Intermetallic Compounds Formed in Sn-20In-2.8Ag Solder BGA Packages with Ag/Cu Pads

The interfacial reactions in a Sn-20In-2.8Ag solder ball grid array (BGA) package with immersion Ag surface finish are investigated. After reflow, the Ag thin film dissolves quickly into the solder matrix, and scallop-shaped intermetallic layers, with compositions of (Cu_0.98Ag_0.02)₆(In_0.59Sn_0.41)₅, appear at the interfaces between Sn-20In-2.8Ag solder ball and Cu pad. No evident growth of the (Cu_0.98Ag_0.02)₆(Sn_0.59In_0.41)₅ intermetallic compounds was observed after prolonged aging at 100 °C. However, the growth accelerated at 150 °C, with more intermetallic scallops floating into the solder matrix. The intermetallic thickness versus the square root of reaction time (t ^1/2) shows a linear relation, indicating that the growth of intermetallic compounds is diffusion-controlled. Ball shear tests show that the strength of Sn-20In-2.8Ag solder joints after reflow is 4.4 N, which increases to 5.18 N and 5.14 N after aging at 100 and 150 °C, respectively.     

石墨烯纳米片对Sn-58Bi钎料显微组织和性能的影响

文中通过粉末冶金法在Sn-58Bi钎料中添加不同质量分数的石墨烯纳米片（GNSs）,以分析GNSs含量对Sn-58Bi钎料显微组织和性能的影响.结果表明,添加GNSs,对Sn-58Bi钎料熔点无明显影响;随着GNSs添加量提高,Sn-58Bi钎料的密度和显微维氏硬度先升高后降低;通过对比添加质量分数为0.05%的GNSs前后Sn-58Bi钎料/铜基板钎焊接头抗剪强度发现,添加GNSs后,由于能够起到细晶强化和弥散强化两方面作用,从而使钎焊接头抗剪切断裂能力提高.     

Cu/Sn-58Bi/Cu焊点电迁移行为研究

采用双辊快速凝固技术制备了Sn-58Bi钎料薄带,并制备Cu/Sn-58Bi/Cu线性焊点。使用电子探针(EPMA)及能谱分析(EDS)研究焊点在电流密度为1×10^4 A/cm^2(25℃)下界面金属间化合物(IMC)、元素扩散与钎料基体组织演变规律。结果表明,随着通电时间延长阳极界面处的IMC层的形状从扇贝状转变为锯齿状,阴极界面处的IMC层由扇贝形变为不规则,其厚度逐渐增加。阳极由于Bi的偏聚形成了富Bi层,Sn在阴极偏聚,基体共晶组织(Bi+β-Sn)粗化。基于线性拟合可知,阳极和阴极的界面IMC层的生长系数n分别为0.263和0.442,其生长机制可归结为体积扩散。     

含碳纳米管的Sn-58Bi钎料的制备及其钎焊性

采用球磨—低温冶炼法制备了不同碳纳米管含量的Sn-58B i-CNTs钎料,借助SEM,EDS和DSC等分析手段研究了碳纳米管在钎料合金中的形态以及碳纳米管对Sn-58B i合金焊点拉脱强度的影响.结果表明,经过钎料低温冶炼后,碳纳米管能够部分加入到Sn-58B i合金中形成复合钎料;Sn-58B i-0.03%CNTs复合钎料在焊盘上的润湿性得到了提高,且微量碳纳米管的加入对钎料熔点的影响不大;碳纳米管在焊点中弥散分布使钎料的组织得到细化,并通过对焊点微观断裂机制的影响,提高焊点的可靠性.     

凝固条件和应变速率对Sn-58Bi钎料拉伸性能和断裂行为的影响

研究了熔炼制备的Sn-58Bi无铅钎料于水冷、空冷、炉冷三种方式冷却后在应变速率0.001,0.002,0.004 s−1下的拉伸性能和断裂行为. 结果表明,水冷和空冷钎料共晶组织细小,尤其是空冷钎料共晶组织更为均匀,而炉冷钎料共晶组织粗大且偏析严重. 随着应变速率增大,三种钎料抗拉强度均提高而断后伸长率均变小. 炉冷钎料组织偏析导致硬脆富Bi相聚集,抗拉强度最大,但断后伸长率极低,为典型的脆性断裂;水冷和空冷钎料的均细共晶组织显著提高了钎料断后伸长率,具有更均匀共晶组织的空冷钎料断后伸长率最大,呈现韧性或韧脆性混合断裂.     

