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1.
Polyaniline (PANI)-ZnO nanocomposite thin film has been successfully fabricated on glass substrates by using vacuum deposition technique. The as-grown PANI-ZnO nanocomposite thin films have been characterized using X-ray diffraction, Scanning Electron Microscopy, Atomic Force Microscopy, UV-visible spectrophotometer and Fourier Transform Infrared (FTIR) spectroscopy, respectively. X-ray diffraction of as-grown film shows the reflection of ZnO nanoparticles along with a broad peak of PANI. The surface morphology of nanocomposite films has been investigated using scanning electron microscopy and atomic force microscopy. The hypsochromic shift of the UV absorption band corresponding to pi-pi* transition in polymeric chain of PANI and a band at 504 cm(-1) due to ZnO nanoparticles has been observed in the FTIR spectra. The hydrogen bonding between the imine group of PANI and ZnO nanoparticle has been confirmed from the presence of the absorbance band at 1151 cm(-1) in the FTIR spectra of the nanocomposite thin films.  相似文献   

2.
Pure ZnO:Eu3+ nanoparticles (~ 50 nm) were prepared by a solution combustion method. ZnO and Eu2O3 were used as starting materials and dissolved in nitric acid. Citric acid was used as a fuel. The reaction mixture was heated at 350 °C resulting into a rapid exothermic reaction yielding pure nanopowders. The atomic weight concentration of Eu3+ doped in ZnO was 20%. Transmission electron microscopy (TEM) was used to study the particle size and morphology. The nanopowders were characterized for phase composition using X-ray diffractrometry (XRD). Particle size distribution (PSD) analysis of ZnO: Eu3+ showed particle sizes ranging from 30 to 80 nm.The photoluminescence emission spectra of ZnO:Eu3+ nanostructures showed a strong band emission around 618 nm when excited with 515 nm wavelength.  相似文献   

3.
We report on the growth of p-type ZnO thin films with improved stability on various substrates and study the photoconductive property of the p-type ZnO films. The nitrogen doped ZnO (N:ZnO) thin films were grown on Si, quartz and alumina substrates by radio frequency magnetron sputtering followed by thermal annealing. Structural studies show that the N:ZnO films possess high crystallinity with c-axis orientation. The as-grown films possess higher lattice constants compared to the undoped films. Besides the high crystallinity, the Raman spectra show clear evidence of nitrogen incorporation in the doped ZnO lattice. A strong UV photoluminescence emission at ~ 380 nm is observed from all the N:ZnO thin films. Prior to post-deposition annealing, p-type conductivity was found to be unstable at room temperature. Post-growth annealing of N:ZnO film on Si substrate shows a relatively stable p-type ZnO with room temperature resistivity of 0.2 Ω cm, Hall mobility of 58 cm2/V s and hole concentration of 1.95 × 1017 cm− 3. A homo-junction p-n diode fabricated on the annealed p-type ZnO layer showed rectification behavior in the current-voltage characteristics demonstrating the p-type conduction of the doped layer. Doped ZnO films (annealed) show more than two orders of magnitude enhancement in the photoconductivity as compared to that of the undoped film. The transient photoconductivity measurement with UV light illumination on the doped ZnO film shows a slow photoresponse with bi-exponential growth and bi-exponential decay behaviors. Mechanism of improved photoconductivity and slow photoresponse is discussed based on high mobility of carriers and photodesorption of oxygen molecules in the N:ZnO film, respectively.  相似文献   

4.
Novel microphone-like ZnO microstructures were grown at a very high density via a simple thermal evaporation process using commercially available ZnO powder in ambient air at ∼ 1050 ± 20 °C in 1 h. The unique as-grown microstructures were characterized in detail in terms of their structural and optical properties. The structural properties of the synthesized products confirmed that they were wurtzite hexagonal phase for the as-grown products. Raman-scattering spectra exhibited a strong and dominated Raman-active E2 (high) mode at 441 cm− 1, confirming the wurtzite hexagonal phase for the as-grown microphone-like ZnO morphologies. The cathodoluminescence (CL) spectrum shows a suppressed near band edge emission at ∼ 380 nm and strong green emission at ∼ 500 nm.  相似文献   

