A study of recombination centers in irradiated <Emphasis Type="Italic">p</Emphasis>-Si crystals

p-Si samples irradiated with 8-Mev electrons are studied. It is suggested that the multicomponent V₃+O or V₂+O₂ complexes are not recombination centers on the basis of an analysis of the dependences of the minority-carrier lifetime τ, the resistivity ρ, the concentration p, and the Hall mobility μ_H on the temperature of isochronous annealing T_ann. Deep donors with energy levels at ΔE_i=E_v+0.40 eV and the V₃+O₃ and the V₃+O₂ complexes affect the values of μ_H and τ. The curves of isochronous annealing are used to determine the annealing-activation energies E_ann for defects such as K centers, interstitial carbon atoms C_i, the V+B and V₂+O₂ complexes, divacancies V₂, and defects with a level at ΔE_i=E_v+0.20 eV. These energies were found to be equal to E_ann=0.9, 0.25, 1.6, 2, 1.54, and 2.33 eV, respectively.     

Hydrogen-containing donors in silicon: Centers with negative effective correlation energy

The reconstruction of shallow-level hydrogen-containing donors in Si is studied. The donors are formed by implantation of low-energy (300 keV) hydrogen ions into the experimental samples and subsequent heat treatment at 450°C. The experiments are carried out for Ag-Mo-Si Schottky diodes and diodes with a shallow (～1 μm) p⁺-n junction. The concentration and distribution of the donors are determined by applying the method of C–V characteristics at a frequency of 1.2 MHz. An analysis of the temperature dependence of the equilibrium electron concentration shows that the reconstruction of the hydrogen-containing donors can be described under the assumption of recharging of a center with negative effective correlation energy (U < 0). The transformation between two equilibrium configurations of a double hydrogen donor (D _B ⁺⁺ ? D _A ⁰ ) proceeds with the Fermi level position E_F = E _c ? 0.30 eV. The reconstruction of the donors from a neutral to a doubly charged state (D _A ⁰ → D _B ⁺⁺ ) which is stimulated by the capture of minority carriers, is observed at room temperature.     

Special features of charge transport in PbGa<Subscript>2</Subscript>Se<Subscript>4</Subscript> crystals

The current-voltage (I-V) characteristics of PbGa₂Se₄ single crystals grown by the Bridgman-Stockbarger method with a resistivity of 10¹⁰–10¹² Ω cm were measured. The value of the majority carrier mobility μ=14 cm² V^?1 s^?1, calculated by the differential method of analysis of I-V characteristics, makes it possible to evaluate a number of parameters: the carrier concentration at the cathode (n_c0=2.48 cm^?3), the width of the contact barrier d_c=5.4×10^?8 cm, the cathode transparency D _c ^* =10^?5–10^?4 eV, and the quasi-Fermi level E_F=0.38 eV. It is found that a high electric field provides the charge transport through PbGa₂Se₄ crystals in accordance with the Pool-Frenkel effect. The value of the dielectric constant calculated from the Frenkel factor is found to be equal to 8.4.     

Study of the electrical properties of Cd<Subscript>x</Subscript>Hg<Subscript>1−<Emphasis Type="Italic">x</Emphasis></Subscript>Te

On the basis of the temperature and field dependences of the Hall coefficient R _H , it was found that samples with a low electron density are, as a rule, compensated, and the degree of compensation changes upon thermal conversion of the conductivity of the sample to p type. For n-Cd_xHg_1?xTe, the ionization energy of the donor level was found from the temperature dependences of resistivity ρ(T): E _d =24–32 meV. For the same samples, after their thermal conversion to p type, the ionization energies of acceptors, which are related to doubly charged vacancies V _Hg ⁺⁺ , were determined: E _a =32 and 48 meV. In addition, a deep level E _t , related to an unknown amphoteric impurity, was found (E _t ?E _v ≈0.7E _g ).     