Cu/Sn-58Bi-xEr2O3/Cu钎焊接头微观组织和力学性能的研究

研究了不同含量的纳米Er2O3颗粒对Sn-58Bi钎料的铺展性能、钎焊接头微观组织和力学性能的影响。结果表明,添加微量的纳米Er2O3颗粒细化了Sn-58Bi钎料的微观组织、改善了Sn-58Bi钎料的铺展性能和力学性能。当纳米Er2O3颗粒的添加量为0.075%(质量分数)时,Sn-58Bi复合钎料得到了最佳的铺展性能, 比Sn-58Bi钎料的铺展系数增大了5.1%;当添加量为0.05%(质量分数)时,Sn-58Bi钎料的组织明显细化且到了最大的抗拉强度89 MPa,比Sn-58Bi共晶钎料的抗拉强度增大了11.5%。     

Interfacial Reactions and Bonding Strength of Sn-xAg-0.5Cu/Ni BGA Solder Joints

The present study details the microstructure evolution of the interfacial intermetallic compounds (IMCs) layer formed between the Sn-xAg-0.5Cu (x = 1, 3, and 4 wt.%) solder balls and electroless Ni-P layer, and their bond strength variation during aging. The interfacial IMCs layer in the as-reflowed specimens was only (Cu,Ni)₆Sn₅ for Sn-xAg-0.5Cu solders. The (Ni,Cu)₃Sn₄ IMCs layer formed when Sn-4Ag-0.5Cu and Sn-3Ag-0.5Cu solders were used as aging time increased. However, only (Cu,Ni)₆Sn₅ IMCs formed in Sn-1Ag-0.5Cu solders, when the aging time was extended beyond 1500 h. Two factors are expected to influence bond strength and fracture modes. One of the factors is that the interfacial (Ni,Cu)₃Sn₄ IMCs formed at the interface and the fact that fracture occurs along the interface. The other factor is Ag₃Sn IMCs coarsening in the solder matrix, and fracture reveals the ductility of the solder balls. The above analysis indicates that during aging, the formation of interfacial (Ni,Cu)₃Sn₄ IMCs layers strongly influences the pull strength and the fracture behavior of a solder joint. This fact demonstrates that interfacial layers are key to understanding the changes in bonding strength. Additionally, comparison of the bond strength with various Sn-Ag-Cu lead-free solders for various Ag contents show that the Sn-1Ag-0.5Cu solder joint is not sensitive to extended aging time.     

热循环对Sn-58Bi-xCNTs/Cu钎焊接头微观组织与力学性能的影响

研究了热循环对Cu/Sn-58Bi/Cu和Cu/Sn-58Bi-0.03CNTs/Cu接头的微观组织、界面金属间化合物(Intermetallic Compound,IMC)形貌、厚度变化及焊点抗拉强度和拉伸断口形貌的影响规律。结果表明,随着热循环周次的增加,钎料微观组织均出现了粗化现象,且在同一热循环条件下,Cu/Sn-58Bi-0.03CNTs/Cu接头组织较为细小;焊点界面IMC层厚度均随热循环周次的增加而出现不断增厚的趋势,且石墨化多壁碳纳米管(CNTs)颗粒增强Sn-58Bi复合钎料焊点界面IMC层长大的趋势较为缓慢;热循环周次增加,接头的抗拉强度均呈现下降趋势;热循环处理后的Cu/Sn-58Bi/Cu焊点和Sn-58Bi-0.03CNTs/Cu焊点拉伸断口形貌主要由韧窝和少量解理面组成,Cu/Sn-58Bi/Cu焊点的断裂机制从韧性断裂转变为韧-脆混合断裂模式,Sn-58Bi-0.03CNTs/Cu焊点的断裂机制均为韧性断裂。     

