X-ray imaging by angular raster scanning

The technology of x-ray W-Al multilayer mirrors with an angular reflection width of more than 0.4 degrees at a 1.54-A wavelength is developed. On this basis an x-ray scanner is constructed. We show experimentally the possibility of object-transfer imaging with a resolution of ~20 mum.     

X-Ray Telescope Onboard Astro-E. II. Ground-Based X-Ray Characterization

X-ray characterization measurements of the x-ray telescope (XRT) onboard the Astro-E satellite were carried out at the Institute of Space and Astronautical Science (Japan) x-ray beam facility by means of a raster scan with a narrow x-ray pencil beam. The on-axis half-power diameter (HPD) was evaluated to be 1.8?-2.2?, irrespective of the x-ray energy. The on-axis effective areas of the XRTs for x-ray imaging spectrometers (XISs) were approximately 440, 320, 240, and 170 cm(2) at energies of 1.49, 4.51, 8.04, and 9.44 keV, respectively. Those of the x-ray spectrometer (XRS) were larger by 5-10%. The replication method introduced for reflector production significantly improved the imaging capability of the Advanced Satellite for Cosmology and Astrophyics (ASCA) XRT, whose HPD is ~3.6?. The increase in the effective area by a factor of 1.5-2.5, depending upon the x-ray energy, compared with that of the ASCA, was brought about by mechanical scale up and longer focal lengths. The off-axis HPDs were almost the same as those obtained on the optical axis. The field of view is defined as the off-axis angle at which the effective area becomes half of the on-axis value. The diameter of the field of view was ~19? at 1.49 keV, decreasing with increasing x-ray energy, and became ~13? at 9.44 keV. The intensity of stray light and the distribution of this kind of light on the focal plane were measured at the large off-axis angles 30? and 60?. In the entire XIS field of view (25.4 mm x 25.4 mm), the intensity of the stray light caused by a pointlike x-ray source became at most 1% of the same pointlike source that was on the optical axis.     

Surface finish requirements for soft x-ray mirrors

We have examined the correlations between direct surface-finish metrology techniques and normalincidence, soft x-ray reflectance measurements of highly polished x-ray multilayer mirrors. We find that, to maintain high reflectance, the rms surface roughness of these mirrors must be less than ~ 1 ? over the range of spatial frequencies extending approximately from 1 to 100 μm(-1)1 (i.e., spatial wavelengths from 1 μm to 10 nm). This range of spatial frequencies is accessible directly only through scanning-probe metrology. Because the surface-finish Fourier spectrum of such highly polished mirrors is described approximately by an inverse power law (unlike a conventional surface), bandwidth-limited rms roughness values measured with instruments that are sensitive to only lower spatial frequencies (i.e., optical or stylus profileres) are generally uncorrelated with the soft x-ray reflectance and can lead to erroneous conclusions regarding the expected performance of substrates for x-ray mirrors.     

Micro texturing of silicon using pulsed N(2)-laser and formation mechanism

A low-cost pulsed N(2)-laser has been used to successfully demonstrate the formation of self-organized conical microtexture in Si. The process is demonstrated in vacuum environment to avoid the use of SF(6) gas and sulfur incorporation. The microtexture is formed with an average structure height of ~15 um, base diameter ~10 μm, and tip-to-tip separation ~8 μm. Energy dispersive x-ray spectroscopy of individual conelike structure shows that the material remains free from impurity incorporation. We have shown that the laser-induced-damage-related absorption can be successfully restored after an hour annealing at 1000 °C, making the material an ideal candidate for photovoltaic and other photonic applications.     

Cone-beam tomography with a digital camera

We show that x-ray computer tomography algorithms can be applied with minimal alteration to the three-dimensional reconstruction of visible sources. Diffraction and opacity affect visible systems more severely than x-ray systems. For camera-based tomography, diffraction can be neglected for objects within the depth of field. We show that, for convex objects, opacity has the effect of windowing the angular observation range and thus blurring the reconstruction. For concave objects, opacity leads to nonlinearity in the transformation from object to reconstruction and may cause multiple objects to map to the same reconstruction. In x-ray tomography, the contribution of an object point to a line integral is independent of the orientation of the line. In optical tomography, however, a Lambertian assumption may be more realistic. We derive an expression for the blur function (the patch response) for a Lambertian source. We present experimental results showing cone-beam reconstruction of an incoherently illuminated opaque object.     

