Electrical contacts to nitrogen incorporated nanocrystalline diamond films

The effect of surface plasma treatment on the nature of the electrical contact to the nitrogen incorporated nanocrystalline diamond (n-NCD) films is reported. Nitrogen incorporated NCD films were grown in a microwave plasma enhanced chemical vapor deposition (MPECVD) reactor using CH₄ (1%)/N₂ (20%)/Ar (79%) gas chemistry. Raman spectra of the films showed features at ∼ 1140 cm^− 1, 1350 cm^− 1(D-band) and 1560 cm^− 1(G-band) respectively with changes in the bonding configuration of G-band after the plasma treatment. Electrical contacts to both untreated and surface plasma treated films are formed by sputtering and patterning Ti/Au metal electrodes. Ohmic nature of these contacts on the untreated films has changed to non-ohmic type after the hydrogen plasma treatment. The linear current–voltage characteristics could not be obtained even after annealing the contacts. The nature of the electrical contacts to these films depends on the surface conditions and the presence of defects and sp² carbon.     

Characterization of nanocrystalline diamond films implanted with nitrogen ions

Nanocrystalline diamond films, prepared by a microwave plasma-enhanced CVD, were implanted using 110-keV nitrogen ions under fluence ranging from 10¹⁶–10¹⁷ ions cm⁻². AFM, XRD, XPS and Raman spectroscopy were used to analyze the changes in surface structure and chemical state of the films before and after implantation. Results show that high-fluence nitrogen ions implanted in the nanocrystalline diamond film cause a decline in diamond crystallinity and a swelling of the crystal lattice; the cubic-shaped diamond grains in the film transform into similar roundish-shaped grains due to the sputtering effect of implanted nitrogen ions. Nitrogen-ion implantation changes the surface chemical state of the nanocrystalline diamond film. After high-fluence implantation, the surface of the film is completely covered by a layer of oxygen-containing groups. This phenomenon plays an importance role in the reduction of the adhesive friction between an Al₂O₃ ball and the nanocrystalline diamond film.     

Synthesis of nanocrystalline diamond films using microwave plasma CVD

Diamond is one of the most valuable materials for the industrial applications because of its excellent properties including high hardness, with good electrical insulation and thermal conductivity. Mechanical polishing processes of diamond are difficult and very costly. To limit those costs, it is reasonable to think that the surface roughness of the as-grown diamond film should be as small as possible. In this study, a nanocrystalline diamond film was synthesized on a 4-inch Si wafer at 923 K and methane concentration of 10 vol.%, (H₂/CH₄=100/10 sccm) using a microwave plasma CVD system. In order to increase the nucleation density, the substrate was pretreated by dry scratch method with diamond powder of two sizes (250 nm and 5 nm). The nucleation density was approximately 1×10¹¹ cm⁻². The grown diamond films were analyzed by Raman spectroscopy and X-ray diffraction (XRD). The grain size was observed to be approximately 10 nm by FE-SEM observation. Surface roughness was measured as Rms=8.4 nm by atomic force microscope (AFM). The as-grown properties of those nanocrystalline diamond films were almost efficient for tribological and the optical applications.     

Wettability of nanocrystalline diamond films

The wettability of nanocrystalline CVD diamond films grown in a microwave plasma using Ar/CH₄/H₂ mixtures with tin melt (250–850 °C) and water was studied by the sessile-drop method. The films showed the highest contact angles θ of 168 ± 3° for tin among all carbon materials. The surface hydrogenation and oxidation allow tailoring of the θ value for water from 106 ± 3° (comparable to polymers) to 5° in a much wider range compared to microcrystalline diamond films. Doping with nitrogen by adding N₂ in plasma strongly affects the wetting presumably due to an increase of sp²-carbon fraction in the films and formation of C–N radicals.     