石墨烯纳米片增强的Sn-58Bi/Cu焊点可靠性

将不同含量（0%,0.025%,0.05%,0.075%,0.1%,0.2%,质量分数）的石墨烯纳米片（GNSs）添加到Sn-58Bi低温钎料中,研究了GNSs对钎料熔化温度、润湿性能、剪切强度、显微组织和界面反应的影响。结果表明：添加GNSs可以改善Sn-58Bi钎料焊点的润湿性能和抗剪切强度,但对其熔化温度的影响较小。随着GNSs的添加,钎料得到了相对细化的显微组织,界面金属间化合物（IMC）的厚度明显降低,并逐渐趋于平整。另外,随着GNSs的加入,Sn-58Bi钎料的剪切断裂模式从脆性断裂转变为脆性和韧性混合的断裂模式,这与其抗剪切强度的变化是一致的。因此,添加微量的GNSs是增强Sn-58Bi/Cu焊点可靠性的有效途径。     

激光重熔PBGA钎料球与Au/Ni/Cu焊盘的界面反应

研究了塑料球栅阵列（PBGA）钎料球重熔过程中钎料与Au/Ni/Cu焊接之间的界面反应，结果表明：界面处金属间化合物的生成与激光输入量能密切相关，当激光输入能量较小时，焊盘上的Au没有完全溶解到钎料中，界面处存在一层连续的AuSn2和一些垂直或斜向生长到钎料中的针状AuSn4化合物，增大激光输入能量，Au完全溶解到钎料中，界而处连续的AuSn2化合物层全部转化为针状AuSn4相，有部分AuSn4针从界面处折断并落入钎料中，当激光功率为18W，激光加热时间为400ms时，AuSn4相在界面处消失，以细小颗粒弥散分布在钎料内部。     

Cu基板退火处理的Cu/Sn58Bi/Cu钎焊接头界面微结构

研究了铜基板退火处理对Cu/Sn58Bi界面微结构的影响. 结果表明,在回流以及时效24 h后Cu/Sn58Bi/Cu界面只观察到Cu₆Sn₅. 随着时效时间的增加,在界面形成了Cu₆Sn₅和Cu₃Sn的双金属间化合物(IMC)层,并且IMC层厚度也随之增加. 长时间时效过程中,在未退火处理的铜基板界面产生了较多铋偏析,而在退火处理的铜基板界面较少产生铋偏析. 比较退火处理以及未退火处理的铜基板与钎料界面IMC层生长速率常数,发现铜基板退火处理能减缓IMC层生长,主要归因于对铜基板进行退火处理能够有效的消除铜基板的内应力与组织缺陷,从而减缓Cu原子的扩散,起到减缓IMC生长的作用.     

热-剪切循环条件下Sn-3．5Ag-0．5Cu／Cu（Ni）界面化合物生长行为研究

对热-剪切循环条件下Sn-3．5Ag-0．5Cu钎料在Cu和Ni界面上原子扩散和化合物的生长行为进行了研究。结果表明：再流焊后，在Sn-3．5Ag-0．5Cu／Ni界面上形成（CuxNi1-x）6Sn5化合物；热-剪切循环200周次后，（NixCu1-x）Sn3化合物在（CuxNi1-x）6Sn5化合物周围以片状快速长大；而Sn-3．5Ag-0．5Cu／Cu界面从钎焊到热-剪切循环720周次始终只存在Cu6Sn5金属化合物层。随着热-剪切循环周数的增加，（CuxNi1-x）6Sn5和Cu6Sn5化合物形态均从笋状向平面状生长。界面金属间化合物的厚度随循环周数的增加而增加，且生长基本遵循抛物线规律，说明Cu原子的扩散控制了（CuxNi1-x）6Sns和Cu6Sn5化合物的生长。     

