激光重熔在钎料凸点成形中的应用

激光由于具有高能量输入密度以及可局部加热的优点而在面阵列电子封装钎料凸点成形中具有潜在的优势，介绍了激光重熔在面阵列封装钎料凸点成形中的研究进展，并且对PBGA共晶钎料球激光重熔进行了工艺研究，研究结果表明；采用合适的激光输入能量可以在非常短的时间内获得表面质量光滑的钎料凸点。     

Hygrothermal Delaminations in Lead-Free Solder Reflow of Electronic Packages

The use of environmentally friendly lead-free solder in electronic assembly requires a higher process temperatures that double the saturated steam pressure inside the electronic package. We studied the interfacial delamination fractures created by the trapped steam inside the defect voids in packages by computationally modeling the steam diffusion and evaporation processes and the hygrothermal fracture behaviors. These results were compared with results from the conventional saturated steam pressure approach. The comparisons revealed that the saturated steam approach is appropriate for small defects, while the evaporative-diffusion approach is suited for delamination analyses of small and large defects. Our results showed that the strain energy release rate increased with initial defect growth, but reached a defect-size independent plateau when the defect had grown larger than the temperature-dependent critical defect size. To control delamination in packages undergoing lead-free solder reflow, the interfacial fracture energy release rate should be engineered to be above this plateau by controlling the interfacial adhesion, and the applied strain energy release rate should be reduced by reducing the diffusion and evaporation rate of water in the materials.     

BGA 再流焊技术

随着科学技术的飞速发展,电子器件封装的小型化技术也得到很大的提高,元器件的组装密度越来越高。IC封装向着集成化、高性能化、多引线、面阵列端子型封装和裸芯片组装方向发展,这已经远远超出传统电路的SMT组装技术。本文着重从BGA器件的封装形式、再流焊技术以及检测三方面进行详细讨论。     

Impact of Electrical Current on the Long-Term Reliability of Fine-Pitch Ball Grid Array Packages with Sn-Ag-Cu Solder Interconnects

The interaction between electrical current and the long-term reliability of fine-pitch ball grid array packages with Sn-3.0Ag-0.5Cu (wt.%) solder ball interconnects is investigated. In this study, 0.4-mm fine-pitch packages with 300-μm-diameter Sn-Ag-Cu solder balls are used. Electrical current was applied under various conditions to two different package substrate surface finishes to compare the effects of chemically unmixed and mixed joint structures: a Cu/SAC305/Cu structure and a NiAu/SAC305/Cu structure, respectively. To study the thermal impact on the thermal fatigue performance and long-term reliability, the samples were thermally cycled from 0°C to 100°C with and without current stressing. Based on Weibull plots, the characteristic lifetime was degraded for the mixed joint structure, but little degradation was observed for the unmixed joint structure. The microstructure evolution was observed during constant current stressing and current stressing during thermal cycling. Accelerated intermetallic precipitation depletion at the package-side interface was observed in NiAu/SAC305/Cu structures due to current stressing, which was identified as the potential reason for the degradation in the thermal cycling performance.     

再成形（Re—Balled）焊球阵魏封装的焊球强度评估

近年来,许多国家禁止在电子产品中铅的使用,但是一些特定产品拥有豁免权。拥有豁免权的电子产品生产厂商面临含铅元器件供应缺乏的现状,因此生产厂商开始寻求利用焊球再成形技术把焊球阵列封装中的无铅焊球转变为锡铅焊球。焊球再成形技术曾经被用于元器件的回收再利用．但是关于焊球再成形元器件的可靠性信息十分有限。介绍了利用焊球再成形技术使无铅焊球阵列封装转变为锡铅焊球阵列封装。两种焊球去除方法和两种焊球再贴装方法分别用于实现从无铅焊球到锡铅焊球的转变,用以调查再成形工艺对于封装质量的影响。热时效试验以及焊球强度评估用于检测焊球再成形工艺过程。     

