电子封装中的无铅Sn-3.8Ag-0.5Cu/Cu界面研究

针对钎料与焊盘间形成IMC层的厚度是影响可靠性的一个关键因素．对无铅钎料Sn-3．8Ag-0．5Cu与Cu盘进行了重熔,采用Olympus（光学金相显微镜）,SEM（扫描电镜）和EDX（能谱X射线）界面分析手段,研究了合金Sn-3．8Ag-0．5Cu与Cu焊盘接头的钎焊性和在焊接过程中IMC的形成与长大机理,探讨了IMC厚度与保温时间的变化规律．研究结果表明,无铅钎料合金Sn-3．8Ag-0．5Cu在钎焊务件下与Cu焊盘能够实现良好的连接,其连接层为Cu6Sn5金属间化合物,重熔时的IMC层生长基本上符合抛物线规律．     

新型Au—Ag—Ge钎料的性能及焊接界面特征

根据Au-Ag-Ge三元相图，制备2种新型钎料合金Au-19.25Ag-12.80Ge和Au-21．06Ag-13．09Ge（质量分数，％）。利用差热分析仪和Sirion200场发射扫描电镜对钎料的熔化特性及显微组织进行分析，并对其与纯Ni的润湿性加以研究。研究结果表明：Au-19．25Ag-12．80Ge合金的性能较好，其熔化温度范围为446．76-494．40℃，结晶温度区间为47．64℃：焊接温度在510～550℃范围内时，Au-19.25Ag-12.80Ge钎料合金与Ni基体具有良好的铺展性和润湿性，焊接时钎料合金与Ni基体之间形成了一条连续的金属间化合物层，能谱分析表明该金属间化合物层为Ge3Ni5，由于该化合物较脆，过厚的金属间化合物层使焊接接头的剪切强度下降，故应适当控制焊接工艺以获得理想的焊接界面组织。     

SnAgCu-Bi-Ni无铅微焊点的电迁移行为

以直径为400μm的SnAgCu-Bi-Ni(Ag<1%)微焊点为对象,研究了微焊点在电流时效过程中的电迁移行为.对球栅阵列(ball grid array,BGA)焊点组装电路在不同温度下进行不同时长的电流时效试验.从焊点微观组织和硬度梯度的变化两个方面分析了电迁移现象的行为规律.研究结果表明,电迁移试验后焊点阴极区域金属间化合物(intermetallic compound,IMC)分解,附近形成大量微空洞,Cu焊盘大量消耗,焊点中部和阳极形成了大量(Cu,Ni,)6Sn5化合物,附近形成大量小丘,电迁移作用导致焊点内部微硬度形成由阳极向阴极递减的梯度分布,较高的试验温度显著加快电迁移进程.     

低银系无铅焊料合金界面结构研究

电子锡焊料合金的焊接界面的金属间化合物具有硬而脆的特性,在应力影响下易产生裂纹,进而引发断裂失效.研究界面金属间化合物层的结构、形貌和服役条件下的变化,对提高焊料合金的可靠性具有重要意义.采用实验和数值计算的方法,研究Sn0.1 Ag0.7 Cu、Sn0.3 Ag0.7 Cu、Sn0.5 Ag0.7 Cu、Sn0.8 Ag0.7 Cu、Sn1.0 Ag0.7 Cu焊料合金的金属间化合物结构和形貌,并进行了室温和高温高湿条件下的老化试验,研究界面形貌,厚度变化.研究表明:焊接完成后的界面形貌不平滑,部分金属间化合物异常长大,经过高温高湿试验后,焊接界面变得比较均匀、平滑;随着Ag含量的升高,界面的生长活化能呈先升高后降低,当Ag含量为0.3％时,具有最大的活化能78.9 kJ/mol,界面金属间化合物较为稳定,服役可靠性较高.     

金属间化合物对Sn-Ag-Cu无铅钎料钎焊接头性能的影响

采用扫描电镜、能谱分析、透射电镜、X射线衍射和电子衍射等分析手段,研究了Cu含量对Sn-Ag-Cu/Cu钎焊接头界面处生成的金属间化合物Cu6Sn5的生长形态对接头剪切强度的影响。结果表明:在Sn-Ag-Cu钎焊接头的界面处有扇贝状的Cu6Sn5金属间化合物的生成,调整Cu含量,可改变Cu6Sn5的形状和避免大柱状的Cu6Sn5生成,提高接头剪切强度,钎焊接头的断裂主要是韧性断裂。时效试验结果表明:当时效温度为室温、时间为1000 h时,Cu含量高的Sn-Ag-Cu钎料所生成Cu6Sn5的形态变化为长的空心截面六边形柱体,由于Cu6Sn5所形成的空心孔洞导致Sn-Ag-Cu/Cu界面成为强度弱区,从而使接头的剪切强度有所下降。     

