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1.
介绍了在低成本夹具上,任意微带结构二端口网络S参数去嵌入的方法;该方法用于获取放大器模块的S参数,根据这些参数设计的C波段的放大器实测结果与仿真一致。  相似文献   

2.
一种去嵌入射频测量技术   总被引:2,自引:0,他引:2  
去嵌入是一种射频微波精确测量技术。本文介绍了一种新型的去嵌入测量技术。该方法只需要一个对称的直通微带结构就能完成去嵌入。最后利用该方法对0603封装的电感进行了测量,并提取了精确测量后的电感模型。结果表明本去嵌入方法可以应用于射频PCB上器件模型的精确测量和模型提取。  相似文献   

3.
硅基片上射频集成无源器件进行S参数测试时不可避免受到焊盘寄生效应的影响。针对这一问题,提取了三组不同长度硅基共面波导型传输线的S参数,基于级联理论的三种去嵌入方法被用于传输线模型分布参数的精确表征,并结合电磁仿真综合对比。结果表明:相对于其他两种常用去嵌入方法,"混合"法得到的S参数曲线与无焊盘仿真最为接近(平均偏差S_(11)≤3.392%,S_(21)≤5.184%),且削弱了去嵌入过程中测量误差的影响,有效减少了分布参数曲线波动。  相似文献   

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设计制作了一种新型叉指式共面波导传输线并对其性能进行了初步的研究。通过微加工技术加厚的接地线可以减少传输线平行部分之间的相互干扰,仿真和测试表明在5~20GHz范围内其回波损耗有两个极小值,极小值的位置随传输线结构参数的变化而变化。以-20dB为基准,这两个极小值附近的带宽可以达到1.95GHz,相对带宽分别可以达到23.5%和9.97%,相应的插入损耗在0.33dB/cm和0.5dB/cm左右。这种传输线有助于减小器件整体尺寸,在带通滤波器和移相器的设计方面有重要用途。  相似文献   

6.
黄成  文科  叶达  程杰 《微电子学》2017,47(2):289-292
生产测试中通常使用网络分析仪进行射频集成电路(RF IC)S参数测量。一些表贴封装元器件不能直接与网络分析仪连接,通常使用含夹具的测试系统进行连接测试。在无法提供有效校准件的情况下,提出了利用测试系统建模结合去嵌入的方法,解决了RF IC批量测试中的S参数测试问题,并进行了对比验证。  相似文献   

7.
一种基于同轴波导的异向传输线   总被引:1,自引:0,他引:1  
该文提出了一种基于同轴波导的新型异向传输线,与现有基于微带电路的异向传输线相比,这种结构有更高的工作频率、损耗较低和更大的功率容量;与基于同轴波导和矩形波导的异向传输线相比,其结构更简单容易实现。等效电路与有限元仿真的结果均表明这种结构在特定的频段表现出明显的异向特性。  相似文献   

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9.
为了实现宽带复合左右手传输线,提出并设计了一种反对称X型周期性左右手传输线结构.建立了结构的集总参数等效电路模型,并通过提取等效电路的元件值和S参数仿真,验证了传输线结构的谐振特性.采用参数反演算法对传输线结构的本构参数进行了提取和分析,证实了该结构具有1.6 GHz的带宽,其中在10.08~10.9 GHz呈现左手特性,在9.3~10.08 GHz呈现右手特性,属于宽带左右手传输线结构.最后,应用印刷电路板技术制作了X型复合左右手传输线,并利用平板波导系统对其S参数进行了测试,实验测试结果和仿真结果吻合较好,证明了所设计的左右手传输线结构的有效性.为宽带左右手传输线结构的设计和分析提供了一种手段.  相似文献   

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De-embedding is a mathematical inverse operation used in network analysis to separate and obtain differences. The time-domain analysis process saparates reflections, identifies them, and allows selected reflections to be analyzed. This paper uses both techniques to explain and illustrate the results.  相似文献   

12.
A simple method which facilitates the variational analysis of a generalised N-layer (dielectric) transmission line is described. The numerical computations of the capacitance, effective permittivity and the characteristic impedance can be easily performed on a digital computer. It should be realised that the method presented in this letter does, indeed, tremendously simplify the formidable task of the determination of the potential distribution function which meets the boundary conditions of the multilayer inhomogeneous dielectric configuration.  相似文献   