Investigation of nitrogen addition on hydrogen incorporation in CVD diamond films from polycrystalline to nanocrystalline

The effect of nitrogen addition in the gas phase on hydrogen impurity incorporation into CVD diamond films was investigated. A series of thick diamond films of different morphology and quality ranging from large-grained polycrystalline to fine-grained nanocrystalline were deposited on silicon wafers using a 5 kW microwave plasma assisted CVD system. They were obtained only by changing the small amount of oxygen and nitrogen addition while keeping all other input parameters the same. Bonded hydrogen impurity in these diamond films was studied by using Fourier-transform infrared spectroscopy. It was found that with increasing the amount of nitrogen addition in the gas phase, the produced diamond films from large-grained polycrystalline gradually shift to fine-grained nanocrystalline and their crystalline quality is drastically degraded, while the amount of incorporated hydrogen impurity in the diamond films increases sharply. The role of nitrogen additive on diamond growth and hydrogen incorporation is discussed. These results shed light into the growth mechanism of CVD diamond films ranging from polycrystalline to nanocrystalline, and the incorporation mechanism of hydrogen impurity in CVD diamonds.     

Gas sensing properties of nanocrystalline diamond films

Toxic gas sensing device with metal electrodes built into nanocrystalline diamond (NCD) is investigated. The NCD morphology is controlled via seeding and/or deposition time. The surface properties and morphology of NCD are studied using scanning electron microscopy (SEM) and atomic force microscopy (AFM). AFM measurements reveal increase in NCD surface area by up to 13%. Gas sensing properties of H-terminated NCD device show high sensitivity towards oxidizing species where the surface conductivity is increased by an order of magnitude for humid air and by three orders of magnitude for COCl₂. The surface conductivity exhibits a small decrease to reducing spices (CO₂, NH₃).     

Thermal analysis of submicron nanocrystalline diamond films

The thermal properties of sub-μm nanocrystalline diamond films in the range of 0.37–1.1 μm grown by hot filament CVD, initiated by bias enhanced nucleation on a nm-thin Si-nucleation layer on various substrates, have been characterized by scanning thermal microscopy. After coalescence, the films have been outgrown with a columnar grain structure. The results indicate that even in the sub-μm range, the average thermal conductivity of these NCD films approaches 400 W m^− 1 K^− 1. By patterning the films into membranes and step-like mesas, the lateral component and the vertical component of the thermal conductivity, k_lateral and k_vertical, have been isolated showing an anisotropy between vertical conduction along the columns, with k_vertical ≈ 1000 W m^− 1 K^− 1, and a weaker lateral conduction across the columns, with k_lateral ≈ 300 W m^− 1 K^− 1.     

AC behavior of intrinsic nanocrystalline diamond films

Nanocrystalline diamond was prepared by hot filament assisted chemical vapor deposition technique. The nanometer sized dimension of diamond grains was determined by X-ray line broadening. AC electrical response of deposits, constituted by well formed diamond grains, was studied by admittance spectroscopy at different temperatures. Grain boundary and grain surface were considered different regions able to influence differently the frequency dependent AC response. Observed variations in admittance spectra were attributed to a modification of the grain surface response as frequency and temperature rise. A semiconductor to metal-like transition was evidenced in admittance spectra increasing the frequency of applied signal at lower temperatures.     

Subgap photoluminescence spectroscopy of nanocrystalline diamond films

We report on the effect of ambient conditions and UV irradiation on the subgap photoluminescence of nanocrystalline diamond prepared by microwave plasma enhanced chemical vapour deposition. We measured the photoluminescence of self-supporting membranes of thickness about 290 nm with the grain size up to 40 nm under variable ambient conditions – pressure, temperature, air, nitrogen and helium atmospheres. We have found that intensity of photoluminescence of samples kept under low pressure increases during the time. The photoluminescence intensity of samples under low pressure depends on sample temperature with maximum at about 260 K. The photoluminescence increase can be enhanced substantially by UV irradiation (325 nm) of the sample under certain conditions: temperature greater than ~ 280 K, low pressure of ambient atmosphere. We interpret the experimental results in terms of desorption of water molecules and their interaction with the of individual diamond nanocrystals in the membrane.     