Resonant Γ-<Emphasis Type="Italic">X</Emphasis> tunneling in single-barrier GaAs/AlAs/GaAs heterostructures

The electron transport through single-barrier GaAs/AlAs/GaAs heterostructures is studied. This transport is caused by resonant tunneling between the two-dimensional states related to the Γ valley of the GaAs conduction band and various two-or zero-dimensional donor states related to the lower X valleys of the AlAs conduction band. The resonant electron tunneling both via various two-dimensional states related to the X_z and X_xy valleys in AlAs (the X_z and X_xy states) and via related states of Si donors X _z ^D and X _xy ^D was observed. This circumstance made it possible to determine the binding energies of these states (E_B(X _z ^D )≈50 meV and E_B(X _xy ^D )≈70 meV, respectively) directly from the results of identification of resonance features in transport characteristics. An analysis of the structure of experimental resonances corresponding to tunneling between the Γ and X Landau levels in a magnetic field made it possible to determine the transverse effective mass in the X valleys of AlAs (m_t=(0.2±0.02)m₀). An additional fine structure of donor resonances is observed in experimental transport characteristics. This fine structure is caused by resonant tunneling of electrons through the states of the donors that are located in various atomic layers of the AlAs barrier (in the growth direction) and therefore have different binding energies.     

Dissociation energies of a C<Subscript>i</Subscript>C<Subscript>s</Subscript> complex and the <Emphasis Type="Italic">A</Emphasis> center in silicon

Reactions of annealing of A centers (VO) and complex centers consisting of interstitial carbon atoms and substitutional carbon atoms (C_iC_s) in n-Si irradiated with fast electrons or ⁶⁰Co gamma quanta were analyzed. The kinetics of isochronous annealing of the above centers was evaluated. By comparing the results of calculations with published experimental data, which were obtained by measuring the concentration of centers with the level E_c?0.17 eV in the course of isochronous heat treatment of irradiated n-Si, the dissociation energy E for the C_iC_s complex was estimated at 1.10±0.05 eV. The activation energy for annealing of this center was found to be equal to \(E_{aC_i C_s } \approx 2.0eV\). The dissociation energy for the A center was estimated at E_A=1.94 eV.     

Accumulation of structural defects in silicon irradiated with PF<Stack><Subscript><Emphasis Type="Italic">n</Emphasis></Subscript><Superscript>+</Superscript></Stack> cluster ions with medium energies

The method of Rutherford backscattering spectrometry in combination with channeling is used to study the accumulation of structural defects in silicon at room temperature as a result of irradiation with P⁺ and F⁺ atomic ions and also with cluster PF _n ⁺ ions (n = 1, …, 4) with the energy of 2.1 keV/amu and with identical generation rate of primary defects. The conditions for correct comparison of the results of bombardment with atomic and cluster ions composed of atoms of various types are suggested. It is found that the characteristics of accumulation of structural defects in silicon in the case of bombardment with PF _n ⁺ cluster ions differ widely from those under irradiation with both atomic ions that are involved in the cluster ion (P⁺ and F⁺) and with atomic heavy ions that have atomic mass close to that of the mass of a PF _n ⁺ cluster. It is shown that, with irradiation conditions being the same, cluster ions produce much more radiation defects in the surface region than do atomic ions; i.e., a molecular effect is observed. Plausible mechanisms of this phenomenon are considered.     

Reflection spectra of two polymorphic modifications of cadmium arsenide

The optical properties of cadmium arsenide are studied. Reliable new data on the reflection spectra are obtained owing to the use of perfect crystals and high-precision spectral equipment. The reflection spectra of the polymorphic modifications α″-Cd₃As₂ (space group D _4h ¹⁵ ) and α′-Cd₃As₂ (space group ) are D _4h ¹¹ are recorded at room and liquid-nitrogen temperatures in polarized light (E ⊥ c, E ‖ c) at incident-light photon energies of 1–5 eV. For the α′ modification, anisotropy is observed in the reflection spectra for the first time. The obtained results are compared with the known experimental and theoretical data.     

Detection of hydrogen impurity in silicon radiation detectors

The behavior of silicon particle detectors irradiated with 2.5-MeV electrons during subsequent annealing is studied. Annealing at 100–250°C was found to result in the formation of two types of traps with the levels E _c ?0.32 eV and E_v+0.29 eV. Increasing the annealing temperature to 300°C makes both traps disappear. On the basis of data obtained, it was concluded that these traps are related to hydrogen-containing complexes. The presence of hydrogen in a crystal results in a decrease in the annealing temperature for vacancy-oxygen (VO) complexes and complexes consisting of carbon and oxygen interstitials (C_iO_i). The reason for this phenomenon is the passivation of these complexes by hydrogen, which results in the formation of electrically active VOH centers {with the level E _c ?0.32 eV} in an intermediate stage of this process. It is assumed that hydrogen penetrates the structures under investigation in one of the stages of their fabrication.     