13.
A simple method of analysis of microstrip transmission lines by the corner function method (eigenfunction approach) is presented. The inhomogeneous dielectric system of the microstrip is treated as a mixed boundary-value problem and is solved by the use of the least-squares collocation method. The results obtained by this method agree well with previous theoretical results and the method of analysis is much less laborious, simpler and faster.  相似文献   

14.
In this paper, the new technique of time-domain analysis of discontinuities in a planar transmission line is presented. In the process of time-domain analysis, the analysis model of system and the concept of transfer function are employed and the frequency-domain method of lines and the technique of the fast Fourier transform are used. The results of time-domain data and frequency-domain characteristics for the shielded microstrip with step discontinuity are given and compared with the published results of other authors.  相似文献   

15.
The electromagnetic coupling to an angled two-strip transmission line is analysed to constructing an angled two-plate transmission line equivalent to the original geometry, and then solving the cylindrical transmission line equations of the original source analytically. The results agree with the numerical values of the circuit-concept approach.<>  相似文献   

16.
The authors propose a general method of deembedding S-parameter measurements of the device-under-test (DUT) for which typical parasitics associated with probe pads and interconnect-metal lines can be deembedded from the measurement. The DUT is the analog silicon bipolar junction transistor including the pad and interconnects. This method includes the subtraction of the parasitic shunt y-parameters of the on-wafer open calibration pattern as well as the subtraction of the parasitic series z-parameters on the on-wafer open circuit which are taken from measurements of the short and through circuits. It is demonstrated that the calculated power loss for the pad and interconnect parasitics can be comparable to the power consumption of the advanced bipolar transistor at high frequencies (⩾10 GHz). A knowledge of the magnitude and type of parasitic deembedding circuit elements can aid the device engineer in the analysis of the error associated with deembedding  相似文献   

17.
In this paper, the theory for the sensitivity analysis of a multiconductor line is described, and the sensitivities of the receivingend voltage and power with respect to the various line parameters have been evaluated.  相似文献   

18.
带有频变负载的传输线系统的瞬态响应分析是电磁兼容领域的一个重要内容,特别是对于频变负载网络较为复杂或内部结构不清晰的情况,其瞬态响应的分析较为困难。本文首先在采样频率点处对频变负载端口导纳进行测量或计算得到相应的采样导纳,并采用有理函数逼近的方式对端口导纳进行等效;之后采用矩阵束(MPM)方法求解出有理逼近函数所需的极点和留数,并将其代入到分段线性递归卷积(PLRC)技术中,实现传输线和频变负载连接点处电压的分段线性递归卷积表达;最后,结合传输线方程实现带有频变负载的传输线系统的瞬态响应分析,并通过2个算例对所提方法的性能进行验证。结果表明,所提方法在计算精确度上具有明显的优势。  相似文献   

19.
《现代电子技术》2017,(1):163-166
非平行结构的传输线在电力电子系统中普遍存在,当其上通有电压和电流信号时,会在周围传输线上产生串扰响应。采用时域传输线方程建立多根非平行传输线之间的串扰模型,结合FDTD方法,分析在脉冲集总源激励下受扰导线始端和终端负载上的串扰电压响应特性,将其结果与仿真结果对比,验证了该方法的正确性。研究结果表明,非平行结构中受扰线始端和终端负载上的串扰电压响应随着传输线离地面高度的增大而增大,随着传输线之间夹角的增大而变小,且减小的趋势逐渐减弱,从而为线缆间的串扰防护提供了参考依据。  相似文献   

20.
The transmission line matrix (TLM) method for microwave circuit analysis calculates the time-domain variation of the electromagnetic fields in response to an arbitrarily chosen excitation. Spectral estimation for the TLM method by use of the discrete fourier transform and fast Fourier transform is reviewed. Error bounds are given and checked by means of a numerical example. A spectral estimation method based on Prony's method for use with TLM is presented. A numerical example shows that the method allows an order of magnitude reduction in the number of iterations in the TLM method for equal accuracy  相似文献   

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