Imaging electronic structure of carbon nanotubes by voltage-contrast scanning electron microscopy

We introduce voltage-contrast scanning electron microscopy (VC-SEM) for visual characterization of the electronic properties of single-walled carbon nanotubes. VC-SEM involves tuning the electronic band structure and imaging the potential profi le along the length of the nanotube. The resultant secondary electron contrast allows to distinguish between metallic and semiconducting carbon nanotubes and to follow the switching of semiconducting nanotube devices, as confi rmed by in situ electrical transport measurements. We demonstrate that high-density arrays of individual nanotube devices can be rapidly and simultaneously characterized. A leakage current model in combination with fi nite element simulations of the device electrostatics is presented in order to explain the observed contrast evolution of the nanotube and surface electrodes. This work serves to fill a void in electronic characterization of molecular device architectures. Electronic Supplementary Material  Supplementary material is available for this article at and is accessible for authorized users. This article is published with open access at Springerlink.com     

High frequency scanning gate microscopy and local memory effect of carbon nanotube transistors

We use impedance spectroscopy to measure the high-frequency properties of single-walled carbon nanotube field effect transistors (swCN-FETs). Furthermore, we extend scanning gate microscopy (SGM) to frequencies up to 15 MHz and use it to image changes in the impedance of swCN-FET circuits induced by the SGM tip gate. In contrast to earlier reports, the results of both experiments are consistent with a simple RC parallel circuit model of the swCN-FET, with a time constant of 0.3 micros. We also use the SGM tip to show the local nature of the memory effect normally observed in swCN-FETs, implying that nanotube-based memory cells can be miniaturized to dimensions of the order of tens of nm.     

Electroluminescence from single-wall carbon nanotube network transistors

The electroluminescence (EL) properties from single-wall carbon nanotube network field-effect transistors (NNFETs) and small bundle carbon nanotube field effect transistors (CNFETs) are studied using spectroscopy and imaging in the near-infrared (NIR). At room temperature, NNFETs produce broad (approximately 180 meV) and structured NIR spectra, while they are narrower (approximately 80 meV) for CNFETs. EL emission from NNFETs is located in the vicinity of the minority carrier injecting contact (drain) and the spectrum of the emission is red shifted with respect to the corresponding absorption spectrum. A phenomenological model based on a Fermi-Dirac distribution of carriers in the nanotube network reproduces the spectral features observed. This work supports bipolar (electron-hole) current recombination as the main mechanism of emission and highlights the drastic influence of carrier distribution on the optoelectronic properties of carbon nanotube films.     

Lithography-free fabrication of carbon nanotube network transistors

A novel non-lithographic technique for the fabrication of carbon nanotube thin film transistors is presented. The whole transistor fabrication process requires only one mask which is used both to pattern transistor channels based on aerosol synthesized carbon nanotubes and to deposit electrodes by metal evaporation at different angles. An important effect of electrodynamic focusing was utilized for the directed assembly of transistor channels with feature sizes smaller than the mask openings. This dry non-lithographic method opens up new avenues for device fabrication especially for low cost flexible and transparent electronics.     

Electrical properties of carbon nanotube thin-film transistors fabricated using plasma-enhanced chemical vapor deposition measured by scanning probe microscopy

The electrical properties of carbon nanotube thin-film transistors (CNT-FETs) fabricated using plasma-enhanced chemical vapor deposition (PECVD) were studied by scanning probe microscopy. The measured results suggest the formation of an island structure in the subthreshold regime and the disappearance of the island structure at the ON state. These results were explained by the change in the effective number of CNTs that contributed to the electrical conduction due to the gate-bias-dependent resistance of the semiconducting CNTs. The results obtained by Monte Carlo simulation revealed similar results. The effects of metallic CNTs with defects and the scatter of the drain current in the subthreshold regime were also examined.     

Polymer electrolyte gating of carbon nanotube network transistors

Network behavior in single-walled carbon nanotubes (SWNTs) is examined by polymer electrolyte gating. High gate efficiencies, low voltage operation, and the absence of hysteresis in polymer electrolyte gating lead to a convenient and effective method of analyzing transport in SWNT networks. Furthermore, the ability to control carrier type with chemical groups of the host polymer allows us to examine both electron and hole conduction. Comparison to back gate measurements is made on channel length scaling. Frequency measurements are also made giving an upper limit of approximately 300 Hz switching speed for poly(ethylene oxide)/LiClO(4) gated SWNT thin film transistors.     

