Low-voltage high-gain differential OTA for SC circuits

A new differential operational transconductance amplifier (OTA) for SC circuits that operates with a supply voltage of less than two transistor threshold voltages is presented. Its simplicity relies on the use of a low-voltage regulated cascode circuit, which achieves very high output impedance under low-voltage restrictions. The OTA has been designed to operate with a supply voltage of V/sub DD/=1.5 V, using a 0.6 /spl mu/m CMOS technology with transistor threshold voltages of V/sub TN/=0.75 V and V/sub TP/=-0.85 V. Post-layout simulation results for a load capacitance (C/sub L/) of 2 pF show a 75 MHz gain-bandwidth product and 100 dB DC gain with a quiescent power consumption of 750 /spl mu/W.     

A 3.3-V ISDN U-interface line driver with a new I/sub Q/-control circuit

In this work, we propose a new quiescent current (I/sub Q/) control circuit applicable to line drivers for digital subscriber line (DSL) applications. The line driver consists of preamplifier, error amplifiers, output transistors, and I/sub Q/ control circuits. A new method is proposed for controlling I/sub Q/ values in order to obtain high linearity performance. It also helps to determine the minimum off-current value of the class-AB output stage to reduce crossover distortion. The line driver is implemented for ISDN U-interface applications. It is fabricated in a 0.35-/spl mu/m CMOS technology for a single power supply voltage of 3.3 V, and a total harmonic distortion of less than -64 dB is achieved.     

CMOS micro-power output stage for integrated voltage references

A CMOS micro-power, class-AB output stage with high current-drive capability for integrated voltage references is presented. A weak-inversion MOS translinear-loop ensures that the harmonic mean of the push and pull currents equals a constant bias current. It can source/sink 20 mA with only 15 /spl mu/A quiescent current, thus achieving very high power efficiency. It operates from a 2.5 V power supply and is stable for capacitive loads up to 2 nF.     

Compact power-efficient class-AB CMOS exponential voltage to voltage converter

A novel implementation of a rail-to-rail exponential voltage to voltage converter is presented. It is based on a pseudo-exponential approximation that is easily achieved by the nonlinear currents of a class-AB transconductor. Measurement results for a 0.5 /spl mu/m CMOS technology show a 52 dB output voltage range with linearity error less than /spl plusmn/2 dB using a dual supply voltage of /spl plusmn/750 mV. The power dissipation is less than 40 /spl mu/W.     

0.5-V analog circuit techniques and their application in OTA and filter design

We present design techniques that make possible the operation of analog circuits with very low supply voltages, down to 0.5 V. We use operational transconductance amplifier (OTA) and filter design as a vehicle to introduce these techniques. Two OTAs, one with body inputs and the other with gate inputs, are designed. Biasing strategies to maintain common-mode voltages and attain maximum signal swing over process, voltage, and temperature are proposed. Prototype chips were fabricated in a 0.18-/spl mu/m CMOS process using standard 0.5-V V/sub T/ devices. The body-input OTA has a measured 52-dB DC gain, a 2.5-MHz gain-bandwidth, and consumes 110 /spl mu/W. The gate-input OTA has a measured 62-dB DC gain (with automatic gain-enhancement), a 10-MHz gain-bandwidth, and consumes 75 /spl mu/W. Design techniques for active-RC filters are also presented. Weak-inversion MOS varactors are proposed and modeled. These are used along with 0.5-V gate-input OTAs to design a fully integrated, 135-kHz fifth-order elliptic low-pass filter. The prototype chip in a 0.18-/spl mu/m CMOS process with V/sub T/ of 0.5-V also includes an on-chip phase-locked loop for tuning. The 1-mm/sup 2/ chip has a measured dynamic range of 57 dB and draws 2.2 mA from the 0.5-V supply.     

