辅助气体压强比例对中频脉冲非平衡磁控溅射沉积类金刚石薄膜结构与性能的影响

以高纯石墨为靶材、氩气(Ar)和甲烷(CH4)为辅助气体,利用中频脉冲非平衡磁控溅射技术在不同气体压强比例下制备了类金刚石薄膜,采用原子力显微镜、拉曼光谱仪、傅立叶变换红外光谱仪、纳米压痕测试仪对所制备薄膜的表面形貌、微观结构、机械性能进行了分析.结果表明:当Ar气压强比例由17％增加到50％时,类金刚石薄膜的RMS表面粗糙度、sp3杂化键含量、纳米硬度、弹性模量随Ar气压强比例的增加而增加,当Ar气压强比例由50％增加到86％时,薄膜的RMS表面粗糙度、sp3杂化键含量、纳米硬度、弹性模量随Ar气压强比例的增加而减小.以上结果说明辅助气体压强比例对类金刚石薄膜的表面形貌、微观结构、机械性能有较大的影响.     

PECVD法制备类金刚石薄膜的摩擦学性能

采用射频等离子体增强化学气相沉积法(rf-PECVD),在45钢表面沉积了类金刚石(DLC)薄膜,借助激光拉曼光谱仪(Raman)、X射线光电子能谱(XPS)、扫描电子显微镜(SEM)和原子力显微镜(AFM),分析了DLC膜的键结构、表面形貌和结构特征,用原位纳米力学测试系统测定了薄膜的硬度.以GCr15钢为摩擦副材料...     

直流负偏压对类金刚石薄膜结构和性能的影响

利用直流-射频-等离子体增强化学气相沉积技术在单晶硅表面制备了类金刚石薄膜，采用原子力显微镜、Raman光谱、X射线光电子能谱、红外光谱、表面轮廓仪和纳米压痕仪考察了直流负偏压对类金刚石薄膜表面形貌、微观结构、沉积速率和硬度等性能的影响。结果表明：无直流负偏压条件下，薄膜呈现有机类聚合结构，具有较低的SP3含量和硬度；叠加上直流负偏压后，薄膜具有典型的类金刚石结构特征，SP3含量和硬度得到了显著的提高；但随着直流负偏压的升高，薄膜的沉积速率和H含量逐渐降低，而SP3含量和硬度在直流负偏压为200V时出现最大值，此后逐渐降低。     

基体温度对中频脉冲非平衡磁控溅射技术沉积类金刚石薄膜结构与性能的影响

利用中频脉冲非平衡磁控溅射技术在不同的基体温度下制备了类金刚石(DLC)薄膜,采用Raman光谱、X射线光电子能谱(XPS)、纳米压痕测试仪、椭偏仪对所制备DLC薄膜的微观结构、机械性能、光学性能进行了分析。Raman光谱和XPS结果表明,当基体温度由50℃增加到100℃时,DLC薄膜中的sp3杂化键的含量随基体温度的升高而增加,当基体温度超过100℃时,DLC薄膜中的sp3杂化键的含量随基体温度的升高而减少。纳米压痕测试表明,DLC薄膜的纳米硬度随基体温度的增加先增加而后减小,基体温度为100℃时制备的薄膜的纳米硬度最大。椭偏仪测试表明,类金刚石薄膜的折射率同样随基体温度的增加先增加而后减小,基体温度为100℃时制备的薄膜的折射率最大。以上结果说明基体温度对DLC薄膜中的sp3杂化键的含量有很大的影响,DLC薄膜的纳米硬度、折射率随薄膜中的sp3杂化键的含量的变化而变化。     

基体偏压对中频磁控溅射沉积DLC膜结构的影响

利用中频非平衡磁控溅射技术,以氩气和甲烷混合气体为工作气体,在载玻片和单品硅片上沉积含氢的类金刚石簿膜.改变加载在基体上的负偏压,在0～400 V范围内,制备5种偏压值下的薄膜,研究偏压对薄膜结构的影响.用光学显微镜和AFM考察薄膜的光学形貌;激光Raman谱定性分析膜的化学组分;VFIR分析其C-H键合类型;纳米压痕法测量膜的硬度.结果表明:当基体上施加偏压-100 V时,可以有效地提高沉积粒子与基体结合力以及溥膜的致密性,薄膜中正四面体的sp3结构和sp3CHn含最增加,纳米硬度提高.     