Noise characteristics of single-walled carbon nanotube network transistors

The noise characteristics of randomly networked single-walled carbon nanotubes grown directly by plasma enhanced chemical vapor deposition (PECVD) are studied with field effect transistors (FETs). Due to the geometrical complexity of nanotube networks in the channel area and the large number of tube-tube/tube-metal junctions, the inverse frequency, 1/f, dependence of the noise shows a similar level to that of a single single-walled carbon nanotube transistor. Detailed analysis is performed with the parameters of number of mobile carriers and mobility in the different environment. This shows that the change in the number of mobile carriers resulting in the mobility change due to adsorption and desorption of gas molecules (mostly oxygen molecules) to the tube surface is a key factor in the 1/f noise level for carbon nanotube network transistors.     

Imaging of the Schottky barriers and charge depletion in carbon nanotube transistors

The photovoltage produced by local illumination at the Schottky contacts of carbon nanotube field-effect transistors varies substantially with gate voltage. This is particularly pronounced in ambipolar nanotube transistors where the photovoltage switches sign as the device changes from p-type to n-type. The detailed transition through the insulating state can be recorded by mapping the open-circuit photovoltage as a function of excitation position. These photovoltage images show that the band-bending length can grow to many microns when the device is depleted. In our palladium-contacted devices, the Schottky barrier for electrons is much higher than that for holes, explaining the higher p-type current in the transistor. The depletion width is 1.5 mum near the n-type threshold and smaller than our resolution of 400 nm near the p-type threshold. Internal photoemission from the metal contact to the carbon nanotube and thermally assisted tunneling through the Schottky barrier are observed in addition to the photocurrent that is generated inside the carbon nanotube.     

Low-frequency noise in ambipolar carbon nanotube transistors

Low-frequency noise measurements on individual single-walled carbon nanotube transistors exhibiting ambipolar characteristics have been carried out. With a polymer electrolyte as gate medium, low-frequency noise can be monitored in both p- and n-channel operation of the same nanotube under the same chemical environment. 1/ f noise in the p-channel of polymer electrolyte gated nanotube transistor is similar to that of back gate operation. However, most devices exhibit significantly larger noise amplitude in the n-channel operation that has a distinct dependence on the threshold voltage. A nonuniform energy distribution of carrier trapping/scattering sites is considered to explain these observations.     

Length scaling of carbon nanotube transistors

Carbon nanotube field-effect transistors are strong candidates in replacing or supplementing silicon technology. Although theoretical studies have projected that nanotube transistors will perform well at nanoscale device dimensions, most experimental studies have been carried out on devices that are about ten times larger than current silicon transistors. Here, we show that nanotube transistors maintain their performance as their channel length is scaled from 3 μm to 15 nm, with an absence of so-called short-channel effects. The 15-nm device has the shortest channel length and highest room-temperature conductance (0.7G?) and transconductance (40 μS) of any nanotube transistor reported to date. We also show the first experimental evidence that nanotube device performance depends significantly on contact length, in contrast to some previous reports. Data for both channel and contact length scaling were gathered by constructing multiple devices on a single carbon nanotube. Finally, we demonstrate the performance of a nanotube transistor with channel and contact lengths of 20 nm, an on-current of 10 μA, an on/off current ratio of 1 x 10?, and peak transconductance of 20 μS. These results provide an experimental forecast for carbon nanotube device performance at dimensions suitable for future transistor technology nodes.     

Transparent and flexible carbon nanotube transistors

We report the fabrication of transparent and flexible transistors where both the bottom gate and the conducting channel are carbon nanotube networks of different densities and Parylene N is the gate insulator. Device mobilities of 1 cm(2) V(-1) s(-1) and on/off ratios of 100 are obtained, with the latter influenced by the properties of the insulating layer. Repetitive bending has minor influence on the characteristics, with full recovery after repeated bending. The operation is insensitive to visible light and the gating does not influence the transmission in the visible spectral range.     

Transmission electron microscopy study of individual carbon nanotube breakdown caused by Joule heating in air

We present repeated structural and electrical measurements on individual multiwalled carbon nanotubes, alternating between electrical measurements under ambient conditions and transmission electron microscopy (TEM). The multiwalled carbon nanotubes made by chemical vapor deposition were manipulated onto cantilever electrodes extending from a specially designed microfabricated chip. Repeated TEM investigations were then made of the progressive destruction of the nanotube structure induced by Joule heating in air. The electrical measurements indicate that the studied nanotubes behave as diffusive conductors with remarkably predictable electrical properties despite extensive structural damage.     

