共查询到20条相似文献,搜索用时 78 毫秒
1.
2.
实验选取两种国产纳滤膜NF2A和NF3A进行纳滤膜淡化高氟苦咸水的基础研究,考察操作压力、温度、进水pH、进水氟浓度、总含盐量(TDS)及运行时间对纳滤膜分离性能的影响,并测定膜的Zeta电位,同时简单比较两种膜.研究结果表明,两种纳滤膜处理高氟苦咸水的理想操作条件为:压力1.0~1.5 MPa,温度20℃,进水pH=6.5左右,在此条件下NF3A纳滤膜的脱盐率为79%,脱氟率为90%,产水通量为53 L/(m2·h),NF2A纳滤膜的脱盐率分别为73%,73%和71L/(m2·h),此外,随进水氟浓度和总含盐量的增大,纳滤膜的脱氟和脱盐率降低,同时得出两种膜在长期运行72 h内膜性能基本保持稳定,最后测得NF3A和NF2A的Zeta电位分别为-22和-18 mV.这项研究为国产纳滤膜处理高氟苦咸水的实际应用提供了技术数据,有利于国产纳滤膜的发展和完善. 相似文献
3.
纳滤膜在北京阿苏卫填埋场渗滤液改扩建工程中的应用 总被引:2,自引:0,他引:2
在阿苏卫垃圾卫生填埋场渗滤液改扩建工程中,以膜生物反应器(MBR)的出水为研究对象,考察了在一定的pH、进水流量、操作压力下纳滤膜对CODcr、NH3-N和电导率的去除情况.结果表明:在设备初期运行阶段,在pH为7、操作压力为0.5 MPa时,纳滤膜对CODcr的去除率达75%;对NH3-N的去除率较低,出水的NH3-N值略低于进水;对电导率的平均去除率达55%.此外,还分析了纳滤膜的运行性能以及与原有反渗透处理工艺联合使用等问题. 相似文献
4.
5.
6.
采用自制聚丙烯中空纤维膜接触器,以海水作为吸收剂,对模拟烟气中CO2进行吸收试验研究,主要考察烟气流量、CO2浓度、海水流量、海水pH值及膜填充率对CO2脱除率及膜接触器传质性能的影响.研究结果表明:(1)提高烟气流量或CO2浓度能提高膜接触器对CO2的处理量,导致脱碳率下降;(2)提高海水流量能明显提高脱碳率和传质速率;(3)提高海水pH可增大海水对CO2的吸收能力,直接决定了海水对CO2的吸收机制;(4)增大膜接触器填充率所对应的脱碳率并非最高,有效气液接触面积是影响脱碳率和过程传质的重要因素. 相似文献
7.
8.
9.
10.
11.
12.
碳化硼的氧化特性研究 总被引:1,自引:1,他引:0
研究了碳化硼在400-800℃空气中烧结时的氧化特性,采用XRD、SEM对氧化后的碳化硼的相结构和表面形貌进行分析。观察。结果表明,碳化硼有600℃左右开始氧化,氧化后部分生成玻璃态的B2O3,氧化过程为热激活过程,激活能Q=17.17kJ/mol。 相似文献
13.
14.
Takahiro Kondo 《Science and Technology of Advanced Materials》2013,14(1):780-804
AbstractVarious types of zero, one, and two-dimensional boron nanomaterials such as nanoclusters, nanowires, nanotubes, nanobelts, nanoribbons, nanosheets, and monolayer crystalline sheets named borophene have been experimentally synthesized and identified in the last 20 years. Owing to their low dimensionality, boron nanomaterials have different bonding configurations from those of three-dimensional bulk boron crystals composed of icosahedra or icosahedral fragments. The resulting intriguing physical and chemical properties of boron nanomaterials are fascinating from the viewpoint of material science. Moreover, the wide variety of boron nanomaterials themselves could be the building blocks for combining with other existing nanomaterials, molecules, atoms, and/or ions to design and create materials with new functionalities and properties. Here, the progress of the boron nanomaterials is reviewed and perspectives and future directions are described. 相似文献
15.
16.
17.
D. V. Shtansky Y. Yamada-Takamura T. Yoshida Y. Ikuhara 《Science and Technology of Advanced Materials》2000,1(4):1046
The mechanism and the crystallography of the nucleation and growth of cubic boron nitride (c-BN) films deposited on 100-oriented silicon substrate by RF bias sputtering have been studied by means of cross-sectional high-resolution transmission electron microscopy and X-ray photoelectron spectroscopy. Both methods provide experimental information showing no sp2-bonded BN layer formation in the subsurface region of c-BN phase. This is clear evidence for layer-by-layer homoepitaxial growth of cubic boron nitride without graphitic monolayers in the near-surface region of the film. The turbostratic boron nitride (t-BN) consists of thin sub-layers, 0.5–2 nm thick, growing in such a way that a sub-layer normal is almost parallel to the growth direction. t-BN also comprises a large volume fraction of the grain boundaries with high interface energies. The present result and the finding by Shtansky et al. [Acta Mater. 48, 3745 (2000)], who showed that an individual sub-layer consists of parallel lamellae in both the hexagonal (h-BN) and rhombohedral (r-BN) configurations, demonstrate that high intrinsic stress in the films is due to the complex structure of sp2-bonded BN. The crystallography of c-BN films indicates heteroepitaxial nucleation of cubic phase on the graphitic BN structural precursor. The present results are consistent with stress-induced c-BN formation. 相似文献
18.
D.V. Shtansky Y. >Yamada-Takamura T. Yoshida Y. Ikuhara 《Science and Technology of Advanced Materials》2013,14(4):219-225
The mechanism and the crystallography of the nucleation and growth of cubic boron nitride (c-BN) films deposited on 〈100〉-oriented silicon substrate by RF bias sputtering have been studied by means of cross-sectional high-resolution transmission electron microscopy and X-ray photoelectron spectroscopy. Both methods provide experimental information showing no sp2-bonded BN layer formation in the subsurface region of c-BN phase. This is clear evidence for layer-by-layer homoepitaxial growth of cubic boron nitride without graphitic monolayers in the near-surface region of the film. The turbostratic boron nitride (t-BN) consists of thin sub-layers, 0.5–2 nm thick, growing in such a way that a sub-layer normal is almost parallel to the growth direction. t-BN also comprises a large volume fraction of the grain boundaries with high interface energies. The present result and the finding by Shtansky et al. [Acta Mater. 48, 3745 (2000)], who showed that an individual sub-layer consists of parallel lamellae in both the hexagonal +h-BN) and rhombohedral (r-BN) configurations, demonstrate that high intrinsic stress in the films is due to the complex structure of sp2-bonded BN. The crystallography of c-BN films indicates heteroepitaxial nucleation of cubic phase on the graphitic BN structural precursor. The present results are consistent with stress-induced c-BN formation. 相似文献
19.