ECR-RF双功率源等离子体化学气相沉积制备类金刚石薄膜的研究

利用微波ECR加射频功率源等离子体化学气相沉积技术,以CH4为碳源气体,Ar气为稀释气体,在硅片(100)上制备了类金刚石薄膜.Raman光谱证实了薄膜的类金刚石特性;傅立叶变换红外光谱表明薄膜中存在明显的C-H键结构.采用AFM观察了表面形貌,均方根粗糙度大约为1.489nm,表明薄膜表面比较光滑.最后对其进行了摩擦性能测试,薄膜的平均摩擦系数为0.102.     

电子回旋共振-微波等离子体化学气相沉积法制备a-C∶H(N)薄膜

采用电子回旋共振-微波等离子体化学气相沉积技术,使用CH4和N2混合气作为反应气体,在硅衬底上制备掺氮含氢非晶碳(a-C∶H(N))薄膜.紫外Raman光谱证实了薄膜的类金刚石特性;傅立叶变换红外光谱表明薄膜中存在CH和CN键结构.采用原子力显微镜(AFM)观察薄膜的微观表面形貌,结果表明薄膜表面光滑.论文详细叙述了薄膜制备工艺,对测试结果进行了分析讨论,也对这种薄膜在微电子机械系统中的潜在应用进行了探讨.     

射频辉光放电自偏压对类金刚石碳膜结构和性能的影响

采用高压探头示波器系统研究了射频辉光放电参数对自偏压的影响规律.结果发现自偏压随着射频功率平方根而线性增加,随纯Ar和Ar,C2H2混合气体气压的降低而降低,自偏压随C2H2的比率增大而增加,而且,射频输入功率在500和700 W下,由射频辉光放电所制备的类金刚石薄膜分别通过Raman光谱和纳米压痕技术测试,研究了这些薄膜的微观结构和机械性能.功率500 W制备的类金刚石薄膜(ID/IG为0.66)较700W制备的类金刚石薄膜(ID/IG为1.44)具有较高的硬度和sp3键含量,表明在500 W功率下制备的类金刚石薄膜中有高含量的sp3键.     

阴极真空弧源沉积氟化类金刚石薄膜的结构与性能研究

采用脉冲磁过滤阴极真空弧源沉积系统(FCVA)在单晶硅基片上制备了含氟量不同的一系列氟化类金刚石膜(a-C:F).重点研究了氟掺杂对非晶态碳基薄膜结构、机械性能和疏水性能的影响.薄膜的成分和结构采用X射线光电子能谱仪(XPS)和激光拉曼光谱(Raman)进行了表征,薄膜表面形貌和粗糙度采用原子力显微镜(AFM)进行了分析.使用纳米压痕仪测量了薄膜硬度,纳米划痕仪测量了膜基结合力.采用躺滴法测量薄膜与双蒸水之间的接触角来评价其疏水性能.结果表明,随着CF4流量的逐渐增加,薄膜的氟化程度逐渐增强,膜中最大氟含量达45.6 at%;薄膜呈典型的类金刚石状结构,但薄膜的无序化程度增强;由于-CFn+的刻蚀,薄膜表面更加致密化、粗糙度逐渐减小.薄膜的机械性能良好,硬度在12GPa以上.薄膜的疏水性能得到增强,与双蒸水之间的最大接触角达106°,接近于聚四氟乙烯(PTFE,110°).     

射频等离子体增强化学气相沉积类金刚石薄膜的结构及摩擦学性能研究

以C2H2为碳源,Ar为辅助气体,利用射频等离子体化学气相沉积的方法在载玻片上成功地制备了类金刚石(DLC)薄膜.通过红外光谱分析了所制备DLC薄膜的结构;利用原子力显微镜分析了薄膜的表面形貌;通过表面轮廓仪测量了薄膜的沉积速率;还利用摩擦磨损仪对薄膜的机械性能进行了研究.实验结果表明,制备的DLC薄膜比较致密、均匀,有较好的耐磨性能.     