Sn-6.5Zn/Cu焊点时效过程中的界面特征与结构演变

研究150°C等温时效对Sn-6.5Zn/Cu焊点微观结构特征与显微硬度的影响,分析界面金属间化合物的形成与演变机制。结果表明：Sn-6.5Zn/Cu焊点界面化合物层由CuZn和Cu5Zn8组成;随着等温时效时间的延长,化合物层的厚度表现为先增大、后减小的趋势;长时间的高温时效会导致Cu-Zn金属间化合物的分解,并破坏界面连续致密的化合物层。在局部破坏的界面区Cu基体处形成不连续的Cu6Sn5化合物层;时效后界面粗化并形成明显的孔洞。时效导致界面显微硬度不同程度的增大。     

Bi掺杂对Sn-3.0Ag-0.5Cu钎料电化学腐蚀性能及枝晶生长的影响

采用动电位扫描和交流阻抗等方法研究Bi掺杂对Sn-3.0Ag-0.5Cu钎料在3.5%NaCl(质量分数)溶液中电化学腐蚀性能及枝晶生长的影响;采用SEM和XRD技术分析其腐蚀形貌及成分。结果显示:随着Bi含量增加,腐蚀电流密度增大,但自腐蚀电位不呈规律性变化。阻抗谱显示:掺杂前后阻抗谱特征相同,均可用两个时间常数的等效电路模型表示,其拟合误差<5%。随着Bi含量的增加,容抗弧半径减小,电荷传递电阻和腐蚀产物膜电阻均减小,耐蚀性能降低。SEM像显示,Bi掺杂对钎料在介质中电化学迁移速度有减缓作用,因而对迁移所致的枝晶生长具有抑制作用。XRD谱显示,枝晶主要成分为Sn和Cu6Sn5,同时伴有少量的Bi和Ag3Sn。     

SnPb钎料与Au/Ni/Cu焊盘反应过程中Au的分布

采用熔融的共晶锡铅钎料熔滴与Au/Ni/Cu焊盘瞬时接触液固反应形成钎料凸点,随后进行再流焊及老化.对这一过程中的钎料/焊盘界面金属间化合物组织的演化,尤其是Au-Sn化合物的形成及分布进行了研究.结果表明,钎料熔滴与焊盘液固反应形成了Au-Sn界面化合物,铜层未完全反应.在随后的再流焊过程中,界面处的铜层完全消耗掉,镍层与钎料反应形成Ni3Sn4界面组织;针状的AuSn4化合物分布于钎料基体中.老化条件下分布于钎料基体中的AuSn4重新在界面沉积,在Ni3Sn4层上形成(AuxNi1-x)Sn4层.(AuxNi1-x)Sn4在界面的沉积遵循分解扩散机制,并促进富铅相的形成.钎料与焊盘反应过程中Au-Sn化合物的演化及分布直接影响钎料与焊盘的连接强度.     

SnAgCu/Cu和SnAgCu/Au/Ni/Cu表面贴装元件焊点高温存贮试验分析

研究了SnAgCu／Cu及SnAgCu／Au／Ni／Cu表面贴装元件焊点在高温存贮试验条件下抗剪强度的变化规律。结果表明，SnAgCu／Cu及SnAgCu／Au／Ni／Cu焊点抗剪强度随保温时间的延长降低，SnAgCu／Cu焊点的抗剪强度高于SnAgCu／Au／Ni／Cu焊点的抗剪强度。SnAgCu／Cu及SnAgCu／Au／Ni／Cu焊点的断口形貌分析表明，断裂大多数都发生在贴装元件端头金属化层内，少数发生在钎料与焊盘的界面以及焊点内部。     

Interfacial reactions and mechanical properties between Sn-4.0Ag-0.5Cu and Sn-4.0Ag-0.5Cu-0.05Ni-0.01Ge lead-free solders with the Au/Ni/Cu substrate

