流动对ZTS晶体(100)面台阶生长动力学影响的研究

通过利用光学显微镜对ZTS晶体(100)面的台阶推移过程进行实时观察,对不同溶液供应速度及不同过饱和度下的台阶生长动力学进行了研究。结果表明,随着溶液供应速度S的增大,台阶平均推移速率先增大后减小。溶液供应速度S≈1.2mL/min时,台阶平均推移速率达到最大。而在静止的生长溶液中,台阶平均推移速率随着过饱和度σ的增大呈非线性增大,同时确定了生长死区σd和台阶平均推移速率急剧增大时的临界过饱和度值σ*,并计算了不同过饱和度阶段的台阶动力学系数和台阶活化能。     

KDP晶体(100)面生长台阶聚并现象的AFM研究

采用激光偏振干涉手段实时测量了KDP晶体(100)面的生长速度与过饱和度之间的关系,用AFM技术观察了KDP晶体(100)面在不同过饱和度下的基本台阶和聚并台阶形貌,并据此分析了由基本台阶到聚并台阶的过程及其与过饱和度之间的关系.研究表明:过饱和度为1.8%时,(100)面上以基本台阶为主,基本台阶的高度为0.366 nm,约为半晶胞高度;增大过饱和度,基本台阶开始聚并,聚并初期,台阶高度增加,进而台阶宽度增加;随着过饱和度的增大,台阶聚并加剧,推移速度加快,但聚并台阶的斜率基本不变.     

ZTS晶体(100)面生长过程的实时AFM研究

利用原子力显微镜(AFM)对不同生长条件下ZTS晶体(100)面生长过程进行实时观测发现,(100)面均呈现为台阶面,台阶分单台阶、聚并台阶和准聚并台阶3种。位错、缺陷和二维成核均可形成单台阶;聚并台阶以整体推移的方式生长,而准聚并台阶内的单台阶保持单台阶推移的特点。单台阶的推移展现出明显的各向异性。聚并台阶的聚并程度随着过饱和度增大而增大;台阶簇内台阶合并和不同生长源生成的沿不同推移方向推移的台阶相互影响引起台阶运动失稳均能导致聚并台阶的形成;聚并台阶列同步向前推移体现出生长的稳定性,随着生长进行,生长台阶各个位置的过饱和度差异会导致稳定性遭到破坏。另外发现,晶体表面存在优先成核位置,优先成核位置位于台阶边缘,且成核过程遵循成核—扩展—再次成核的规律性。     

pH值对ADP晶体(100)面生长的影响

通过对40℃、不同pH值和过饱和度下ADP晶体(100)面法向生长速度的研究,发现在同一过饱和度下,改变pH值后晶面的生长速度明显加快。实验数据显示,在过饱和度较低时,(100)面的生长以螺旋位错生长机制为主;过饱和度较高时,以二维成核生长机制为主,而且pH值的改变会促使ADP晶体在较低的过饱和度下就从位错生长机制向二维成核生长机制转变。利用实验数据计算出了不同pH值下、二维成核生长机制控制晶体生长时的台阶棱边能。最后,运用原子力显微镜(AFM)非实时观察了不同过饱和度、不同pH值下生长的ADP晶体(100)面的微观形貌,发现与正常pH值相比,在较低的过饱和度下,pH=2.5和5.0的晶面上就出现了二维核。     

二维平移法小尺寸KDP单晶生长溶液流动与传质模拟

二维平移法是一种新型的晶体生长方法.在该方法中,晶体不再作正反转运动,而是沿着特定轨迹作周期性的平移运动.本工作对二维平移法小尺寸磷酸二氢钾(KDP)单晶生长过程进行了数值模拟研究,获得了不同平移速度、不同平移距离以及不同迎流角度下晶体附近溶液流动与晶面过饱和度分布.结果表明:增加平移速度,晶面过饱和度随之增加,但流场结构并无明显变化;增大平移距离,晶面的过饱和度反而降低,标准差则有逐渐增大的趋势,这不利于提高过饱和度均匀性;不同迎流角度下,柱面的过饱和度分布差异较大,对流的不对称性也更加明显,当迎流角度为45°时,对晶体生长更有利.此外,台阶推移结果表明,不均匀的过饱和度会造成台阶弯曲和聚并,二维平移法更利于台阶稳定推移,有望提高形貌稳定性和晶体质量.     

