板级跌落冲击载荷下无铅焊点形状对BGA封装可靠性的影响

焊点高度和焊盘尺寸相同情况下,分析焊点形状（桶形、柱形、沙漏形）对BGA封装在板级跌落冲击载荷下可靠性的影响。根据不同焊点形状建立3种3D有限元模型,采用Input-G方法将加速度曲线作为数值模型的载荷输入,对BGA封装件在板级跌落冲击载荷下的可靠性进行分析。结果表明：在跌落冲击过程中,在0.1ms左右PCB板出现最大弯曲变形;焊点形状对BGA封装件在跌落冲击过程中的可靠性有较大的影响;以最大剥离应力作为失效准则对三种焊点进行寿命预测, 沙漏形焊点的平均碰撞寿命值最大,其次是柱形焊点,桶形焊点最小,表明沙漏形焊点在跌落测试中表现出较好的抗跌落碰撞性能。     

随机振动条件下SMT焊点半经验疲劳寿命累积模型

研究了SMT焊点在随机振动条件下引起的振动疲劳情况,给出了SMT焊点半经验随机振动疲劳寿命累积模型,并通过对某SMT电路板进行随机振动疲劳测试,验证了模型的正确性。     

板级跌落碰撞下无铅焊点的有限元分析

为了预测跌落碰撞下球栅阵列(BGA)封装中无铅焊点的失效,采用ABAQUS软件来模拟跌落碰撞过程中焊点的应力分布.首先建立圆形电路板(PCB)组件的有限元模型,接着用模态试验和有限元模拟相结合的方法确定有限元模型的边界条件和PCB的阻尼参数,然后运用ABAQUS有限元软件模拟PCB组件从三种高度下跌落碰撞过程中BGA封装中无铅焊点的拉应力分布.结果表明:封装最外圈四个拐角焊点的拉应力最大,最大拉应力出现在焊点靠近封装的一侧.由此预测最外圈拐角的焊点最易失效,焊点失效的位置在靠近封装一侧.     

就地化保护装置跌落冲击载荷下的可靠性分析

目的 为了评估就地化保护装置跌落冲击载荷下的失效情况。方法 基于显式动力学理论,采用有限元法对就地化保护装置进行跌落冲击的建模仿真。分析PCB板变形与焊点失效之间的关系,探讨元件封装方式对产品抗跌落冲击性能的影响,提出以Von Mises准则得到的焊点最大应力联合跌落寿命模型,进行元件封装可靠性评估的分析方法。针对元件不同封装方式的装置进行跌落验证试验。结果 就地化保护装置跌落冲击仿真结果与试验结果基本吻合。结论 验证了评估元件封装失效分析方法的准确性,为推断产品可靠性提供了理论支撑。     

板级封装焊点的振动冲击加速失效方法研究

设计了一种针对板级微电子封装微焊点的振动冲击加速失效试验。对线路板施加定频正弦振动载荷,测量线路板应变值以标定PCB板级载荷水平,采用高速数据采集系统记录了振动载荷作用下的微焊点失效动态过程。结果表明：通过调节振动条件,采用板级振动试验可以获得近似板级跌落冲击试验的峰值形变,其峰值载荷作用频次高于跌落冲击试验;失效数据监测结果显示焊点在振动冲击试验中表现为疲劳失效特征。本加速失效试验在保持焊点失效特征的同时提高了试验效率,可作为跌落冲击条件下微焊点板级可靠性评估的备选试验方案。     

基于比例风险模型的板级无铅焊点跌落寿命分析

文中进行了三组跌落高度下的焊点疲劳寿命试验,采用比例风险模型(PHM)分析跌落高度对焊点寿命分布的影响。PHM模型估计得到的焊点寿命期望(MTTF)及寿命失效概率密度与实验数据都能够较好的吻合,验证了模型的有效性。且由焊点跌落MTTF值随高度变化曲线可看出,当跌落高度略大于0.6m时焊点MTTF值都小于10次,表明无铅焊点对冲击载荷非常敏感。最后用估计得到的寿命期望结合Miner准则得到板极无铅焊点跌落寿命损伤累积模型。     