电化学沉积DLC膜及其表征

采用电化学沉积方法，甲醇有机溶剂作碳源，在直流电源作用下在单晶硅表面沉积得到碳薄膜。薄膜不溶于苯、丙酮等有机溶剂，具有较高的硬度(16GPa左右)，用AFM、Raman和FTIR分析手段对该薄膜表面形貌和结构进行表征，Raman和FTIR结果表明电化学沉积得到的是含氢的类金刚石碳薄膜。通过研究样品薄膜的XPS和XAES谱图特征，进一步证实薄膜是DLC薄膜，并用线性插入法估算出样品薄膜中SP^3的相对含量为60％，同时推测了电化学沉积DLC薄膜的生长机理。     

CVD of hard DLC films in a radio frequency inductively coupled plasma source

Chemical vapor deposition (CVD) of hard diamond-like carbon (DLC) films on silicon (100) substrates from methane was successfully carried out using a radio frequency (r.f.) inductively coupled plasma source (ICPS). Different deposition parameters such as bias voltage, r.f. power, gas flow and pressure were involved. The structures of the films were characterized by Fourier transform infrared (FTIR) spectroscopy and Raman spectroscopy. The hardness of the DLC films was measured by a Knoop microhardness tester. The surface morphology of the films was characterized by atomic force microscope (AFM) and the surface roughness (R_a) was derived from the AFM data. The films are smooth with roughness less than 1.007 nm. Raman spectra shows that the films have typical diamond-like characteristics with a D line peak at 1331 cm⁻¹ and a G line peak at 1544 cm⁻¹, and the low intensity ratio of I_D/I_G indicate that the DLC films have a high ratio of sp³ to sp² bonding, which is also in accordance with the results of FTIR spectra. The films hardness can reach approximately 42 GPa at a comparatively low substrate bias voltage, which is much greater than that of DLC films deposited in a conventional r.f. capacitively coupled parallel-plate system. It is suggested that the high plasma density and the suitable deposition environment (such as the amount and ratio of hydrocarbon radicals to atomic or ionic hydrogen) obtained in the ICPS are important for depositing hard and high quality DLC films.     

Preparation of diamond-like carbon films by cathodic micro-arc discharge in aqueous solutions

Diamond-like carbon films (DLC) and silicon doped diamond-like carbon films were deposited on Ni substrate by cathodic micro-arc discharge at room temperature in aqueous solutions. The deposit potential was 130 V. The structure of the films was characterized by a scanning electron microscope (SEM), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Raman spectra and XPS analysis demonstrated that the films were diamond-like carbon clearly. SEM observation showed that the DLC films were uniform and the thickness was about 200 nm. Potentiodynamic polarization curve indicated the corrosion resistance of the Ni substrate was markedly improved by DLC films.     

异丙醇溶液中电化学法制备类金刚石薄膜的研究

采用电化学方法,以分析纯的异丙醇溶液作为碳源,低温(60～70℃)常压条件下,在(100)硅片上沉积了类金刚石薄膜。利用扫描电子显微镜(SEM)、原子力显微镜(AFM)、拉曼光谱仪(Raman)和傅里叶变换红外光谱仪(FTIR)表征了薄膜的表面形貌和结构。结果表明,电解异丙醇溶液可以获得表面均匀致密且sp3碳含量较高的含氢类金刚石薄膜。     

Structural studies of aluminium nitride embedded in amorphous carbon

Aluminum nitride containing diamond-like carbon was fabricated with pulsed laser deposition without post processing. The compositions of the targets used were varied at 1, 5, 10, 15 at.% and pure carbon was used as a reference. The films were comprehensively characterized with Atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS) and Transmission electron microscopy (TEM). Roughness analysis using AFM showed an increasing root-mean-square (RMS) roughness with increasing AIN content in target, while XPS analysis showed that the aluminum-nitrogen bonding was still present in the films after the fabrication process. Microstructural studies and selected area electron diffraction (SAED) pattern confirmed the presence of AIN crystals in DLC matrix. This nanostructured composite material is useful for luminescence applications.     

