Invited article: Vector and Bragg Magneto-optical Kerr effect for the analysis of nanostructured magnetic arrays

Experimental and theoretical aspects of obtaining the magnetic information carried by laser beams diffracted from an array of micro- or nanosized magnetic objects are reviewed. We report on the fundamentals of vector magneto-optic Kerr effect (MOKE), Bragg-MOKE, and second-order effects in the Kerr signal in longitudinal Kerr geometry as well as on an experimental setup used for vector and Bragg-MOKE experiments. The vector and Bragg-MOKE technique in combination with micromagnetic simulation is a reliable tool for measuring the complete magnetization vector and for characterizing the reversal mechanism of lateral magnetic nanostructures. We discuss the Bragg-MOKE effect for three standard domain configurations during the magnetization reversal process and present the expected behavior of the magnetic hysteresis loops.     

Comment on "Print your atomic force microscope" [Rev. Sci. Instrum. 78, 075105 (2007)

The paper of Kühner et al. [Rev. Sci. Instrum. 78, 075105 (2007)], presents a sound realization of a very nice idea. Namely, to design and prepare (via rapid prototyping) a custom head for atomic force microscope (AFM). Custom AFM heads are essential for various applications, which include the AFM force spectroscopy modes and convenient AFM coupling with other techniques. Our comment concerns the deflection data for a thermally driven AFM cantilever obtained by Kühner et al. using their AFM setup (Figure 3 therein). The results of Kühner et al. imply that a thermally excited AFM cantilever vibrates with aberrantly large amplitudes. Namely, the deflection noise amplitudes for the MLCT-D cantilever are 60-100 times larger than what is typically observed in our lab and by others. As we argue, the author's mistake is likely attributed to an improper usage of the AFM bandwidth. We explain the necessary correction and discuss the issue of bandwidth for the AFM force spectroscopy measurements.     

Comment on "MEMS-based high speed scanning probe microscopy" [Rev. Sci. Instrum. 81, 043702 (2010)

In a recent article, Disseldorp et al. [Rev. Sci. Instrum. 81, 043702 (2010)] present a micromachined z-scanner for scanning probe microscopy (SPM). The scanner comprises a micromachined electrostatically actuated membrane anchored to its substrate with crab-leg flexures. This structure is used as a fast actuator specifically for atomic force microscope and scanning tunneling microscope. The authors present topographic images acquired using the scanner in this paper and elsewhere [F. C. Tabak et al., Ultramicroscopy 110, 599 (2010)]. Although the work is clearly described, it does not appear to be placed in proper context. For example, the authors claim that previous work on microelectromechanical systems SPM has not been focused on high-speed imaging with feedback, which is not supported by the existing literature. In addition, similar actuator structures, albeit slightly larger scale, have been designed and used for SPM applications. Here, we would like comment briefly on the existing literature to clarify the significance of the work.     

Comment on "A versatile thermoelectric temperature controller with 10 mK reproducibility and 100 mK absolute accuracy" [Rev. Sci. Instrum. 80, 126107 (2009)

Libbrecht and Libbrecht recently described a thermoelectric temperature controller for which they claimed an absolute accuracy of 100 mK. They did not specify the heat-dissipation coefficient for their thermistor temperature sensor-which would dissipate more power than is usual in such circuits- nor make any allowance for self-heating in the thermistor. Self-heating can be expected to have introduced more than 100 mK of absolute error in their circuit.