Effect of co-adsorbed dopants on initial diamond growth steps: H abstraction from an adsorbed CH3

The effect induced by a neighbouring co-adsorbed dopant on H abstraction from an adsorbed CH₃ species on diamond has been investigated by using an ultra-soft pseudo-potential density functional theory (DFT) method under periodic boundary conditions. Both the (100) and (111) diamond surface orientations were considered with various types of dopants in two different hydrogenated forms; AH_x (A = N, B, S, or P; X = 0 or 1 for S; X = 1 or 2 for N, B and P, and X = 2 or 3 for C). The H abstraction by gaseous radical H was found to be energetically favoured by the presence of the dopants in all of their different hydrogenated forms. For NH₂, SH, or PH₂, this effect is induced by a destabilisation of the diamond surface by sterical repulsions between the adsorbed growth species CH₃ and the co-adsorbed dopant. For BH₂ and the dopants in their radical form, the abstraction reaction is favoured due to the formation of a new covalent bond between the dopant and the co-adsorbed CH₂ (product of the abstraction reaction), which strongly stabilises the surface after the abstraction process.     

High-quality diamond film deposition on a titanium substrate using the hot-filament chemical vapor deposition method

Diamond film on titanium substrate has become extremely attractive because of the combined properties of these two unique materials. Diamond film can effectively improve the properties of Ti for applications as aerospace and biomedical materials, as well as electrodes. This study focuses on the effects of process parameters, including gas composition, substrate temperature, gas flow rate and reactor pressure on diamond growth on Ti substrates using the hot-filament chemical vapor deposition (HFCVD) method. The nucleation density, nuclei size as well as the diamond purity and growth tendency indices were used to quantify these effects. The crystal morphology of the material was examined with scanning electron microscopy (SEM). Micro-Raman spectroscopy provided information on the quality of the diamond films. The growth tendency of TiC and diamond film was determined by X-ray diffraction analysis. The optimal conditions were found to be: CH₄:H₂ = 1%, gas flow rate = 300 sccm, substrate temperature T_sub = 750 °C, reaction pressure = 40 mbar. Under these conditions, high-quality diamond film was deposited on Ti with a growth rate of 0.4 μm/h and sp² carbon impurity content of 1.6%.     

Formation of self-assembled platinum particles on diamond and their embedding in diamond by microwave plasma chemical vapor depositions

Single-crystalline and polycrystalline diamond films containing platinum particles with sizes of ≤ ≈ 100 nm have been formed through a self-assembling process. Pt thin films pre-deposited on diamond were found to completely change in shape to grains during a subsequent diamond overgrowth process using a microwave-plasma chemical-vapor-deposition (MPCVD) technique. The self-assembled Pt grains on flat diamond surfaces had approximately spherical particles with rather uniform sizes when the pre-deposited Pt films were sufficiently thin or less than ≈ 1 μm in thickness. The average diameter of such Pt particles, D, was well controlled simply by changing the thickness of the pre-deposited Pt film, t_pt, since D was proportional to t_pt. Such spherical Pt particles were completely embedded after sufficient diamond overgrowth. Transmission electron microscope observations revealed that most of the spherical Pt particles were well crystallized and that the interfacial structures between the diamond overlayer and the buried Pt particles were sufficiently sharp without any appreciable mixing regions.     

Grain size dependent physical and chemical properties of thick CVD diamond films for high energy density physics experiments

We report on the grain size dependent morphological, physical and chemical properties of thick microwave-plasma assisted chemical vapor deposited (MPCVD) diamond films that are used as target materials for high energy density physics experiments at the Lawrence Livermore National Laboratory. Control over the grain size, ranging from several μm to a few nm, was achieved by adjusting the CH₄ content of the CH₄/H₂ feed gas. The effect of grain size on surface roughness, morphology, texture, density, hydrogen and graphitic carbon content was systematically studied by a variety of techniques. For depositions performed at 35 to 45 mbar and 3000 W microwave power (power density ~ 10 W cm^− 3), an abrupt transition from micro-crystalline diamond to nanocrystalline diamond was observed at 3% CH₄. This transition is accompanied by a dramatic decrease in surface roughness, a six percent drop in density and an increasing content in hydrogen and graphitic carbon impurities. Guided by these results, layered nano-microhybrid diamond samples were prepared by periodically changing the growth conditions from nano- to microcrystalline.     