Pinhole-array x-ray spectrometer for laser-fusion experiments

A pinhole-array x-ray spectrometer for laser-fusion experiments is demonstrated. An array of approximately 300 pinholes is placed in front of a flat-crystal spectrometer, yielding target images at photon energies ~10 eV apart (for photon energies of ~4 to 5 keV). For wideband radiation the images are two dimensional, whereas when a single spectral line is used, the field of view in the direction of dispersion is limited. However, single spectral line images can have a field of view sufficient for imaging the compressed target core. We show the image at the Ti-Kalpha-line fluorescence from a Ti-doped shell, which we show to be excited by continuum radiation from the compressed core. The Kalpha image delineates the cold, compressed shell at peak compression, which can otherwise be obtained only through backlighting. In addition, the array provides spectra of high spectral resolution because of the reduction in the effective source size.     

X-ray induced electrostatic charging of helium films

It is well known that free electrons can be held onto the free surface of liquid helium through either their own image charges or through the effect of an externally applied electric field. The resultant electrostatic pressure causes films to thin. We have recently measured x-ray reflectivity from static films of isotopic mixtures of helium with an intense x-ray beam in the temperature range between 0.37 K and 1.3 K. Normally, no significant thickness variation with x-ray intensity is expected over a wide range of temperatures when the film is superfluid. We have found that even modest x-ray intensities affect the thickness of films containing only trace amounts of³He. We believe that the effect is due to x-ray produced photoelectrons, which thermalize in the vapor and then reside on the surface, attracted by both the film and a charged substrate. The temperature and concentration dependence is then due to the transport properties of the electrons at the surface. It may be possible to study the 2-D electron gas produced in this way by diffraction techniques.     

Noninterferometric phase-contrast images obtained with incoherent x-ray sources

We report on what are believed to be the first full-scale images obtained with the coded aperture concept, which uses conventional x-ray sources without the need to collimate/aperture their output. We discuss the differences in the underpinning physical principles with respect to other methods, and explain why these might lead to a more efficient use of the source. In particular, we discuss how the evaluation of the first imaging system provided promising indications on the method's potential to detect details invisible to conventional absorption methods, use an increased average x-ray energy, and reduce exposure times-all important aspects with regards to real-world implementations.     

Improved analyzer multilayers for aluminium and boron detection with x-ray fluorescence

We have developed improved analyzer multilayers for the detection of aluminium (Al) and boron (B) on silicon (Si) wafers with wavelength-dispersive x-ray fluorescence spectrometers. For the detection of Al on Si wafers we show that WSi(2)/Si and Ta/Si multilayers provide detection limits that are 42% and 60% better, respectively, than with currently used W/Si multilayers. For the detection of B on Si wafers we show that La/B(4)C multilayers improve the detection limit by ~28% compared with a conventionally used Mo/B(4)C multilayer.     

High-efficiency x-ray gratings with asymmetric-cut multilayers

We present the fabrication and analysis of efficient and highly dispersive gratings for the x-ray and extreme ultraviolet (EUV) regime. We show that an asymmetric-cut multilayer structure can act as a near-perfect blazed grating. The precision and high line density are achieved by layer deposition of materials, which can be controlled to the angstrom level. We demonstrate this in the EUV regime with two structures made by cutting and polishing magnetron-sputtered multilayer mirrors of over 2000 bilayers thick, each with a period of 6.88 nm. These were cut at angles of 2.9° and 7.8° to the surface. Within the 3% bandwidth rocking curve of the multilayer, the angular dispersion of the diffracted wave was in agreement with the grating equation for elements with 7250 and 19,700 line pairs/mm, respectively. The dependence of the measured efficiency was in excellent agreement with a formulation of dynamical diffraction theory for multilayered structures. At a wavelength of 13.2 nm, the efficiency of the first-order diffraction was over 95% of the reflectivity of the uncut multilayer. We predict that such structures should also be effective at shorter x-ray wavelengths. Both the Laue (transmitting) and Bragg (reflecting) geometries are incorporated in our formalism, which is applied to the analysis of multilayer Laue lenses and focusing and dispersing Bragg optics.     

