一种具有自校准功能的CMOS分数数字锁相环

提出了一种数字锁相环(DPLL),它的相频检测器采用全新的设计方法和自校准技术,具有工作频率范围宽,抖动低,快速锁定的优点.锁相环在1.8V外加电源电压时,工作在60～600MHz的频率范围内.采用分数分频技术,加速锁定过程并具有较小的输出频率间隔,利用∑-Δ调制改善相位噪声性能.设计在SMIC 0.18μm,1.8V,1P6M标准CMOS工艺上实现,峰-峰相位抖动小于输出信号周期的0.8%,锁相环的锁定时间小于参考频率预分频后信号周期的150倍.     

CMOS数字锁相环中的自校准技术

提出了一种数字锁相环(DPLL).该电路采用自校准技术,具有快速锁定、低抖动、锁定频率范围宽等优点.设计的锁相环在1.8 V外加电源电压时,工作在60～600 MHz宽的频率范围内.电路采用5层金属布线的0.18 μm CMOS工艺制作.测试结果显示,电路的峰-峰抖动小于输出信号周期(Tout)的0.5%,锁相环锁定时间小于参考时钟预分频后信号周期(Tpre)的150倍.     

一种采用新的相频检测技术的CMOS数字锁相环

提出了一种新型的数字锁相环 (DPLL) ,它的相频检测器采用全新的设计方法 ,与传统电荷泵锁相环相比 ,具有快速锁定、低抖动、低功耗、频率范围宽、且能消除相位“死区”的优点。锁相环在 1.8V外加电源电压时 ,工作在 6 0～ 6 0 0MHz宽的频率范围内 ,最大功耗为 3.5mW。采用分数分频技术 ,具有较小的输出频率间隔 ,并利用Σ Δ调制改善相位噪声性能。设计采用 0 .18μm ,5层金属布线工艺。峰 峰相位抖动小于输出信号周期(Tout)的 0 .5 % ,锁相环的锁定时间小于参考频率预分频后信号周期 (Tpre)的 15 0倍。     

一种输出范围10~600MHz的高性能锁相环

在传统锁相环结构基础上设计了一种基于0.18μm CMOS工艺的高速、低功耗、低噪声的高性能混合信号锁相环.测试结果显示,该芯片在1.8V电源供电下,可以提供从10～600MHz的稳定输出信号.同时该芯片输出抖动小,在输出频率152MHz处的峰峰值抖动小于50ps,均方抖动约7ps.锁相环的版图尺寸为560tan×400μm,核心功耗约6mW.     

基于锁定时间分析的锁相环频率合成器

提出了一种新的针对采用二阶无源滤波器的锁相环频率合成器锁定时间的估算公式,并通过仿真软件及实测结果对该公式进行了验证。基于该估算公式,设计了一种具有快速锁定功能的锁相环频率合成器。实验结果表明该锁相环频率合成器锁定时间小于7μs,具有快速锁定的功能。同时该锁相环还具有良好的相位噪声性能,对于32GHz输出信号相位噪声为-72dBc/Hz@1kHz以及-90dBc/Hz@1MHz。     

基于PI控制的全数字锁相环设计

针对以往全数字锁相环研究中所存在电路结构复杂、设计难度较大和系统性能欠佳等问题,提出了一种实现全数字锁相环的新方法。该锁相环以数字比例积分控制的设计结构取代了传统的一些数字环路滤波控制方法。应用EDA技术完成系统设计,并进行计算机仿真。仿真结果表明:在一定的频率范围内,该锁相环锁定时间最长小于15个输入信号周期,相位抖动小于输出信号周期的5%,且具有电路结构简单、环路性能好和易于集成的特点。     

一种低杂散锁相环频率综合器

基于SMIC 0.13 μm CMOS工艺,设计了一种锁定频率范围为0.25~1.25 GHz的低杂散锁相环频率合成器。该电路采用一种改进的高精度电荷泵,以减小电荷共享、电流失配等非理想效应,降低了相位误差,减少了输出信号的参考杂散;采用压控电阻器作为延迟单元,设计了一种输出频率广、相位噪声低的压控振荡器。Spectre仿真显示,输出电平在0.3~1.1 V范围时,电荷泵的充放电电流失配仅为0.2 %,锁相环锁定后的杂散小于-90 dBm,满足了低杂散的设计要求。     