高速悬浮转子跌落在保护轴承上的碰撞力研究

对高速转子跌落在保护轴承上的碰撞力进行了理论分析和试验研究。基于Hertz接触理论,建立了转子跌落在保护轴承上的非线性碰撞力模型,并提出了转子跌落在保护轴承上的碰撞力测量方案,设计了碰撞力测量装置;考虑到碰撞力测量装置的非线性影响,运用冲击力锤分别在不同大小的冲击力下对碰撞力测量装置进行了标定,由转子跌落后支撑环的振动加速度信号反推碰撞力。对不同初始转速下转子跌落在保护轴承上的碰撞力进行了试验研究,得到了转子跌落后支撑环的振动加速度信号和转子轴心轨迹;试验结果表明:初始转速越高,转子跌落后保护轴承受到的振动冲击越大,越容易出现涡动现象,且转子跌落后0. 1 s内,保护轴承受到的冲击达到最大值;最后根据碰撞力的试验结果对碰撞力模型进行了评估,识别出了碰撞系统动力学模型中的等效质量me和等效刚度系数ke,并验证了模型的有效性。     

基于子模型法的焊点热应力分析

基于ABAQUS有限元分析软件,利用子模型法对PBGA封装结构的焊点在温度循环载荷下的应力场进行了研究,并比较了不同焊点直径、焊点高度、焊点间距对其应力场的影响规律.结果表明,焊点的最大应力值与焊点直径和焊点间距成正比,与焊点高度成反比.研究结果对焊点的可靠性评估和优化设计有一定的指导意义.     

热力耦合场下互连微焊点的疲劳寿命分析

该文设计热循环和跌落耦合冲击试验,选用Sn_(96.5)Ag_(3.0)Cu_(0.5)(SAC305)和Sn_(63)Pb_(37)(Sn-37Pb)两种焊料制成焊球,以芯片尺寸封装(CSP)芯片为研究基底,焊盘分别进行Ni/Au化学电镀和有机保焊膜涂覆两种工艺处理,研究该环境对CSP微尺度焊点疲劳寿命的影响。结果表明:CSP微尺度焊点的失效模式是先快后慢,初期失效的变化率最高,产品具有固有的耐耦合冲击能力,无铅焊点更适用于低周热循环和低能级跌落耦合冲击环境,有铅焊点的抗跌落冲击能力较强,Ni/Au处理的焊盘配合无铅焊球制成的CSP器件具有更高的耐高周耦合冲击可靠性,焊点的失效机制是由离散的空洞逐渐向界面裂纹转变。     

无铅焊点在跌落冲击载荷下动态特性研究

针对JEDEC标准板的局限性，设计了一种圆形PCB，建立了无铅焊点三维有限元模型，运用ABAQUS有限元分析软件对设计板在跌落冲击载荷下的动态特性进行模拟仿真，找到了封装中焊点的薄弱环节，得出焊点的应力状况与PCB板的挠曲变形存在一致的对应关系，验证了PCB板在跌落冲击过程中弯曲振动导致的交变应力是焊点破坏的原因。     

Reliability behavior of lead-free solder joints in electronic components

With more consumer products moving towards environmentally friendly packaging, making solder Pb-free has become an urgent task for electronics assemblies. Solder joints are responsible for both electrical and mechanical connections. Solder joint does not have adequate ductility to ensure the repeated relative displacements due to the mismatch between expansion coefficients of the chip carrier and the circuit board. Materials behavior of solder joints involves a creep–fatigue interaction, making it a poor material for mechanical connections. The reliability of solder joints of electronics components has been found playing a more important role in service for microelectronics components and micro-electro-mechanical systems. So many researchers in the world investigated reliability of solder joints based on finite element simulation and experiments about the electronics devices, such as CR, QFP, QFN, PLCC, BGA, CSP, FCBGA and CCGA, which were reviewed systematically and extensively. Synchronously the investigation on reliability of solder joints was improved further with the high-speed development of lead-free electronic packaging, especially the constitutive equations and the fatigue life prediction equations. In this paper, the application and research status of constitutive equations and fatigue life prediction equations were reviewed, which provide theoretic guide for the reliability of lead-free solder joints.     

