语言编程训练软件，主要目标是对编程者进行基本算法训练以及编程解题的思维训练。     

直流X射线模拟电缆X射线响应的可行性

本文对电缆X射线辐照响应的机理和模拟方法进行了研究,分析了电缆直流和脉冲X射线辐照响应的异同。建立了带状电缆X射线辐照响应一维计算模型,该模型包含电缆屏蔽层和介质层间隙、介质层瞬态辐射感应电导率等计算模型,模拟了带状电缆直流和脉冲X射线辐照电流响应。模拟结果表明,在X射线注量相同的条件下,电缆直流和方波脉冲X射线响应具有类似的波形特征及相同的间隙电压。因此,在该计算模型描述的电缆X射线辐照响应机制下,可利用直流X射线开展相应的脉冲X射线辐照响应机制模拟。     

凸度检测系统中X光机参数对厚度测量精度的影响

X射线凸度检测技术可在线获得板带材的断面轮廓并反馈到连轧系统实现实时凸度控制,在冶金工业中得到广泛应用,是冶金自动化中的关键技术。该项技术存在厚度测量范围大、测量精度要求高的特点。本文通过理论分析厚度测量精度与X光机管电压和管电流的关系,得到X光机管电流是决定系统极限测量精度的主要因素,X光机管电压是决定系统测量厚度范围的主要因素。在此基础上给出了由测量精度确定管电流的方法和由测量范围确定管电压的方法,为系统X光机的选型和测量档位设定提供指导依据。     

Apparent Linear Attenuation Coefficients in Phase Contrast X-Ray Tomography

In the inline phase contrast X-ray tomography the reconstructed apparent linear attenuation coefficient values may be greatly larger than sample’s linear attenuation coefficients or even be negative. In this work we present a general formula to quantitatively relate the apparent linear attenuation coefficient values in cone-beam phase contrast tomography to sample’s linear attenuation coefficients and refractive indices. This formula overcomes the gross inaccuracy of the existing formula in the literature in analyzing high-resolution phase contrast tomography, and it will be useful for correctly interpreting and quantifying the apparent linear attenuation coefficients in cone-beam X-ray phase contrast tomography.     

Scanning X-ray microfluorescence in a SEM for the analysis of very thin overlayers

In this paper, we used back-foil scanning X-ray microfluorescence (SXRF) and we examined the sensitivity of the technique for the analysis of very thin overlayers, where electron probe X-ray microanalysis (EPMA) reaches its detection limits. The lateral resolution of back-foil SXRF is also calculated for all the systems used. Both experimental results and Monte-Carlo calculations are used in this respect. Back-foil SXRF used in optimized experimental conditions, is found to be more sensitive than EPMA, especially in the case of very thin overlayers. The lateral resolution of back-foil SXRF is of the order of some micrometers. This is much better than the lateral resolution in conventional XRF and of the same order of magnitude as in EPMA.     

使用X光聚束系统的X射线荧光分析研究

复合光导管组成的Ｘ光透镜可将发散的Ｘ光束聚至直径φ０．５ｍｍ，聚束后的功率密度增加１０＾４倍，这种新型的Ｘ光透镜已用于Ｘ射线荧光分析研究，使用Ｘ光管功率仅２Ｗ，而探测限可达１０＾－９－１０＾１０ｇ．     

X光透镜应用于蛋白大分子晶体衍射

采用Ｘ光透镜替代单色仪双聚焦镜应用于生物蛋白大分子晶体衍射分析,照射晶体样品的光强提高１－２个量级,衍射强度的提高远大于５倍,大大缩短了测试时间,分辨能力改善０．０２－０．０６ｎｍ,信噪比也有改善。     

X光透镜在X射线衍射技术中的应用

用整体平行束X光透镜代替常规衍射仪的索拉狭缝和/或附加狭缝,入射和衍射X光强度可提高1.5―3.5倍,分辨率可达0.4°,可用于薄膜、粉末样品和离子束沉积样品的分析。将微会聚X光透镜应用于生物大分子衍射、高压X射线衍射、四圆X射线衍射3个不同的衍射领域,在相同X光源功率条件下,使用X光透镜后的衍射强度提高到原来的3―10倍,信噪比和分辨率有不同程度的改善。     

Development of a new X-ray source using backscattered X-ray with the use of a cold cathode

The development of an intense X-ray source using backscattered X-ray produced using an advanced electrode configuration is described. The electrodes were composed of field emitters deposited on a wire mounted on a perforated plate as the cathode and a copper plate as the anode. Electrons from these emitters collided with the copper plate and X-ray was generated at collision points. The backscattered X-ray in the direction normal to the electron trajectory through a hole in the anode escaped from the vacuum chamber through a beryllium window. Continuous and characteristic X-rays were detected at an applied voltage lower than that of a conventional X-ray source from 3.0 to 9.4 kV, respectively. Moreover, the X-ray dosage measured with a survey meter reached 0.95 mSv/h at 5.0 kV of applied voltage. The transmission images of three types of material used as an X-ray source for the X-ray imaging system indicate three advantages; low power consumption, focal point controllable by adjusting applied voltage, and photographable motion picture of X-ray transmission.     

Influence of resonant Raman scattering in the elemental analysis using X-ray emission based techniques

A tabulation of characteristic X-ray energies across the periodic table are provided where those X-rays are expected to result in a significant fractional resonant Raman scattering (RRS) contribution to the X-ray attenuation from a particular shell/subshell of the same or another element. The tabulations can be considered as guideline so as to know what can be expected due to RRS in typical photon- and particle-induced X-ray emission spectrometry. The RRS contribution is not included in the available theoretical attenuation coefficients, which are generally used in estimation of the matrix corrections in routine quantitative elemental analysis based on various X-ray emission techniques. The radiative RRS peaks can also interfere with normal X-ray spectrum and influence the elemental analysis. The RRS cross-section depends upon the energy difference of the X-ray energy and the shell/subshell ionization threshold taken in the units of the shell/subshell energy width, density of available states near the Fermi level, and the band structure in case the element is in the solid form. Some aspects of the dependence of the RRS contribution on the chemical forms of the elements are also discussed.     

高能X射线探测器射线串扰模拟研究

探测器的串扰噪声会对探测器的信噪比以及高能工业CT的图像质量产生很大的影响。本文利用EGSnrc程序模拟估算了CdWO4探测器模块的串扰噪声,并初步分析比较了影响探测器模块串扰噪声的各种因素。对在实际中选用和设计探测器模块有一定的指导意义,同时为利用软件修正探测器串扰噪声提供了理论计算参数。