一种低功耗快速锁定简易锁相式频率合成器

采用0.5 μm CMOS工艺,设计了一种简易锁相式频率合成器。采用“类锁相环”结构,在传统锁相环频率合成器的基础上,去除了电荷泵和低通滤波器。利用鉴频鉴相器的输出结果作为开关信号,控制压控振荡器的工作状态,使压控振荡器的输出信号在第N个周期返回鉴频鉴相器后立即被关断,直到下一个参考时钟周期来临。分析了电路的结构和工作原理,并对每个模块进行了理论分析。该频率合成器能够快速地产生固定的时钟频率,具有结构简单、功耗低、锁定时间短等优点。仿真结果表明,输入参考时钟为4 MHz时,该频率合成器的输出频率为15.96 MHz,功耗为2.96 mW,锁定时间小于1 μs。     

一种2.4-GHz全集成双环路频率综合器的设计

根据不同锁相环频率综合器架构各自的优缺点,选择了双环路锁相环结构以获得低相位噪声和快速锁定时间。采用0.18μm CMOS工艺设计了一款2.4 GHz全集成双环路锁相环频率综合器,由主锁相环和参考锁相环环路构成。采用MATLAB和SpectreRF对锁相环系统的相位噪声、锁定时间进行了仿真,得到主锁相环输出频率为在2.4 GHz时,相位噪声为-120 dBc/Hz@1 MHz,功耗为10 mW,电源电压为1.8 V。频率范围为2.4 GHz至2.5 GHz,RMS相位误差为1°,锁定时间为5μs。     

低杂散锁相环中电荷泵的设计

采用IBM 0.18 μm CMOS工艺,设计了一款应用于433 MHz ASK接收机中低杂散锁相环的电荷泵电路.设计采用与电源无关的带隙基准偏置电流源和运算放大器,实现了电荷泵充放电电流源的精确匹配,有效抑制了传统电荷泵对锁相环锁定状态中杂散信号的影响.电路在Cadence的Spectre工具下进行仿真,结果表明:当电源电压为1.8 V、参考电流为30 μA、输出电压范围在0.5～1.5 V时,充放电电流精确匹配,杂散小于-80 dB,其性能符合接收机系统要求.     

具有锁频/锁频-锁相两种工作模式的CMOS数字锁相环

提出了一种新型的数字锁相环（DPLL），它具有锁频（FL）和锁频-锁相（FPL）两种工作模式，在FL和FPL两种工作模式下分别可以获得较低的频率抖动和相位噪声。并采用自校准技术，具有快速锁定，低抖动，工作频率范围宽的优点。     

A fast-locking low-jitter digitally-enhanced DLL dynamically controlled for loop-gain and stability

Conventional structure of delay locked loops (DLLs) is modified to achieve better jitter and smaller lock time. In the proposed structure, analog charge pump is eliminated, to remove the problems of leakage current on output capacitance, and is replaced by combination of a digital accumulator (ACC) and a digital-to-analog converter. A programmable ACC is also proposed, to dynamically control the loop gain and lock time. When the loop enters to lock region at the first time, a lock detector block disables ACC and equivalent digital code is stored on a latch array. So, a fixed control voltage controls delay elements and the systematic jitter, due to periodic discharge of control voltage. RMS jitter of less than 33.5 and 1.6 ps are achieved at 20 and 625 MHz operating frequencies, respectively, when the supply is subject to 110 mV random noise and also 40 mV periodic noise, related to generated clock signals. Lock time is reduced from 38 to 2 µs at 20 MHz, and also from 900 to 45 ns at 600 MHz, when the proposed dynamic control mechanism is applied on the loop. Total power consumption for the main core of DLL is 7.85 mW at 1.8 V supply in 0.18 µm CMOS process.     

A 1.3-cycle lock time, non-PLL/DLL clock multiplier based on directclock cycle interpolation for “clock on demand”

A 1.3-cycle lock-in time, non-PLL/DLL clock multiplier based on direct clock cycle interpolation is proposed with an array structure of short-circuit-current-suppression interpolators. The circuits have been fabricated with a 0.25-μm digital CMOS and operated in any condition where digital CMOS circuits operate. Measured results have achieved 1.3 clock cycle lock time and cycle-to-cycle jitter suppression characteristics. The circuits have been verified in 622-Mb/s clock and data recovery that satisfied the ITU-T G.958 jitter tolerance specification     

基于FPGA的数字锁相环实现与性能分析

在数字通信系统中,对传输数据的位同步信号提取非常重要.在基于FPGA的数字系统中,通常是设计一个数字锁相环(DPLL)来解决这些问题.文章设计一种新的利用bang-bang鉴相器实现的DPLL,bang-bang鉴相器能直接从接收数据流中提取位时钟信号,且在减少抖动、侪频、时钟恢复和数据同步有很好的优越性.分析了,整个数字锁相环在无高斯白噪声环境下的性能,最后给出了整个锁相环的波形仿真.     