铝/铜复合界面金属间化合物

冷轧复合板轧制后要进行一定的热处理以加强界面的结合强度,但同时也带来一定的问题如在界面形成不利于界面结合的化合物.本文对冷轧制备的铝/铜层状双金属片进行了研究,得到了不同退火温度和退火时间下扩散热处理后界面金属间化合物相的生长规律,初步建立了金属间化合物形成的动力学模型.     

Sn基钎料／Cu基板间反应润湿及界面结构研究现状

为了防止铅（Pb）对自然环境的污染,目前人们对Sn基无铅钎料及其相关性能作了大量研究．综述了通过改变添加的合金元素种类、温度和Cu基板上的金属镀层,Sn基钎料润湿力以及界面组织形态的变化,提出了在不同实验条件下Sn基钎料的反应润湿性能不同的观点．     

尺寸效应下的无铅微焊点研究进展

为了研究无铅微焊点在尺寸效应下的可靠性,综述了微焊点的界面反应机制,常用添加元素对微连接金属间化合物(IMC)的作用及微焊点在尺寸效应下的主要问题.分析表明,IMC层主要由两种铜锡化合物Cu6 Sn5和Cu3 Sn组成.微焊点的连接形式有焊盘小尺寸微焊点和微通孔焊盘无铅微焊点两种,柯肯达尔(Kirkendall)孔洞、电迁移及焊料尺寸都会对接头的力学性能、拉伸强度和剪切强度造成较大的影响.同时,压力钎焊等新工艺可以促进焊料中元素的扩散,从而对抑制接头组织中脆性相和提高钎焊接头强度有显著效果.     

纳米CuAl2的制备及其结构表征

根据ICF靶材料研究的需要,采用自悬浮定向流法制备了金属间化合物CuAl2纳米复合微粉,并通过TEM和XRD等分析手段对复合微粒材料的显微结构和相组成进行了研究。结果表明,所制备的纳米复合颗粒呈规则的球形,粒径分布在30～50 nm之间,颗粒的主要组成相为CuAl2,并有少量的Al和Cu9Al4存在。结合自悬浮定向流技术的基本原理,发现生成金属间化合物的类型与制备过程中金属蒸气的成分有关,两者的原子分数有相应的对应关系。     

Interfacial IMC Growth and Nanomechanical Characterizations of Solder in Sn-16Sb/Cu Joints during Solid-state Aging

The effects of aging time and temperature on the formation and growth behavior of interfacial intermetallic compound(IMC) of Sn-16 Sb/Cu(wt%) solder joints prepared by using dip soldering were investigated. The results show that the major IMCs between Sn-16 Sb solder and Cu substrate after thermal aging are Cu3 Sn and Cu6 Sn5. The thickness of the interfacial IMC in Sn-16 Sb/Cu is linearly against the square root of aging time, which indicates that the growth of IMC is mainly controlled by diffusion between Cu and Sn atoms. By using linear regression method, the growth rate constants of interfacial IMC layers are 1.254×10~(-18), 8.821×10~(-18) and 1.22×10~(-17) m~2 s~(-1) for Sn-16 Sb/Cu joints aged at 120, 150 and 170 ℃, respectively. Besides, the activation energy of the interfacial IMC growth was also calculated to be 68.27 kJ/mol. The IMC grain diameters after aging treatment increase with the increasing aging time, with i e, d = 0.492 t~(0.106), d = 0.543 t~(0.143) and d = 0.290 t~(0.263) for aging temperatures of 120, 150 and 170 ℃, respectively. Besides, by using nanoindentation, the softening of Sn-16 Sb solder was found during aging treatment. Moreover, the U-shape evolution of the values in hardness and Young's moduli was found in this work.     

SAC/Cu及SAC-Bi-Ni/Cu回流焊界面金属间化合物演变

为了研究微焊点界面金属间化合物的演变行为,以Sn-Ag-Cu(SAC)及Sn-Ag-Cu-BiNi(SAC-Bi Ni)微焊点为研究对象,研究界面金属间化合物在不同工艺参数回流焊过程中的演变行为.借助SEM及深腐蚀技术,系统分析了回流时间、回流温度及冷却速率对界面金属间化合物形貌及晶粒尺寸的影响.实验结果表明:回流温度对界面金属间化合物形貌及演变行为存在显著影响.在较高的回流温度下,界面金属间化合物呈楞面状.在钎料处于液态状态下,界面金属间化合物生长迅速.回流冷却速率对焊点体钎料微观组织影响显著但对界面金属间化合物影响较小.     

