共查询到18条相似文献,搜索用时 62 毫秒
1.
全球电子封装行业的无铅化趋势,使得镀层锡晶须自发生长的问题变得十分突出。由于晶须的导电性可以引起高密度封装引脚之间短路,从而使电子产品失效甚至引发灾难性的事故,因此研究并阐明锡晶须生长机理、探索有效抑制锡晶须生长的手段、寻找合适的锡晶须生长加速实验方法评估电子产品的可靠性,成为当前亟需解决的问题。本文从锡晶须问题的由来,锡晶须的危害、锡晶须生长的机理、影响锡晶须生长的因素、抑制锡晶须生长的方法和锡晶须生长加速实验方法等几个方面,对锡晶须问题尤其是近年来这方面的研究进展作一简要评述,并提出一些需要研究的课题。 相似文献
2.
3.
随着公众环保意识的增强,含铅焊料的发展和应用受到了极大的限制,研制新型的、环境友好的无铅焊料来取代传统的锡铅焊料成为近年来研究的热点,而添加微量元素合金化以获得性能优异的无铅焊料尤其受到研究者的关注。本文系统地综述了添加微量稀土元素对无铅焊料物理化学性能、显微组织、力学性能、电迁移及锡晶须生长等的影响,并对稀土元素在无铅焊料中的应用及发展趋势进行了展望。 相似文献
4.
5.
6.
7.
8.
9.
介绍了无铅焊接技术的现状以及国内外对Sn-Ag和Sn-Zn等二元无铅焊料的研究成果,以及无铅焊接的几种常见技术. 相似文献
10.
周婕 《中国新技术新产品》2009,(21):142-143
无铅技术已经成为电子行业的首选,但是由于其发展时间相对较短,可靠性仍需验证。军工企业出于可靠性的考虑,仍旧采用有铅焊接技术,但是在实际生产过程中却不可避免的越来越多的遇到无铅器件,本文介绍无铅物料的管理和有铅工艺与无铅器件混用的相应预防和解决方案。 相似文献
11.
A kinetic model based on the principle of maximum degradation rate of the total system free energy, MDR law using thermodynamic data, is proposed and successfully applied to the selection of the first intermetallic compound (IMC) phase in Cu/Sn and Ni/Sn diffusion couples. The first phases predicted with this model for Cu/Sn and Ni/Sn are Cu6Sn5 and Ni3Sn4, respectively, resulting in good agreement with experimental observations. 相似文献
12.
无铅焊料Sn-3.8Ag-0.7Cu的低周疲劳行为 总被引:2,自引:0,他引:2
测量了Sn-3.8Ag-0.7Cu无铅焊料试样的循环滞后回线、循环应力响应曲线、循环应力-应变和应变寿命关系,研究了焊料在总应变幅控制下的低周疲劳行为结果表明:该焊料合金在总应变幅较高(1%)时发生连续的循环软化,而在总应变幅较低(≤0.4%)时则表现为循环稳定.线性回归分析表明,该焊料的低周疲劳寿命满足Coffin-Manson经验关系式,由此给出了焊料在室温下的低周疲劳参数.采用扫描电镜观测和分析了焊料在疲劳前后的组织特征. 相似文献
13.
The coupling effect of both minor alloying addition and reducing the amount of Zn phase have been proposed as an important strategy to improve the integrity and reliability of eutectic Sn–9Zn solder joints. In this work, the changes in microstructures, thermal behaviors and mechanical properties associated with the alloying of Ni and Sb to eutectic Sn–Zn after reducing the amount of Zn phase were explored. Thermal analysis confirmed that Ni and Sb additions being effective in reducing the amount of undercooling, while the melting temperature and pasty range remained at the hypoeutectic Sn–6.5Zn level. The resulting ultimate (UTS), yield tensile strength (YS) and elongation (El) of Sn–6.5Zn–0.5Ni and Sn–6.5Zn–0.5Sb alloys were experimentally determined and compared with the corresponding results of plain Sn–6.5Zn solder alloy. It was found that the Sn–6.5Zn–0.5Ni and Sn–6.5Zn–0.5Sb alloys examined comply with the compromise between high mechanical strength and ductility. Microstructural analysis revealed that the origin of change in mechanical properties was attributed to the enhanced solid solution effect of Sb and the flower shaped (Ni, Zn)3Sn4 intermetallics (IMC) phase produced by Ni addition. The Sn–6.5Zn–0.5Sb alloy has the highest UTS and appropriate ductility of all alloys examined. This finding indicates the capability of newly developed ternary solder alloys to serve a much wider array of value-added applications. 相似文献
14.
15.
Peng Xue Song-bai Xue Yi-fu Shen Hong Zhu 《Journal of Materials Science: Materials in Electronics》2014,25(6):2671-2675
The effect of Nd and Ga additions on Sn whisker growth inhibition in Sn–9Zn solder is newly reported in this work. After ageing treatment at room temperature and 125 °C for over 4 months, no Sn whisker growth was observed in the joints soldered with Sn–9Zn–0.5 Ga–0.08Nd and Sn–9Zn–0.5 Ga–1Nd solders. XRD analysis shows that the formation of GaNd and GaNd3 compounds instead of SnNd compound is the key factor. Because the Gibbs formation free energies of GaNd and GaNd3 are more negative than that of SnNd, the GaNd and GaNd3 compounds are relatively more stable, no free Sn atoms released during exposure and oxidizing reaction to feed the Sn whisker growth. EDX analysis was also identified that the formation of Ga–Nd compounds substituted for the Sn–Nd IMC is the main factor that inhibited the spontaneous growth of Sn whisker. 相似文献
16.
David J. Klinger 《Quality and Reliability Engineering International》1991,7(5):365-370
Failure mechanisms associated with the effects of humidity on plastic packaged devices are briefly reviewed. Relevant experimental and theoretical work on these failure mechanisms is then considered, pointing to an incomplete understanding as to why relative humidity is the appropriate variable, along with temperature to use in acceleration factor models. The BET equation (Brunauer, Emmett and Teller), is invoked to provide a theoretical underpinning to the use of relative humidity in such acceleration factor models. The BET equation provides such a connection by relating surface concentration of water to vapour pressure of water. Using the BET equation as a starting point, we derive a relation between surface concentration of water and relative humidity that has no explicit temperature dependence. We then consider a simple kinetic model for a corrosion reaction leading to failure. The result is an acceleration factor that is a typical Arrhenius form, multiplied by a simple function of relative humidity. This form is similar to other power-law acceleration factor models that have been developed empirically. Now a physical derivation is offered as a theoretical basis for power-law models of the effects of humidity on plastic packaged device reliability. 相似文献
17.
为解决Sn-Bi焊料在焊接时容易产生凝固偏析、降低焊点力学性能的问题,采用对焊点进行时效处理的方法来消除Bi的粗化结晶,从而增强焊料的机械性能.研究表明,焊点在125℃时效处理16 h,粗大块状的Bi全部消融,呈颗粒状均匀分布,焊料中的Sn与焊盘上的Cu生成一层厚度约为3μm的Cu6Sn5金属间化合物,使焊点的剪切强度由40 MPa升高到54 MPa.研究还发现,时效处理后的焊点在100℃下长时间放置,微观组织不再发生变化,说明时效处理提高了焊料基体的抗热性能,因此,可以将125℃/16 h的时效处理作为表面贴装生产工艺流程的一道必要工序,使Sn-Bi焊料真正满足实用要求. 相似文献