Biased enhanced growth of nanocrystalline diamond films by microwave plasma chemical vapor deposition

Smooth nanocrystalline diamond thin films with rms surface roughness of ∼17 nm were grown on silicon substrates at 600°C using biased enhanced growth (BEG) in microwave plasma chemical vapor deposition (MPCVD). The evidence of nanocrystallinity, smoothness and purity was obtained by characterizing the samples with a combination of Raman spectroscopy, X-ray diffraction (XRD), atomic force microscopy and Auger electron spectroscopy. The Raman spectra of the films exhibit an intense band near 1150 cm⁻¹ along with graphitic bands. The former Raman band indicates the presence of nanocrystalline diamond. XRD patterns of the films show broad peaks corresponding to inter-planar spacing of (111) and (220) planes of cubic diamond supporting the Raman results. Auger line shapes closely match with the line shape of diamond suggesting high concentration of sp³ carbon on the surfaces of the films. The growth of dominantly sp³ carbon by BEG in the MPCVD system at the conditions used in the present work can be explained by the subsurface implantation mechanism while considering some additional effects from the high concentration of atomic hydrogen in the system.     

Growth of nanocrystalline diamond films by biased enhanced microwave plasma chemical vapor deposition

Nanocrystalline diamond (NCD) films were grown using biased enhanced growth (BEG) in microwave plasma chemical vapor deposition on mirror polished silicon substrates at temperatures in the range from 400 to 700°C. The films were characterized by Raman spectroscopy, X-ray diffraction (XRD), Auger electron spectroscopy and atomic force microscopy (AFM). Hardness of the films was measured by nano-indentor. Apart from graphitic D and G bands in the films, the Raman spectra exhibit NCD features near 1140 cm⁻¹. The relative intensity of the NCD to graphitic G band in the Raman spectra of the films is negligible in the films grown at 400°C. It increases with temperature and attains a maximum at 600°C following a sharp decrease in the films grown at higher temperatures. XRD results also indicate a maximum concentration of NCD in the film grown at 600°C. Average hardness of the films increases with temperature from ∼5 GPa to ∼40 GPa up to 600°C followed by a decrease (∼24 GPa) in the film grown at 700°C. Substrate temperature seems to play a crucial role in the growth of NCD in BEG processes. An increase in growth temperature may be responsible for evolving bonded hydrogen and increasing mobility of carbon atoms. Both factors help in developing NCD in the films grown at 500 and 600°C with a combination of subplantation mechanism, due to biasing, and a high concentration of H atoms in the gas-phase, typical of CVD diamond process. At 700°C the implanted carbon atoms may be migrating back to the surface resulting in domination of surface processes in the growth, which in turn should result in increase in graphitic content of the films at such a high methane concentration and continuous biasing used in the present study.     

Characterization of crystalline diamond incorporated diamond-like carbon films

The purpose of this paper is to show the production and characterization of diamond-like carbon (DLC) films with incorporated crystalline diamond (CD), produced by plasma enhanced chemical vapor deposition. CD-DLC films were characterized by scanning electron microscopy, X-ray diffraction, atomic force microscopy and Raman scattering spectroscopy. Wetting contact angle, stress and friction coefficient were also evaluated. Our results demonstrated CD-DLC films are more hydrogenated and hydrophobic, with higher fiction coefficient. The stress values kept almost constantly.     