Internal quantum efficiency of stimulated emission of (λ=1.55 µm) InGaAsP/InP laser diodes

The stimulated emission (η _i ^st ) of InGaAsP/InP separate-confinement double heterostructure lasers operating at λ=1.5–1.6 μm has been studied experimentally and theoretically. Laser heterostructures with a varied design of the waveguide layer were grown by MOCVD. The maximum internal quantum efficiency η _i ^st ≈97% was obtained in a structure with a double-step waveguide characterized by minimum leakage into the p-emitter above the generation threshold. The high value of η _i ^st is provided by low threshold and nonequilibrium carrier concentrations at the interface between the waveguide and p-emitter. The calculation yields η _i ^st values correlating well with the experimental data. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 37, No. 2, 2003, pp. 243–248. Original Russian Text Copyright ? 2003 by Skrynnikov, Zegrya, Pikhtin, Slipchenko, Shamakhov, Tarasov.     

Effective electron mass in heavily doped GaAs in the ordering of impurity complexes

Spectra of edge photoluminescence (PL) at 300 K have been studied in a set of Czochralski-grown Te-doped GaAs single crystals with a free carrier density of n₀=10¹⁷–10¹⁹ cm^?3. The carrier density dependences of the chemical potential and band gap narrowing are obtained by analyzing the PL spectral line profiles. The dependence of the effective mass of electrons at the bottom of the conduction band on their density, m ₀ ^* (n₀), is calculated. It is shown that the nonmonotonic m ₀ ^* (n₀) dependence correlates with data on electron scattering in the material under study and results from the ordering of impurity complexes.     

Special features of annealing of radiation defects in irradiated <Emphasis Type="Italic">p</Emphasis>-Si crystals

p-Si single crystals grown by the Czochralski method were studied; the hole concentration in these crystals was p = 6 × 10¹³ cm^?3. The samples were irradiated with 8-MeV electrons at 300 K and were then annealed isochronously in the temperature range T _ann = 100–500°C. The studies were carried out using the Hall method in the temperature range of 77–300 K. It is shown that annealing of divacancies occurs via their transformation into the B _s V ₂ complexes. This complex introduces the energy level located at E _v + 0.22 eV into the band gap and is annealed out in the temperature range of 360–440°C. It is assumed that defects with the level E _v + 0.2 eV that anneal out in the temperature range T _ann = 340–450°C are multicomponent complexes and contain the atoms of the doping and background impurities.     

On the photoconductivity of TlInSe<Subscript>2</Subscript>

The current–voltage (I–V) and photocurrent–light intensity (I _pc –Φ) characteristics and the photoconductivity relaxation kinetics of TlInSe₂ single crystals are investigated. Anomalously long relaxation times (τ ≈ 10³ s) and some other specific features of the photoconductivity are observed, which are explained within the barrier theory of inhomogeneous semiconductors. The heights of the drift and recombination barriers are found to be, respectively, E _dr ≈ 0.1 eV and E _r ≈ 0.45 eV.     

Low-temperature instabilities of the electrical properties of Cd<Subscript>0.96</Subscript>Zn<Subscript>0.04</Subscript>Te:Cl semi-insulating crystals

The electrical properties in the temperature range 295–430 K and low-temperature (4.2 K) photoluminescence of Cd_1?xZn_xTe:Cl semi-insulating crystals grown from melts with a variable impurity content (C _Cl ⁰ = 5 × 10¹⁷–1 × 10¹⁹ cm^?3) are investigated. Nonequilibrium processes leading to a decrease in carrier concentration are observed in all the samples at low temperatures (T = 330–385 K). These changes are reversible. The activation energy of these processes E _a is found to be 0.88 eV. As with semi-insulating CdTe:Cl, the observed phenomena can be explained by a change in the charge state of background copper atoms: Cu_Cd ? Cu_i. The introduction of Zn changes the ratio of the concentrations of shallow-level donors Cu_i and Cl_Te from their levels in the initial material.     