再成形(Re-Balled)焊球阵列封装的焊球强度评估

近年来,许多国家禁止在电子产品中铅的使用,但是一些特定产品拥有豁免权。拥有豁免权的电子产品生产厂商面临含铅元器件供应缺乏的现状,因此生产厂商开始寻求利用焊球再成形技术把焊球阵列封装中的无铅焊球转变为锡铅焊球。焊球再成形技术曾经被用于元器件的回收再利用,但是关于焊球再成形元器件的可靠性信息十分有限。介绍了利用焊球再成形技术使无铅焊球阵列封装转变为锡铅焊球阵列封装。两种焊球去除方法和两种焊球再贴装方法分别用于实现从无铅焊球到锡铅焊球的转变,用以调查再成形工艺对于封装质量的影响。热时效试验以及焊球强度评估用于检测焊球再成形工艺过程。     

Solder Ball Attachment Assessment of Reballed Plastic Ball Grid Array Packages

The ban of lead in consumer-based electronics by many countries has resulted in a dramatic reduction in the availability of electronic components with tin-lead terminations. With the uncertainty associated with lead-free reliability and the issues associated with mixing lead-free solder with tin-lead solder, medical, defense, and aerospace equipment manufacturers are examining and in some cases implementing reprocessing practices to convert lead-free terminations to tin-lead. For area array packages, the practice is referred to as reballing. While reballing has been used for part reclamation, very little information is available on the reliability of reballed parts. This paper presents lead-free ball grid array (BGA) packages subjected to two ball removal and two ball reattachment techniques. Solder attach strength was used as a metric to examine the reballing process. Both the ball shear test and the cold bump pull (CBP) test were used to test solder strength. The impact of isothermal aging was also examined. The solder strength of reballed BGAs remained at the same level when different reballing methods were used and under different aging conditions. The lead-free non-reballed BGAs had higher solder strength and wider strength distribution than reballed tin-lead BGAs. The pull strength increased as the pull speed increased in the CBP test.      

选择再流焊炉的最佳方案

简要介绍再流焊接技术，介绍了选择再流焊炉必须考虑的主要因素，提出组建适用于中小批量生产的ＳＭＴ生产线再流焊炉的最佳方案。     

钎料量对通孔再流焊焊点强度的影响规律

以波峰焊工艺焊点强度为标准,研究在不同钎料量下通孔再流焊焊点的强度.同时考虑了印制电路板厚度对焊点强度的影响.结果发现当钎料量超过临界值时,通孔再流焊点的强度可以和波峰焊焊点强度相比拟.观察焊点的外观形态及内部钎料填充情况,找出它对焊点强度的影响规律,为焊点质量目检提供了参考标准.     

Solder Joint Characteristics and Reliability of Lead-Free Area Array Packages Assembled at Various Tin–Lead Soldering Process Conditions

This paper presents a comprehensive study on the effects of critical process conditions on solder joint metallurgy and reliability of mixed-alloy solder joints. The solder joint metallurgy of mixed alloys was characterized and the lead distribution through the solder joint was analyzed, for different package types and under various process conditions. The results showed that the solder paste amount (ultimately the tin percentage (Sn%) in the alloy) and the reflow temperature play critical roles in the mixed-alloy assembly, both in terms of compositional homogeneity and voiding. The reliability of mixed-alloy solder joints was then studied at various process conditions, under different thermal and mechanical stress environments. The study revealed that the sensitivity of the reliability of the mixed-alloy solder joints to the process condition depends on the type of environmental loading.      

Modeling the Rate-Dependent Durability of Reduced-Ag SAC Interconnects for Area Array Packages Under Torsion Loads

Solder durability models frequently focus on the applied strain range; however, the rate of applied loading, or strain rate, is also important. In this study, an approach to incorporate strain rate dependency into durability estimation for solder interconnects is examined. Failure data were collected for SAC105 solder ball grid arrays assembled with SAC305 solder that were subjected to displacement-controlled torsion loads. Strain-rate-dependent (Johnson–Cook model) and strain-rate-independent elastic–plastic properties were used to model the solders in finite-element simulation. Test data were then used to extract damage model constants for the reduced-Ag SAC solder. A generalized Coffin–Manson damage model was used to estimate the durability. The mechanical fatigue durability curve for reduced-silver SAC solder was generated and compared with durability curves for SAC305 and Sn-Pb from the literature.     