Effects of nitrogen addition on morphology and mechanical property of DC arc plasma jet CVD diamond films

Nitrogen-doped diamond films have been synthesized by 100 KW DC arc plasma jet chemical vapor deposition using a CH₄/Ar/H₂ gas mixture. The effect of nitrogen addition into the feed gases on the growth and surface morphology and mechanical property of diamond film was investigated. The reactant gas composition was determined by the gas flow rates. At a constant flow rate of hydrogen (5000 sccm) and methane (100 sccm), the nitrogen to carbon ratio (N/C) were varied from 0.06 to 0.68. The films were grown under a constant pressure (4 KPa) and a constant substrate temperature (1073 K). The deposited films were characterized by scanning electron microscopy, Raman spectroscopy and X-ray diffraction. The fracture strength of diamond films was tested by three point bending method. The results have shown that nitrogen addition to CH₄/H₂/Ar mixtures had led to a significant change of film morphology, growth rate, crystalline orientation, nucleation density and fracture strength for free-standing diamond films prepared by DC arc plasma jet.     

Influence of hydrogen on the residual stress in nanocrystalline diamond films

Nanocrystalline films were deposited by microwave-plasma CVD at a pressure of 200 mbar from an Ar/H₂/CH₄ plasma where the hydrogen fraction in the process gas was varied between 2 and 7%.Residual stress is a critical parameter in thin film deposition and especially important for technical applications of nanocrystalline diamond because high residual stress can lead to cracking or even to delamination of the film from the substrate. An ex-situ optical device was used to measure the residual stress of the substrate.It is shown that by controlling the process parameters the residual stress in the NCD films can be adjusted in a wide range even from compressive to tensile.The films were characterized by two wavelength scanning micro Raman spectroscopy and SEM.In this work a correlation is made between the intrinsic stress measurements and the Transpolyacetylene peaks (around 1120 cm^− 1 and 1450 cm^− 1) in the Raman spectra of NCD films. It is shown that the intensity and the FWHM of the peaks correlate with the tensile stress in the films. A model correlating the Raman spectra to the grain size and thus to the intrinsic stress measurements is given in this paper.     

Influence of the substrate nature on the properties of nanocrystalline diamond films

Nanocrystalline diamond/amorphous carbon (NCD/a-C) nanocomposite films have been deposited by microwave plasma CVD from CH₄/N₂ mixtures on a variety of substrates such as polycrystalline diamond, cubic boron nitride, silicon, titanium nitride, and Ti–6Al–4V. The study aimed to investigate the influence of the chemical nature of the substrate, the surface roughness, and the pretreatment of the substrate on the nucleation, the bulk structure, and the mechanical and tribological properties of the NCD/a-C films. The present paper is especially devoted to the bulk structure of the films. By means of X-ray diffraction (XRD), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) it is shown that the bulk properties of the films are not affected by the properties of the substrate although these have a strong influence on the nucleation behaviour. XRD measurements show that – irrespective of the substrate used – the films contain diamond nanocrystallites of 3–5 nm diameter. From the Raman spectra it can be inferred that the crystallite/matrix ratio does not vary. The XPS measurements, finally, show that there are no great changes in the sp²/sp³ ratio of the matrix. These findings are discussed in view of possible growth mechanisms of NCD/a-C nanocomposite films.     

Synthesis of nitrogen incorporated diamond-like carbon thin films using microwave surface-wave plasma CVD

Nitrogenated diamond-like (DLC:N) carbon thin films have been deposited by microwave surface wave plasma chemical vapor deposition on silicon and quartz substrates, using argon gas, camphor dissolved in ethyl alcohol composition and nitrogen as plasma source. The deposited DLC:N films were characterized for their chemical, optical, structural and electrical properties through X-ray photoelectron spectroscopy, UV/VIS/NIR spectroscopy, Raman spectroscopy, atomic force microscope and current–voltage characteristics. Optical band gap decreased (2.7 to 2.4 eV) with increasing Ar gas flow rate. The photovoltaic measurements of DLC:N / p-Si structure show that the open-circuit voltage (V_oc) of 168.8 mV and a short-circuit current density (J_sc) of 8.4 μA/cm² under light illumination (AM 1.5 100 mW/cm²). The energy conversion efficiency and fill factor were found to be 3.4 × 10^{− 4}% and 0.238 respectively.     

