共查询到19条相似文献,搜索用时 62 毫秒
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混合信号电路(Mixed-signalCircuits)广泛应用于通信、多媒体、工业电子和消费类电子产品中。其测试方法有很多,其中基于边界扫描技术的混合信号测试总线已越来越受欢迎。在定义混合信号测试总线时,要求不仅能够测试桥接故障、开路故障、对模拟元件值进行测试,而且还要能够与IEEE1149.1兼容。为此,IEEE半导体工业协会(SA)标准委员会于1999年6月批准了建立混合信号测试总线标准的1149.4文件。 相似文献
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介绍了边界扫描的技术原理,及其在集成电路测试中的具体应用,并给出了一种基于边界扫描技术的板级集成电路测试系统的方案及实现。 相似文献
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分析了混合信号边界扫描测试的工作机制对测试系统的功能需求,实现了符合IEEE1149.4标准的混合信号边界扫描测试系统。仿真和测试实践表明,该测试系统具有对系统级、PCB级和芯片级电路进行简单互连测试、差分测试和参数测试等功能,结构简单、携带方便、工作可靠。 相似文献
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提出了一种基于边界扫描技术的模拟集成电路内建自测试方案。该方案依照IEEE 1149.4边界扫描测试标准, 在添加极少电路元件的基础上, 增加了电路性能测试单元(FTM), 能够充分利用电路系统中已有数模混合资源, 通过控制器内部向被测电路施加激励, 完成模拟集成电路的功能性测试。采用Cyclone II系列芯片EP2C35F672C8实现测试系统设计, 并以模拟集成滤波芯片MAX292为被测核心电路展开实验, 其频率特性的测试结果表明了该测试方案的正确性和系统测试的有效性。 相似文献
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将内部IEEE 1149架构与集成在产品中的通信端口链接起来,供外界使用. 相似文献
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缺乏可控制性和可观察性是SOC嵌入式内核测试电路最难解决的问题.本文提出在SOC嵌入式内核测试电路中引入DFT和BIST方法.介绍了IEEE1149.4混合信号测试总线及其应用特点,讨论运用重配置的DFT方法和测试点插入的DFT方法来增强混合信号系统的可控制性和可观察性.阐述ADC/DAC与PLL两种电路的BIST技术在SOC嵌入式内核测试的应用.为解决SOC混合信号测试难题提供一种有效的方法. 相似文献
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Debugging electronic circuits is traditionally done with bench equipment directly connected to the circuit under debug. In the digital domain, the difficulties associated with the direct physical access to circuit nodes led to the inclusion of resources providing support to that activity, first at the printed circuit level, and then at the integrated circuit level. The experience acquired with those solutions led to the emergence of dedicated infrastructures for debugging cores at the system-on-chip level. However, all these developments had a small impact in the analog and mixed-signal domain, where debugging still depends, to a large extent, on direct physical access to circuit nodes. As a consequence, when analog and mixed-signal circuits are integrated as cores inside a system-on-chip, the difficulties associated with debugging increase, which cause the time-to-market and the prototype verification costs to also increase.The present work considers the IEEE1149.4 infrastructure as a means to support the debugging of mixed-signal circuits, namely to access the circuit nodes and also an embedded debug mechanism named mixed-signal condition detector, necessary for watch-/breakpoints and real-time analysis operations. One of the main advantages associated with the proposed solution is the seamless migration to the system-on-chip level, as the access is done through electronic means, thus easing debugging operations at different hierarchical levels. 相似文献
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基于IEEE1149.4的测试方法研究 总被引:4,自引:0,他引:4
根据混合信号边界扫描测试的工作机制,提出了符合l149.4标准的测试方法,并用本研究室开发的混合信号边界扫描测试系统进行了测试验证。 相似文献
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Makie-Fukuda K. Kikuchi T. Matsuura T. Hotta M. 《Solid-State Circuits, IEEE Journal of》1995,30(2):87-92
This paper proposes a method of measuring the influence of digital noise on analog circuits using wide-band voltage comparators as noise detectors. Noise amplitude and r.m.s voltage are successfully measured by this method. A test chip is fabricated to measure the digital noise influence. From the experimental results, it is shown that the digital noise influence can be considerably reduced by using a differential configuration in analog circuits for mixed-signal IC's. The digital noise influence can be further reduced by lowering the digital supply voltage. These results show that the voltage-comparator-based measuring method is effective in measuring the influence of digital noise on analog circuits 相似文献
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This paper reviews computer-aided design techniques to address mixed-signal coupling in integrated circuits, particularly wireless RF circuits. Mixed-signal coupling through the chip interconnects, substrate, and package is detrimental to wireless circuit performance as it can swamp out the small received signal prior to amplification or during the mixing process. Specialized simulation techniques for the analysis of periodic circuits in conjunction with semi-analytical methods for chip substrate modeling help analyze the impart of mixed-signal coupling mechanisms on such integrated circuits. Application of these computer-aided design techniques to real-life problems is illustrated with the help of a design example. Design techniques to mitigate mixed-signal coupling can be determined with the help of these modeling and analysis methods 相似文献
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Nai-Chi Lee 《Journal of Electronic Testing》1993,4(4):361-368
Progress in analog circuit testing has been hindered by the lack of structured design-for-testability methodologies. With the increasing complexity of analog/mixed-signal circuits, test program development time is now a major obstacle in achieving shorttime-to-market, while production testing cost is a prominent factor in total production cost. TheAnalog Autonomous Test is a structured design-for-testability scheme for analog circuits. Originally developed for testing analog circuits at chip level, AAT extends naturally to cover testing of mixedsignal integrated circuits mounted on printed circuit boards. With the addition of an analog test bus to PCBs, testability for analog components (bothcore circuits andglue circuits) can be improved, in a manner similar to that achieved for digital boards by the IEEE 1149.1 boundary scan scheme. Details on the implementation of thisAnalog Autonomous Test Bus, both at chip level and board level, are presented here. Its limitations and potential applications are also discussed. 相似文献
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Nai-Chi Lee 《Analog Integrated Circuits and Signal Processing》1993,4(3):261-268
Progress in analog circuit testing has been hindered by the lack of structured design-for-testability methodologies. With the increasing complexity of analog/mixed-signal circuits, test program development time is now a major obstacle in achieving shorttime-to-market, while production testing cost is a prominent factor in total production cost. TheAnalog Autonomous Test is a structured design-for-testability scheme for analog circuits. Originally developed for testing analog circuits at chip level, AAT extends naturally to cover testing of mixedsignal integrated circuits mounted on printed circuit boards. With the addition of an analog test bus to PCBs, testability for analog components (bothcore circuits andglue circuits) can be improved, in a manner similar to that achieved for digital boards by the IEEE 1149.1 boundary scan scheme. Details on the implementation of thisAnalog Autonomous Test Bus, both at chip level and board level, are presented here. Its limitations and potential applications are also discussed. 相似文献