A Fast-Lock Wide-Range Delay-Locked Loop Using Frequency-Range Selector for Multiphase Clock Generator

This brief describes a fast-lock mixed-mode delay-locked loop (DLL) for wide-range operation and multiphase outputs. The architecture of the proposed DLL uses the mixed-mode time-to-digital-converter scheme for a frequency-range selector and a coarse tune circuit to reduce the lock time. A multi-controlled delay cell for the voltage-controlled delay line is applied to provide the wide operating frequency range and low-jitter performance. The charge pump circuit is implemented using a digital control scheme to achieve adaptive bandwidth. The chip is fabricated in a 0.25-mum standard CMOS process with a 2.5-V power-supply voltage. The measurements show that this DLL can be operated correctly when the input clock frequency is changed from 32 to 320 MHz, and can generate ten-phase clocks within a single cycle without the false locking problem associated with conventional DLLs and wide-range operation. At 200 MHz, the measured rms random jitter and peak-to-peak deterministic jitter are 4.44 and 15 ps, respectively. Moreover, the lock time is less than 22 clock cycles. This DLL occupies less area (0.07 mm²) and dissipates less power (15 mW) than other wide-range DLLs.     

A wide-range all digital DLL for multiphase clock generation

This paper presents a wide-range all digital delay-locked loop (DLL) for multiphase clock generation. Using the phase compensation circuit (PCC), the large phase difference is compensated in the initial step. Thus, the proposed solution can overcome the false-lock problem in conventional designs, and keeps the same benefits of conventional DLLs such as good jitter performance and multiphase clock generation. Furthermore, the proposed all digital multiphase clock generator has wide ranges and is not related to specific process. Thus, it can reduce the design time and design complexity in many different applications. The DLL is implemented in a 0.13 μm CMOS process. The experimental results show that the proposal has a wide frequency range. The peak-to-peak jitter is less than 7.7 ps over the operating frequency range of 200 MHz-1 GHz and the power consumption is 4.8 mW at 1 GHz. The maximum lock time is 20 clock cycles.     

A clock generator with cascaded dynamic frequency counting loops for wide multiplication range applications

This work presents a clock generator with cascaded dynamic frequency counting (DFC) loops for wide multiplication range applications. The DFC loop, which uses variable time period to estimate and tune the frequency of the digitally controlled oscillator (DCO), enhances the resolution of frequency detection. The conventional phase-frequency detector (PFD) and programmable divider are replaced with a digital arithmetic comparator and a DCO timing counter. The value in the DCO timing counter is separated into quotient and remainder vectors. A threshold region is set in the remainder vector to reduce the influence of jitter variation in frequency detection. The loop stability can be retained by cascading two DFC loops when the multiplication factor (N) is large. The proposed clock generator achieves a multiplication range from 4 to 13 888 with output peak-to-peak jitter less than 2.8% of clock period. A test chip for the proposed clock generator is fabricated in 0.18-/spl mu/m CMOS process with core area of 0.16 mm/sup 2/. Power consumption is 15 mW @ 378 MHz with 1.8-V supply voltage.     

A PLL clock generator with 5 to 10 MHz of lock range formicroprocessors

A microprocessor clock generator based on an analog phase-locked loop (PLL) is described for deskewing the internal logic control lock to an external system lock. This PLL is fully generated onto a 1.2-million-transistor microprocessor in 0.8-μm CMOS technology without the need for external components. It operates with a lock range from 5 to 110 MHz. The clock skew is less than 0.1 ns, with a peak-to-peak jitter of less than 0.3 ns for a 50-MHz system clock frequency     

Low-jitter multi-phase digital DLL with closest edge selection scheme for DDR memory interface

A multi-phase digital delay-locked loop (DLL) capable of a low-jitter feature for DDR memory interface is reported. The DLL repeatedly selects the output clock edge which is closest to the reference clock edge to reduce the total jitter. A test chip was fabricated in a 0.18 mm CMOS process to verify its functionality. The measured RMS and peak-to-peak jitter of the DLL are 6.2 and 20.4 ps, respectively. The power consumption of the DLL is 12 mW from a 1.8 V supply voltage.