Quality of diamond wafers grown by microwave plasma CVD: effects of gas flow rate

We found a strong impact of gas flow rate on diamond growth process in a 5 kW microwave plasma chemical vapour deposition reactor operated on CH₄-H₂ gas mixtures. Diamond films of 0.1–1.2 mm thickness and 2.25 in. in diameter were produced at H₂ flow rates varied systematically from 60 sccm to 1000 sccm at 2.5% CH₄. The highest growth rate, 5 μm h⁻¹, was observed at intermediate F values (≈300 sccm). Carbon conversion coefficient (the number of C atoms going from gas to diamond) increases monotonically up to 57% with flow rate decrease, however, this is accompanied with a degradation of diamond quality revealed from Raman spectra, thermal properties and surface morphology. High flow rates were necessary to produce uniform films with thermal conductivity >18 W cm⁻¹ K⁻¹. Diamond disks with very low optical absorption (loss tangent tgδ<10⁻⁵) in millimetre wave range (170 GHz) have been grown at optimized deposition conditions for use as windows for high-power gyrotrons.     

Modeling of nitrogen/diborane/methane/hydrogen plasma for nanocrystalline diamond growth: Comparison with experimental data

Gas phase thermodynamic equilibrium calculations involving N₂/B₂H₆/CH₄/H₂ mixtures were performed to investigate the chemical interactions leading to boron incorporation and microstructure variations in microwave plasma assisted chemical vapor deposition of diamond films. Molecular fractions of several BH_x (x = 1–3) species were calculated to study the incorporation mechanism of boron atom into diamond structure. A strong influence of the BH in causing the boron incorporation level in diamond lattice is confirmed by the correlation of its modeled equilibrium composition in the gas phase with boron content as determined experimentally. Nitrogen addition leads to nanocrystallinity and a reduction in boron incorporation due to a decrease in BH as additional B/N/H radicals are formed in the gas phase. We also obtained a good degree of agreement between the theoretically predicted CH₃/CN gas phase ratio and the experimental surface roughness trends as measured for all samples.     

Studies of heteroepitaxial growth of diamond

Large-scale heteroepitaxial growth of diamond depends critically on the development of a suitable lattice-matched substrate system. Oxide substrates, notably MgO and SrTiO₃, on which thin epitaxial films of iridium serve as a nucleation layer for diamond have already shown considerable promise. We describe here improvements in the growth of single crystal diamond by low-pressure microwave plasma-enhanced CVD. Oxide substrates with flat, low-index surfaces form the initial basis for the process. Iridium was deposited on heated substrates in a UHV electron-beam evaporation system resulting in epitaxial films, typically 150–300 nm thick, with Ir (1 0 0) parallel to the surface of all substrates as confirmed by X-ray and electron backscattering diffraction. Following Ir deposition, the samples were transferred to a CVD reactor where a bias-enhanced nucleation step induced a dense condensate that completely covered the Ir surface. Uniform nucleation densities of order 10¹² cm⁻² were observed. Interrupted growth studies, carried out at intervals from seconds to minutes subsequent to terminating the nucleation step, revealed a rapid coalescence of grains. One hour of growth resulted in a smooth, nearly featureless, (0 0 1) diamond film. For extended growth runs, slabs of diamond were grown with thickness as great as 38 μm and lateral dimensions near 4 mm. The crystals were transparent in visible light and cleaved on (1 1 1) planes along 〈1 1 0〉 directions, similar to natural diamond. Of particular significance is the successful use of sapphire as an underlying substrate. Its high crystalline perfection results in epitaxial Ir films with X-ray linewidths comparable to those grown on SrTiO₃. However, Al₂O₃ possesses superior interfacial stability at high temperatures in vacuum or in a hydrogen plasma with a better thermal expansivity match to diamond. Since sapphire is available as relatively inexpensive large diameter substrates, these results suggest that wafer-scale growth of heteroepitaxial diamond should be feasible in the near future.     

Graphitized filament plasma enhanced CVD deposition of nanocrystalline diamond

A novel approach to the deposition of polycrystalline diamond is presented. The technique is based on the hot filament chemical vapour deposition technique (HFCVD). While it is similar to a high plasma power “bias enhanced growth” HFCVD, it relies on a graphite filament rather than on a metal one. It was found that with an appropriate choice of the growth parameters, 4–9% CH₄ in H₂, filament temperature > 2200 °C, 25 mBar gas pressure, plasma power > 500 W, a long filament lifetime can be achieved, when a simultaneous deposition of graphitic carbon on the hot graphite filament and of nanocrystalline diamond on a substrate facing the filament assembly is realized. In this paper the growth of nanocrystalline diamond films and their characterization (SEM, XRD, AFM) are presented. While the technique is promising for low cost, large area deposition of nanocrystalline diamond films, also the growth of microcrystalline diamond has been observed.     