ZTS晶体缺陷的实时AFM观测

利用原子力显微镜(AFM)对硫脲硫酸锌(ZTS)(100)面的生长过程进行实时观测研究,发现晶体表面凹陷及杂质对台阶推移的阻碍作用均有可能导致凹坑的出现;大台阶对凹坑和杂质的覆盖是包裹体产生的重要原因。首次观察到杂质分界点现象,不可移动杂质的存在不会终止台阶的推移。     

硫脲硫酸锌晶体（100）面台阶生长动力学实时研究

运用光学显微镜实时观测了硫脲硫酸锌晶体（100）面台阶推移过程。获得了不同过饱和度、不同台阶高度、不同生长时间、不同台阶边缘扭折密度下的台阶推移速率;应用＂净流量＂模型解释了不同台阶推移速率的差异与过饱和度之间的依赖关系,计算了生长单元与台阶融合活化能及单台阶的动力学系数。通过分析发现台阶推移速率随过饱和度增加而线性增加,随台阶高度增加而下降;同一台阶推移速率随时间变化的现象与台阶重组过程有关;而台阶边缘扭折密度则从根本上决定了台阶推移速率的大小和变化趋势。     

KDP晶体相变界面微观形貌及大台阶形成的AFM观察

采用原子力显微镜实时和非实时观察了不同过饱和度下KDP晶体(100)面相变界面微观形貌,观察到晶体从生长死区恢复生长的过程;首次得到大台阶形成过程的实时AFM图像,解释了大台阶的形成机理;分析了台阶失稳的原因。结果表明,不同实验条件下,KDP(100)面相变界面均呈现为台阶面。在低过饱和度下,生长台阶来源于螺位错;在较高过饱和度下,层状台阶列来源于二维核。     

ADP晶体{100}面族二维成核生长微观形貌的AFM研究

ADP晶体{100}面族微观形貌的非实时AFM(atomic force microscopy,AFM)成像表明,过饱和度σ=0.053时,晶面上出现二维成核生长;随σ增加至0.11,二维岛数量急剧增加,尺寸减小,分布渐趋均匀,二维成核生长逐渐增强,界面呈现出由光滑向粗糙转变的特征;各二维岛形状趋近于长条形,表现出各向异性,长轴平行于[001]晶向;二维岛上有单分子高度的台阶和台阶聚并后高度为2～3nm的大台阶;二维岛间融合时取向相同;σ=0.053时,融合后所形成的较大二维岛的生长呈现出周边快中心慢的情况,将可能导致产生晶体缺陷.     

ADP晶体的生长丘、台阶微观形貌及台阶棱边能

ADP晶体{100}面族生长的实时与非实时AFM(atomic force microscopy,AFM)研究表明,过饱和度σ处于0.005～0.04,生长温度介于293～313K之间时,晶面上观察到位错生长丘和其它晶体缺陷所形成的生长丘,晶面主要为台阶推进方式生长;位错生长丘上空洞的出现与位错弹性理论相符;随过饱和度σ降低,台阶形貌会发生相应变化;生长温度为298K时,台阶棱边能不小于6.2×10-7J/cm2.     

A SiC bicrystal junction on the (0 0 0 1) plane

A SiC bicrystal junction in which two crystals superpose with a common (0001) plane has been investigated by optical microscopy and X-ray precession camera techniques. The behaviour of such a junction is discussed from the viewpoint of sintering and grain boundaries in SiC using a crystallographic concept of compound tessellation. Six examples of bicrystals are considered with respect to the observed and calculated superposing rotation angles and the densities of the superpositions.     

直接观察位错结构的扫描电镜电子通道衬度技术

介绍了扫描电镜电子通道衬度技术，该技术可以很好地观察材料中位错结构、用这种技术观察受循环载荷作用的铜单晶中的典型位错结构，与常规的ＴＥＭ方法观察结果基本一致。     

Ductile-brittle behavior at the (1 1 0)[0 0 1] crack in bcc iron crystals loaded in mode I

Fracture experiments performed at room temperature on four test samples made of Fe-3wt.%Si single crystals with an edge crack (1 1 0)[0 0 1] (crack plane, crack front) showed approximately 45° deflections of the crack from the initial crack plane (1 1 0). This behavior appeared to be independent on loading rate. Fractographic analysis confirmed that the cracks were deviated along {1 0 0} planes and the fracture was accompanied by dislocation slip and by twinning. 3D simulations at 300 K by molecular dynamic technique in bcc iron with edge cracks of equivalent orientation indicated that the crack itself could contribute to understanding of this behavior by three processes: twinning on oblique {1 1 2} planes, which hindered growth of the original crack, and by emission of dislocations on oblique {0 1 1} and {1 2 3} planes, which led to separation of the {1 0 0} planes and might cause decohesion and subsequent cleavage fracture along the mentioned planes.     