Critical studies to improve service reliability of Sn–Ag–Cu solder joints by thermal treatments

Lead-free electronic packages intended for use in applications such as aerospace, military, and other highly demanding service conditions, necessitate exceptional mechanical reliability of lead-free electronic solder joints under realistic service conditions. Most current design strategies employed for improving the reliability of lead-free electronic solder joints are aimed at developing suitable alloying additions and reinforcements to the solder itself. At present there exists no suitable methodology to minimize the effects of service conditions while the solder joint is in service. Since thermomechanical fatigue reliability of electronic solder joints is closely related to the crack nucleation that occurs during very early stages of repeated thermal excursions, this study is based on subjecting solder joints to a limited number of thermal shock (TS) cycles in a chosen temperature regime to nucleate cracks, then evaluating their effectiveness in improving reliability when the solder joints are subjected to additional TS cycles in a different temperature regime. This study is a preliminary investigation, aimed at developing suitable methodology to minimize the effects of damage to lead-free solder joint specimens subjected to repeated thermal excursions during service, by imposing appropriate thermal treatments. These thermal treatments can be automatically implemented at programmed intervals during the service life of the electronic packages. Methods employed in these studies may also be useful to enhance long-term service reliability and to obtain a conservative estimate of long-term service reliability.     

Fatigue and fracture assessment for reliability in electronics packaging

Modern electronics products relentlessly become more complex, higher in density and speed, and thinner and lighter for greater portability. The package of these products is therefore critical. The reliability of the interconnection of electronics packaging has become a critical issue. In this study, the novel testing methods for electronic packaging are introduced and failure mechanisms of electronic packaging are explained. Electronics packaging is subjected to mechanical vibration and thermal cyclic loads which lead to fatigue crack initiation, propagation and the ultimate fracture of the packaging. A small-sized electromagnetic-type bending cycling tester, a micro-mechanical testing machine, and thermal fatigue testing apparatus were specially developed for the reliability assessment of electronics packaging. The long-term reliability of an electronic component under cyclic bending induced high-cycle fatigue was assessed. The high-cycle bending-fatigue test was performed using an electromagnetic-type testing machine. The time to failure was determined by measuring the changes in resistance. Using the micro-mechanical tester, low cycle fatigues were performed and compared with the results of a finite element analysis to investigate the optimal shape of solder bumps in electronic packaging. Fatigue tests on various lead-free solder materials are discussed. To assess the resistance against thermal loads, pseudo-power cycling method is developed. Thermal fatigue tests of lead-containing and lead-free solder joints of electronic packaging were performed using the pseudo-power cycling tester. The results from the thermal fatigue tests are compared with the mechanical fatigue data in terms of the inelastic energy dissipation per cycle. It was found that the mechanical load has a longer fatigue life than the thermal load at the same inelastic energy dissipation per cycle.     

Detrimental Effects of Excessive Gold Plating on Lead-Free Solder Joints

While most of the industries are striving very hard to produce totally lead-free electronic products, many concerns remain regarding lead-free solder joint reliability. One major concern is the robustness of gold metallization of the electronic components for lead-free soldering. Increasing gold content has been known to result in embrittlement and early failure in electronic assemblies. Therefore, information about the lead-free solder/gold metallization interdiffusion at high-temperature applications is very important for controlling the technological processes for the reliability of the electronic interconnects. The challenges of solder/gold metallization interdiffusion during high-temperature application/test are gold embrittlement, intermetallics growth, void formation, and also tin-whisker formation. This paper illustrates few case histories of such challenges. Importance of the thickness of the gold termination has been discussed and some parameters to optimizing the thickness of the gold termination have been suggested. Some remedial measures are suggested to control the lead-free solder/gold metallization diffusion in the electronics interconnects.     

Influence of nanoparticle addition on the formation and growth of intermetallic compounds (IMCs) in Cu/Sn–Ag–Cu/Cu solder joint during different thermal conditions

Abstract

Nanocomposite lead-free solders are gaining prominence as replacements for conventional lead-free solders such as Sn–Ag–Cu solder in the electronic packaging industry. They are fabricated by adding nanoparticles such as metallic and ceramic particles into conventional lead-free solder. It is reported that the addition of such nanoparticles could strengthen the solder matrix, refine the intermetallic compounds (IMCs) formed and suppress the growth of IMCs when the joint is subjected to different thermal conditions such as thermal aging and thermal cycling. In this paper, we first review the fundamental studies on the formation and growth of IMCs in lead-free solder joints. Subsequently, we discuss the effect of the addition of nanoparticles on IMC formation and their growth under several thermal conditions. Finally, an outlook on the future growth of research in the fabrication of nanocomposite solder is provided.     