Validation of radiographic simulation codes including x-ray phase effects for millimeter-size objects with micrometer structures

The mix between x-ray phase and attenuation information needs to be understood for accurate object recovery from radiography and tomography data. We are researching and experimentally validating algorithms that simulate x-ray phase contrast to determine the required physics necessary for quantitative object recovery. The results of a study are described to determine if a multislice (beam-propagation) method is required for simulating x-ray radiographs. We conclude that the multislice method is not required for accurate simulation of greater than or equal to 8 keV x-ray radiographs of millimeter-size objects with micrometer structures.     

NIST/Sandia/ICDD Electron Diffraction Database: A Database for Phase Identification by Electron Diffraction

A new database containing crystallographic and chemical information designed especially for application to electron diffraction search/match and related problems has been developed. The new database was derived from two well-established x-ray diffraction databases, the JCPDS Powder Diffraction File and NBS CRYSTAL DATA, and incorporates 2 years of experience with an earlier version. It contains 71,142 entries, with space group and unit cell data for 59,612 of those. Unit cell and space group information were used, where available, to calculate patterns consisting of all allowed reflections with d-spacings greater than 0.8 A for ~ 59,000 of the entries. Calculated patterns are used in the database in preference to experimental x-ray data when both are available, since experimental x-ray data sometimes omits high d-spacing data which falls at low diffraction angles. Intensity data are not given when calculated spacings are used. A search scheme using chemistry and r-spacing (reciprocal d-spacing) has been developed. Other potentially searchable data in this new database include space group, Pearson symbol, unit cell edge lengths, reduced cell edge length, and reduced cell volume. Compound and/or mineral names, formulas, and journal references are included in the output, as well as pointers to corresponding entries in NBS CRYSTAL DATA and the Powder Diffraction File where more complete information may be obtained. Atom positions are not given. Rudimentary search software has been written to implement a chemistry and r-spacing bit map search. With typical data, a full search through ~ 71,000 compounds takes 10~20 seconds on a PDP 11/23-RL02 system.     

Plasma treatment for restoration of dielectric multilayer mirrors in short-wavelength free-electron lasers

Dielectric multilayer mirrors, degraded through irradiation by high-energy undulator radiation, were successfully restored by surface treatment with RF-induced O(2) plasma. The mirror loss, which had been increased up to ~1000 parts in 10(6) (ppm) through the mirror degradation, was drastically reduced to ~100 ppm during the treatment. Such a mirror-restoration technique has been desired especially in short-wavelength free-electron lasers (FEL's), because the laser gain is so small that even a mirror loss as small as ~1000 ppm interferes with the FEL oscillation. The mirror degradation is most likely caused by the deposition and doping of carbon atoms onto the dielectric surface. The surface analysis by the x-ray photoelectron spectroscopy revealed that the plasma treatment effectively removed the carbon contamination covering the mirror surfaces without serious surface damage by high-energy particles from the plasma.     

多孔阳极氧化铝薄膜的制备

采用二次氧化的方法,在短时间内制备了多孔阳极氧化铝薄膜(Anodic Alumina Membrane, 简称AAM),借助扫描电子显微镜(SEM),能谱分析(EDS)和X射线衍射(XRD)等测试手段分析了氧化铝膜的微观形貌和晶体结构,讨论了电解液温度波动和铝材表面缺陷对AAM表面形貌的影响.研究结果表明:制备的多孔氧化铝薄膜是非晶态氧化铝,在其表面孔径为50～70 nm的六边形孔洞分布均匀,且垂直于薄膜表面平行生长.氧化过程中,电解液温度的稳定有利于形成规则的孔洞阵列;通过电化学抛光预处理,可有效去除机械划痕,避免薄膜表面沟壑状形貌的形成,提高了孔洞分布的均匀性.     

Solution-process coating of vertical ZnO nanowires with ferroelectrics

We have developed a modified misted deposition process by combining substrate and mist heating for the deposition of ferroelectrics on 3D nanostructures. Arrays of vertical ZnO nanowires, sputter coated with Pd bottom electrodes, are used as the substrate. Scanning electron microscopy investigations show that conformal coating of ferroelectric Pb(Zr,Ti)O(3) (PZT) with good step coverage is obtained at deposition temperatures above 140?°C. The substrate heating also eliminates the common 'bundling' problem of the nanowire arrays. On the basis of data on x-ray diffraction, energy dispersive x-ray spectroscopy, and P-E hysteresis of PZT films on flat substrates, we obtain the optimum substrate temperature window to be 180-220?°C, in terms of best step coverage and an evident ferroelectricity. This is a significant step towards the end-goal of fully integrated ZnO nanowires with ferroelectric capacitors, which may be useful for the light-emitting applications of ZnO.     