再流区工艺参数对焊接可靠性的影响

影响表面组装焊接可靠性的因素很多，从钎焊机理入手，经过金相分析就再流区工艺参数对焊点微观结构的影响进行了研究，并结合焊点拉脱试验提出了再流区工艺控制的原则。     

常规锡膏回流焊接空洞的分析与解决

锡膏回流焊是半导体封装中组装工艺之一,较大焊接面积中焊接空洞是最常见和最难解决的问题之一。通过对锡膏印刷回流焊工艺特性的分析和相关性试验,排查出造成空洞的主要影响因素,运用实验设计(DOE)优化工艺参数、减少焊接空洞。为满足芯片焊接空洞要求,采用二次印刷回流新工艺,将芯片焊接空洞面积率降低到5%以内,解决因空洞引起的芯片裂损问题,为常规低成本锡膏回流焊接工艺的焊接空洞问题改善提供了参考。     

无铅焊料十温区回流焊过程的仿真研究

通过对回流焊接工艺参数传输带速度、各个炉区温度设定和焊膏熔化温度曲线的关系研究,建立了大尺寸PCB组件传热过程的数学模型。基于ANSYS平台,模拟了无铅焊料PCB组件在十温区回流焊接过程中的温度场,从而确定了合适的焊接参数。     

CMOS门阵列电路用封装外壳的研制

介绍了一种用于封装万门至十万门级ＣＭＯＳ门阵列电路的ＰＣＡ１３２多层陶瓷外壳的研制。该外壳的设计采用了ＣＡＤ设计布线,模拟并优化外壳的信号线电阻、线间电容、电感及传输延迟等参数,使其满足电路要求。并且通过结构可靠性设计,使外壳抗机械冲击、温度冲击能力大大提高,满足了高可靠应用要求。     

再流焊接加热设备的新进展

主要介绍了美国市场上再流焊接设备的发展新动向，以及选择和使用再流焊接设备的一些考虑因素。     

焊膏回流性能动态测试法及其应用

通过体视显微镜和CCD等视频设备录制、焊膏回流动态测试方法,观察焊膏回流的整个过程,有助于分析焊膏回流过程中出现的问题,弥补了目前焊膏–锡珠试验只能观察最终结果,而不能对中间过程进行评价的缺点。利用该方法研究了保温时间和焊膏活性对焊膏回流性能的影响,对焊膏的收球性能进行了评价。结果表明:焊膏回流的保温时间有一定限制,超过限制,产生缺陷的机会大大增加;对于活性较强的焊膏,可以通过增加焊膏的黏性,减少锡珠和立碑以及元件歪斜倾向;通过对不同焊膏的回流过程进行对比,提出了焊膏收球性能良好的参考标准。     

焊盘尺寸对FC—PBGA焊点可靠性的影响

影响封装可靠性的因素很多,其中对封装及供货厂商相关的封装设计方面的各种变量应该给予足够的重视。焊盘尺寸是影响焊点可靠性的关键因素之一,不同供货厂商的各种工艺造成焊盘尺寸方面的差异,对可靠性造成了极大的影响。有限元应力分析、波纹干涉测量试验及可靠性试验表明,基板厚度影响封装可靠性。文章采用有限元模拟来定量分析焊盘尺寸对PBGA封装可靠性的影响,把空气对空气热循环试验结果与FEM预测进行比较,讨论最佳焊盘尺寸,并预测对焊点可靠性的影响。     

再流焊焊点可靠性自动管理系统

加热因子Q是描述SMT再流焊过程的一个量化参数,决定了再流焊工艺以及焊点的可靠性,其大小直接反映了焊点的吸热量以及焊接界面形成的金属间化合物的形态.通过自动再流焊管理系统(ARM)对温度曲线进行监控和优化,调整加热因子,实现可靠的产品焊接.     

回流温度曲线对CBGA植球空洞影响研究

随着陶瓷球栅阵列(CBGA)封装形式的产品被广泛应用,空洞对可靠性的影响受到重视。以CBGA256封装形式的电路产品为例,通过调节回流温度曲线研究空洞形成的机理和回流焊时间对空洞率的影响。研究结果表明,随着加热时间的增加,焊点空洞的数量呈现先降低后升高的趋势,而加热时间过长不利于助焊剂残留的排出造成空洞增多,而回流时间的增加有利于回流过程中熔化焊料内部空洞的溢出。