共查询到19条相似文献,搜索用时 62 毫秒
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本文利用5kW微波等离子体装置,在直径22mm的石英上沉积金刚石薄膜。实验研究了衬底在不同位置对沉积金刚石薄膜的质量产生的影响。实验中将2块石英衬底编号为A和B,样品A被放在偏离钼基片台中心5mm的位置,使石英的中间区域偏离等离子体球,而边缘区域处于等离子体球的下方。通过SEM和拉曼光谱表征所沉积的金刚石膜,对比样品A的中间和边缘区域发现中间的区域金刚石膜的质量差且不均匀,边缘区域则长出取向一致的(100)面金刚石。通过分析认为,较高的温度、大的等离子体密、合适的碳源浓度度等条件有利于(100)面金刚石薄膜的沉积。随后改进工艺,将样品B放在基片台中心使其处于等离子体的正下方,并调整生长温度和甲烷浓度,成功的获得了高质量均匀的(100)面金刚石薄膜。 相似文献
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利用雾化热解工艺,在Si(100)衬底上制备了Eu掺杂的ZnO薄膜,通过N2的作用,将前驱体溶液输送到衬底表面,同时为实现ZnO的晶化,衬底温度保持在350℃.通过RBS分析了薄膜和衬底之间的原子分布,结果显示了ZnO薄膜与Si衬底之间存在过渡层.对RBS数据的分析表明该过渡层的形成是由于Si向ZnO层中的扩散,表明Si向氧化物中的扩散是不能忽略的,即使在350℃的低温下.同时,作者利用Fick扩散方程对Si向Eu3 掺杂ZnO薄膜的扩散行为进行了分析,结果表明掺杂离子Eu3 具有阻止Si扩散的能力,其原因可能与Eu3 离子在晶界上的偏析有关. 相似文献
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本文以丙酮和氢气为气源,采用优化钽丝排列分布的偏压增强热丝CVD装置对钨丝衬底进行了金刚石薄膜沉积研究。采用扫描电镜(SEM)、拉曼(Raman)光谱等方法检测了金刚石薄膜的质量,分析了沉积工艺对金刚石形核和生长的影响。研究结果分析表明,当直径为1mm的钨丝与热丝之间的最佳距离为4—6mm且反应压力为4665.5Pa、碳源浓度为1.8%时可得到涂层厚度均匀又能覆盖整个钨丝外表面的高质量金刚石薄膜,为以后的自支撑的金刚石薄膜管的制备和回转体刀具的外表面金刚石涂层打下基础。 相似文献
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WU Ping GAO Yanqing QIU Hong PAN Liqing TIAN Yue Wang Fengping 《稀有金属(英文版)》2007,26(2):176-181
Ni80Fe20/Ni48Fe12Cr40 bilayer films and Ni80Fe20 monolayer films were deposited at room temperature on SiO2/Si(100) substrates by electron beam evaporation. The influence of the thickness of the Ni48Fe12Cr40 underlayer on the structure, magnetization, and magnetoresistance of the Ni80Fe20/Ni48Fe12Cr40 bilayer film was investigated. The thickness of the Ni48Fe12Cr40 layer varied from about 1 nm to 18 nm while the Ni80Fe20 layer thickness was fixed at 45 nm. For the as-deposited bilayer films the introducing of the Ni48Fe12Cr40 underlayer promotes both the (111) texture and grain growth in the Ni80Fe20 layer. The Ni48Fe12Cr40 underlayer has no significant influence on the magnetic moment of the Ni80Fe20/Ni48Fe12Cr40 bilayer film. However, the coercivity of the bilayer film changes with the thickness of the Ni48Fe12Cr40 undedayer. The optimum thickness of the Ni48Fe12Cr40 underlayer for improving the anisotropic magnetoresistance effect of the Ni80Fe20/Ni48Fe12Cr40 bilayer film is about 5 nm. With a decrease in temperature from 300 K to 81 K, the anisotropic magnetoresistance ratio of the Ni80Fe20 (45 nm)/Ni48Fe12Cr40 (5 nm) bilayer film increases linearly from 2.1% to 4.8% compared with that of the Ni80Fe20 monolayer film from 1.7% to 4.0%. 相似文献
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《金属功能材料》2007,14(2):23-23
一般稀土金属-过渡金属系磁致伸缩材料都有脆和容易氧化等问题。而具有体心立方结构(bcc)的铁系磁致伸缩材料,较之稀土-铁系材料具有较高的韧性和耐蚀性。Fe-17%(原子)Ga单晶合金在室温下显示很高的磁致伸缩敏感度,但这一合金有价格高昂且难处理等问题,然而Fe-Al合金显然有其更多的优越性。因此,采用离子镀装置制备了Fe-Al合金薄膜,研究了结晶结构和磁特性及其磁致伸缩特性。研究时所用的薄膜试样是在三电极配置离子镀装置上制备的。首先在电弧炉中用纯铁(99.9%)和铝(99.5%)制得Fe-Al合金锭,通过电子束加热熔融蒸发形成Fe-Al合金蒸发源。在此蒸发源-基片Si(100)间设置的探针电极上施加正电位(50V),使之发生放电,由此所蒸发的金属蒸汽等离子化并沉积于硅基片上,通过改变Fe-Al合金蒸发物的成分来控制所形成的合金薄膜的成分。依靠基片托架背面的加热器来控制基片温度,于523K基片温度下进行镀膜。用能散X射线光谱法分析Fe-Al合金膜的成分,用触针法测定膜厚,用X射线衍射装置进行结构分析,用振动样品磁强计测定试样磁性,用光杠杆法测定试样的磁致伸缩。 相似文献
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用第一原理理论研究了Au吸附于清洁及H化Si(001)表面的特性。结果表明,对于清洁表面,Au原子的吸附能够打断衬底Si层的二聚体化学键;在低温下,Au原子停留在表面,但由于具有较小的扩散势垒,比较容易扩散到Si衬底中。而Au原子在H-Si(001)表面的吸附则不会打破衬底Si二聚体键,这一点与清洁表面的吸附性质完全相反。 相似文献
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采用硅树脂作为SiO2/(Si3N4+BN)复合材料涂层,并取得较好的防潮效果。将SiO2/(Si3N4+BN)复合材料涂层后弯曲强度提高约27%左右;介电常数和介电损耗角正切变化分别为0.02和0.2×10^-3。 相似文献
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HU Qingyu ZHAO Hangwei WEN Lishi WANG Yongzhong QIAO Guiwen Institute of Metal Research Academia Sinica Shenyang China 《金属学报(英文版)》1989,2(12):444-446