A low-voltage, highly linear voltage-controlled transconductor

A low-voltage fully differential, voltage-controlled transconductor is described. The proposed transconductor achieves a wide input/control voltage range, with a highly linear transconductance factor and truly fully differential output currents. The transconductor is used to implement a G/sub m/-C adaptive forward equalizer (FE) for a 125 Mbps wire line transceiver using digital core transistors with channel length of no more than double the feature size in a typical digital CMOS 180-nm process and supply voltage as low as 1.6 V. The adaptive FE enables IEEE 1394b transceivers to operate over UTP-5 cables for up to 100 m in length. The transconductor stage occupies 1945 /spl mu/m/sup 2/ and consumes an average power of 418 /spl mu/w at 125 Mbps and 1.8-V supply.     

DRAM plate electrode bias optimization for reducing leakage current in UV-O/sub 3/ and O/sub 2/ annealed CVD deposited Ta/sub 2/O/sub 5/ dielectric films

A new plate biasing scheme is described which allowed the use of 65% higher supply voltage without increasing the leakage current for the UV-O/sub 3/ and O/sub 2/ annealed chemical-vapor-deposited tantalum pentaoxide dielectric film capacitors in stacked DRAM cells. Dielectric leakage was reduced by biasing the capacitor plate electrode to a voltage lower than the conventionally used value of V/sub cc//2. Ta/sub 2/O/sub 5/ films with 3.9 nm effective gate oxide, 8.5 fF//spl mu/m/sup 2/ capacitance and <0.3 /spl mu/A/cm/sup 2/ leakage at 100/spl deg/C and 3.3 V supply are demonstrated.<>     

DC and RF characteristics of E-mode Ga/sub 0.51/In/sub 0.49/P-In/sub 0.15/Ga/sub 0.85/As pseudomorphic HEMTs

The DC and RF characteristics of Ga/sub 0.49/In/sub 0.51/P-In/sub 0.15/Ga/sub 0.85/As enhancement- mode pseudomorphic HEMTs (pHEMTs) are reported for the first time. The transistor has a gate length of 0.8 /spl mu/m and a gate width of 200 /spl mu/m. It is found that the device can be operated with gate voltage up to 1.6 V, which corresponds to a high drain-source current (I/sub DS/) of 340 mA/mm when the drain-source voltage (V/sub DS/) is 4.0 V. The measured maximum transconductance, current gain cut-off frequency, and maximum oscillation frequency are 255.2 mS/mm, 20.6 GHz, and 40 GHz, respectively. When this device is operated at 1.9 GHz under class-AB bias condition, a 14.7-dBm (148.6 mW/mm) saturated power with a power-added efficiency of 50% is achieved when the drain voltage is 3.5 V. The measured F/sub min/ is 0.74 dB under I/sub DS/=15 mA and V/sub DS/=2 V.     

A 2-V 23-/spl mu/A 5.3-ppm//spl deg/C curvature-compensated CMOS bandgap voltage reference

A high-order curvature-compensated CMOS bandgap reference, which utilizes a temperature-dependent resistor ratio generated by a high-resistive poly resistor and a diffusion resistor, is presented in this paper. Implemented in a standard 0.6-/spl mu/m CMOS technology with V/sub thn//spl ap/|V/sub thp/|/spl ap/0.9 V at 0/spl deg/C, the proposed voltage reference can operate down to a 2-V supply and consumes a maximum supply current of 23 /spl mu/A. A temperature coefficient of 5.3 ppm//spl deg/C at a 2-V supply and a line regulation of /spl plusmn/1.43 mV/V at 27/spl deg/C are achieved. Experimental results show that the temperature drift is reduced by approximately five times when compared with a conventional bandgap reference in the same technology.     

1.5 V large-driving class-AB buffer amplifier with quiescent current control

A 1.5 V large-driving class-AB buffer amplifier with quiescent current control suitable for output driver application is proposed. An experimental prototype buffer demonstrated that the circuit draws only 80 /spl mu/A static current, and exhibited the rise time of 0.4 /spl mu/s and fall time of 1 /spl mu/s under a 100 /spl Omega///150 pF load.     