High compressive stress in nanocrystalline diamond films grown by microwave plasma chemical vapor deposition

Hard and smooth nanocrystalline diamond (NCD) thin films were deposited on mirror polished silicon substrates by biased enhanced growth in a microwave plasma chemical vapor deposition system. The films were characterized by Raman spectroscopy, X-ray diffraction and atomic force microscopy. Stress in the films was calculated by measuring the radius of curvature of the films on substrates and hardness was measured using a Nanoindenter. Stress in the films increases, first, with decreasing methane concentration in the gas phase while keeping biasing voltage constant, and second, with increasing biasing voltage while keeping the methane concentration constant. Observation of enormous stress (∼30 GPa) was possible in the films, which is due to strong adhesion between the films and substrates. To the best of our knowledge, this is the maximum value of stress reported so far in any kind of carbon thin films. It was hypothesized that it is mostly hydrogen content of the films in the methane series and graphitic content of the films in voltage series that are responsible in generating compressive stress in the respective films. The hardness follows almost a reverse trend than stress with the two growth parameters and can be well-defined from the relative concentration of NCD to graphitic content of the films, as estimated from Raman spectroscopy.     

Local boron environment in B-doped nanocrystalline diamond films

Thin films of heavily B-doped nanocrystalline diamond (B:NCD) have been investigated by a combination of high resolution annular dark field scanning transmission electron microscopy and spatially resolved electron energy-loss spectroscopy performed on a state-of-the-art aberration corrected instrument to determine the B concentration, distribution and the local B environment. Concentrations of ～1 to 3 at.% of boron are found to be embedded within individual grains. Even though most NCD grains are surrounded by a thin amorphous shell, elemental mapping of the B and C signal shows no preferential embedding of B in these amorphous shells or in grain boundaries between the NCD grains, in contrast with earlier work on more macroscopic superconducting polycrystalline B-doped diamond films. Detailed inspection of the fine structure of the boron K-edge and comparison with density functional theory calculated fine structure energy-loss near-edge structure signatures confirms that the B atoms present in the diamond grains are substitutional atoms embedded tetrahedrally into the diamond lattice.     

Effect of metallic seed layers on the properties of nanocrystalline diamond films

Three metallic films (Mo, Ti and W) were sputtered on Si substrates and ultrasonically seeded in diamond powder suspension. Nanocrystalline diamond (NCD) films were deposited using a dc arc plasma jet CVD system on the seeded metallic layers and, for comparison, a seeded Si without any metallic layer. The effect of metallic seed layers on the nucleation, microstructure, composition and mechanical properties of NCD films was investigated by atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), Raman spectroscopy and nanoindentation. We found that the metallic seed layers were transformed into metallic carbide or/and metallic silicide during the deposition of NCD films at high temperature. Adding metallic seed layers had no obvious effect on the bonding structure of the NCD films but significantly improved their surface roughness and mechanical properties. The NCD film deposited on W seed layer displays the lowest root-mean-square roughness of 19 nm while that on Ti seed layer has the highest compactness, hardness and elastic modulus.     

The effects of nitrogenation on the electrochemical properties of nanocrystalline diamond films

The effect of the nitrogenation on the electrochemical properties of nanocrystalline diamond films produced by microwave plasma CVD in CH₄–Ar–H₂–N₂ gas mixtures was studied systematically, using cyclic voltammetry and electrochemical impedance spectroscopy measurements, for the first time. Differential capacitance, kinetic parameters of reactions in [Fe(CN)₆]^3-/4-redox system and potential window were found to be sensitive to the nitrogen concentration in the process gas. With its increase (from 0 to 25%), a transition of the NCD film behavior from “poor conductor” to metal-like character takes place. The heavily N-doped nanocrystalline diamond films have satisfactory electrochemical properties to be used as electrodes.