5.
In this work, we report the fabrication of high quality single-crystalline ZnO nanorod arrays which were grown on the silicon (Si) substrate using a microwave assisted solution method. The as grown nanorods were characterized using X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), photo-luminescence (PL) and magnetization measurements. The XRD results indicated that the ZnO nanorods are well oriented with the c-axis perpendicular to the substrate and have single phase nature with the wurtzite structure. FE-SEM results showed that the length and diameter of the well aligned rods is about ~ 1 μm and ~ 100 nm respectively, having aspect ratio of 20-30. Room-temperature PL spectrum of the as-grown ZnO nanorods reveals a near-band-edge (NBE) emission peak and defect induced green light emission. The green light emission band at ~ 583 nm might be attributed to surface oxygen vacancies or defects. Magnetization measurements show that the ZnO nanorods exhibit room temperature ferromagnetism which may result due to the presence of defects in the ZnO nanorods.  相似文献   

6.
R.N. Gayen 《Thin solid films》2010,518(14):3595-3603
Indium phosphide films were deposited by flash evaporating InP powder (99.995%) on glass substrates. Microstructural information was obtained from transmission electron microscope and atomic force microscope (AFM) studies. The average value (~ 0.33 nm) of surface roughness of the films was determined by AFM. X-ray diffraction traces indicated reflections from (111), (220) and (311) planes only. The band gap was found to vary between ~ 1.94 eV and 1.96 eV. ε varied between 11.58 and 11.89 while the plasma frequency (ωp,) were seen to vary between 8.52 and 8.59 × 1014 s− 1. The bonding environment in the films was determined from Raman and Fourier transformed infrared measurements. The experimental absorption spectra could be faithfully described by considering the effect of scattering by the ultra small crystallites in the film alone. Photoluminescence peak located at ~ 1.5 eV may be ascribed due to transitions from states arising out of phosphorous vacancy to the valance band. The shoulders of the peak ~ 1.5 eV may originate from the DA transitions between VP and InP.  相似文献   

7.
Electrochemical deposition of ZnO nanorods having a diameter of 80-150 nm and length ~ 2 μm has been carried out. Au particles were sputtered on the ZnO nanorods for different sputtering times (from 0 to 100 s). The Photoluminescence spectra of bare ZnO nanorods showed a weak bandgap emission at around 375 nm and a broad defect-related emission band centered at ~ 596 nm. After the Au sputtering, the defect-related emission disappeared for all the samples. Moreover, the band edge emission intensity was enhanced with Au sputtering time 50 s. The enhancement factor reached a maximum value for the Au sputtering time of 50 s The enhancement in band edge emission is due to the transfer of electrons from defect states to the Au nanoparticles that cause not only an increase of resonant electron density, but also creates energetic electrons in the higher energy states. These resonant electrons can escape from the surface of the Au nanoparticles to conduction band of ZnO nanorods leading to the suppression of defect related emission intensity.  相似文献   

8.
This paper focuses on the preparation of boron doped ZnO (ZnO:B) films prepared by nonreactive mid-frequency magnetron sputtering from ceramic target with 2 wt.% doping source. Adjusting power density, ZnO:B film with low resistivity (1.54 × 10− 3 Ω cm) and high transparency (average transparency from 400 to 1100 nm over 85%) was obtained. Different deposition conditions were introduced as substrate fixed in the target center and hydrogen mediation. Hall mobility increased from 11 to above 26 cm2/V·s, while carrier concentration maintained almost the same, leading to low resistivity of 6.45 × 10− 4 Ω cm. Transmission spectra of ZnO:B films grown at various growth conditions were determined using a UV-visible-NIR spectrophotometer. An obvious blue-shift of absorption edge was obtained while transmittances between 600 nm and 1100 nm remained almost the same. Optical band baps extracted from transmission spectra showed irregular enhancement due to the Burstein-Moss effect and band gap renormalization. Photoluminescence spectra also showed a gradual increase at UV emission peak due to free exciton transition near band gap. We contributed this enhancement in both optical band gap and UV photoluminescence emission to the lattice structure quality melioration.  相似文献   