Effects of stress on the interfacial reactions of metal thin films on (0 0 1)Si

The influences of stress on the interfacial reactions of Ti and Ni metal thin films on (0 0 1)Si have been investigated. Compressive stress present in the silicon substrate was found to retard significantly the growth of Ti and Ni silicide thin films. On the other hand, the tensile stress present in the silicon substrate was found to enhance the formation of Ti and Ni silicides. For Ti and Ni on stressed (0 0 1)Si substrates after rapid thermal annealing, the thicknesses of TiSi₂ and NiSi films were found to decrease and increase with the compressive and tensile stress level, respectively. The results clearly indicated that the compressive stress hinders the interdiffusion of atoms through the metal/Si interface, so that the formation of metal silicide films was retarded. In contrast, tensile stress facilitates the interdiffusion of atoms. As a result, the growth of Ti and Ni silicide is promoted.     

Fabrication and characterization of transparent MEH-PPV/n-GaN (0 0 0 1) heterojunction devices

n-GaN/MEH-PPV thin film heterojunction diode was fabricated by depositing MEH-PPV thin film using spin-coating process on n-GaN (0 0 0 1). The junction properties were evaluated by measuring I-V characteristics. I-V characteristics exhibited well defined rectifying behavior with a barrier height of 0.89 eV and ideality factor of 1.7. The optical band gap of the MEH-PPV film using optical absorption method was found to be 2.2 eV and the fundamental absorption edge in the film is formed by the direct allowed transitions. At higher electric fields, the conductivity mechanism of the film shows a trap charge limited current mechanism. The obtained results indicate that the electronic parameters of the heterojunction diode are affected by properties of MEH-PPV organic film.     

Investigation of the aluminum oxide/Si(1 0 0) interface formed by chemical vapor deposition

Thin films of aluminum oxide were deposited using trimethylaluminum and oxygen. The deposition rate was found to decrease with increasing temperature. Fourier transform infrared spectroscopy and X-ray photoelectron spectroscopy (XPS) were used to investigate the film/substrate interface. When dry O₂ was used during deposition, the film/substrate interface was free of any silicon dioxide or aluminum silicate phase. On annealing the as-deposited films in Ar, a layer of silicon dioxide film formed at the interface. XPS results indicated that the O/Al ratio in the as-deposited films was higher than that in stoichiometric Al₂O₃. However, the ratio was found to decrease in the annealed samples suggesting that excess oxygen present in the deposited films is responsible for the formation of interfacial silicon dioxide layer. Interfacial phase formation was observed in the as-deposited samples, when small amounts of ozone along with oxygen were used as the oxygen precursor.     

Energetics of Ge addimers on the Si(1 0 0) and Ge(1 0 0) surfaces: a comparative study

The adsorption energetics of Ge dimers on the (1 0 0) surfaces of Ge and Si has been investigated using the first-principles molecular dynamics method. Four high-symmetry configurations have been considered and fully relaxed. The most stable configuration for Ge dimers on Si(1 0 0) is found to be in the trough between two surface dimer rows, oriented parallel to the substrate Si dimers. These results are consistent with recent experimental studies of the system using the scanning tunneling microscopy (STM), and help to clarify some existing controversies on the interpretation of the STM images. In contrast, for Ge dimers on Ge(1 0 0), the most stable configuration is on top of the substrate dimer row.     

Temperature-dependent magnetic behavior of the Fe (1 0 0) surface

We present a theoretical study of the magnetic properties at finite temperature of the ideal (1 0 0) surface of iron. The spin-polarized electronic structure at a given temperature is determined with a self-consistent d-band model Hamiltonian in which correlation effects are included in a temperature-dependent splitting parameter. The demagnetization process is analyzed and compared with previous results and experimental trends, which will serve us as a test. The applicability of the model to the study of other complex systems like supported clusters or surfaces with defects is discussed.     

Adsorption of Ni on Si(1 0 0) surface

The chemisorption of one monolayer Ni atoms on ideal Si(1 0 0) surface is studied by using the self-consistent tight binding linear muffin-tin orbital method. Energies of adsorption systems of Ni atoms on different sites are calculated. It is found that Ni atoms can adsorb at fourfold site above the surface and bridge site below the surface. The adsorption of Ni atoms can readily diffuse and penetrate into the subsurface. A Ni, Si mixed layer might exist at the Ni-Si(1 0 0) interface. The layer projected density states are calculated and compared with that of the clean surface. The charge transfers are also investigated.