Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

In situ tensile testing has been performed on thin gold film, 320 nm thick, deposited on polyimide substrates. During the tensile testing, strain/stress measurements have been carried out by X-ray diffraction using the d-sin²ψ method. The X-ray stress analysis suggests crack formation in the films for stresses greater than 670 MPa. The surface of the deformed specimen observed by atomic force microscopy (AFM) exhibits both cracks and two types of straight-sided buckling patterns lying perpendicular to the tensile axis. These buckling patterns can have a symmetrical or asymmetrical shape. The evolution of these two kinds of buckling structures under tensile stress has been observed in situ by AFM and compared to X-ray stress data. The results indicate that symmetrical straight-sided buckling patterns are induced by the compressive stress during unloading, whereas the asymmetrical result from the delamination of the film during the tensile deformation.     

Structural and morphological characterization of Pr and Er-containing SiO2-P2O5 sol-gel thin films

Present work is focused on obtaining and characterization of sol-gel thin films belonging to SiO₂-P₂O₅-Er₂O₃ (I) and SiO₂-P₂O₅-Pr₂O₃ (II) systems. The films have been obtained by spin coating technique for three rotation speeds: 2000, 3500 and 5000 rpm. The deposition of the films was performed at different periods of time, i.e. 24 h, 96 h, 120 h, 144 h and 168 h after instant preparation of the precursor sols. FTIR (Fourier transform infrared spectroscopy) and Raman characterization aimed at investigating the structural changes that occurred in silicophosphate network in dependence on the spin rate of the substrate as well as on the time period elapsed since the sol preparation till the deposition day. FTIR spectra recorded in the 400-4000 cm⁻¹ range revealed Si-O-Si, P-O-P and Si-O-P vibration modes and optical phonons specific for OH units. Raman spectra collected in the 100-4000 cm⁻¹ range put in evidence stretching, bending and mixed vibration modes specific for silicophosphate network as well as rare-earth ion peaks specific to certain electronic transitions. Morphological investigation made by AFM (atomic force microscopy) on Er and Pr-doped silicophosphate sol-gel films evidenced specific features depending on the parameters mentioned above and SEM (scanning electron microscopy) analysis revealed micron sphere structural units, exfoliation of the films and micro cracks.     

Electrodeposition of SmS optical thin films on ITO glass substrate

SmS optical thin films were deposited on the surface of ITO glass with an electrodeposition method using aqueous solution containing SmCl₃·6H₂O and Na₂S₂O₃·5H₂O. The phase composition was analyzed by X-ray diffraction (XRD) and microstructure of the film was characterized by atomic force microscope (AFM). It is showed that SmS thin film could be obtained in the solution with n(Sm)/n(S) = 1:4, pH = 4.0 and annealing in Ar atmosphere at 200 °C for 0.5 h. The as-prepared thin films on the ITO glass exhibit a dense microstructure. The band gap of the thin film has been found to be 3.6 eV.     

Nanomechanical properties of polymer thin films measured by force-distance curves

Force-displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates. Different film thicknesses, from 10 up to 430 nm, were chosen to examine in detail the so called “mechanical double-layer” topic, i.e., the influence of the substrate on the determination of the mechanical properties of thin films. Taking advantage of the Hertz theory we calculated for all films the contact radius between tip and sample as a function of the applied load. Further Young's modulus of the samples was derived from the experimental data as a function of the applied load and, alternatively, of the deformation. The results of this analysis for 10 different film thicknesses were fitted with several half empirical equations proposed by several researchers. The focus of this work is to evaluate such existing half empirical theories for mechanical double-layers and to show the need for an alternative consistent approach.     

Atomic force microscopy and X-ray photoelectron spectroscopy evaluation of adhesion and nanostructure of thin Cr films

Chromium (Cr) thin films were deposited on float glass using electron beam (e-beam) physical vapor deposition and radio frequency (RF) magnetron sputtering techniques. Surface morphology of these Cr films was studied using atomic force microscopy (AFM). The e-beam deposited Cr films consisted of isolated surface mounds while in RF sputtered samples, these mounds combined to form larger islands. Lower surface adhesive properties were observed for e-beam deposited films, as determined from AFM force-distance curves, presumably due to the nanostructural differences. Similar amounts of adsorbed atmospheric carbonaceous contaminants and water vapor were detected on samples deposited using both methods with e-beam deposited samples having additional carbide species, as determined by X-ray photoelectron spectroscopy data. The dominant crystallographic plane in both e-beam deposited and RF sputtered Cr thin films was (110) of body-centered cubic Cr metal structure as determined from X-ray diffraction data. Weak (211) reflection was also observed in RF sputtered samples and was attributed to a different thin Cr film condensation and growth mechanism which resulted in nanostructural differences between films deposited using two different methods.     