9.
We investigated the structural properties of Zn-polar ZnO films with low temperature (LT) ZnO and MgO buffer layers grown by plasma-assisted molecular beam epitaxy on (0001) c-Al2O3 substrates using X-ray diffraction and transmission electron microscopy (TEM). The effects of MgO buffer layer thickness and LT ZnO buffer layer thickness were also examined. The optimum thicknesses for better crystal quality were 8 and 40 nm. One-pair and two-pair LT ZnO/MgO buffer layers were employed, and the changes in the structural properties of the high-temperature (HT) ZnO films using such buffer layers were studied. Contrary to the general tendency of c-ZnO films, the HT ZnO films on the LT ZnO/MgO buffer layers showed higher full width at half maximum (FWHM) values for X-ray rocking curves (XRCs) with (0002) reflection than those with (101?1) reflection. Compared with the one-pair LT ZnO/MgO buffer layers, the FWHM values of (0002) XRCs markedly decreased, whereas those of (101?1) XRCs slightly increased due to the insertion of one more pair of LT ZnO/MgO buffer layers into the previous film with one-pair LT ZnO/MgO buffer layers. The cross-sectional TEM observations with the two-beam condition confirmed that the screw dislocation was the dominant threading dislocation type—a finding that agreed well with the XRC results. On the basis of the plan-view TEM observations, the densities of the total threading dislocations for the HT ZnO films with the one- and two-pair LT ZnO/MgO buffer layers were determined as 2.3 × 109 cm− 2 and 1.6 × 109 cm− 2, respectively. The results imply that the crystal quality of Zn-polar ZnO films can be improved by two-pair LT ZnO/MgO buffer layers, and types of threading dislocations can be modified by adjusting the buffer system.  相似文献   

10.
Bharat Bajaj 《Thin solid films》2010,519(3):1219-1223
Amine modified iron oxide (Fe3O4) nanoparticles were synthesized by thermal decomposition method and were further used to bio-functionalize by grafting of N-hydroxysuccinimide (NHS) ester of folate and ethylenediaminetetraacetate (EDTA). Fe3O4 nanoparticles of ~ 22 nm were confirmed from X-ray diffraction (XRD) and transmission electron microscopy (TEM) studies. FT-IR studies indicated two bands at 1515 cm− 1and 1646 cm− 1, which can be attributed to carboxylic group and the amide linkage respectively, revealing the conjugation of folate with Fe3O4. The conjugation of the chelating agent showed strong C=O stretch and Fe-O vibrations at 1647 and 588 cm− 1 respectively. The value of saturation magnetization for Fe3O4 nanoparticles was found to be 88 emu/g, which further reduced to 18 and 32% upon functionalization with EDTA and NHS ester folate, respectively. These amine modified Fe3O4 nanoparticles can also be functionalized with other bifunctional chelators, such as amino acids based diethylene triamine pentaacetic acid (DTPA), and thus find potential applications in radio-labeling, biosensors and cancer detection, etc.  相似文献   

11.
The epitaxial growth of ZnO thin films on Al2O3 (0001) substrates have been achieved at a low-substrate temperature of 150 °C using a dc reactive sputtering technique. The structures and crystallographic orientations of ZnO films varying thicknesses on sapphire (0001) were investigated using X-ray diffraction (XRD). We used angle-dependent X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) spectroscopy to examine the variation of local structure. The XRD data showed that the crystallinity of the film is improved as the film thickness increases and the strain is fully released as the film thickness reached about 800 Å. The Zn K-edge XANES spectra of the ZnO films have a strong angle-dependent spectral feature resulting from the preferred c-axis orientation. The wurtzite structure of the ZnO films was explicitly shown by the XRD and EXAFS analysis. The carrier concentration, Hall mobility and resistivity of the 800 Å-thick ZnO film were 1.84 × 1019 cm− 3, 24.62 cm2V− 1s− 1, and 1.38 × 10− 2 Ω cm, respectively.  相似文献   

12.
ZnO nanoparticles with average diameter of 25 nm were synthesized by a modified sol–gel method and used in the preparation of (in wt.%) (100 − x) poly(vinyl alcohol) (PVA)/x ZnO nanocomposite films, with x = 0, 1, 2, 3, 4, and 5. The PVA/ZnO films were exposed to UV radiation for 96 h and their thermal, morphological, and spectroscopic properties were investigated. In inert atmosphere, the nanocomposite films showed lower thermal stability than the pure PVA film, and the calorimetric data suggest an interaction between PVA and ZnO in the nanocomposite films. Some crystalline phases could be seen in the films with ZnO, and a direct dependence on the ZnO concentration was also observed. The original structure of ZnO nanoparticles remained unaltered in the PVA matrix and they were uniformly distributed on the film surface. The roughness of the PVA film was not modified by the addition of ZnO; however, it increased after 96 h of UV irradiation, more significantly in the nanocomposite films. The films showed an absorption band centered at 370 nm and a broad emission band in the UV–vis region when excited at 325 nm.  相似文献   