Built-in current sensor for /spl Delta/I/sub DDQ/ testing

This paper presents the implementation of a built-in current sensor for /spl Delta/I/sub DDQ/ testing. In contrast to conventional built-in current monitors, this implementation has three distinctive features: 1) built-in self-calibration to the process corner in which the circuit under test was fabricated; 2) digital encoding of the quiescent current of the circuit under test for robustness purposes; and 3) enabling versatile testing strategy through the implementation of two advanced /spl Delta/I/sub DDQ/ testing algorithms. The monitor has been manufactured in a 0.18-/spl mu/m CMOS technology and it is based on the principle of disconnecting the device under test from the power supply during the testing phase. The monitor has a resolution of 1 /spl mu/A for a background current less than 100 /spl mu/A or 1% of background currents over 100 /spl mu/A to a total of 1-mA full scale. The sensor operates at a maximum clock speed of 250 MHz. The quiescent current is indirectly determined by counting a number of clock pulses which occur during the time the voltage at the disconnected node drops below a reference voltage value. Basically, at the end of the count period, the counted value is inversely proportional to the quiescent current of the device under test. Then, a /spl Delta/I/sub DDQ/ unit processes the counted number and the outcome is compared with a reference number to determine whether a defect exists in the device under test. Accuracy is improved by adjusting the value of the reference number and the frequency of the clock signal depending upon the particular process corner of the circuit under test. The monitor has been verified in a test chip consisting of one "DSP-like" circuit of about 250,000 transistors. Experimental results prove the usefulness of our approach as a quick and effective means for detecting defects.     

A low-power low-voltage OTA-C sinusoidal oscillator with a large tuning range

A new operational transconductance amplifier and capacitor based sinusoidal voltage controlled oscillator is presented. The transconductor uses two cross-coupled class-AB pseudo-differential pairs biased by a flipped voltage follower, and it exhibits a wide transconductance range with low power consumption and high linearity. The oscillator has been fabricated in a standard 0.8-/spl mu/m CMOS process. Experimental results show a frequency tuning range from 1 to 25 MHz. The amplitude is controlled by the transconductor nonlinear characteristic. The circuit is operated at 2-V supply voltage with only 1.58 mW of maximum quiescent power consumption.     

A 0.5-V 1-/spl mu/W successive approximation ADC

A successive approximation analog-to-digital converter (ADC) is presented operating at ultralow supply voltages. The circuit is realized in a 0.18-/spl mu/m standard CMOS technology. Neither low-V/sub T/ devices nor voltage boosting techniques are used. All voltage levels are between supply voltage V/sub DD/ and ground V/sub SS/. A passive sample-and-hold stage and a capacitor-based digital-to-analog converter are used to avoid application of operational amplifiers, since opamp operation requires higher values for the lowest possible supply voltage. The ADC has signal-to-noise-and-distortion ratios of 51.2 and 43.3 dB for supply voltages of 1 and 0.5 V, at sampling rates of 150 and 4.1 kS/s and power consumptions of 30 and 0.85 /spl mu/W, respectively. Proper operation is achieved down to a supply voltage of 0.4 V.     

10-Gb/s limiting amplifier and laser/modulator driver in 0.18-/spl mu/m CMOS technology

A limiting amplifier incorporates active feedback, inductive peaking, and negative Miller capacitance to achieve a voltage gain of 50 dB, a bandwidth of 9.4 GHz, and a sensitivity of 4.6 mV/sub pp/ for a bit-error rate of 10/sup -12/ while consuming 150 mW. A driver employs T-coil peaking and negative impedance conversion to achieve operation at 10 Gb/s while delivering a current of 100 mA to 25-/spl Omega/ lasers or a voltage swing of 2 V/sub pp/ to 50-/spl Omega/ modulators with a power dissipation of 675 mW. Fabricated in 0.18-/spl mu/m CMOS technology, both prototypes operate with a 1.8-V supply.     

A technique to improve the drive current of high-voltage I/O transistors in digital CMOS technologies

By combining a 0.12-/spl mu/m-long 1.2-V thin-oxide transistor with a 0.22-/spl mu/m-long 3.3-V thick-oxide transistor in a 0.13-/spl mu/m CMOS process, a composite MOS transistor structure with a drawn gate length of 0.34 /spl mu/m is realized. Measurements show that at V/sub GS/=1.2 V and V/sub DS/=3.3 V, the composite transistor has more than two times the drain current of the minimum channel length (0.34 /spl mu/m) 3.3-V thick-oxide transistor, while having the same breakdown voltage (V/sub BK/) as the thick-oxide transistor. Exploiting these, it should be possible to implement 3.3-V I/O transistors with better combination of drive current, threshold voltage (V/sub T/) and breakdown voltage in conventional CMOS technologies without adding any process modifications.     