SnAgCu-nano Al钎料Anand本构关系及焊点可靠性

研究了含纳米0.1 wt.%Al颗粒SnAgCu无铅钎料Anand本构关系,将本构关系应用于有限元模拟,分析FCBGA器件SnAgCu-nano Al焊点的应力-应变响应。结果表明,在不同的温度和应变速率的条件下,可以采用非线性数据拟合方法得到SnAgCu-nano Al钎料的Anand本构方程的9个参数值。结合Anand本构模型,采用有限元法计算焊点应力-应变,发现FCBGA器件SnAgCu-nano Al焊点应力-应变分布和焊点阵列有明显的关系,最大的应力-应变集中于拐角焊点;SnAgCu-nano Al焊点的应力-应变值明显低于SnAgCu焊点,证明纳米Al可以提高SnAgCu焊点的可靠性。     

微电子封装中焊锡接点的界面应力奇异性

采用界面力学理论计算了不同形状的含铅/无铅焊锡接点界面应力奇异性指数,建立了焊锡接点的有限元模型,计算了线弹性、弹塑性和Johnson-cook材料模型的界面应力分布.结果表明:随着焊锡接点接触角的增加,界面应力奇异性增强;Sn37Pb/Cu界面比Sn3.5Ag/Cu和Sn3.0Ag0.5Cu/Cu界面的应力奇异性明显;弹塑性变形和应变率效应降低界面应力.     

Effects of nano-sized Ag reinforcing particulates on the microstructure of Sn-0.7Cu solder joints

Composite solders were prepared by mechanically dispersing different volumes of nano-sized Ag particles into the Sn-0.7Cu eutectic solder.The effects of Ag particle addition on the microstrueture of Sn-0.7Cu solder joints were investigated. Besides, the effects of isothermal aging on the microstructural evolution in the interfacial intermetallic compound (IMC) layer of the Sn-0.7Cu solder and the composite solder reinforced with l vol% Ag particles were analyzed, respectively. Experimental results indicate that the growth rate of the interfacial IMC layer in the Ag particles reinforced composite solder joint is much lower than that in the Sn-0.7Cu solder joint during isothermal aging. The Ag particles reinforced composite solder joint exhibits much lower layer-growth coefficient for the growth of the IMC layer than the corresponding solder joint.     

Investigation on the interface of Cu/Al couples during isothermal heating

The evolutionary process and intermetallic compounds of Cu/Al couples during isothermal heating at a constant bonding tem-perature of 550°C were investigated in this paper. The interfacial morphologies...     

不同Cu/Sn比与IMC-Cu复合微焊点形成速度的相关性

为了研究不同Cu/Sn比对复合微焊点IMC-Cu界面生长行为的影响,采用瞬态液相连接技术与热压焊相结合的方法,以泡沫铜、纯Sn和Cu基板为原料,制备IMC-Cu复合微焊点研究不同Cu/Sn比对复合微焊点IMC生长行为影响.结果表明:Cu/Sn比对复合焊点中IMC生长行为影响显著.随着焊点中Sn含量的减少,IMC的生长速...     

Influence of Bi Addition on Pure Sn Solder Joints: Interfacial Reaction,Growth Behavior and Thermal Behavior

The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds(IMCs) layer(η-Cu_6 Sn_5 + e-Cu_3 Sn) for various soldering time and the influence of Bi addition on the thermal behavior of Sn-x Bi solder alloys were investigated. The Cu_6 Sn_5 IMC could be observed as long as the molten solder contacted with the Cu substrate. However, with the longer welding time such as 60 and 300 s, the Cu_3 Sn IMC was formed at the interface between Cu_6 Sn_5 and Cu substrate. With the increase of soldering time, the thickness of total IMCs increased, meanwhile, the grain size of Cu_6 Sn_5 also increased. An appropriate amount of Bi element was beneficial for the growth of total IMCs,but excessive Bi(≥ 5 wt%) inhibited the growth of Cu_6 Sn_5 and Cu_3 Sn IMC in Sn-x Bi/Cu microelectronic interconnects. Furthermore, with the Bi contents increasing(Sn-10 Bi solder in this present investigation), some Bi particles accumulated at the interface between Cu_6 Sn_5 layer and the solder.