Expermental results of the preparation of YBaCuO superconductor thin film on Si(100)substrate by the method of ion beam sputtering deposition is presented.A ZrO_2 buffer layerwas applied to Si(100)substrate,and was found to play an important role in resisting thediffusion of Si toward the film.The thin film is mainly a 123 phase with strong c-axis prefer-red orientation.The onset transition temperature of the film is 100 K and the final transitiontemperature 78 K. 相似文献
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Present address:Hengyang Institute of Technology. TIAN LU WANG Wenhao GONG Yandong SUN Yuzhen LIN Shuzi Institute of Metal Research Academia Sinica Shenyang China 《金属学报(英文版)》1992,5(8):133-137
The XPS spectra of superconducting(123-orthorhombic structure)and non-superconducting(123-tetragonal structure)YBa_2Cu_3O_(7-x)ceramics were obtained at room temperature and130 K with RIBER LAS 3000 surface analysis system,in which a sample cooling stage and asurface cleaning scraper,both made by the authors,were installed.No evidence of Cu~(3+)wasfound.The O 1s shows double lines.They are attributed to O1 and O4 with higher binding en-ergy and to O2 and O3 with lower binding energy respectively,and it was confirmed by cal-culation of SW-X_α method.The differences and changes in valence states of Y,Ba,Cu andO in both samples were discussed. 相似文献
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在LAS3000表面分析系统中用自制的低温样品台和清洁样品刮刀,获得了室温和130K下表面清洁的 YBa_2Cu_?O_(7-x)的X射线光电子谱。对超导与非超导样品中各元素的内层能级X射线光电子谱线进行分析比较.Ols出现双峰,其中高结合能峰属于O1,O4,低结合能峰属于O2,O3.室温下非超导样品的O2,O3高于-2价,Cu略低于+2价共价性极强,Y和Ba呈正常价态;低温下各元素价态无明显变化.室温下超导样品的O2,O3为-2价,Cu平均价高于+2价,离子性较强,存在Y和Ba的低价离子;低温下部分O2,O3价态升高,Cu价基本不变,Y和Ba的价进一步降低.两种样品中O1,O4价态绝对值都很低,反映了周围点阵缺陷的存在。 相似文献
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C.X. Jiang ) J.P. Tu) S.Y. Guo) M.F. Fu) X.B. Zhao) ) Department of Materials Science Engineering Zhejiang University Hangzho u China ) Department of Mechanical Electronic Engineering Nanchang University Nan chang China ) Department of Mechanical Engineering Zhejiang Institute of Science Techn ology Hangzhou China 《金属学报(英文版)》2005,18(3):249-253
1. IntroductionA lum inum and its alloys are used in m any engineering applications because of their highstrength-to-w eightratio and high therm alconductivities.H ow ever,high friction coefficient,poorw earresistance and low seizure load ofalum inum allo… 相似文献
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OPTICAL CHARACTERIZATION OF TiO2 THIN FILM ON SILICON SUBSTRATE DEPOSITED BY DC REACTIVE MAGNETRON SPUTTERING 总被引:1,自引:0,他引:1
1.IntroductionTiO2thin film hasattracted considerable attention in recentyears,due to itshigh refractive index,high transparency in the visibleand near-infrared w avelength region,high dielectricconstant,w ide bandgap,high w earresistance and stability,etc.These m ake itsuitable foruses as solarcells[1-3],protectiveantireflection film s[4],photocatalytic detoxification of polluted w ater[5],electrochom ic devices[6],self-cleaning and antifogging film s[7]and so on.A tpresent,m any differenttec… 相似文献
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WAN Lijun Dalian Maritime University Dalian Liaoning China CHEN Baoqing Dalian Institute of Technology Dalian Liaoning China GUO Kexin 《金属学报(英文版)》1989,2(3):219-221
A new phase was found at the interface between Al film and Ni substrate when the time ofion-plating reaches 5 min.It was identified to be body centered tetragonal lattice with theconstants a=b=0.588 nm,c=0.480 nm.The variation of microstructure and phases with theion-plating time were observed.Based on these results,the ion-plating film formation mech-anism has been also discussed. 相似文献