如何正确应用统计抽样检验

文章简单介绍了统计抽样检验，重点阐述了如何应用统计抽样检验保证产品的质量水平、分析存在的风险，并给出不合格品处理方法。     

统计抽样检验的质量控制与管理

该文简单介绍了统计抽样检验以及存在的风险,重点阐述了如何对统计抽样检验过程进行质量控制与管理,以确保产品的质量水平.     

AQL、LTPD以及“零缺陷”三种抽样检验的比较

抽样检验按照检验值的属性可以划分为计量抽样检验和计数抽样检验,而计数抽样检验又包括一次、二次以及多次抽样方案。文章主要介绍了计数型抽样检验中一次抽样方案的基本概念、抽样原理、表征参数、OC函数、OC曲线以及抽样方案辨别力指标。在此基础上,重点介绍了AQL抽样、LDPT抽样以及"零缺陷"抽样三种抽样检验方法的基本构架和检验流程。通过对三种抽样检验方法的分析对比,零缺陷抽样凭借其抽样方法简便、抽样方案经济、质量理念先进的特点,已经逐渐成为现代企业质量检验管理的潮流所向。     

谈产品检验随机抽样的“随机”性

在企业产品质量检验工作中,主要有全数检验和抽样检验两种实施方法。对于抽样检验,虽然各企业生产的产品有所不同,工艺过程不一样,但建立在概率统计理论基础上的统计抽样检验方法,却已被各企业加以广泛应用。对于各类典型的抽样方法,国家     

浅谈检验员与抽样检验标准

检验标准是检验员判决产品是否合格的重要依据,检验员对抽样检验常识的掌握程度,将直接影响着产品检验测试的有效性和准确性.     

两种抽样检验标准的应用比较

本文介绍了两种抽样检验标准的特点、区别及其应用范围.     

基站检测中的科学抽样研究

根据计数抽样检验理论．研究并提出了基站检测中的计数抽样方法．为贯彻落实有关文件提供了一种科学的参考方案。     

BP神经网络在呼叫中心抽检评估中的应用

为了提高抽样检验的检出率,基于对某运营商呼叫中心服务质量管理现状的分析,提出利用BP神经网络对客服代表输出的话务质量进行风险评估和预判分类的方法。经过Matlab仿真平台的模拟实验,确定风险因子和风险等级,并进行数据归一化处理,建立数学模型,得到结论:BP神经网络技术应用于呼叫中心服务质量风险评估和抽样检验领域是可行的、有效的。基于该方法,可以将呼叫中心服务质量抽样检验的检出率从传统方法的5.3%提高到现在的9.23%,提高了质检人员的工作效率。     

电磁混响室统计特性的检验方法

在介绍电磁混响室各场量理想的统计特性的基础上,简单对比、分析了相关统计检验的思路和方法,提出利用柯尔莫哥洛夫-斯米尔诺夫检验(KS检验)来完成对实际电磁混响室统计特性的检验。两组典型数据的统计分析结果验证了上述方法的可行性和有效性。作为一种与统计特性关系密切的测试方法,电磁混响室中的其它统计检验问题都可以考虑采用这种方法来解决。     

"抽样检验"国家标准的发展概况

抽样检验是质量管理工作的重要组成部分，它是以“用尽量少的样本量来尽量准确地评判总体(批)”为主线展开的。本文围绕这条主线，对不同形式的产品、不同的组批方式论述了不同的抽样方案及作用。     

首件检查的理解与实施

什么是首件检查？为什么要进行首件检查？怎样实施首件检查？首件检查的时机是什么？。只有彻底地理解了首件检查,才能正确地实施首件检查和实现零缺陷的质量控制预期。     

Accelerated life-tests for intermittent destructive inspection,with logistic failure-distribution

Statistically-optimal accelerated life-test plans are suggested for items whose lifetime follows a logistic distribution. Both the scale and location parameters of the lifetime distribution are functions of the stress level. The test plans accommodate intermittent destructive sampling. The number of sampled items which fail to pass the test at the time of each inspection follows a hypergeometric distribution; the number of defective items in the remaining sample which have not yet been tested follows a binomial distribution. Statistically-optimal designs provide test planners with a set of design inputs, such as: 2 stress-levels higher than use stress-level, a set of inspection times, sample allocation, and a censoring time that minimizes the asymptotic variance of the maximum likelihood estimator of a specified quantile of the lifetime distribution. However such a 2 stress-level optimal plan is not practical because model validation is rarely impossible with so few stress-levels at which to test. In order to overcome such impracticality compromise plans that require 3 stress-levels are also suggested at a fixed inspection interval-although these plans lose statistical efficiency     

AOI统计学习建模的AdaBoost算法

PCB贴片安装机器视觉检测(AOI)中,再流焊前后的很多检测中的特征必须依赖对样本的统计学习.机器学习中的AdaBoost算法可以将多个弱学习器组合提升为一个强学习器.本文提出将其应用于AOI的统计学习和检测,可以提高检测精度和速度,并提高泛化性能.对比实验证明了本方法的有效性.     

Accelerated Lifetest Results on Submarine-cable Transistors

A computerized analysis is outlined; it uses a lognormal distribution that is fitted to the observed data by the maximum likelihood method. A typical computer output illustrates the failure levels at operational temperatures. The statistical curve fitting technique aids the analysis of accelerated lifetest data. Failure estimates at junction temperatures, much lower than those under accelerated lifetest, are obtained by extrapolation. However, it is up to user whether such an extrapolation is justified. Due to the quantized nature of the data, an optimum exists for the time of device inspection, whereby statistical information is obtained at minimum testing expense. For example, inspecting the 250°C sample at 80 and 160 hours would be a waste of time since no failures should occur.     

新版《工厂检查要求》第8条审核要领

该文主要描述新版<工厂检查要求>第8条的审核要求.并以开关电源适配器为例,就审核内容、审核方法、样品策划等进行论述.     

Actinic inspection of EUVL mask blank defects by photoemission electron microscopy: Effect of inspection wavelength variation

Extreme ultraviolet (EUV) photoemission electron microscopy (PEEM), which employs standing wave field illumination of a sample, is a potential tool for at-wavelength inspection of phase defects on extreme ultraviolet lithography (EUVL) mask blank. In this paper, we will demonstrate that the contrast of an underneath multilayer programmed defect in EUV-PEEM image is strongly dependent on the inspection wavelength. The observed contrast variation at different inspection wavelengths is in good agreement with the simulation result of a standing wave field on surface of multilayer stack in the mask blank sample. We also observed some native defects on the programmed defect sample, and found that some of them reverse their contrast with varying inspection wavelengths while others do not.     

集成电路标准规范中的LTPD抽样浅析

介绍了集成电路失效率抽样检查的基础理论,论述集成电路标准规范中最常用的LTPD方案,并对LTPD抽样方案中的抽样样本大小进行了计算。     

Incoming test strategy based upon in-process failure and repaircosts

An economic model is developed that challenges traditional statistical quality control methods in the factory. Incoming inspection levels can be determined as a function of both the PPM failure rates and the lot-to-lot stability. Since current incoming failure rates have fallen two orders of magnitude to below 100 PPM, the model can be used to re-evaluate conventional test strategies in high-volume manufacturing operations. Process variability as measured by statistical process control methods can now be monitored as lot stability and incoming inspection levels are adjusted accordingly