Dynamic tomography with a priori information

We present "dynamic tomography" algorithms that allow for the high-resolution, time-resolved imaging of dynamic (i.e., continuously time evolving) complex systems at existing x-ray micro-CT facilities. The behavior of complex systems is constrained by the underlying physics. By exploiting a priori knowledge of the geometry of the physical process being studied to allow the use of sophisticated iterative reconstruction techniques that incorporate constraints, we improve on current frame rates by at least an order of magnitude. This allows time-resolved imaging of previously intractable processes, such as two-phase fluid flow. We present reconstructions from experimental data collected at the Australian National University x-ray micro-CT facility.     

High-resolution superconducting x-ray detectors with two aluminum trapping layers

Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency x-ray spectrometers. We have tested three detectors with niobium x-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. Two detectors differed only in barrier thickness. A third detector includes an extra absorbing layer. Here we present a comparison of detector performance. The best energy resolution measured was 36 eV full width at half maximum at 6 keV.     

High-Current-Density field emission from self-heating printed carbon nanotubes

High-current-density field emitters are considered as the potential and necessary components for compact high definition x-ray sources and high-power cold cathode microwave amplifiers. In this report, high-current-density field emission from self-heating printed carbon nanotubes is introduced. Large emission current causes large heat that increases the temperature of the emitters. The temperature is estimated to be more than ~1600 K. Localized surface field and high temperature both drive more electrons escaping from the emitters, and the maximum current density is larger than ~2.7 A/cm² that will satisfy the need of most vacuum electron devices including x-ray sources and microwave electron devices.     

Characterization of the Advanced Satellite for Cosmology and Astrophysics x-ray telescope: preflight calibration and ray tracing

The x-ray properties of multinested thin-foil mirror x-ray telescopes (XRT's) on board ASCA, the Advanced Satellite for Cosmology and Astrophysics, were fully evaluated with an x-ray pencil beam.Scanning over the telescope aperture of 35 cm in diameter with an x-ray pencil beam, we found the effective area of a set of XRT's to be 325, 200, and 113 cm(2) at energies of 1.5, 4.5, and 8.0 keV, respectively. We derive the point-spread functions (PSF's) of the XRT's by measuring the image profile at the focal plane with an x-ray CCD. The PSF is found to exhibit a sharp core concentrated within 30 arcsec and a broad wing extended to 3 arcmin in half-power diameter. We also evaluate the contribution of stray light, which is caused by the single reflection of x rays by primary or secondary mirrors and by the backside reflection of the mirrors. To obtain the characteristics of the XRT in the energy region of 0.5-10.0 keV, incorporated with the measurements at discrete energies, we develop a ray-tracing method with the telescope design parameter, the PSF, and optical constants. In particular, we obtain the optical constants around the gold-atom M shell (Au-M) absorption-edge energies by measuring the reflectivity of our mirror sample, with monochromatized x-rays in the energy range of 2.0-3.5 keV from synchrotron radiation. Taking into account the PSF's and optical constants, we find that our ray-tracing program can reproduce all these XRT performances.     

Time-resolved x-ray transmission grating spectrometer for studying laser-produced plasmas

The development of a new time-resolved x-ray spectrometer is reported in which a free-standing x-ray transmission grating is coupled to a soft x-ray streak camera. The instrument measures continuous x-ray spectra with 20-psec temporal resolution and moderate spectral resolution (deltalambda >/= 1 A) over a broad spectral range (0.1-5 keV) with high sensitivity and large information recording capacity. Its capabilities are well suited to investigation of laser-generated plasmas, and they nicely complement the characteristics of other time-resolved spectroscopic techniques presently in use. The transmission grating spectrometer has been used on a variety of laser-plasma experiments. We report the first measurements of the temporal variation of continuous low-energy x-ray spectra from laser-irradiated disk targets.