13.
A facile template-free solvothermal approach was applied to synthesize olive-like ZnO nanoparticles with an average diameter of about 300 nm and an average length of about 600 nm. XRD, TEM, SEM, SAED, EDX and PL spectra were employed to characterize the crystal phase, morphologies, the chemical compositions, and optical properties of the ZnO nanostructure. The experimental results showed the as-obtained ZnO was single-crystalline nanostructure and the concentration of CH3COO solution played a key role in controlling the morphology of ZnO. The growth mechanism of ZnO was tentatively investigated. Besides, the olive-like ZnO nanoparticles exhibit a very strong ultraviolet emission centered at 383 nm and a weak green luminescence emission at around 522 nm.  相似文献   

14.
Al-doped transparent conducting zinc oxide (AZO) films, approximately 20-110 nm-thick, were deposited on glass substrates at substrate temperatures between 200 and 300 °C by pulsed laser deposition (PLD) using an ArF excimer laser (λ = 193 nm). When fabricated at a substrate temperature of 260 °C, a 40-nm-thick AZO film showed a low resistivity of 2.61 × 10− 4 Ω·cm, carrier concentration of 8.64 × 1020 cm− 3, and Hall mobility of 27.7 cm2/V·s. Furthermore, for an ultrathin 20-nm-thick film, a resistivity of 3.91 × 10− 4 Ω·cm, carrier concentration of 7.14 × 1020 cm− 3, and Hall mobility of 22.4 cm2/V·s were obtained. X-ray diffraction (XRD) spectra, obtained by the θ-2θ method, of the AZO films grown at a substrate temperature of 260 °C showed that the diffraction peak of the ZnO (0002) plane increased as the film thickness increased from 20 to 110 nm. The full-width-at-half-maximum (FWHM) values were 0.5500°, 0.3845°, and 0.2979° for film thicknesses of 20, 40, and 110 nm, respectively. For these films, the values of the average transmittance in visible light wavelengths (400-700 nm) were 95.1%, 94.2%, and 96.6%, respectively. Field emission scanning electron microscopy (FE-SEM) and atomic force microscopy (AFM) observations showed that even the 20-nm-thick films did not show island structures. In addition, exfoliated areas or vacant and void spaces were not observed for any of the films.  相似文献   

15.
We describe a simple route to flower like ZnO architectures, based on the decomposition of zinc acetate precursor in water-ethylene glycol solution at 140-160 °C for 1d through hydrothermal method. The PXRD pattern reveals that the ZnO crystals are of hexagonal wurtzite structure. Ethylene glycol plays a key role on the morphology control of ZnO crystals. The SEM images of ZnO products prepared at 140 °C and 160 °C mainly exhibit flower like architecture composed of many rods. Whereas, the product prepared at 180 °C shows bunches accompanying a few number of free rods. TEM results reveal that the rods resemble swords with decrease in size from one end to another. From Raman spectrum, the peaks at 437 cm− 1, 382 cm− 1 and 411 cm− 1 correspond to E2 (high), A1 (TO) and E1 (TO) of ZnO crystals respectively. The photoluminescence spectrum exhibits strong UV emission at ~ 397 nm, which comes from recombination of exciton. The possible mechanism for the formation of flower like ZnO architecture is proposed.  相似文献   

16.
Cadmium sulfide–zinc oxide composite nanorods having at least 100 nm diameters were synthesized by a two-step chemical deposition technique. Polycrystalline nanorods of ZnO were grown on indium tin oxide coated quartz substrate by aqueous chemical growth technique. Cadmium sulfide was deposited on the surface of the ZnO nanorod thin film by chemical bath deposition. The X-ray diffraction results revealed the co-existence of polycrystalline CdS and ZnO, both having hexagonal structures. Neither any phase mixing nor any surface diffusion induced alloying was observed. Micro-Raman study detected a pair of optical phonons at 301 cm−1 and 438 cm−1 corresponding to hexagonal CdS and ZnO, respectively. An enhanced light to electricity conversion efficiency of 2.52% was recorded from CdS–ZnO photoanode based electrochemical solar cell under 0.5 sun illumination condition (50 mW cm−2). We observed a significant enhancement of short circuit current of the electrochemical solar cells due to addition of ionic salt solution to the electrolyte.  相似文献   