The effect of joint size on the creep properties of microscale lead-free solder joints at elevated temperatures

Solder joints in electronic packaging systems are becoming smaller and smaller to meet the miniaturization requirements of electronic products and high density interconnect technology. Furthermore, many properties of the real solder joints at the microscale level are obviously different from that of bulk solder materials. Creep, as one of the key mechanical properties at elevated temperatures, can impair the reliability of miniature solder joints in electronic devices. However, there is a lack of knowledge about the comparative creep properties of microscale solder joints of different sizes. Most previous studies have focused on the creep properties of bulk solder materials or solder joints of the same size. In this research, to determine whether a size effect exists for creep properties of solder joints or not, we characterized the creep behaviors of Sn–3.0Ag–0.5Cu lead-free solder joints under tensile loading modes using microscale butt-joint specimens with a copper-wire/solder/copper-wire sandwich structure with two different sizes. Also, the creep failure mechanisms were investigated. Experimental results show that the creep activation energy and creep stress exponent are very similar for both sizes of solder joint. However, under the same testing conditions, the joints with a larger size exhibit a much higher steady-state creep rate and a shorter creep lifetime than the smaller joints.     

电子焊料的无铅化及可靠性问题

随着环境保护意识的增强,人们更清楚意识到铅的剧毒性给人类健康、生活环境带来的严重危害,全球范围已相继立法规定了使用含铅电子焊料的最后期限,无铅封装,无铅焊料成为了近年来的研究热点问题。本文主要叙述了研究无铅焊料的驱动力,以及无铅焊料须满足的基本要求、常用无铅焊料的优缺点和改进方法,同时介绍了无铅化焊接由于焊料的差异和工艺参数的调整,给焊点可靠性带来的相关问题。     

Magnetic nanoparticle-based solder composites for electronic packaging applications

Sn–Ag–Cu (SAC) alloys are regarded as the most promising alternative for traditional Pb–Sn solders used in electronic packaging applications. However, the higher reflow temperature requirement, possible intermetallic formation, and reliability issues of SAC alloys generate several key challenges for successful adoption of Pb-free solder for next generation electronic packaging needs. Localized heating in interconnects can alleviate thermal stresses by preventing subjection of entire package to the higher reflow temperatures associated with the SAC solders. It had been demonstrated that SAC solder–FeCo magnetic nanoparticles (MNPs) composite paste can be reflowed locally with AC magnetic fields, enabling interconnect formation in area array packages while minimizing eddy current heating in the printed circuit board.Solder/magnetic nanocomposite pastes with varying MNP concentration were reflowed using AC magnetic fields. Differential scanning calorimetry results show a reduced undercooling of the composite pastes with the addition of MNPs. TEM results show that the FeCo MNPs are distributed in Sn matrix of the reflowed solder composites. Optical and SEM micrographs show a decrease in Sn dendrite regions as well as smaller and more homogeneous dispersed Ag₃Sn with the addition of MNPs. The MNPs promote Sn solidification by providing more heterogeneous nucleation sites at relatively low undercoolings. The mechanical properties were measured by nanoindentation. The modulus, hardness, and creep resistance, increase with the MNP concentration. The enhanced mechanical properties are attributed to grain boundary and dispersion strengthening.The reflow of solder composites have been modeled based on eddy current power loss in the substrate and magnetic power losses in the solder bumps. Induction reflow of pure solder bumps (<300 μm) in an area array package using 500 Oe magnetic field at 300 kHz requires excessive eddy current power loss in the substrate, resulting in extreme temperatures that lead to blistering and delamination of the substrate. Solder–MNP composites with modest MNP loading showed temperature increases sufficient to achieve solder reflow when subjected to the same AC magnetic fields. Thermomechanical behavior of a solder joint was also modeled under cyclic temperature variations. The stress and strain are highly localized at the interface between solder and substrate. Plastic work accumulated per cycle can be used for lifetime prediction.In this article we review lead-containing and lead-free solder systems, and the electronic packaging technologies pertinent to soldering process. Recent research on the effects of MNPs on localized heating, microstructure evolution, mechanical properties, and thermomechanical reliability are summarized.     

无铅电子封装焊料的研究现状与展望

随着美、日和欧盟就含铅钎料建立相应立法之后,各国都在紧锣密鼓地开展绿色环保无铅产品的研发工作.介绍了国内外无铅焊料所涉及的4种主要成分设计方法,以及当前研究的主要无铅体系及其各自特征;论述了各焊料体系所应用的范围、组织结构和性能,及无铅焊料所关注的主要性能指标和发展趋势,并结合我国国情展望了我国无铅焊料的前进方向.