软件本地化测试的研究

结合 Lotus Notes/Domino 本地化测试实例,讨论了软件测试环境平台的搭建、软件本地化测试管理工具、软件本地化测试管理等     

一种基于CMMI-SW(R)的软件配置管理方法

CMMI—SW是一种指导软件企业实施软件过程改进以及综合评价组织的软件能力成熟度的模型。其中，配置管理是其一个基础部件。因此，提供一种基于CMMI—SW实施配置管理的方法，同时结合企业的业务情况进行必要的裁减，将能够有效地实现维护工作产品的完整性和一致性，最终达到控制软件产品质量的目标。     

基于知识管理的软件开发模型——KCMMI

以软件开发能力成熟度模型CMM为兼容性理论框架,融合集成软件能力成熟度模型（CMMI）和知识管理成熟度模型（KMMM）的相关内容,提出了一种基于知识管理的软件开发过程模型-KCMMI。     

软件本地化测试的研究

结合Lotus Notes/Domino本地化测试实例,讨论了软件测试环境平台的搭建、软件本地化测试管理工具、软件本地化测试管理等。     

CMMI和敏捷开发过程的分析比较

近年来越来越多的软件开发企业应用了CMMI模式,这就涉及到融合敏捷开发的问题。敏捷开发和CMMI都存在其各自适用范围,这两种模式在实践做法、价值观以及原则等方面不仅相互独立又彼此补充。CMMI与敏捷开发包含很多优秀的软件工程实践。作为一个相对比较复杂的软件过程体系,CMMI参考实践做法比较多,而敏捷开发却有着较少的实践做法,且操作起来也比较容易,也许两者在各自环境中具有最优化。但是创建一套敏捷开发与CMMI相融合的软件开发模型,以此积极应对软件企业开发过程中的各种挑战,由此才能取得理想的软件产品投入及产出效果。     

CMMI的基本理论解析

随着社会的快速发展,许多能力成熟度模型已无法满足一些大型软件公司的需求,软件过程能力成熟度模型集成(Capability Maturity Model Integration,CMMI)应运而生。CMMI的普遍应用,给许多大型软件公司的高速运行带来了诸多便捷。文章通过研究CMMI的涵义、结构框架、表示和评估方法及重要性,旨在为CMMI高效使用提供可靠的理论依据和指导意见,使其更好地服务于诸多软件企业。     

软件测试模型及其改进方案

当前软件企业面临着用户需求日益复杂、软件产品架构日益扩大等问题。这些问题向软件测试提出了更高的要求。该文对传统测试模型进行了介绍和分析,在分析V模型、W模型以及X模型等软件测试模型的特点和局限性的基础上．利用增加单元测试准则的方法对软件测试模型进行了改进。基于以上工作,以CMMI的标准为指导对软件测试流程以及测试模型的改进提出了思路和方法。     

基于CMMI的PDM设计

为了提供目前产品数据管理(Product Dato Management,PDM)系统对产品开发过程管理的控制能力,实现产品开发过程中的实时测量与监控,提高管理质量,结合能力成熟度模型(Capability Maturity Model Integration,CMMI)在软件领域的成功经验,适应硬件产品开发领域的需要,在介绍了CMMI的主要思想之后,重点论述了以CMMI为基础定制企业PDM系统的可能性。对产品开发框架进行了分析,提出了基于CMMI的PDM系统概要设计模型。     

基于CMMI的软件项目质量管理研究

随着全球范围内计算机应用技术的不断革新,软件开发与研究项目层出不穷,同时,软件项目质量管理的重要性逐渐显露出来。能力成熟度模型集成（CMMI）是各国中小软件企业普遍认可的质量管理体系。前几年,在中国引入并大力在中小型软件企业推广CMM/CMMI的过程中,出现了诸多问题,尤其是该项目管理模式的可持续发展问题受到国内环境的阻碍。文章就基于CMMI的软件项目质量管理的相关问题进行论述,从中探究提升企业项目管理绩效的可靠手段。     

东软通过CMMI5级评估

12月7日,东软软件股份有限公司在北京宣布,该公司正式通过了由QAIIndia公司组织的CMMI(集成的能力成熟度模型)5级评估,这是东软继2002年12月底通过CMM5级评估之后再次在质量管理和过程改善方面获得的一张绿色通行证,也标志着我国软件企业的能力成熟度和项目管理水平达到行业最高水平。CMMI是由美国国防部与卡内基-梅隆大学和美国国防工业协会共同开发和研制、于2002年4月推出的系统工程和软件工程的集成成熟度模型。CMMI可以解决现有不同CMM模型的重复性、复杂性,并减少由此引起的成本、缩短改进过程。与原有的能力成熟度模型CMM…     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.