High resolution electron energy loss spectroscopy of hydrogenated polycrystalline diamond: Assignment of peaks through modifications induced by isotopic exchange

In this work we unambiguously determine the origin of the different peaks which appear in the High Resolution Electron Energy Loss Spectrum (HREELS) of hydrogenated polycrystalline diamond films for an incident electron energy of 5 eV and loss energies extending to 700 meV. High quality diamond films deposited by hot filament chemical vapor deposition from various isotopic gas mixtures: ¹²CH₄ + H₂, ¹²CD₄ + D₂, ¹²CH₄ + D₂, ¹²CD₄ + D₂, ¹³CH₄ + H₂ were characterized. The different vibrational modes, fundamentals and overtones, were directly identified through the modifications of the HREEL spectra induced by the isotopic exchange of H by D and ¹²C by ¹³C Three types of peaks were identified: (1) pure C–C related peaks (a diamond optical phonon at ∼ 155 meV and its overtones at 300, 450 and 600 meV), (2) pure C–H related peaks (C–H bend at ∼ 150 meV and C–H stretch of sp³ carbon at 360 meV), (3) coupling of C–H and C–C peaks (510 meV peak due to coupling of the C–H stretch at 360 meV with either the C–C stretch or the C–H bend at ∼ 155 meV). The overtones at 300, 450 and 600 meV (associated with electron scattering at diamond optical phonons) indicate a well defined hydrogenated diamond surface since they are absent in the HREEL spectrum of low energy ion beam damaged diamond surface.     

Piezoresistivity of n-type conductive ultrananocrystalline diamond

Recent developments of a piezoresistive sensor prototype based on n-type conductive ultrananocrystalline diamond (UNCD) are presented. Samples were deposited using hot filament chemical vapor deposition (HFCVD) technique, with a gas mixture of H₂, CH₄ and NH₃, and were structured using multiple photolithographic and etching processes. Under controlled deposition parameters, UNCD thin films with n-type electrical conductivity at room temperature (5 × 10^− 3 – 5 × 10¹ S/cm) could be grown. Respective piezoresistive response of such films was analyzed and the gauge factor was evaluated in both transverse and longitudinal arrangements, also as a function of temperature from 25 °C up to 300 °C. Moreover, the gauge factor of piezoresistors with various sheet resistance values and test structure geometries was evaluated. The highest measured gauge factor was 9.54 ± 0.32 at room temperature for a longitudinally arranged piezoresistor with a sheet resistance of about 30 kΩ/square. This gauge factor is well comparable to that of p-type boron doped diamond; however, with a much better temperature independency at elevated temperatures compared to the boron-doped diamond and silicon. To our best knowledge, this is the first report on piezoresistive characteristics of n-type UNCD films.     

Effect of H2/Ar plasma on growth behavior of ultra-nanocrystalline diamond films: The TEM study

Incorporation of H₂ species into Ar plasma was observed to markedly alter the microstructure of diamond films. TEM examinations indicate that, while the Ar/CH₄ plasma produced the ultrananocrystalline diamond films with equi-axed grains (~ 5 nm), the addition of 20% H₂ in Ar resulted in grains with dendrite geometry and the incorporation of 80% H₂ in Ar led to micro-crystalline diamond with faceted grains (~ 800 nm). Optical emission spectroscopy suggests that small percentage of H₂-species (< 20%) in the plasma leads to partially etching of hydrocarbons adhered onto the diamond clusters, such that the C₂-species attach to diamond surface anisotropically, forming diamond flakes, which evolve into dendrite geometry. In contrast, high percentage of H₂-species in the plasma (80%) can efficiently etch away the hydrocarbons adhered onto the diamond clusters, such that the C₂-species can attach to diamond surface isotropically, resulting in large diamond grains with faceted geometry. The field needed to turn on the electron field emission for diamond films increases from E₀ = 22.1 V/μm (J_e = 0.48 mA/cm² at 50 V/μm applied field) for 0% H₂ samples to E₀ = 78.2 V/μm (J_e < 0.01 mA/cm² at 210 V/μm applied field) for 80% H₂ samples, as the grains grow, decreasing the proportion of grain boundaries.     