1.5 V tunable Square-Root Domain filter

A novel approach to the design of low-voltage CMOS Square-Root Domain filters is presented. It is based on the large-signal behaviour of a well-known class-AB linear transconductor. A first-order filter is built employing three such transconductors, featuring simplicity and compactness. Measurement results for an experimental prototype in 0.8 /spl mu/m CMOS validate the technique proposed. The filter operates with a single supply voltage of 1.5 V and can be tuned in more than one decade.     

A CMOS voltage reference based on weighted /spl Delta/V/sub GS/ for CMOS low-dropout linear regulators

A CMOS voltage reference, which is based on the weighted difference of the gate-source voltages of an NMOST and a PMOST operating in saturation region, is presented. The voltage reference is designed for CMOS low-dropout linear regulators and has been implemented in a standard 0.6-/spl mu/m CMOS technology (V/sub thn//spl ap/|V/sub thp/|/spl ap/0.9 V at 0/spl deg/C). The occupied chip area is 0.055 mm/sup 2/. The minimum supply voltage is 1.4 V, and the maximum supply current is 9.7 /spl mu/A. A typical mean uncalibrated temperature coefficient of 36.9 ppm//spl deg/C is achieved, and the typical mean line regulation is /spl plusmn/0.083%/V. The power-supply rejection ratio without any filtering capacitor at 100 Hz and 10 MHz are -47 and -20 dB, respectively. Moreover, the measured noise density with a 100-nF filtering capacitor at 100 Hz is 152 nV//spl radic/(Hz) and that at 100 kHz is 1.6 nV//spl radic/(Hz).     

1.5 V four-quadrant CMOS current multiplier/divider

A low voltage CMOS four-quadrant current multiplier/divider circuit is presented. It is based on a compact V-I converter cell able to operate at very low supply voltages. Measurement results for an experimental prototype in a 0.8 /spl mu/m CMOS technology show good linearity for a /spl plusmn/15 /spl mu/A input current range and a 1.5 V supply voltage.     

Two-phase boosted voltage generator for low-voltage DRAMs

A two-phase boosted voltage (V/sub PP/) generator circuit was proposed for use in gigabit DRAMs. It reduced the maximum gate-oxide voltage of pass transistor and the lower limit of supply voltage to V/sub PP/ and V/sub TN/, respectively, while those for the conventional charge-pump circuit are V/sub PP/+V/sub DD/ and 1.5 V/sub TN/ respectively. Also, the pumping current was increased in the new circuit. The newly proposed two-phase V/sub PP/ charge-pump circuit worked successfully at V/sub DD/ down to 0.8 V by eliminating the threshold voltage loss of the control pulse generator and was tested successfully in a 0.16-/spl mu/m test chip using triple-well CMOS technology.     

Low-Voltage Super class AB CMOS OTA cells with very high slew rate and power efficiency

A simple technique to achieve low-voltage power-efficient class AB operational transconductance amplifiers (OTAs) is presented. It is based on the combination of class AB differential input stages and local common-mode feedback (LCMFB) which provides additional dynamic current boosting, increased gain-bandwidth product (GBW), and near-optimal current efficiency. LCMFB is applied to various class AB differential input stages, leading to different class AB OTA topologies. Three OTA realizations based on this technique have been fabricated in a 0.5-/spl mu/m CMOS technology. For an 80-pF load they show enhancement factors of slew rate and GBW of up to 280 and 3.6, respectively, compared to a conventional class A OTA with the same 10-/spl mu/A quiescent currents and /spl plusmn/1-V supply voltages. In addition, the overhead in terms of common-mode input range, output swing, silicon area, noise, and static power consumption, is minimal.