Ag and O ion irradiation induced improvement in dielectric properties of the Ba(Co1/3Nb2/3)O3 thin films

We present the preliminary results of temperature and frequency dependent dielectric measurements on Ba(Co_1/3Nb_2/3)O₃ (BCN) thin films. These films were prepared on indium tin oxide (ITO) coated glass substrates by the pulse laser deposition (PLD) technique. It exhibits single-phase hexagonal symmetry. These films were irradiated with Ag¹⁵⁺ (200 MeV) and O⁷⁺ (100 MeV) beams at the fluence 1 × 10¹¹, 1 × 10¹², and 1 × 10¹³ ions/cm². On irradiating these films, its dielectric constant (?′) and dielectric loss (tan δ) parameters improve compared to un-irradiated film. Compared to O⁷⁺ irradiation induced point/cluster defects Ag¹⁵⁺ induced columnar defects are more effective in reducing/pinning trapped charges within grains. The present paper highlights the role of swift heavy ion irradiation in engineering the dielectric properties of conductive samples to enable them to be useful for microwave device applications.     

A simple atomic force microscopy method for the visualization of polar and non-polar parts in thin organic films

Here we present a scanning probe microscopy method that allows for the identification of regions of different polarity (i.e. hydrophilicity) in thin organic films. This technique is based on the analysis of the difference between phase images generated at different applied bias voltages in tapping-mode atomic force microscopy. We show that, without any chemical modification of the microscope tip, it is possible to investigate surface properties of complex macromolecular layers, yielding new insight into the functional properties of the photosynthetic electron transport macromolecular complex, Photosystem I.     

Improvement of ultrathin polystyrene film stability by addition of poly(styrene-stat-chloromethylstyrene) copolymer: An atomic force microscopy study

A method to improve the stability of ultrathin polystyrene (PS) films on SiO_x/Si substrate is introduced. In this method, interfacial interactions between PS film and substrate are enhanced by addition of poly(styrene-stat-chloromethylstyrene(ClMS)) copolymer containing 5 mol% of ClMS group. The resulting slight structural modification of the copolymer does not cause phase separation in the polymer blend. On the other hand, the existence of polar ClMS groups provides anchoring sites on the polar SiO_x surface via dipolar interactions. In this study, ratios of the copolymers are varied from 0 to 40 wt.% in the thin films resulting in a systematic increase of the interfacial interactions. The dewetting behaviors of all films subjected to the same annealing conditions are explored via atomic force microscopy. The analyses of root mean square roughness and dewetting area as a function of annealing time and copolymer ratio provide information about the film stability. Our results indicate that blending small quantity of the copolymer with PS significantly increases the stability of ultrathin films.     

Poly(3,4-ethylenedioxythiophene)/poly(4-styrenesulfonate): Correlation between colloidal particles and thin films

We deal with correlation between sizes of colloidal particles and minimum thickness of spin-coated thin films of poly(3,4-ethylenedioxythiophene)/poly(4-styrenesulfonate) (PEDOT/PSS) studied by a dynamic light scattering (DLS), a scanning transmission electron microscopy coupled with an energy dispersive X-ray spectroscopy (STEM-EDX), C₆₀-sputtering X-ray photoelectron spectroscopy (XPS), and an atomic force microscopy. Based on the various measurements, it was pointed out that, PEDOT/PSS colloidal dispersion contained majority of primary nanoparticles with mean diameter of 41 nm and 16 nm for BAYTRON P AG (denote P grade) or BAYTRON PH500 (denote PH grade) solutions, respectively, and small amount of clusters aggregated by the primary particles, based on the DLS measurement and STEM observation. On the other hand, PEDOT/PSS thin films with thickness of 44 nm and 16 nm were easily prepared by spin-coating on silicon wafers from the P and PH grade solutions, respectively. Results of STEM-EDX, DLS, and XPS measurements suggested that the PEDOT/PSS thin films consist of the randomly packed primary nanoparticle-“monolayer”.     

Perpendicular orientation of cylindrical domains upon solvent annealing thin films of polystyrene-b-polylactide

Polystyrene-b-polylactide (PS-PLA) was employed as a precursor to nanoporous thin films containing perpendicular cylindrical channels. Cylinder-forming PS-PLA was spin coated onto Si substrate and solvent annealed using acetone, chlorobenzene and tetrahydrofuran (THF) for different durations. By atomic force microscopy, three types of final morphology were observed at the free surface of the films (PLA surface layer, perpendicular cylinders and parallel cylinders) depending on the type of solvent and annealing time. Well-organized perpendicular domains were obtained by annealing in THF. From this oriented PS-PLA annealed thin films, a mild hydrolysis led to a highly ordered array of perpendicularly-oriented cylindrical nanopores arranged on a hexagonal lattice, rendering the resulting nanoporous mask useful for nanopattern transfer processes. The weak resistance of the film/substrate interface during PLA etching was overcome by UV light exposure prior hydrolysis.     