Imaging of surface strain and polishing artefacts in fused silica by environmental scanning electron microscopy

The recently developed application of charge contrast imaging (CCI), available in variable pressure or environmental scanning electron microscopes (ESEM), has been found to provide images of near surface strain around micro-indentations in fused silica glass. Results suggest this strain contrast information is derived from within a few nanometres of the material surface, making CCI an invaluable tool for the study of nanometre scale surface deformation. Images of indentation strain have also been imaged using backscattered electron (BSE) imaging. The CCI technique has also been applied to the study of fused silica surfaces polished by chemically active polishing abrasives. In the samples studied, CCI provides unique images of linear defects residing below layers of chemically adhered polishing compound. Visualisation of surface strain on sub-nm rms glasses provides supporting evidence for plastic (permanent) deformation of the glass surface at the nanometre level during polishing with certain abrasives and for chemical interactions between the polishing abrasive and glass surface.     

Charge noise in liquid-gated single-wall carbon nanotube transistors

The noise properties of single-walled carbon nanotube transistors (SWNT-FETs) are essential for the performance of electronic circuits and sensors. Here, we investigate the mechanism responsible for the low-frequency noise in liquid-gated SWNT-FETs and its scaling with the length of the nanotube channel down to the nanometer scale. We show that the gate dependence of the noise amplitude provides strong evidence for a recently proposed charge-noise model. We find that the power of the charge noise scales as the inverse of the channel length of the SWNT-FET. Our measurements also show that surprisingly the ionic strength of the surrounding electrolyte has a minimal effect on the noise magnitude in SWNT-FETs.     

Phase diffusion in single-walled carbon nanotube Josephson transistors

We investigate electronic transport in Josephson junctions formed by individual single-walled carbon nanotubes coupled to superconducting electrodes. We observe enhanced zero-bias conductance (up to 10e ²/h) and pronounced sub-harmonic gap structures in differential conductance, which arise from the multiple Andreev reflections at superconductor/nanotube interfaces. The voltage-current characteristics of these junctions display abrupt switching from the supercurrent branch to the resistive branch, with a gate-tunable switching current ranging from 65 pA to 2.5 nA. The finite resistance observed on the supercurrent branch and the magnitude of the switching current are in good agreement with the classical phase diffusion model for resistively and capacitively shunted junctions.     

Three-dimensional electrostatic effects of carbon nanotube transistors

We explore the three-dimensional (3-D) electrostatics of planar-gate carbon nanotube field-effect transistors (CNTFETs) using a self-consistent solution to the Poisson equation with equilibrium carrier statistics. We examine the effects of the gate insulator thickness and dielectric constant and the source/drain contact geometry on the electrostatics of bottom-gated (BG) and top-gated (TG) devices. We find that the electrostatic scaling length is mostly determined by the gate oxide thickness, not by the oxide dielectric constant. We also find that a high-k gate insulator does not necessarily improve short-channel immunity because it increases the coupling of both the gate and the source/drain contact to the channel. It also increases the parasitic coupling of the source/drain to the gate. Although both the width and the height of the source and drain contacts are important, we find that for the BG device, reducing the width of the 3-D contacts is more effective for improving short channel immunity than reducing the height. The TG device, however, is sensitive to both the width and height of the contact. We find that one-dimensional source and drain contacts promise the best short channel immunity. We also show that an optimized TG device with a thin gate oxide can provide near ideal subthreshold behavior. The results of this paper should provide useful guidance for designing high-performance CNTFETs.     

Chemical optimization of self-assembled carbon nanotube transistors

We present the improvement of carbon nanotube field effects transistors (CNTFETs) performances by chemical tuning of the nanotube/substrate and nanotube/electrode interfaces. Our work is based on a method of selective placement of individual single walled carbon nanotubes (SWNTs) by patterned aminosilane monolayer and its use for the fabrication of self-assembled nanotube transistors. This method brings a relevant solution to the problem of systematic connection of self-organized nanotubes. The aminosilane monolayer reactivity can be used to improve carrier injection and doping level of the SWNT. We show that the Schottky barrier height at the nanotube/metal interface can be diminished in a continuous fashion down to an almost ohmic contact through these chemical treatments. Moreover, sensitivity to 20 ppb of triethylamine is demonstrated for self-assembled CNTFETs, thus opening new prospects for gas sensors taking advantages of the chemical functionality of the aminosilane used for assembling the CNTFETs.     

Superaligned carbon nanotube grid for high resolution transmission electron microscopy of nanomaterials

Nano is one of the hottest topics in current science and technology. Characterizations of nanomaterials by high resolution transmission electron microscopy (TEM) are becoming indispensable today. To gain better performance of TEM, people are expecting a novel TEM grid of which the supporting film should be highly conductive, ultrathin but robust, and preferably nanoholey. Here we report a method of mass producing such a kind of carbon nanotube TEM grids. The supporting films are made by cross stacking ultrathin superaligned carbon nanotube films, resulting in a large number of nanosized holes and numerous effective edges. Together with the robustness, good conductivity, and strong adsorbability inherited from carbon nanotubes, these TEM grids show much better performance than conventional amorphous carbon grids.