17.
J.P. Kar  S. Tuli 《Vacuum》2006,81(4):494-498
An attempt to correlate deposition-induced effects and the morphological properties with the electrical properties of the aluminum nitride (AlN) films have been made. The AlN film was sputter deposited on silicon while increasing the pressure in steps from 2×10−3 to 8×10−3 mbar. An X-ray diffractogram revealed that the intensity of (0 0 2) orientation increased till 6×10−3 mbar pressure, but it changed to (1 0 0) orientation of the AlN film at 8×10−3 mbar. The FTIR spectra of the absorption band of the films were observed around 682 cm−1 and became prominent at 6×10−3 mbar. A decrease in the grain size was seen by SEM images at 8×10−3 mbar. The AFM measurements revealed that the surface roughness varied from 1.56 to 3.24 nm with pressure. It was found that the insulator charge density (Qin) increased from 1.4×1011 cm−2 to 1.3×1012 cm−2 with increase in pressure. On the other hand, the interface state density (Dit) was found minimum (7.3×1011 eV−1 cm−2) at 6×10−3 mbar. It is found that presence of the Qin and Dit are primarily governed by the sputtering pressure of the AlN film.  相似文献   

18.
In this paper, ZnO nanoparticles have been synthesized with and without the use of surfactants under different reaction conditions. The size of the ZnO nanoparticles varied in diameter (2 nm-28 nm) according to the reaction conditions employed. Promising particle size dependent antibacterial and antifungal activities of the ZnO nanoparticles have been observed. Transmission electron microscopy (TEM), X-ray diffraction (XRD) and Infrared spectroscopy (FTIR) techniques were used to characterize the particle size and morphology.  相似文献   

19.
S. Adhikari 《Thin solid films》2010,518(19):5421-5425
Thermal evaporation technique was employed to deposit pristine and iodine doped polyaniline (PANI) thin films on glass substrates. PANI was synthesized by the chemical oxidation method. Iodine doping was carried out by evaporation. The polymer synthesized was characterized by Thermo Gravimetric Analysis (TGA), Fourier Transform Infra Red (FTIR) and Ultraviolet-Visible (UV-VIS) spectroscopy. The evaporation temperature was optimized from TGA measurements. The thin film was deposited in vacuum at 1.33 × 10− 4 Pa by thermal evaporation of PANI. The polymer film was characterized by FTIR and UV-VIS spectroscopy. The surface morphology of the films was studied by field emission scanning electron microscopy. The resistivity was measured by van der Pauw technique. The conductivity of the doped films was seen to increase with the iodine concentration and many fold increase in conductivity was observed in comparison to the pristine films. The increase in conductivity is due to the generation of polaron band in the band gap upon iodine doping.  相似文献   

20.
B. Boyarbay  A. Uygun 《Thin solid films》2010,518(8):2216-2221
Au/PANI/p-Si/Al and Au/PANI TiO2 TTAB/p-Si/Al heterojunctions have been fabricated by spin coating of soluble polyaniline (PANI) and PANI titanium dioxide (TiO2) tetradecyltrimethylammonium bromide (TTAB) on the chemically cleaned p-Si substrates. The thicknesses of the polymeric films have been determined by a profilometer. The current-voltage (I-V) characteristics of the heterojunctions have been obtained in the temperature range of 98-258 K. These devices have showed the rectifying behavior such as diode. The I-V characteristics of the devices have been analyzed on the basis of the standard thermionic emission theory at low forward bias voltage regime. It has been shown that the values of ideality factor decrease while the values of barrier height increase with increasing temperature. This temperature dependence has been attributed to the presence of barrier inhomogeneities at the organic/inorganic semiconductor interface. Furthermore, analysis of the double logarithmic I-V plots at higher forward bias voltages at all temperatures indicates that transport through the organic thin film is explained by a space-charge-limited current process characterized by exponential distribution of traps within the band gap of the organic film. The total concentration of traps has been found to be 3.52 × 1014 cm− 3 and 3.14 × 1015 cm− 3 for PANI and PANI TiO2 TTAB layer, respectively.  相似文献   

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