On the correlation between morphology and electronic properties of copper phthalocyanine (CuPc) thin films

The morphology of vacuum deposited copper phthalocyanine (CuPc) thin films surface deposited on Si(111) have been studied using the contact mode Atomic Force Microscope (AFM). The influence of substrate temperature during deposition and of the post-deposition UHV annealing on surface roughness as well as on the average and maximum grain height was determined. The observed changes of surface morphology were in a good correlation with the shift of surface Fermi level position in the band gap after O₂ exposure determined in our recent photoemission studies.     

The influence of the additives composition and concentration on the properties of SnOx thin films used in photocatalysis

The aim of this study is to investigate the influence of different organic additives on the surface properties of SnO_x thin films used for photocatalytic degradation of methylene blue. The films were obtained by anodic oxidation of tin substrate in electrolyte solutions containing green additives based on hydrophobic and hydrophilic maleic anhydride copolymers. The hydrophobic copolymer leads to the formation of thin films with increased specific area which generates a larger interfacial area between the layers and the dye solution. The consequence is an improvement in the photocatalytic efficiency: up to 16% compared to less than 5% for samples electrodeposited without polymer. The hydrophilic copolymer presence in the electrolyte solution leads to higher grain size and lower surface energy which significantly reduce the photocatalytic properties of the layers. The use of copolymers can be a tool for enhancing the surface roughness and film's wettability and thus the photodegradation efficiency.     

Studies on chemically deposited CuInSe2 thin films

Nanocrystalline thin films of CuInSe₂ have been prepared by chemical bath deposition technique at temperatures below 60 °C. X-ray diffraction of the films confirmed the identity of CuInSe₂ and with largely broadened peaks indicated the nanocrystalline nature of the films. Images from scanning electron microscope represented spherical nanoparticles.     

Phase stabilization and microstructural studies of lead lanthanum titanate thin films

Thin ferroelectric films of PLTx (Pb_1−xLa_xTi_1−x/4O₃) have been prepared by a sol-gel spin coating process. As deposited films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various concentrations of La (x = 0.04, 0.08 and 0.12) on ITO coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out on films annealed at temperatures (350, 450, 550 and 650 °C). Characterization of these films by X-ray diffraction shows that the films annealed at 650 °C exhibit tetragonal phase with perovskite structure. Atomic force microscope (AFM) images are characterized by slight surface roughness with a uniform crack free, densely packed structure. Fourier transform infrared spectra (FTIR) studies of PLTx thin films (x = 0.08) deposited on Si substrates have been carried out to get more information about the phase stabilization.     

Conductive-atomic force microscopy study of local electron transport in nanostructured titanium nitride thin films

Simultaneous local current and topography measurements were made on the surface of titanium nitride thin films by conductive-atomic force microscopy (C-AFM). Two compositions, stoichiometric TiN and sub-stoichiometric TiN_0.76 were investigated. Local variation of current at grain and grain boundaries was examined. The current flow is filamentary in nature, with the number of percolation paths being smaller for sub-stoichiometric titanium nitride. Current-voltage characteristics of stoichiometric TiN reveal that the grain interiors are electrically conductive, while in sub-stoichiometric TiN_0.76 thin film, grains are electrically resistive, i.e., a potential barrier to electron transport exists at the junction between the grain and the grain boundary in sub-stoichiometric TiN_0.76. Therefore, electron transport in this film is due to tunneling through the junction, which leads to increased resistivity. The total resistance of the samples measured using the four probe technique is 1 and 400 kΩ for TiN and TiN_0.76 respectively. In both type of compounds the grain and grain boundary resistances are of the order of MΩ. The grain and grain boundaries are connected in a manner that causes the total resistivity to be lower than the local resistivity.     

Formation and properties of surface-anchored amine-terminated poly(dimethylsiloxane) assemblies with tunable physico-chemical characteristics

Surface-anchored amine-terminated poly(dimethysiloxane) (PDMS) assemblies with tunable physico-chemical characteristics were fabricated with a simple two-step procedure. Firstly, 3-glycidoxypropylmethyldimethoxysilane (GPDMS) molecules were self-assembled on silicon surface, and then coupled to PDMS through a surface ring-opening reaction. The structure and morphology of the amine-terminated PDMS assemblies were characterized with various techniques such as ellipsometry, contact angle goniometer, grazing angle attenuated total reflectance-Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and atomic force microscopy. The GPDMS monolayers were truly monomolecular films with a virtually normal molecular orientation of densely packed molecules, which were firmly tethered to the hydroxylated silicon substrate. Self-assembly of PDMS molecules resulted in the formation of homogeneous films ~ 6.3 nm thick with the surface roughness ~ 0.898 nm. The calculation of grafting parameters from experimental measurements indicated that the presence of homogeneous and densely grafted PDMS films allowed us to predict a “brushlike” regime for the polymer chains in good solvents.     