Synthesis of diamond using ultra-nanocrystalline diamonds as seeding layer and their electron field emission properties

A modified nucleation and growth process was adopted so as to improve the electron field emission (EFE) properties of diamonds films. In this process, a thin layer of ultra-nanocrystalline diamonds (UNCD), instead of bias-enhanced-nuclei, were used as nucleation layer for growing diamond films in H₂-plasma. The morphology of the grains changes profoundly due to such a modified CVD process. The geometry of the grains transform from faceted to roundish and the surface of grains changes from clear to spotty. The Raman spectroscopies and SEM micrographs imply that such a modified diamond films consist of UNCD clusters (~ 10–20 nm in size) on top of sp³-bonded diamond grains (~ 100 nm in size). Increasing the total pressure in CVD chamber deteriorated the Raman structure and hence degraded the EFE properties of the films, whereas either increasing the methane content in the H₂-based plasma or prolonged the growth time improved markedly the Raman structure and thereafter enhanced the EFE properties of diamond films. The EFE properties for the modified diamond films can be turned on at E₀ = 11.1 V/μm, achieving EFE current density as large as (J_e) = 0.7 mA/cm² at 25 V/μm applied field.     

Homoepitaxial single crystal diamond growth at different gas pressures and MPACVD reactor configurations

Homoepitaxial growth of single crystal diamond by microwave plasma chemical vapor deposition in a 2.45 GHz reactor was investigated at high microwave power density varied from 80 W/cm³ to 200 W/cm³. Two methods of achieving high microwave power densities were used (1) working at relatively high gas pressures without local increase of electric field and (2) using local increase of electric field by changing the reactor geometry (substrate holder configuration) at moderate gas pressures. The CVD diamond layers with thickness of 100–300µm were deposited in H₂–CH₄ gas mixture varying methane concentration, gas pressure and substrate temperature. The (100) HPHT single crystal diamond seeds 2.5 × 2.5 × 0.3 mm (type Ib) were used as substrates. The high microwave power density conditions allowed the achievement of the growth rate of high quality single crystal diamond up to 20 µm/h. Differences in single crystal diamond growth at the same microwave power density 200 W/cm³ for two process conditions—gas pressure 210 Torr (flat holder) and 145 Torr (trapezoid holder)—were studied. For understanding of growth process measurements of the gas temperature and the concentration of atomic hydrogen in plasma were made.     

Nucleation and growth surface conductivity of H-terminated diamond films prepared by DC arc jet CVD

High-quality polycrystalline diamond film has been extremely attractive to many researchers, since the maximum transition frequency (f_T) and the maximum frequency of oscillation (f_max) of polycrystalline diamond electronic devices are comparable to those of single crystalline diamond devices. Besides large deposition area, DC arc jet CVD diamond films with high deposition rate and high quality are one choice for electronic device industrialization. Four inch free-standing diamond films were obtained by DC arc jet CVD using gas recycling mode with deposition rate of 14 μm/h. After treatment in hydrogen plasma under the same conditions for both the nucleation and growth sides, the conductivity difference between them was analyzed and clarified by characterizing the grain size, surface profile, crystalline quality and impurity content. The roughness of growth surface with the grain size about 400 nm increased from 0.869 nm to 8.406 nm after hydrogen plasma etching. As for the nucleation surface, the grain size was about 100 nm and the roughness increased from 0.31 nm to 3.739 nm. The XPS results showed that H-termination had been formed and energy band bent upwards. The nucleation and growth surfaces displayed the same magnitude of square resistance (R_s). The mobility and the sheet carrier concentration of the nucleation surface were 0.898 cm/V s and 10¹³/cm² order of magnitude, respectively; while for growth surface, they were 20.2 cm/V s and 9.97 × 10¹¹/cm², respectively. The small grain size and much non-diamond carbon at grain boundary resulted in lower carrier mobility on the nucleation surface. The high concentration of impurity nitrogen may explain the low sheet carrier concentration on the growth surface. The maximum drain current density and the maximum transconductance (g_m) for MESFET with gate length L_G of 2 μm on H-terminated diamond growth surface was 22.5 mA/mm and 4 mS/mm, respectively. The device performance can be further improved by using diamond films with larger grains and optimizing device fabrication techniques.     

High temperature thermal conductivity of free-standing diamond films prepared by DC arc plasma jet CVD

Free-standing diamond films with 1.68 mm in polished thickness have been prepared by DC arc plasma jet CVD. By means of simply changing the placing orientation of diamond films along the laser transmission direction while testing, the through-thickness thermal conductivity (κ_⊥) together with the in-plane (κ_//) thermal conductivity of free-standing diamond films were measured by laser flash technique over a wide temperature range. Results show that the thermal conductivity κ_⊥ and κ_// of free-standing diamond films are up to 1916 and 1739 Wm^− 1 K^− 1 at room temperature, respectively, showing small anisotropy (9%), and following the relationship κ ~ T^− n as temperature rises. The conductivity exhibits similar value compared to that of high-quality single crystal diamond above 500 K for both through-thickness and in-plane directions of CVD diamond films. The effects of impurities and grain boundaries on thermal conductivity of diamond films with increasing temperature were discussed.     