<Emphasis Type="Italic">p</Emphasis><Superscript>+</Superscript>-Si-<Emphasis Type="Italic">n</Emphasis>-CdF<Subscript>2</Subscript> heterojunctions

Boron diffusion and the vapor-phase deposition of silicon layers are used to prepare ultrashallow p⁺-n junctions and p⁺-Si-n-CdF₂ heterostructures on an n-CdF₂ crystal surface. Forward portions of the I–V characteristics of the p⁺-n junctions and p⁺-Si-n-CdF₂ heterojunctions reveal the CdF₂ band gap (7.8 eV), as well as allow the identification of the valence-band structure of cadmium fluoride crystals. Under conditions in which forward bias is applied to the p⁺-Si-n-CdF₂ heterojunctions, electroluminescence spectra are measured for the first time in the visible spectral region.     

Structurally complex two-hole and two-electron slow traps with bikinetic properties in <Emphasis Type="Italic">p</Emphasis>-ZnTe and <Emphasis Type="Italic">n</Emphasis>-ZnS crystals

Thermal-activation and photoactivation methods were used to ascertain the existence of two-hole traps in p-ZnTe crystals and two-electron traps in n-ZnS. It was found that these traps have a large number of energy states that are grouped in two series of levels: E_V+(0.46–0.66) eV and E_V+(0.06–0.26) eV in p-ZnTe and E_C?(0.6–0.65) eV and E_C?(0.14–0.18) eV in n-ZnS. Both the hole and the electron traps belong to the class of slow traps with bikinetic properties. These traps feature normal kinetic properties in the state with a single trapped charge carrier and feature anomalous kinetic properties in the state with two charge carriers. Multiple-parameter models allowing for a relation of traps in p-ZnTe and n-ZnS to the vacancy-impurity pairs distributed according to their interatomic distances and localized in the region of microinhomogeneities with collective electric fields that repel the majority charge carriers are suggested. The main special features of behavior of electron and hole traps are explained consistently using the above models.     

Photovoltaic effects in CdV<Subscript>2</Subscript>S<Subscript>4</Subscript> single crystals and structures based on them

Single crystals of the CdV₂S₄ ternary compound are grown, and their crystal structure, electrical properties, and optical absorption are studied. The substitution of vanadium for Group III element in A^IIB ₂ ^III C ₄ ^VI compounds results in the formation of crystals of n-type conduction with an electron density of ～10¹⁸ cm^?3 and a Hall mobility U_n≈150 cm²/(V s) at T=300 K, which is limited by scattering on lattice vibrations. Rectifying photosensitive structures based on CdV₂S₄ single crystals are fabricated for the first time, their photoelectric properties are studied, and a conclusion is made on their applicability in the design of wide-spectral-range photodetectors of unpolarized light.     

Excition states in semiconductor quantum dots in the modified effective mass approximation

A new modified effective mass approximation is suggested to describe the excitonic energy spectrum of quantum dots of radii a comparable to the exciton Bohr radius a _ex ⁰ . It is shown that, for quantum dots simulated by infinitely deep potential wells, the effective mass approximation is appropriate for describing excitons in quantum dots of radii a ≈ a _ex ⁰ , if the reduced effective mass of the excitons, μ, is considered as a function of the radius of the quantum dot a, μ = μ(a).     

Electron-phonon damping factor for the landau quantization of 2D electrons with a fine structure of the energy spectrum

The drift of degenerate 2D electrons in the channel of the heterojunction potential well is considered. In a quantizing magnetic field B, the electrons scan the defects of the heteroboundary, which perturb their momentum and energy equilibrium state (T, T _D ⁰ ). The stationary nonequilibrium state (T, T _D ^* ) is attained by electron-phonon relaxation in energy and momentum. The experimentally observed nonlinear dependence T_D(T) is explained by the admixture of deformation acoustic phonons to the interaction of 2D electrons with piezoelectric phonons.     

Migration energy of vacancies in <Emphasis Type="Italic">p</Emphasis>-type silicon crystals

p-Si:B samples were irradiated with 8-MeV electrons. The values of the activation energy of annealing for K centers and for (V + B) complexes obtained from the curves of isochronous annealing of these centers are found to be equal to 0.915 and 1.6 eV, respectively. The volumetric measurements of photovoltage over the irradiated region make it possible to estimate the values of the migration energy of vacancies. The migration energy is found to be \(E_{V^{ + + } }^M \approx 0.6 eV\) for positively charged vacancies and \(E_{V^0 }^M \approx 0.345 eV\) for neutral vacancies.