Effect of thermal stress on magnetic domain patterns of multiferroic Bi1-xDyxFeO3 thin films

Effect of temperature on magnetic domain structure of Bi_0.7Dy_0.3FeO₃ (BDFO) multiferroic thin films is studied in situ using magnetic force microscopy (MFM). Initially, as the temperature increases the domains start aligning from irregular to more distinct stripe pattern. However, above 250 °C, the domain alignment is disturbed. The systematic change in the domain configuration with temperature, suggests a strong thermal history of the system. The randomness in domain alignment caused above 250 °C is correlated to internal stress developed during ferromagnetic to paramagnetic phase transition occurring in BDFO. Indirect experimental evidence is given to support the explanation based on stress.     

Spectroscopic ellipsometry investigations of the optical properties of manganese doped bismuth vanadate thin films

The optical properties of Bi₂V_1−xMn_xO_5.5−x {x = 0.05, 0.1, 0.15 and 0.2 at.%} thin films fabricated by pulsed laser deposition on platinized silicon substrates were studied in UV-visible spectral region (1.51-4.17 eV) using spectroscopic ellipsometry. The optical constants and thicknesses of these films have been obtained by fitting the ellipsometric data (Ψ and Δ) using a multilayer four-phase model system and a relaxed Lorentz oscillator dispersion relation. The surface roughness and film thickness obtained by spectroscopic ellipsometry were found to be consistent with the results obtained by atomic force and scanning electron microscopy. The refractive index measured at 650 nm does not show any marginal increase with Mn content. Further, the extinction coefficient does not show much decrease with increasing Mn content. An increase in optical band gap energy from 2.52 to 2.77 eV with increasing Mn content from x = 0.05 to 0.15 was attributed to the increase in oxygen ion vacancy disorder.     

Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-diyl): Fullerene heterostructures detected by Kelvin force microscopy

Thin blend polymer films made of poly(3-hexylthiophene-2,5-diyl) (electron donor) and fullerene derivatives as electron acceptors ([6,6]-thienylC61 butyric acid methyl ester and [6,6]-thienylC71 butyric acid methyl ester) are prepared by the spin-coating technique on indium tin oxide covered glass substrates. Time-resolved photo-induced changes of surface potentials are detected by Kelvin force microscopy (KFM). Changes of surface potentials by 10-150 mV reveal different quality and kinetics of charge generation in the two blends in short (minutes) and long (hours) time periods. This is attributed to a combination of electron accumulation, trapping, and organic material degradation under ambient conditions. As KFM characterizes the blend films directly without metal contact layer, it reveals differences in the opto-electronic behavior of the blends, which are not detected by common photovoltaic cell characterization.     

Poly (3,4-ethylenedioxythiophene) (PEDOT) and poly (3,4-ethylenedioxythiophene)-few walled carbon nanotube (PEDOT-FWCNT) nanocomposite based thin films for Schottky diode application

Transparent, conductive films of poly (3,4-ethylenedioxythiophene) (PEDOT) and poly (3,4-ethylenedioxythiophene)-few walled carbon nanotube (PEDOT-FWCNT) nanocomposite were synthesized by in-situ oxidative polymerization and investigated for their Schottky diode property. The prepared films were characterized by UV–Vis spectroscopy, thermal gravimetric analysis (TGA), surface resistivity, cyclic voltametery, scanning electron microscopy (SEM) and high resolution transmission electron microscopy (HRTEM). SEM reveals the formation of homogeneous and adhesive polymer films while HRTEM confirms the uniform wrapping of polymer chains around the nanotube walls for PEDOT-FWCNT film. Improved thermal stability, conductivity and charge storage property of PEDOT in the presence of FWCNT is observed. Among different compositions, 5 wt. % of FWCNT is found to be optimum with sheet resistance and transmittance of 500 Ω sq⁻¹ and 77%, respectively. Moreover, the electronic and junction properties of polymer films were studied and compared by fabricating sandwich type devices with a configuration of Al/PEDOT or PEDOT-FWCNT nanocomposite/indium tin oxide (ITO) coated glass. The measured current density-voltage characteristics show typical rectifying behavior for both configurations. However, enhanced rectification ratio and higher forward current density is observed in case of PEDOT-FWCNT based Schottky diode. Furthermore, reliability test depicts smaller hysteresis effect and better performance of PEDOT-FWCNT based diodes.