n-type phosphorus-doped polycrystalline diamond on silicon substrates

The microwave plasma-assisted deposition of reproducible and homogeneously n-type phosphorus-doped polycrystalline (microcrystalline) diamond films on silicon substrates is described. The phosphorus incorporation is obtained by adding gaseous phosphine (PH₃) to the gas mixture during growth. The low CH₄/H₂ ratio (0.15%) and the use of the same growth parameters as for homoepitaxial {111} films, led to a good crystalline quality of the continuous polycrystalline diamond layers, confirmed by SEM images and Raman spectroscopy measurements.Secondary-ion mass spectrometry (SIMS) analysis measured a phosphorus concentration [P] of at least 7 × 10¹⁷ cm^− 3. Cathodoluminescence spectroscopy in our P-doped polycrystalline films shows a phosphorus bound exciton (BE^TO_P) peak between 5.142 and 5.181 eV. Cathodoluminescence and Raman-effect spectroscopy confirmed the improvement of the crystalline quality of our films as well as a decrease in the intensity of the internal strain when the grain size was decreased. Cathodoluminescence imaging and SIMS depth profile of phosphorus demonstrated a very good homogeneity of phosphorus incorporation in the films.     

Hydrogen incorporation,bonding and stability in nanocrystalline diamond films

The hydrogen concentration in hot filament and microwave plasma CVD nanocrystalline diamond films is analysed by secondary ion mass spectrometry and compared to the film grain size. The surface and bulk film carbon bonds are analysed respectively by X-ray photoelectron spectroscopy (XPS) and ultra-violet Raman spectroscopy. XPS results show the presence of the hydrogenated p-type surface conductive layer. The respective intensities of the 1332 cm^− 1 diamond peak, of the G and D bands related to sp² phases, and of the 3000 cm^− 1 CH_x stretching mode band, are compared on Raman spectra. The samples are submitted to thermal annealing under ultra-high vacuum in order to get hydrogen out-diffusion. XPS analysis shows the surface desorption of hydrogen. Thermal annealing modifies the sp² phase structure as hydrogen out diffuses.     

Growth of atomically step-free surface on diamond {111} mesas

Diamond homoepitaxy by microwave plasma-enhanced chemical vapor deposition was investigated on {111} substrate. Growth at a low CH₄/H₂ ratio of 0.025% in a gas phase results in the formation of an atomically step-free surface over 10 × 10-µm² mesas of diamond {111} substrate, when there are no screw dislocations in the mesas. This was achieved through ideal lateral growth, in which two-dimensional terrace nucleation was completely suppressed. The application of the selective formation of the step-free surface and the lateral growth of diamond films will open the way for the realization of high-quality electronic devices using diamond.     

Homoepitaxial diamond film with an atomically flat surface over a large area

Homoepitaxial diamond films with atomically flat surface were grown using the microwave plasma chemical vapor deposition method at a low CH₄ concentration of less than 0.05% in a CH₄ and H₂ mixed gas system. In Ib (001) diamond substrates having misorientation angles of 0.5°, atomic force microscope image on the surface of film grown at 0.025% CH₄ concentration showed that the films had atomically flat surface with mean roughness of 0.04 nm in area as large as 4×4 mm² (the whole region of the substrate).     

Low temperature and large area deposition of nanocrystalline diamond films with distributed antenna array microwave-plasma reactor

Diamond films grown at low temperature (< 400 °C) on large area of different substrates can open new applications based on the thermal, electrical and mechanical properties of diamond. In this paper, we present a new distributed antenna array PECVD system, with 16 microwave plasma sources arranged in a 2D matrix, which enables the growth of 4-inch nanocrystalline diamond films (NCD) at substrate temperature in the range of 300–500 °C. The effect of substrate temperature, gas pressure and CH₄ concentration in the total gas mixture of H₂/CH₄/CO₂ on the morphology and growth rate of the NCD films is reported. The total gas pressure is found to be a critical deposition parameter for which growth rates and crystalline quality both increasing with decreasing the pressure. Under optimized conditions, the process enables deposition of uniform (~ 10%) and high purity NCD films with very low surface roughness (5–10 nm), grain size of 10 to 20 nm at growth rates close to 40 nm/h. Nanotribology tests result in the friction coefficient of the NCD films close to that obtained for the standard tetrahedral amorphous carbon coatings (ta-C) indicating the suitability of this low-temperature diamond coating for mechanical applications such as bearing or micro-tools.