共查询到16条相似文献,搜索用时 203 毫秒
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利用动态机械分析仪(DMA),测定环氧模塑封材料(EMC)的粘弹性数据;经过数据拟合处理,得到有限元仿真所需的相关参数.将D2-FBGA中芯片厚度、粘结剂厚度、部分EMC厚度及基板厚度作为优化参数,选用正交实验设计,建立了这四个参数的正交表;并用MSC、 Marc,计算了D2-FBGA在热循环载荷下的热应力分布.通过统计软件stata,建立了最大等效应力与上述参数的关系的回归方程;分析了各个结构参数对器件最大等效应力的影响程度;使用单纯形法,得出一组最优结构参数及对应的最大等效应力值.结果表明:通过优化,器件的最大等效应力从(90.58 MPa)下降到66.84 MPa,优化效果明显. 相似文献
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扇出型封装在塑封过程中会出现芯片偏移及翘曲等缺陷,详细了解环氧塑封材料(EMC)的特性能够准确预测封装材料、结构、塑封工艺对塑封效果的影响。针对用于扇出型封装的EMC材料采用动态机械分析仪、差示扫描量热仪、流变仪测试其动态力学性能、固化动力学性能、流变学性能和热容,并建立可用于有限元分析的材料特性数学模型。结果表明,EMC在150℃等温固化60 min后具有最少残余固化;100℃环境下黏度随温度增加速率最快;时温等效原理可预测实验频率以外的力学行为。模型曲线与实验数据的拟合优度均大于0.982,材料表征模型满足准确性与适用性的要求。 相似文献
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回流焊过程中,双边扁平无引脚(DFN)封装会因为巨大的温度变化产生翘曲和应力,影响超高频射频识别(RFID)芯片的性能和可靠性.选取DFN3封装为例从理论方面分析结构和材料参数对封装翘曲和应力的影响,发现减小环氧塑封料(EMC)热膨胀系数(CTE)、增大其杨氏模量均能减小封装翘曲;通过有限元仿真分析得出的结论与理论分析相一致.为了减小封装翘曲和应力,选定具有更小CTE的9240HF10AK-B3(Type R)作为新型EMC.通过有限元仿真结果对比发现,在25℃时,采用新型EMC的封装翘曲增大了 16.8%,应力减小了 4.1%;260℃时,其封装翘曲减小了 45.7%,应力减小了 9.2%.同时,新型EMC的RFID芯片标签回波损耗较之前优化了 6.59%. 相似文献
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Rao Y. Shi S.H. Wong C.P. 《Components and Packaging Technologies, IEEE Transactions on》2000,23(3):434-439
Finite element analyses (FEAs) have been widely used to preventively predict the reliability issues of flip-chip (FC) packages. The validity of the simulation results strongly depends on the inputs of the involved material properties. For FC packages Young's modulus-temperature relationship is a critical material property in predicting of the package reliability during -55°C to 125°C thermal cycling. Traditional tensile tests can obtain the modulus at selected temperatures, but are tedious, expensive, and unable to accurately predict the Young's modulus-temperature relationship within a wide temperature range. Thus, this paper is targeted to provide a simple but relatively accurate methodology to obtain the Young's modulus-temperature relationship. In this paper, three commercial silica filled underfill materials were studied. A simple specimen (based on ASTM D638M) preparation method was established using a Teflon mold. A dynamic-mechanical analyzer (DMA) was used to obtain the stress-strain relationship under controlled force mode, storage and loss modulus under multi-frequency mode, and stress relaxation under stress relaxation mode. A simple viscoelastic model was used and an empirical methodology for obtaining Young's modulus-temperature relationship was established 相似文献
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In the microelectronics device, FR-4 material is one of the key component materials in the packaging structure. The structure of FR-4 is featured as a typical orthotropic polymer composite material reinforced with glass fiber. Although the material may exhibit viscoelastic behavior, the material is commonly regarded as temperature-dependent elastic one in the microelectronics reliability analysis. The purpose of this study is to investigate the material property modeling effect of FR-4 on the reliability prediction. To obtain the FR-4 material properties, a series of stress relaxation test was performed. Based on the data, the behavior of the FR-4 was modeled as orthotropic temperature-dependent elastic and viscoelastic. An analytical method was employed to calculate the engineering constants required for the calculations. The elastic calculation was performed by ANSYS, and the viscoelastic calculation by a FORTRAN program, respectively. The FORTRAN program was written separately, and capable of calculating the viscoealstic calculations when the material is orthotropic. Board on chip (BOC) packaging structure, a new type of the first level packaging for memory chip, was considered for the stress development analysis. The results were compared to examine the difference based on the FR-4 material property modeling. 相似文献
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提出了一个细观力学模型,该模型同时考虑了热膨胀和蒸汽膨胀对叠层芯片尺寸封装(SCSP)中芯片黏结层变形的影响.当初始温度确定时,由该模型可求得给定温度下芯片黏结层内部的蒸汽压力和孔隙率,从而判断芯片黏结层在焊接回流时的可靠性.当温度从100℃升高到250℃时,芯片黏结层的饱和蒸汽压、等效弹性模量及孔隙率分别从0.10 ... 相似文献
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《Microelectronics Reliability》2015,55(11):2336-2344
A numerical procedure for constructing the multiaxial viscoelastic model for polymeric packaging material over a wide range of temperature is presented. By using the proposed best-fitting procedure, experimentally measured frequency-domain Young's and shear storage moduli are used to calculate the time-domain bulk and shear relaxation moduli which describe the three-dimensional constitutive behavior of a viscoelastic solid. The numerical procedure incorporates restrictions that ensure that the derived time-domain material function is physics compatible. The proposed procedure was applied to construct the viscoelastic constitutive models of epoxy molding compounds (EMCs), and compared to results obtained by using approximate-formula based direct conversion procedure. It was shown that, without using the proposed procedure, the directly calculated time-dependent Poisson's ratio oscillates significantly in the rubbery regime and is physically inadmissible. To validate the constitutive model constructed by using the proposed procedure, a numerical finite element model that incorporates the viscoelastic constitutive model of the EMC was applied to simulate warpage of an overmolded package under the solder reflow process and compared to experimental shadow Moiré measurements. 相似文献
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选用SiO_2、Al_2O_3、Si_3N_4三种陶瓷颗粒的复合填充环氧模塑料(EMC),研究了不同填料种类、含量对EMC导热系数、热膨胀系数(CTE)、介电常数等性能的影响随着填料百分含量的增加,EMC的热导率、介电常数也随之增加,而其热膨胀系数显著下降相同体积百分含量下,Al_2O_3、Si_3N_4复合体系EMC热导率和介电常数高于SiO_2、Si_3N_4复合体系,而其热膨胀系数比后者低。百分含量为60%时,前者热导率达到2.254 W(m·K)~(-1)、后者达到2.04w(m·K)~(-1)。百分含量为65%时,其CTE分别为1.493×10~(-5)K~(-1)、1.643×10~(-5)K~(-1),同时两体系复合材料的介电常数可以维持在较低水平 相似文献