Sn-4.0Ag-0.5Cu (SAC) and Sn-4.0Ag-0.5Cu-0.05Ni-0.01Ge (SACNG) lead-free solders reacting with the Au/Ni/Cu multi-layer substrate were investigated in this study. All reaction couples were reflowed at 240 and 255 °C for a few minutes and then aged at 150 °C for 100-500 h. The (Cu, Ni, Au)₆Sn₅ phase was formed by reflowing for 3 min at the interface. If the reflowing time was increased to 10 min, both (Cu, Ni, Au)₆Sn₅ and (Ni, Cu, Au)₃Sn₄ phases formed at the interface. The AuSn₄ phase was found in the solder for all reaction couples. An addition of Ni and Ge to the solder does not significantly affect the IMC formation. After a long period of heat-treatment, the thickness of the (Cu, Ni, Au)₆Sn₅ and (Ni, Cu, Au)₃Sn₄ phases increased and the intermetallic compounds (IMCs) growth mechanism obeyed the parabolic law and the IMC growth mechanism was diffusion-controlled. The mechanical strengths for both the soldered joints decreased with increasing thermal aging time. The SACNG/Au/Ni/Cu couple had better mechanical strength than that in the SAC/Au/Ni/Cu couple.     

电迁移促进Cu/Sn-58Bi/Cu焊点阳极界面Bi层形成的机理分析

研究了Cu/Sn-58Bi/Cu对接接头焊点在电流密度为5×103～1.2×104A/cm2条件下钎料基体中阳极界面Bi层的形成机理.电迁移过程中,Bi元素为主要的扩散迁移元素,在电迁移力的作用下由阴极向阳极进行迁移.由于Bi原子的扩散迁移速度比Sn原子要快,促使Bi原子首先到达阳极界面.大量的Bi原子聚集在阳极界面时,形成了压应力,迫使Sn原子向阴极进行迁移,于是在阳极界面处形成了连续的Bi层.阴极处由于金属原子的离去,形成了拉应力,导致了空洞和裂纹在界面处的形成.Bi层的形态主要分为平坦的Bi层和带有凹槽的Bi层.Bi原子进行扩散迁移的通道有三种:Bi晶界、Sn晶界和Sn/Bi界面.随着电流密度和通电时间的增加,Bi层的厚度逐渐增加.电迁移力和焦耳热的产生成为Bi原子扩散迁移的主要驱动力.     

Fe粉对Sn-3Ag-0.5Cu复合钎料组织及性能的影响

通过在钎料中添加Fe粉颗粒,研究其对Sn-3Ag-0.5Cu复合无铅钎料的黏度、熔点、钎焊接头界面微观组织、与Cu基板之间的润湿性及焊点力学性能的影响。结果表明:微米级Fe粉的添加增加了复合钎料焊膏单位体积内焊粉的接触面积,使得焊膏内摩擦力增大,导致复合钎料焊膏的黏度增加;微米级Fe粉的添加对Sn-3Ag-0.5Cu钎料的熔化特性没有显著影响;钎焊时,由于重力偏聚及界面吸附作用,Fe粉颗粒集中沉积于Sn-3Ag-0.5Cu-Fe/Cu钎焊接头界面处靠近钎料一侧,由于增大液态钎料黏度而导致钎料与Cu板间的润湿性降低;与Sn-3Ag-0.5Cu/Cu相比,Sn-3Ag-0.5Cu-Fe/Cu界面处钎料一侧粗大的β-Sn枝晶区消失,取而代之的是细小的等轴晶。Sn-3Ag-0.5Cu-1%Fe/Cu的剪切强度为46 MPa,比Sn-3Ag-0.5Cu/Cu剪切强度提高39%;靠近界面金属间化合物处钎料基体的显微硬度提高约25%。     

FORMATION AND CHANGE OF AuSn4 COMPOUNDS AT INTERFACE BETWEEN PBGA SOLDER BALL AND Au／Ni／Cu METALLIZATION DURING LASER AND INFRA-RED REFLOW SOLDERING

Interactions between 63Sn37Pb solder and PBGA metallization (Au/Ni/Cu) during laser and infrared reflow soldering were studied.During laser reflow soldering process,a thin layer of AuSn4 was observed at the interface of the solder bumps,its morphology was strongly dependent on the laser reflow power and heating time.The solder bumps formed by the first laser reflow was reflowed again to form the solder joints.The AuSn4 compounds formed in the first laser reflow process dissolved into the bulk solder after the secondary infrared reflow process.The needle-like AuSn4 changed into rodlike,and distributed inside the solder near the solder/pad interface.