Investigation of corrosion behavior of nitrogen doped and platinum/ruthenium doped diamond-like carbon thin films in Hank's solution

Undoped (DLC), nitrogen-doped (N-DLC) and platinum/ruthenium doped diamond-like carbon (PtRu-DLC) thin films were deposited on p-Si (100) substrates using a DC magnetron sputtering deposition system. The chemical composition, bonding structure, surface morphology and adhesion strength of the films were characterized using X-ray photoelectron spectroscopy (XPS), micro-Raman spectroscopy, atomic force microscopy (AFM) and micro-scratch test, respectively. The corrosion behavior of the films in a Hank's solution was investigated using potentiodynamic polarization test. The corrosion results revealed that the PtRu-DLC film had the highest corrosion potential among the films used in this study.     

Corrosion behavior of aluminum doped diamond-like carbon thin films in NaCl aqueous solution

Aluminum doped diamond-like carbon (DLC:Al) thin films were deposited on n-Si(100) substrates by co-sputtering a graphite target under a fixed DC power (650 W) and an aluminum target under varying DC power (10-90 W) at room temperature. The structure, adhesion strength and surface morphology of the DLC:Al films were characterized by X-ray photoelectron spectroscopy (XPS), micro-scratch testing and atomic force microscopy (AFM), respectively. The corrosion performance of the DLC:Al films was investigated by means of potentiodynamic polarization testing in a 0.6 M NaCl aqueous solution. The results showed that the polarization resistance of the DLC:Al films increased from about 18 to 30.7 k(omega) though the corrosion potentials of the films shifted to more negative values with increased Al content in the films.     

通过制备Ti/TiC和Si/SixNy过渡层在铜基体上沉积类金刚石膜的研究

将磁控溅射物理气相沉积（MS-PVD）和电子回旋共振-微波等离子体增强化学气相沉积（ECR—PECVD）技术相结合，在铜基体上通过制备两种不同的过渡层，成功地沉积了类金刚石膜。拉曼光谱结果分析表明，所制备的碳膜都具有典型的类金刚石结构特征。通过原子力显微镜对薄膜的微观形貌进行分析，采用纳米压痕测量薄膜的硬度和模量。并对Ti／TiC过渡层和Si／SixNy过渡层上沉积的类金刚石薄膜进行了研究对比。     

Analysis on Structure and Properties of Diamondlike Carbon Films from Ion Beam Deposition

Diamondlike carbon (DLC) films from a primary ion beam deposition system, were examined using nanoindentation, SEM, AES, XPS, and Raman Spectroscopy. The films have hardness values ranging from 21 to 29 GPa. The results of SEM and AES show that the films are predominantly carbon without any crystalline features, and that nitrogen is incorporated as nitrogen is used as the ion beam source. XPS, and Raman Spectroscopy confirm that the films are amorphous carbon with a combination of sp³ with sp² bonding. It is concluded that DLC films can be directly deposited on steel using a single ion beam to sputter the solid target, and the structure and properties of DLC largely depend on ion beam source.     

Optical and mechanical properties of diamond like carbon films deposited by microwave ECR plasma CVD

Diamond like carbon (DLC) films were deposited on Si (111) substrates by microwave electron cyclotron resonance (ECR) plasma chemical vapour deposition (CVD) process using plasma of argon and methane gases. During deposition, a d.c. self-bias was applied to the substrates by application of 13·56 MHz rf power. DLC films deposited at three different bias voltages (−60 V, −100 V and −150 V) were characterized by FTIR, Raman spectroscopy and spectroscopic ellipsometry to study the variation in the bonding and optical properties of the deposited coatings with process parameters. The mechanical properties such as hardness and elastic modulus were measured by load depth sensing indentation technique. The DLC film deposited at −100 V bias exhibit high hardness (∼ 19 GPa), high elastic modulus (∼ 160 GPa) and high refractive index (∼ 2·16–2·26) as compared to films deposited at −60 V and −150 V substrate bias. This study clearly shows the significance of substrate bias in controlling the optical and mechanical properties of DLC films.